Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2006
08/08/2006US7088108 Method for detecting an offset drift in a wheatstone measuring bridge
08/08/2006US7088107 Circuit pattern inspection instrument and pattern inspection method
08/08/2006US7088092 Silicon-on-insulator channel architecture for automatic test equipment
08/08/2006US7088091 Testing a multi-channel device
08/08/2006US7088075 Battery pack
08/08/2006US7087501 Manufacture of probe unit having lead probes extending beyond edge of substrate
08/08/2006US7087443 Optimized temperature controller for cold mass introduction
08/08/2006US7087442 Process for the formation of a spatial chip arrangement and spatial chip arrangement
08/08/2006US7087441 Method of making a circuitized substrate having a plurality of solder connection sites thereon
08/08/2006US7087439 Method and apparatus for thermally assisted testing of integrated circuits
08/08/2006US7086149 Method of making a contact structure with a distinctly formed tip structure
08/03/2006WO2006080111A1 Semiconductor integrated circuit and system lsi
08/03/2006WO2006080067A1 Secondary cell charge/discharge electricity amount estimation method and device, secondary cell polarization voltage estimation method and device, and secondary cell remaining capacity estimation method and device
08/03/2006WO2006079690A1 Position detector
08/03/2006WO2006079590A1 Desktop computer blade fault identification system and method
08/03/2006WO2006079193A1 System and method for guidance of assembly of electronic components
08/03/2006WO2006035365A3 Charging method and circuit using indirect current sensing
08/03/2006WO2005121825B1 Test arrangement including anisotropic conductive film for testing power module
08/03/2006WO2005112348A3 System and method for detecting link failures
08/03/2006WO2005085884A3 System and method for reducing temperature variation during burn in
08/03/2006US20060174178 Programmable scan shift speed control for LBIST
08/03/2006US20060174177 Apparatus and method for using MEMS filters to test electronic circuits
08/03/2006US20060174176 Semiconductor integrated circuit and method for testing the same
08/03/2006US20060174175 Array self repair using built-in self test techniques
08/03/2006US20060174174 Method, system, and storage medium for estimating and improving test case generation
08/03/2006US20060174173 Built-in Test Circuit for an Integrated Circuit Device
08/03/2006US20060174171 Method and apparatus for reducing transmission errors caused by periodic transients in digital subscriber line (DSL) communication systems
08/03/2006US20060172445 Method for determining properties of a film, and apparatus for realizing the method
08/03/2006US20060172444 Efficient method of forming and assembling a microelectronic chip including solder bumps
08/03/2006US20060172442 Semiconductor production system and semiconductor production process
08/03/2006US20060172063 Method and apparatus for detecting portable electronic device functionality
08/03/2006US20060171305 Access point channel forecasting for seamless station association transition
08/03/2006US20060171283 Method and apparatus for decoding data in a layered modulation system
08/03/2006US20060170472 Variable delay circuit
08/03/2006US20060170448 Method of sensing motor winding current in integrated stepper motor buffer
08/03/2006US20060170447 Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel
08/03/2006US20060170446 System and method for testing devices utilizing capacitively coupled signaling
08/03/2006US20060170445 Method for testing the sensitive input range of Byzantine filters
08/03/2006US20060170444 Novel fluorescent and photoemission apparatus and method for submicron IC failure analysis
08/03/2006US20060170443 Avalanche testing at final test of top and bottom FETs of a buck converter
08/03/2006US20060170442 Protection devices for integrated circuit boards
08/03/2006US20060170441 Interface for testing semiconductors
08/03/2006US20060170440 Vertical probe card, probes for vertical probe card and method of making the same
08/03/2006US20060170439 Probe for testing a device under test
08/03/2006US20060170438 Probe card
08/03/2006US20060170437 Probe card for testing a plurality of semiconductor chips and method thereof
08/03/2006US20060170436 Radio frequency identification labels and systems and methods for making the same
08/03/2006US20060170435 Programmable devices to route signals on probe cards
08/03/2006US20060170434 Method And Apparatus For Verifying Planarity In A Probing System
08/03/2006US20060170429 Connector, connector testing apparatus and method
08/03/2006US20060170428 Electrical safety cord
08/03/2006US20060170427 Exterior lamp check for motor vehicles
08/03/2006US20060170412 Sokcet assembly for testing semiconductor device
08/03/2006US20060170410 Compensation of simple fiber optic faraday effect sensors
08/03/2006US20060170408 Method for activating and deactivating electronic circuit units and circuit arrangement for carrying out the method
08/03/2006US20060170104 Method and structure for defect monitoring of semiconductor devices using power bus wiring grids
08/03/2006US20060169678 Probe positioning and bonding device and probe bonding method
08/03/2006US20060168802 Wireless identification device, RFID device with push-on/push-off switch, and method of manufacturing wireless identification device
08/03/2006US20060168793 System and method for estimation of integrated circuit signal characteristics using optical measurements
08/03/2006DE4208533B4 Vorrichtung und Verfahren zur Erfassung eines mechanischen Defekts in einem elektrischen fehlerhaft arbeitenden Isolator Apparatus and method for detecting a mechanical defect in an electrical malfunctioning insulator
08/03/2006DE19881127B4 Halbleiterbauelement-Testgerät und Testtablett zur Verwendung in dem Testgerät The semiconductor device testing apparatus and test tray for use in the test device
08/03/2006DE102005060016A1 Verfahren zum Verifizieren von Fehlern von intelligenten Batterien durch Messen der Eingangs-Ladespannung und zugeordnete Systeme Method for verifying defects of intelligent batteries by measuring the charging voltage input and associated systems
08/03/2006DE10128156B4 Adapter für Testautomaten Adapter for test machines
08/02/2006EP1686672A2 Electronic apparatus
08/02/2006EP1686391A1 Procedure for evaluating the performance of an automobile vehicle battery
08/02/2006EP1686390A1 Apparatus for estimating and displaying the remaining capacity of a battery and wireless telephone apparatus
08/02/2006EP1686389A1 Apparatus and method for monitoring charging/discharging capacity of battery packs
08/02/2006EP1686388A1 Timing comparator, data sampling device, and test device
08/02/2006EP1686387A1 A method and an apparatus for testing electrical properties
08/02/2006EP1686386A1 Method and apparatus to measure the current-voltage characteristics of photovoltaic devices and to equalize the irradiance of a solar simulator
08/02/2006EP1686385A1 Conductive contact holder and conductive contact unit
08/02/2006EP1686382A2 Finger switch
08/02/2006EP1685750A2 Independently adjustable circuit board carrier
08/02/2006EP1685417A1 Hot switchable voltage bus for iddq current measurements
08/02/2006EP1685416A2 Method and apparatuses for using packet data to manage a data stream in a broadband communications system
08/02/2006EP1685415A2 Method for forming photo-defined micro electrical contacts
08/02/2006EP1685414A2 Electric utility storm outage management
08/02/2006EP1606972B1 Method of programming a hearing aid by a programming device
08/02/2006EP1543339B1 Method and apparatus for determining iddq
08/02/2006EP1410052B1 Multi-mode storage cell
08/02/2006EP0944824B1 Device and method for testing electrosurgical instruments
08/02/2006CN2802517Y Automatic tracking compensation and earthing wire selecting positioning device using arc suppression coil
08/02/2006CN2802510Y 探针装置 Probe device
08/02/2006CN2802509Y Binding base with quickly connecting testing function and connecting device for electric equipment
08/02/2006CN1813481A Method and apparatus for control channel scheduling in a packet data communication system
08/02/2006CN1813465A Portable battery driven apparatus
08/02/2006CN1813199A Method for predicting the residual service life of an electric energy accumulator
08/02/2006CN1813198A Testing radio frequency and analogue circuits
08/02/2006CN1813197A Memory bus checking procedure
08/02/2006CN1813196A Method and circuit arrangement for the self-testing of a reference voltage in electronic components
08/02/2006CN1813195A Method and circuit arrangement for the self-testing of a reference voltage in electronic components
08/02/2006CN1813176A Pressure-sensitive sensor
08/02/2006CN1812826A Gas-collecting unit, test head, and IC device testing apparatus
08/02/2006CN1812199A Memory modules and tester
08/02/2006CN1812070A Probe card, method of manufacturing the probe card and alignment method
08/02/2006CN1811965A Hard disc clamping device
08/02/2006CN1811482A Device and method for monitoring battery set charge/discharge capacity
08/02/2006CN1811481A Apparatus for estimating and displaying the remaining capacity of a battery and wireless telephone apparatus
08/02/2006CN1811480A Method and apparatus for real-time monitoring level signal
08/02/2006CN1811479A Device with board abnormality detecting circuit