Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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08/16/2006 | CN1818667A Manual probe carriage system and method of using the same |
08/16/2006 | CN1818597A Luminescent efficiency measuring method of organic electroluminescent device |
08/16/2006 | CN1817625A A method and apparatus for detecting exposed metal cords in an elastomeric strip |
08/16/2006 | CN1270498C Packet transmitter unit, packet receiver unit and packet transmission system |
08/16/2006 | CN1270402C Multiple plateau battery charging method and system to charge to the second plateau |
08/16/2006 | CN1270275C Method for checking data production and substrate checking apparatus by the same method |
08/16/2006 | CN1269455C 超声诊断仪 Ultrasound Scanner |
08/15/2006 | US7093216 Apparatus connectable to a computer network for circuit design verification, computer implemented method for circuit design verification, and computer program product for controlling a computer system so as to verify circuit designs |
08/15/2006 | US7093213 Method for designing an integrated circuit defect monitor |
08/15/2006 | US7093209 Method and apparatus for packaging test integrated circuits |
08/15/2006 | US7093177 Low-jitter clock for test system |
08/15/2006 | US7093176 Programmable test for memories |
08/15/2006 | US7093175 Decompressor/PRPG for applying pseudo-random and deterministic test patterns |
08/15/2006 | US7093174 Tester channel count reduction using observe logic and pattern generator |
08/15/2006 | US7093172 System and method for determining on-chip bit error rate (BER) in a communication system |
08/15/2006 | US7092868 Annealing harvest event testcase collection within a batch simulation farm |
08/15/2006 | US7092848 Control system health test system and method |
08/15/2006 | US7092836 Method for locating wiring swap in a hi-fix structure of a simultaneous multi-electronic device test system |
08/15/2006 | US7092830 Method for estimating long term end-of-life characteristics using short-term data for lithium/silver vanadium oxide cells |
08/15/2006 | US7092829 Instantaneous wire interruption detection system for vehicle electrical system |
08/15/2006 | US7092468 Timing recovery system for a multi-pair gigabit transceiver |
08/15/2006 | US7092412 Method and apparatus for long haul high speed data transmission over XDSL pseudo channels |
08/15/2006 | US7092361 System and method for transmission of operations, administration and maintenance packets between ATM and switching networks upon failures |
08/15/2006 | US7092358 System and method for facilitating flexible quality of service |
08/15/2006 | US7092354 Method and apparatus to provide redundancy in a network |
08/15/2006 | US7092303 Dynamic memory and method for testing a dynamic memory |
08/15/2006 | US7092110 Optimized model and parameter selection for optical metrology |
08/15/2006 | US7092067 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof |
08/15/2006 | US7092018 Image signal processor and deficient pixel detection method |
08/15/2006 | US7091768 Circuit for controlling internal supply voltage driver |
08/15/2006 | US7091739 System and method for detecting an operational fault condition in a power supply |
08/15/2006 | US7091738 Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel |
08/15/2006 | US7091737 Apparatus and methods for self-heating burn-in processes |
08/15/2006 | US7091736 Method and apparatus for selecting multiple settings for an integrated circuit function |
08/15/2006 | US7091735 Testing probe and testing jig |
08/15/2006 | US7091734 Electroconductive contact unit |
08/15/2006 | US7091733 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
08/15/2006 | US7091732 Systems and methods for probing processor signals |
08/15/2006 | US7091731 Flexible ribbon probe for peripheral leads of an electronic part's package |
08/15/2006 | US7091730 Dual probe assembly for a printed circuit board test apparatus |
08/15/2006 | US7091729 Cantilever probe with dual plane fixture and probe apparatus therewith |
08/15/2006 | US7091728 Voltage isolated detection apparatus and method |
08/15/2006 | US7091727 Method and IC for detecting capacitance variation |
08/15/2006 | US7091724 Model-based fault detection in a motor drive |
08/15/2006 | US7091723 AFCI circuit test module |
08/15/2006 | US7091716 Multilayer wiring board, manufacturing method therefor and test apparatus thereof |
08/15/2006 | US7091715 Method and apparatus for micro-machined sensors using enhanced modulated integrative differential optical sensing |
08/15/2006 | US7091698 Battery capacity calculating method |
08/15/2006 | US7091597 Power supply device |
08/15/2006 | US7091496 Electron microscopic inspection apparatus |
08/15/2006 | US7089736 Variable nozzle turbo (VNT) solenoid temperature estimator |
08/15/2006 | CA2536648A1 Corded leakage-current detection and interruption apparatus |
08/10/2006 | WO2006083898A1 System and scanout circuits with error resilience circuit |
08/10/2006 | WO2006083862A1 Method and apparatus for verifying planarity in a probing system |
08/10/2006 | WO2006083502A1 Method for determining state of charge of lead-acid batteries of various specific gravities |
08/10/2006 | WO2006082555A1 Testable electronic circuit |
08/10/2006 | WO2006082425A1 Battery management system |
08/10/2006 | WO2006082295A1 Method for testing electrical conductors by photoelectric effect, using a separator plate |
08/10/2006 | WO2006082294A1 Method for testing electrical elements using an indirect photoelectric effect |
08/10/2006 | WO2006082293A1 Method and system for testing or measuring electrical elements, using two offset pulses |
08/10/2006 | WO2006082292A1 Method and system for testing or measuring electrical elements |
08/10/2006 | WO2006073736A3 Probe head arrays |
08/10/2006 | WO2006069365A3 Battery pack leakage cut-off |
08/10/2006 | WO2006017753A3 Propagation of minimum guaranteed scheduling rates |
08/10/2006 | US20060179393 Device and method for creating a signature |
08/10/2006 | US20060179386 Metadata-Facilitated software testing |
08/10/2006 | US20060179385 Context-sensitive user help in a software-based development environment |
08/10/2006 | US20060179384 Double data rate serial encoder |
08/10/2006 | US20060179383 Extending test sequences to accepting states |
08/10/2006 | US20060179382 Method and circuit for implementing array bypass operations without access penalty |
08/10/2006 | US20060179381 Detection and recovery of dropped writes in storage devices |
08/10/2006 | US20060179380 On-chip electronic hardware debug support units having execution halting capabilities |
08/10/2006 | US20060179379 System for monitoring processing device utilization in a computer |
08/10/2006 | US20060179378 Semiconductor integrated circuit and method of testing the same |
08/10/2006 | US20060179377 ABIST data compression and serialization for memory built-in self test of SRAM with redundancy |
08/10/2006 | US20060179376 Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit |
08/10/2006 | US20060179375 Split L2 latch with glitch free programmable delay |
08/10/2006 | US20060179374 Wireless hardware debugging |
08/10/2006 | US20060179373 Device and method for JTAG test |
08/10/2006 | US20060179372 Signal drive de-emphasis control for serial bus |
08/10/2006 | US20060178784 Method and apparatus for latent temperature control for a device under test |
08/10/2006 | US20060177298 Test head positioning system |
08/10/2006 | US20060176827 Network performance tuner |
08/10/2006 | US20060176809 Non-blocking internet backbone network |
08/10/2006 | US20060176804 Data transfer apparatus and multicast system |
08/10/2006 | US20060176252 Output circuit for gray scale control, testing apparatus thereof, and method for testing output circuit for gray scale control |
08/10/2006 | US20060176186 Fan monitoring for failure prediction |
08/10/2006 | US20060176072 Method and apparatus for testing liquid crystal display device |
08/10/2006 | US20060176071 Inspection probe, inspection device for optical panel and inspection method for the optical panel |
08/10/2006 | US20060176070 Semiconductor chip and method of testing the same |
08/10/2006 | US20060176069 Wired circuit board and producing method thereof |
08/10/2006 | US20060176068 Methods used in a secure memory card with life cycle phases |
08/10/2006 | US20060176067 Method and system for detecting potential reliability failures of integrated circuit |
08/10/2006 | US20060176066 Device for measurement and analysis of electrical signals of an integrated circuit component |
08/10/2006 | US20060176065 Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
08/10/2006 | US20060176064 Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board |
08/10/2006 | US20060176061 Fluid detection cable |
08/10/2006 | US20060176060 Method and circuit arrangement for the detection of ground faults on electronic trips for low-voltage circuit breakers comprising serially connected measuring amplifiers |
08/10/2006 | US20060176059 Motor phase current measurement using a single DC bus shunt sensor |
08/10/2006 | US20060176058 Device and method for testing the seal tightness of a fuel tank system of a motor vehicle |