| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/02/2006 | CN1811478A Method of predicting high-k semiconductor device lifetime |
| 08/02/2006 | CN1811477A Lightning arrester leakage current and action frequency real-time monitoring system |
| 08/02/2006 | CN1811476A Thyristor core parameter testing mould |
| 08/02/2006 | CN1811475A Electrical wire recognition device and electrical wire recognition method |
| 08/02/2006 | CN1811474A Transformer dynamic stability state parameter tester and diagnostic software |
| 08/02/2006 | CN1811472A Automatic measuring and displaying method for control angle |
| 08/02/2006 | CN1811471A Voltage detecting circuit and voltage detecting system |
| 08/02/2006 | CN1811464A Detection installation of circuit board, storage medium, detection method of circuit board, manufacturing method of circuit board, and circuit board |
| 08/02/2006 | CN1811463A Diaphragm-holding device for test |
| 08/02/2006 | CN1811462A Electric circuit board tester |
| 08/02/2006 | CN1268179C Test seat interface circuit board |
| 08/02/2006 | CN1268041C Contact for spiral contactor and spiral contactor |
| 08/02/2006 | CN1267997C Semiconductor storage device |
| 08/02/2006 | CN1267744C Equipment for series connection secondary battry unit and method for controlling said unit |
| 08/02/2006 | CN1267743C Method and system for monitoring lead-acid battery state |
| 08/02/2006 | CN1267742C Vehicle power source monitoring and early warning method and device |
| 08/02/2006 | CN1267741C Diagnosis mechanism for power generator with rotor |
| 08/02/2006 | CN1267740C Apparatus and method for testing circuit modules |
| 08/02/2006 | CN1267739C Scanning design with nano-scanning design test cost and test vector input method |
| 08/02/2006 | CN1267738C Semiconductor measurer and semiconductor measuring method |
| 08/01/2006 | USRE39212 Abnormality detection apparatus for power supply circuit |
| 08/01/2006 | US7086016 Method and apparatus for verifying logical equivalency between logic circuits |
| 08/01/2006 | US7085982 Pulse generation circuit and semiconductor tester that uses the pulse generation circuit |
| 08/01/2006 | US7085981 Method and apparatus for generating test data sets in accordance with user feedback |
| 08/01/2006 | US7085980 Method and apparatus for determining the failing operation of a device-under-test |
| 08/01/2006 | US7085979 Voltage-glitch detection device and method for securing integrated circuit device from voltage glitch attack |
| 08/01/2006 | US7085978 Validating test signal connections within an integrated circuit |
| 08/01/2006 | US7085977 Method and system for detecting an outlying resistance in a plurality of resistive elements |
| 08/01/2006 | US7085976 Method and apparatus for hardware co-simulation clocking |
| 08/01/2006 | US7085974 Semiconductor device, method of testing the same and electronic instrument |
| 08/01/2006 | US7085972 System for testing a group of functionally independent memories and for replacing failing memory words |
| 08/01/2006 | US7085964 Dynamic test program generator for VLIW simulation |
| 08/01/2006 | US7085667 System and method of heating up a semiconductor device in a standard test environment |
| 08/01/2006 | US7085661 State detecting system and device employing the same |
| 08/01/2006 | US7085659 Dynamic energy threshold calculation for high impedance fault detection |
| 08/01/2006 | US7085239 Method and apparatus for determining the forward link closed loop power control set point in a wireless packet data communication system |
| 08/01/2006 | US7085236 Active queue management for differentiated services |
| 08/01/2006 | US7085234 Method and apparatus for automatic load-balancing on multisegment devices |
| 08/01/2006 | US7085230 Method and system for evaluating the quality of packet-switched voice signals |
| 08/01/2006 | US7085229 Scheduling assist for data networking packet dequeuing in a parallel 1-D systolic array system |
| 08/01/2006 | US7085228 Adaptive radio resource management for wireless local area networks |
| 08/01/2006 | US7085227 Method for testing congestion avoidance on high speed networks |
| 08/01/2006 | US7084965 Arrangement and method for inspecting unpatterned wafers |
| 08/01/2006 | US7084716 Ultrafast sampler with coaxial transition |
| 08/01/2006 | US7084661 Scanning kelvin microprobe system and process for analyzing a surface |
| 08/01/2006 | US7084660 System and method for accelerated detection of transient particle induced soft error rates in integrated circuits |
| 08/01/2006 | US7084659 Power supply arrangement for integrated circuit tester |
| 08/01/2006 | US7084658 Semiconductor integrated circuit device |
| 08/01/2006 | US7084655 Burn-in test apparatus for BGA packages using forced heat exhaust |
| 08/01/2006 | US7084654 “2-step contact” clamping fixture for the flexible print circuit on a head gimbal assembly |
| 08/01/2006 | US7084653 Contact-type film probe |
| 08/01/2006 | US7084652 Non-destructive contact test |
| 08/01/2006 | US7084651 Probe card assembly |
| 08/01/2006 | US7084650 Apparatus and method for limiting over travel in a probe card assembly |
| 08/01/2006 | US7084649 Method and apparatus for measuring three-dimensional distribution of electric field |
| 08/01/2006 | US7084638 Intermediate circuit capacitor short-circuit monitoring |
| 08/01/2006 | US7084637 Method for monitoring at least two electromagnetic valves of an internal combustion engine, especially an internal combustion engine of a motor vehicle in particular |
| 08/01/2006 | US7084618 Parallel bus debugging tool |
| 08/01/2006 | US7084616 Method and device for measuring an electrical voltage |
| 08/01/2006 | US7084358 Apparatus and method for balancing and for providing a compliant range to a test head |
| 08/01/2006 | US7083544 Method and apparatus for monitoring a transmission part |
| 08/01/2006 | US7083428 Hybrid interface apparatus for testing integrated circuits having both low-speed and high-speed input/output pins |
| 08/01/2006 | US7082682 Contact structures and methods for making same |
| 08/01/2006 | US7082666 Method for testing print circuit boards |
| 07/27/2006 | WO2006079041A1 Integrated sensor system monitoring and characterizing lightning events |
| 07/27/2006 | WO2006078376A1 Allocating device testing resources |
| 07/27/2006 | WO2006078057A1 Inspection device, inspection method, and inspection device sensor |
| 07/27/2006 | WO2006078045A1 Circuit pattern inspection device and method thereof |
| 07/27/2006 | WO2006078043A1 Circuit pattern inspection device and method thereof |
| 07/27/2006 | WO2006077950A1 Sensor, inspection apparatus and inspection method |
| 07/27/2006 | WO2006077948A1 Sensor, inspection device, and inspection method |
| 07/27/2006 | WO2006077823A1 Substrate inspecting apparatus and substrate inspecting method |
| 07/27/2006 | WO2006077746A1 Semiconductor integrated circuit |
| 07/27/2006 | WO2006077685A1 Test instrument and test method |
| 07/27/2006 | WO2006076893A1 Method and device for detection of defects in solar cell elements |
| 07/27/2006 | WO2006053325A3 Method for measuring vcsel reverse bias leakage in an optical module |
| 07/27/2006 | WO2006049871A8 Apparatus for non-contact testing of microcircuits |
| 07/27/2006 | WO2006019820A3 Method and system for determining cracks and broken components in armor |
| 07/27/2006 | WO2006019738A3 Traveling wave based relay protection |
| 07/27/2006 | WO2005114233A3 System and method for providing channels in application server and transaction-based systems |
| 07/27/2006 | WO2005076909A3 Methods and apparatus for controlling the flow of multiple signal sources over a single full duplex ethernet link |
| 07/27/2006 | US20060168498 Test apparatus and program for testing a dut |
| 07/27/2006 | US20060168491 Automated tests for built-in self test |
| 07/27/2006 | US20060168490 Apparatus and method of controlling test modes of a scannable latch in a test scan chain |
| 07/27/2006 | US20060168489 System and shadow circuits with output joining circuit |
| 07/27/2006 | US20060167646 Method and apparatus for performing testing of interconnections |
| 07/27/2006 | US20060167645 Apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) |
| 07/27/2006 | US20060167639 Error detection apparatus and method and signal extractor |
| 07/27/2006 | US20060166479 Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same |
| 07/27/2006 | US20060166385 Method for measuring peak carrier concentration in ultra-shallow junctions |
| 07/27/2006 | US20060166384 Method for manufacturing industrial products and combination of masks for manufacturing the same |
| 07/27/2006 | US20060166044 Fuel cell protection |
| 07/27/2006 | US20060165272 Method for generating high-contrast images of semiconductor sites via one-photon optical beaminduced current imaging and confocal reflectance microscopy |
| 07/27/2006 | US20060165107 Method of sending a multipoint stream in a local area network and connection device implementing the method |
| 07/27/2006 | US20060165000 Multiplicity adjustment system and method |
| 07/27/2006 | US20060164997 Dependency structure from temporal data |
| 07/27/2006 | US20060164118 Inspection method of array board and inspection equipment thereof |
| 07/27/2006 | US20060164117 Gate drive circuit for an insulated gate power transistor |
| 07/27/2006 | US20060164116 Internal reference voltage generation for integrated circuit testing |
| 07/27/2006 | US20060164115 Defect analyzing device for semiconductor integrated circuits, system therefor, and detection method |