| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/31/2006 | US20060192584 Test semiconductor device and method for determining Joule heating effects in such a device |
| 08/31/2006 | US20060192583 Test tray for handler for testing semiconductor devices |
| 08/31/2006 | US20060192582 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 08/31/2006 | US20060192581 Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 08/31/2006 | US20060192580 Thermal transferring member, test board and test apparatus |
| 08/31/2006 | US20060192579 Method and apparatus for determining probing locations for a printed circuit board |
| 08/31/2006 | US20060192578 Inspection method and inspection apparatus |
| 08/31/2006 | US20060192577 Anisotropically conductive sheet |
| 08/31/2006 | US20060192576 Wafer prober for enabling efficient examination |
| 08/31/2006 | US20060192575 Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 08/31/2006 | US20060192574 Probe navigation method and device and defect inspection device |
| 08/31/2006 | US20060192573 Method and device for determining a characteristic of a semicondctor sample |
| 08/31/2006 | US20060192572 Method and structure for measuring a bonding resistance |
| 08/31/2006 | US20060192566 Continuity tester with magnetic ground and method therefor |
| 08/31/2006 | US20060192545 Voltage detection pole |
| 08/31/2006 | US20060192445 Synchronous machine |
| 08/31/2006 | US20060192116 Charged particle beam device probe operation |
| 08/31/2006 | US20060191136 Method Of Making Microelectronic Spring Contact Array |
| 08/31/2006 | US20060191135 Methods for establishing electrical connections by drawing one or both of an element of an electrical connector and a contact toward the other |
| 08/31/2006 | DE69833093T2 Schwebende Bitleitungen Prüfmodus mit digital steuerbaren Bitleitungen-Abgleichschaltungen Pending bit test mode with digitally controllable bit lines matching circuits |
| 08/31/2006 | DE60025247T2 Schaltung und verfahren zum testen und kalibrieren To test and calibrate circuit and method |
| 08/31/2006 | DE202006010086U1 Adapter used to position contact tips for microelectronic circuit testing, includes drive converting rotary motion into translation of positioning component |
| 08/31/2006 | DE102005007580A1 Integrated circuit unit e.g. memory circuit, testing device, has connecting unit for connecting tester circuit to circuit subunits, where one subunit has compression/decompression unit to exchange test and response signals between subunits |
| 08/31/2006 | DE102004016740B4 Verfahren zum Erkennen eines Isolationsfehlers in einem Hochspannungsumrichter A method for detecting an insulation fault in a high-voltage converter |
| 08/31/2006 | DE102004002708B4 Sortierhandler für Burn-In-Tester Sorting handler for burn-in tester |
| 08/30/2006 | EP1696564A1 Variable delay circuit |
| 08/30/2006 | EP1696479A1 Contactor for reliability evaluation tester |
| 08/30/2006 | EP1696242A1 Method for managing semiconductor characteristic evaluation apparatus and computer program therefor |
| 08/30/2006 | EP1696241A1 Anisotropic conductive connector and circuit device inspection method |
| 08/30/2006 | EP1695425A1 Method and device for detecting a broad-band noise source in a direct voltage distribution network |
| 08/30/2006 | EP1695407A1 System and method for treating process fluids delivered to an electrochemical cell stack |
| 08/30/2006 | EP1695362A2 Polymorphic automatic test systems and methods |
| 08/30/2006 | EP1695248A2 High level arc fault detector |
| 08/30/2006 | EP1695104A1 Method and assembly for testing a power output stage |
| 08/30/2006 | EP1695103A1 Pseudo random verification of a device under test in the presence of byzantine faults |
| 08/30/2006 | EP1695102A1 Characterizing circuit performance |
| 08/30/2006 | EP1695101A1 System for testing one or more groups of ic-chips while concurrently loading/unloading another group |
| 08/30/2006 | EP1695100A2 Resistive probe tips |
| 08/30/2006 | EP1695099A2 Isolation buffers with controlled equal time delays |
| 08/30/2006 | EP1695055A1 Measuring device, in particular a temperature measuring transducer |
| 08/30/2006 | EP1695041A2 Integrated circuit with debug support interface |
| 08/30/2006 | EP1649296A4 Hand mounted testing meter |
| 08/30/2006 | EP1618397B1 Measurement circuit with improved accuracy |
| 08/30/2006 | EP1417497A4 Virtual line switched ring (vlsr) connection state distribution scheme |
| 08/30/2006 | EP1402616B1 Synchronous machine |
| 08/30/2006 | EP1135916B1 Fault conditions affecting high speed data services |
| 08/30/2006 | EP1000363B1 Spreading resistance profiling system |
| 08/30/2006 | EP0979414B1 Multi-probe test head and test method |
| 08/30/2006 | CN2812494Y Intelligent real-time cold test apparatus for fault of street lamp |
| 08/30/2006 | CN2812293Y Memory module with its chips being connected by holddown piece and conducting terminals |
| 08/30/2006 | CN2812023Y Specimen structure for magnetic performance test of cold rolled silicon steel sheet |
| 08/30/2006 | CN2812022Y Universal integrated reference source for fluorescent lamp |
| 08/30/2006 | CN2812021Y Capacitor measurer |
| 08/30/2006 | CN2812012Y Measurer for starting current of motor for artificial lift well |
| 08/30/2006 | CN2811994Y Short sample measuring rack for high-temperature superconductive strip |
| 08/30/2006 | CN2811993Y Tensile force measuring rack for high-temperature superconductive strip |
| 08/30/2006 | CN2811962Y Synchronous motor state detector based on Profibus-DP field bus |
| 08/30/2006 | CN1826713A Socket and test apparatus |
| 08/30/2006 | CN1826536A Automatic test system with easily modified software |
| 08/30/2006 | CN1826535A Pattern generator and testing apparatus |
| 08/30/2006 | CN1825730A Phase-loss detection for rotating field machine |
| 08/30/2006 | CN1825676A Battery pack |
| 08/30/2006 | CN1825589A Semiconductor device and inspection method of the same and electromagnetic detection equipment |
| 08/30/2006 | CN1825132A System and method connecting inner scanning and boundary scanning |
| 08/30/2006 | CN1825131A Method for managing semiconductor characteristic evaluation apparatus and computer program therefor |
| 08/30/2006 | CN1825130A Semiconductor test management system and method |
| 08/30/2006 | CN1825129A Method and apparatus for semiconductor testing |
| 08/30/2006 | CN1825128A LED tester |
| 08/30/2006 | CN1825127A Method and apparatus for quantifying the timing error induced by an impedance variation of a signal path |
| 08/30/2006 | CN1825126A Method and apparatus for quantifying the timing error induced by crosstalk between signal paths |
| 08/30/2006 | CN1825125A Testing module with mini-testing point suitable for various electrical characters |
| 08/30/2006 | CN1825124A Test tray for handler for testing semiconductor devices |
| 08/30/2006 | CN1825100A Printed circuit board inspecting method and apparatus inspection logic setting method and apparatus |
| 08/30/2006 | CN1825073A Automatic apparatus for LED tester table |
| 08/30/2006 | CN1272820C Trip device with testing circuit for electric leakage to ground |
| 08/30/2006 | CN1272711C Stack test method |
| 08/30/2006 | CN1272636C Method and apparatus for detecting electric power assembly |
| 08/30/2006 | CN1272635C Circuit distribution inspection device, circuit distribution inspection method, and recording medium |
| 08/30/2006 | CN1272634C Testing a batch of electrical components |
| 08/30/2006 | CN1272632C Wafer-level burn-in and test |
| 08/30/2006 | CN1272626C Surface state inspection method for curved body and substrate inspection apparatus |
| 08/30/2006 | CN1272625C Inspection method for electric element, inspection device for electric terminal box, and inspection device for terminal fitting part |
| 08/29/2006 | US7100132 Source synchronous timing extraction, cyclization and sampling |
| 08/29/2006 | US7100124 Interface configurable for use with target/initiator signals |
| 08/29/2006 | US7100099 Test apparatus |
| 08/29/2006 | US7100098 Systems and methods for testing performance of an electronic device |
| 08/29/2006 | US7100090 Semiconductor memory device having a test circuit |
| 08/29/2006 | US7099852 Detection of pump cavitation/blockage and seal failure via current signature analysis |
| 08/29/2006 | US7099808 Capacitance and transmission line measurements for an integrated circuit |
| 08/29/2006 | US7099791 System and method for linking and loading compiled pattern data |
| 08/29/2006 | US7099789 Characterizing distribution signatures in integrated circuit technology |
| 08/29/2006 | US7099783 Semiconductor integrated circuit, design support apparatus, and test method |
| 08/29/2006 | US7099750 Data access method and data access apparatus for accessing data at on-vehicle information device |
| 08/29/2006 | US7099693 Mobile communication terminal and method for warning a user of a low-voltage state of the same |
| 08/29/2006 | US7099425 Adjustment circuit and method for tuning of a clock signal |
| 08/29/2006 | US7099351 Method and system for remote measurement of network traffic |
| 08/29/2006 | US7099337 Mechanism for implementing class redirection in a cluster |
| 08/29/2006 | US7099282 Determining the effects of new types of impairments on perceived quality of a voice service |
| 08/29/2006 | US7099276 Apparatus and method for distributing a load across a trunk group |
| 08/29/2006 | US7099275 Programmable multi-service queue scheduler |