Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2006
08/16/2006CN1818667A Manual probe carriage system and method of using the same
08/16/2006CN1818597A Luminescent efficiency measuring method of organic electroluminescent device
08/16/2006CN1817625A A method and apparatus for detecting exposed metal cords in an elastomeric strip
08/16/2006CN1270498C Packet transmitter unit, packet receiver unit and packet transmission system
08/16/2006CN1270402C Multiple plateau battery charging method and system to charge to the second plateau
08/16/2006CN1270275C Method for checking data production and substrate checking apparatus by the same method
08/16/2006CN1269455C 超声诊断仪 Ultrasound Scanner
08/15/2006US7093216 Apparatus connectable to a computer network for circuit design verification, computer implemented method for circuit design verification, and computer program product for controlling a computer system so as to verify circuit designs
08/15/2006US7093213 Method for designing an integrated circuit defect monitor
08/15/2006US7093209 Method and apparatus for packaging test integrated circuits
08/15/2006US7093177 Low-jitter clock for test system
08/15/2006US7093176 Programmable test for memories
08/15/2006US7093175 Decompressor/PRPG for applying pseudo-random and deterministic test patterns
08/15/2006US7093174 Tester channel count reduction using observe logic and pattern generator
08/15/2006US7093172 System and method for determining on-chip bit error rate (BER) in a communication system
08/15/2006US7092868 Annealing harvest event testcase collection within a batch simulation farm
08/15/2006US7092848 Control system health test system and method
08/15/2006US7092836 Method for locating wiring swap in a hi-fix structure of a simultaneous multi-electronic device test system
08/15/2006US7092830 Method for estimating long term end-of-life characteristics using short-term data for lithium/silver vanadium oxide cells
08/15/2006US7092829 Instantaneous wire interruption detection system for vehicle electrical system
08/15/2006US7092468 Timing recovery system for a multi-pair gigabit transceiver
08/15/2006US7092412 Method and apparatus for long haul high speed data transmission over XDSL pseudo channels
08/15/2006US7092361 System and method for transmission of operations, administration and maintenance packets between ATM and switching networks upon failures
08/15/2006US7092358 System and method for facilitating flexible quality of service
08/15/2006US7092354 Method and apparatus to provide redundancy in a network
08/15/2006US7092303 Dynamic memory and method for testing a dynamic memory
08/15/2006US7092110 Optimized model and parameter selection for optical metrology
08/15/2006US7092067 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof
08/15/2006US7092018 Image signal processor and deficient pixel detection method
08/15/2006US7091768 Circuit for controlling internal supply voltage driver
08/15/2006US7091739 System and method for detecting an operational fault condition in a power supply
08/15/2006US7091738 Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel
08/15/2006US7091737 Apparatus and methods for self-heating burn-in processes
08/15/2006US7091736 Method and apparatus for selecting multiple settings for an integrated circuit function
08/15/2006US7091735 Testing probe and testing jig
08/15/2006US7091734 Electroconductive contact unit
08/15/2006US7091733 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
08/15/2006US7091732 Systems and methods for probing processor signals
08/15/2006US7091731 Flexible ribbon probe for peripheral leads of an electronic part's package
08/15/2006US7091730 Dual probe assembly for a printed circuit board test apparatus
08/15/2006US7091729 Cantilever probe with dual plane fixture and probe apparatus therewith
08/15/2006US7091728 Voltage isolated detection apparatus and method
08/15/2006US7091727 Method and IC for detecting capacitance variation
08/15/2006US7091724 Model-based fault detection in a motor drive
08/15/2006US7091723 AFCI circuit test module
08/15/2006US7091716 Multilayer wiring board, manufacturing method therefor and test apparatus thereof
08/15/2006US7091715 Method and apparatus for micro-machined sensors using enhanced modulated integrative differential optical sensing
08/15/2006US7091698 Battery capacity calculating method
08/15/2006US7091597 Power supply device
08/15/2006US7091496 Electron microscopic inspection apparatus
08/15/2006US7089736 Variable nozzle turbo (VNT) solenoid temperature estimator
08/15/2006CA2536648A1 Corded leakage-current detection and interruption apparatus
08/10/2006WO2006083898A1 System and scanout circuits with error resilience circuit
08/10/2006WO2006083862A1 Method and apparatus for verifying planarity in a probing system
08/10/2006WO2006083502A1 Method for determining state of charge of lead-acid batteries of various specific gravities
08/10/2006WO2006082555A1 Testable electronic circuit
08/10/2006WO2006082425A1 Battery management system
08/10/2006WO2006082295A1 Method for testing electrical conductors by photoelectric effect, using a separator plate
08/10/2006WO2006082294A1 Method for testing electrical elements using an indirect photoelectric effect
08/10/2006WO2006082293A1 Method and system for testing or measuring electrical elements, using two offset pulses
08/10/2006WO2006082292A1 Method and system for testing or measuring electrical elements
08/10/2006WO2006073736A3 Probe head arrays
08/10/2006WO2006069365A3 Battery pack leakage cut-off
08/10/2006WO2006017753A3 Propagation of minimum guaranteed scheduling rates
08/10/2006US20060179393 Device and method for creating a signature
08/10/2006US20060179386 Metadata-Facilitated software testing
08/10/2006US20060179385 Context-sensitive user help in a software-based development environment
08/10/2006US20060179384 Double data rate serial encoder
08/10/2006US20060179383 Extending test sequences to accepting states
08/10/2006US20060179382 Method and circuit for implementing array bypass operations without access penalty
08/10/2006US20060179381 Detection and recovery of dropped writes in storage devices
08/10/2006US20060179380 On-chip electronic hardware debug support units having execution halting capabilities
08/10/2006US20060179379 System for monitoring processing device utilization in a computer
08/10/2006US20060179378 Semiconductor integrated circuit and method of testing the same
08/10/2006US20060179377 ABIST data compression and serialization for memory built-in self test of SRAM with redundancy
08/10/2006US20060179376 Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit
08/10/2006US20060179375 Split L2 latch with glitch free programmable delay
08/10/2006US20060179374 Wireless hardware debugging
08/10/2006US20060179373 Device and method for JTAG test
08/10/2006US20060179372 Signal drive de-emphasis control for serial bus
08/10/2006US20060178784 Method and apparatus for latent temperature control for a device under test
08/10/2006US20060177298 Test head positioning system
08/10/2006US20060176827 Network performance tuner
08/10/2006US20060176809 Non-blocking internet backbone network
08/10/2006US20060176804 Data transfer apparatus and multicast system
08/10/2006US20060176252 Output circuit for gray scale control, testing apparatus thereof, and method for testing output circuit for gray scale control
08/10/2006US20060176186 Fan monitoring for failure prediction
08/10/2006US20060176072 Method and apparatus for testing liquid crystal display device
08/10/2006US20060176071 Inspection probe, inspection device for optical panel and inspection method for the optical panel
08/10/2006US20060176070 Semiconductor chip and method of testing the same
08/10/2006US20060176069 Wired circuit board and producing method thereof
08/10/2006US20060176068 Methods used in a secure memory card with life cycle phases
08/10/2006US20060176067 Method and system for detecting potential reliability failures of integrated circuit
08/10/2006US20060176066 Device for measurement and analysis of electrical signals of an integrated circuit component
08/10/2006US20060176065 Probe assembly with multi-directional freedom of motion and mounting assembly therefor
08/10/2006US20060176064 Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board
08/10/2006US20060176061 Fluid detection cable
08/10/2006US20060176060 Method and circuit arrangement for the detection of ground faults on electronic trips for low-voltage circuit breakers comprising serially connected measuring amplifiers
08/10/2006US20060176059 Motor phase current measurement using a single DC bus shunt sensor
08/10/2006US20060176058 Device and method for testing the seal tightness of a fuel tank system of a motor vehicle