| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/29/2006 | US7098878 Semiconductor device and liquid crystal panel driver device |
| 08/29/2006 | US7098683 Motor driving system having power semiconductor module life detection function |
| 08/29/2006 | US7098682 Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element |
| 08/29/2006 | US7098681 Semiconductor device, method for testing the same and IC card |
| 08/29/2006 | US7098680 Connection unit, a board for mounting a device under test, a probe card and a device interfacing part |
| 08/29/2006 | US7098679 Circuit tester interface |
| 08/29/2006 | US7098678 Multiple local probe measuring device and method |
| 08/29/2006 | US7098677 Method and device for measuring intensity of electromagnetic field, method and device for measuring current-voltage distribution, and method for judging quality of electronic device, and electronic device therefor |
| 08/29/2006 | US7098676 Multi-functional structure for enhanced chip manufacturibility and reliability for low k dielectrics semiconductors and a crackstop integrity screen and monitor |
| 08/29/2006 | US7098668 Digital measuring head |
| 08/29/2006 | US7098665 Method for prediction of the internal resistance of an energy storage battery, and a monitoring device for energy storage batteries |
| 08/29/2006 | US7098650 Apparatus for planarizing a probe card and method using same |
| 08/29/2006 | US7098649 Testing circuits on substrates |
| 08/29/2006 | US7098648 Automatic range finder for electric current testing |
| 08/29/2006 | US7098647 Coaxial cable unit, test apparatus, and CPU system |
| 08/29/2006 | US7098646 Radio frequency power generation and power measurement |
| 08/29/2006 | US7098644 Non-contact high-voltage electrometer architecture with low-voltage feedback |
| 08/29/2006 | US7098643 Wire identifier |
| 08/29/2006 | US7098626 Power supply apparatus |
| 08/29/2006 | US7098625 Apparatus and method for estimating charge rate of secondary cell |
| 08/29/2006 | US7098560 Flux probe for electric generator |
| 08/29/2006 | US7098475 Apparatuses configured to engage a conductive pad |
| 08/29/2006 | US7098455 Method of inspecting a circuit pattern and inspecting instrument |
| 08/29/2006 | US7098153 Semiconductor device, manufacture and evaluation methods for semiconductor device, and process condition evaluation method |
| 08/29/2006 | US7098059 Surface emitting semiconductor laser and process for producing the same including forming an insulating layer on the lower reflector |
| 08/29/2006 | US7098055 Apparatus and method for testing defects |
| 08/29/2006 | US7098053 Method of producing semiconductor elements using a test structure |
| 08/29/2006 | US7098051 Structure and method of direct chip attach |
| 08/29/2006 | US7098050 Corona based charge voltage measurement |
| 08/29/2006 | US7098049 Shallow trench isolation void detecting method and structure for the same |
| 08/29/2006 | US7098048 Method and apparatus for capturing fault state data |
| 08/29/2006 | US7098047 Wafer reuse techniques |
| 08/29/2006 | US7097488 Socket for electrical parts |
| 08/24/2006 | WO2006088745A2 Detection algorithm for delivering inline power down four pairs of an ethernet cable to a single powered device |
| 08/24/2006 | WO2006088238A1 Method and system for scheduling tests in a parallel test system |
| 08/24/2006 | WO2006087877A1 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device |
| 08/24/2006 | WO2006087844A1 Wiring connected state inspecting instrument |
| 08/24/2006 | WO2006087826A2 Wiring connection state inspection device |
| 08/24/2006 | WO2006087772A1 Burn-in apparatus |
| 08/24/2006 | WO2006087296A1 Assembly comprising an electric conductor for transmitting electric energy and method for determining the load of an electric conductor |
| 08/24/2006 | WO2006087231A1 Power consumption debugging in mobile terminals |
| 08/24/2006 | WO2006069955A3 Method and device for the secure operation of a switching device |
| 08/24/2006 | WO2006020578A3 Self-cleaning lower contact |
| 08/24/2006 | WO2006014512A3 System and method for selecting stable routes in wireless networks |
| 08/24/2006 | WO2006012211A3 A system and method for adaptive rate selection for wireless networks |
| 08/24/2006 | WO2005109366A3 Method and apparatus for controlling traffic in a computer network |
| 08/24/2006 | WO2005062869A3 Path engine for optical network |
| 08/24/2006 | US20060190886 Optimizing IC clock structures by minimizing clock uncertainty |
| 08/24/2006 | US20060190885 Method of displaying delay |
| 08/24/2006 | US20060190860 Method and system for debugging using replicated logic and trigger logic |
| 08/24/2006 | US20060190794 Test apparatus and testing method |
| 08/24/2006 | US20060190793 Establishing a reference bit in a bit pattern |
| 08/24/2006 | US20060190792 Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element |
| 08/24/2006 | US20060190791 Enabling special modes within a digital device |
| 08/24/2006 | US20060190790 In-situ monitor of process and device parameters in integrated circuits |
| 08/24/2006 | US20060190789 Synchronization point across different memory BIST controllers |
| 08/24/2006 | US20060190788 Method and apparatus for verifying memory testing software |
| 08/24/2006 | US20060190787 Target system, debugging system, integrated circuit device, microcomputer and electronic apparatus |
| 08/24/2006 | US20060190786 Semiconductor integrated circuit and method of tesiting semiconductor integrated circuit |
| 08/24/2006 | US20060190785 In-situ monitor of process and device parameters in integrated circuits |
| 08/24/2006 | US20060190784 Method and circuit using boundary scan cells for design library analysis |
| 08/24/2006 | US20060190783 On-chip high-speed serial data analyzers, systems, and associated methods |
| 08/24/2006 | US20060190782 Mechanism to provide test access to third-party macro circuits embedded in an asic (application-specific integrated circuit) |
| 08/24/2006 | US20060190781 Clock control circuit for test that facilitates an at speed structural test |
| 08/24/2006 | US20060190780 High reliability memory module with a fault tolerant address and command bus |
| 08/24/2006 | US20060190201 Derivation of composite step-function response |
| 08/24/2006 | US20060190199 Method and integrated circuit for use by a handheld multiple function device |
| 08/24/2006 | US20060189010 Method of testing FPC bonding yield and FPC having testing pads thereon |
| 08/24/2006 | US20060189008 Method for monitoring implantation depth of impurity |
| 08/24/2006 | US20060189005 Methods for fabricating semiconductor devices so as to stabilize the same when contact-bearing surfaces thereof face over test substrates |
| 08/24/2006 | US20060187726 Memory bus checking procedure |
| 08/24/2006 | US20060187001 Timing closure monitoring circuit and method |
| 08/24/2006 | US20060186914 Phase-loss detection for rotating field machine |
| 08/24/2006 | US20060186913 Liquid crystal display and test method thereof |
| 08/24/2006 | US20060186912 Apparatus and methods for self-heating burn-in processes |
| 08/24/2006 | US20060186911 Apparatus and methods for self-heating burn-in processes |
| 08/24/2006 | US20060186910 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
| 08/24/2006 | US20060186909 Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test |
| 08/24/2006 | US20060186908 Probe card |
| 08/24/2006 | US20060186907 Method and apparatus for semiconductor testing utilizing dies with integrated circuit |
| 08/24/2006 | US20060186906 High density interconnect system for IC packages and interconnect assemblies |
| 08/24/2006 | US20060186905 Contactor for electronic parts and a contact method |
| 08/24/2006 | US20060186904 Wafer holder for wafer prober and wafer prober equipped with the same |
| 08/24/2006 | US20060186903 Apparatus and method for terminating probe apparatus of semiconductor wafer |
| 08/24/2006 | US20060186894 Voltage measurement device |
| 08/24/2006 | US20060186893 Systems and methods for testing wireless devices |
| 08/24/2006 | US20060186892 Open-phase detecting method and apparatus |
| 08/24/2006 | US20060186891 Non-redundant safety monitoring for an electric drive mechanism (with a sensor) |
| 08/24/2006 | US20060186890 Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and power supply system |
| 08/24/2006 | US20060186874 System and method for mechanical testing of freestanding microscale to nanoscale thin films |
| 08/24/2006 | US20060186872 Electric field detector |
| 08/24/2006 | DE69833123T2 Schaltungsanordnung zum testen eines kerns Circuitry for testing of a nucleus |
| 08/24/2006 | DE69635570T2 Taktschaltung für ein schnellfehlendes, funktionellfehlendes, fehlertolerantes Multiprozessorsystem Clock circuit for a quick missing, missing functional, fault-tolerant multiprocessor system |
| 08/24/2006 | DE202004021082U1 Probe for measuring electrical characteristics of integrated circuit, microelectronic device, has conductive via formed between front and back surfaces of dielectric substrate, in thickness direction |
| 08/24/2006 | DE19504714B4 Verfahren und Vorrichtung zur Überwachung einer Zustandsgröße eines Leistungsschalters A method and apparatus for monitoring a state quantity of a circuit breaker |
| 08/24/2006 | DE102006006048A1 Testgerät und Testverfahren Test apparatus and test procedure |
| 08/24/2006 | DE102005009317A1 Verfahren und Vorrichtung zur Bestimmung einer Aktivierungsschwelle Method and apparatus for determining an activation threshold |
| 08/24/2006 | DE102005007593A1 Semiconductor component test adapter uses arm mounted contact pins with adjustable seats to select contacts |
| 08/24/2006 | DE102005007103A1 Verfahren zum Testen einer zu testenden Schaltungseinheit mit Auskopplung von Verifikationssignalen und Testvorrichtung zur Durchführung des Verfahrens A method of testing a circuit to be tested with outcoupling unit of verification signals and test device for carrying out the method |
| 08/24/2006 | CA2598822A1 Wiring connected state inspecting instrument |