Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2006
08/17/2006WO2005109775A3 Broadband network and application service testing method and apparatus
08/17/2006WO2005098462A3 Probe card and method for constructing same
08/17/2006WO2005086610A3 Shared network ring protection
08/17/2006WO2003032652A3 Method and apparatus for evaluating and optimizing a signaling system
08/17/2006US20060184850 Apparatus for preventing bus reset when removing a device from an IEEE 1394 network
08/17/2006US20060184849 Test pattern generator and test pattern generation method for onboard memory devices
08/17/2006US20060184848 Semiconductor integrated circuit having test function and manufacturing method
08/17/2006US20060184847 Semiconductor device tested using minimum pins and methods of testing the same
08/17/2006US20060183470 Method and arrangement of testing device mobile station
08/17/2006US20060182141 Apparatus and method for autonomic adjustment of connection keep-alives
08/17/2006US20060182036 Fault detection device
08/17/2006US20060181301 System and method for testing devices utilizing capacitively coupled signaling
08/17/2006US20060181300 Method for testing a circuit unit and test apparatus
08/17/2006US20060181299 Tab tape and method of manufacturing the same
08/17/2006US20060181298 Method, interconnect and system for testing semiconductor components
08/17/2006US20060181297 Method and Apparatus for Non-Invasively Testing Integrated Circuits
08/17/2006US20060181296 Method and Apparatus for Non-Invasively Testing Integrated Circuits
08/17/2006US20060181295 Method for fabricating an interconnect for semiconductor components
08/17/2006US20060181294 System for testing semiconductor components having interconnect with variable flexure contacts
08/17/2006US20060181293 Low impedance test fixture for impedance measurements
08/17/2006US20060181292 Probe card assembly and method of attaching probes to the probe card assembly
08/17/2006US20060181291 Method and apparatus for locating and testing a chip
08/17/2006US20060181290 Apparatus and method for contacting of test objects
08/17/2006US20060181284 Method and apparatus for the location and indication of cable splices and cable faults
08/17/2006US20060181283 Apparatus for and method of cable diagnostics utilizing time domain reflectometry
08/17/2006US20060181282 Method and circuit arrangement for the self-testing of a reference voltage in electronic components
08/17/2006US20060181268 Apparatus and method for detecting photon emissions from transistors
08/17/2006US20060181267 Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum
08/17/2006US20060181266 Flat panel display inspection system
08/17/2006US20060181265 Electronic device test system
08/17/2006US20060181261 Method and circuit arrangement for monitoring the mode of operation of one or more load circuits, especially of a domestic appliance
08/17/2006DE69832605T2 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet Interface scanning element and the communication device that uses
08/17/2006DE202006008817U1 Measuring and testing equipment for e.g. three-phase power socket, has transponder that is utilized for adjusting and storing device-specific data are between three-phase power socket and equipment
08/17/2006DE19504287B4 Drehmoment-Erfassungsvorrichtung für einen Wechselstrommotor Torque detecting apparatus for an AC motor
08/17/2006DE102005048285A1 Device for controlling charge of electrical battery in motor vehicle has measuring resistor which is arranged within pole recess of pole tap whereby mechanical stress is not transferred on measuring resistor by flexible wire
08/17/2006DE102005007227A1 Anordnung mit einem elektrischen Leiter zur Übertragung elektrischer Energie sowie Verfahren zur Ermittlung der Belastung eines elektrischen Leiters Arrangement with an electrical conductor for transmitting electrical energy as well as procedures for determining the load of an electrical conductor
08/17/2006DE102005006303A1 Fluid electrolyte accumulator gassing voltage monitoring procedure uses pressure, optical or acoustic measurements to detect bubbles and initiate voltage measurement
08/17/2006DE102005005751A1 Testvorrichtung mit reflexionsarmer Signalverteilung Test device with anechoic signal distribution
08/17/2006DE102005005101A1 Integrated circuit`s semiconductor components testing system, has control unit that switches switching device based on power consumption information to connect or separate integrated circuits with or from supply unit
08/17/2006DE102005004174A1 Motor vehicle battery diagnosis method, involves characterizing motor vehicle battery as defective, if amplitude of battery power e.g. charging power or discharging power, falls below given power threshold value
08/17/2006DE102004059506B3 Anordnung zum Test von eingebetteten Schaltungen mit Hilfe einer separaten Versorgungsspannung An arrangement for embedded test circuits by means of a separate supply voltage
08/17/2006DE102004051489B4 Connection device for vehicle battery, has electrical switch temporarily contacting conductor such that current flow in conductor is switched on/off, where information from external unit, which is generated inside device, controls switch
08/17/2006DE102004043050B4 Verfahren, Halbleitervorrichtung und Testsystem zur Loop-back-Vermessung des Interface-Timings von Halbleitervorrichtungen Method, semiconductor device and test system for Loop-back measurement of the interface timing of semiconductor devices
08/17/2006DE102004006298B4 Verbindungsanordnung für ein Messelement eines Batteriesensors Connection arrangement for a sensing element of a battery sensor
08/16/2006EP1691209A1 Method and apparatus for detecting charged state of secondary battery based on neural network calculation
08/16/2006EP1691208A1 Saturation polarization estimation method and device, and discharge-enabled capacitance estimation method
08/16/2006EP1691207A1 Method for qualifying joints and contacts of electric circuits
08/16/2006EP1691206A2 Method and apparatus for testing semiconductor dice
08/16/2006EP1690316A1 Antenna coupler
08/16/2006EP1690241A2 System-in-package and method of testing thereof
08/16/2006EP1690102A1 Integrated circuit with leakage control and method for leakage control
08/16/2006EP1690101A2 Internet endpoint system
08/16/2006EP1623239A4 Method and system for improved single-ended loop make-up identification
08/16/2006EP1516194B1 Method and system for transmitting an information signal over a power cable
08/16/2006EP1181566B1 Testing fastenings of printed circuit board
08/16/2006CN2807274Y Broken line monitoring device of metering monitor
08/16/2006CN2807272Y Earth leakage protective device reliability test apparatus
08/16/2006CN2807271Y Multi-path multi-core line inspection equipment
08/16/2006CN2807270Y Electricity transmit wire circuit broken monitoring and warning device
08/16/2006CN2807269Y Insulator flashover breakdown indicating device
08/16/2006CN2805709Y Photoelectric identification positioning device for hospital CT apparatus management
08/16/2006CN1820364A Object-to-be-treated carrying system and object-to-be-treated carrying method
08/16/2006CN1820207A Charging rate estimating method, charging rate estimating unit and battery system
08/16/2006CN1820206A Test apparatus and test method
08/16/2006CN1820205A Ic with on-board characterization unit
08/16/2006CN1820204A Carrying device,electronic parts processing device and carrying method in the device
08/16/2006CN1820193A Scanning probe inspection apparatus
08/16/2006CN1819739A Method for preventing circuit board line from breaking
08/16/2006CN1819421A Oscillation boosting method of synthetic total-working conditioner experimental device
08/16/2006CN1819412A Insulation resistance deterioration detection method and insulation resistance deterioration detection device for motor, and motor driver
08/16/2006CN1819394A Discrimination of dead storage battery by charger
08/16/2006CN1819199A Semiconductor product with semiconductor substrate and testing structure and method
08/16/2006CN1819197A Semiconductor device tested using minimum pins and methods of testing the same
08/16/2006CN1819192A 半导体器件以及半导体封装 Semiconductor device and semiconductor package
08/16/2006CN1819097A Lift stop intelligent detection and detector for leakage protector
08/16/2006CN1818706A Power supply aging system
08/16/2006CN1818705A Voltage-frequency conversion apparatus and method of generating reference voltage therefor
08/16/2006CN1818704A Use of frequency transformer for motor temperature-raising experiment
08/16/2006CN1818703A Motor temperature-raising experimental method and device
08/16/2006CN1818702A Generation and use of calibration data for automated test equipment
08/16/2006CN1818701A Automatic fault-testing of logic blocks using internal at-speed logic-bist
08/16/2006CN1818700A Device and method for jtag test
08/16/2006CN1818699A Flexible balancing temperature-raising experimental device of crystal brake valve
08/16/2006CN1818698A Experimental method of chain static synchronous compensator IGCT valve
08/16/2006CN1818697A Single-pouring synthetic experimental method of high-voltage parallel crystal brake valve
08/16/2006CN1818696A Two-way valve working sequence with single pouring of synthetic work condition experimental device
08/16/2006CN1818695A Crystal brake trigger sequence in overcurrent experimental device
08/16/2006CN1818694A Crystal wafer for testing aging and electricity performances and construction thereof
08/16/2006CN1818693A Electric power line fault indicator
08/16/2006CN1818692A Semiconductor device including fuse and method for testing the same capable of suppressing erroneous determination
08/16/2006CN1818691A Cable fault positioning system and method
08/16/2006CN1818690A Conducting noise controller and controlling method for electromagnetic compatible device
08/16/2006CN1818689A IV characteristic measuring method and device for ferroelectric thin-film materials
08/16/2006CN1818688A System including an operating speed detection apparatus, an operating speed detection apparatus and method thereof
08/16/2006CN1818687A Life-stopping intelligent inspection and inspector for leakage protector
08/16/2006CN1818686A Life-stopping intelligent inspection and inspector for leakage protector
08/16/2006CN1818684A Method and device for measuring battery internal resistance
08/16/2006CN1818683A Circuit and method for inspecting piezoelectric resonance mode by time-domain transient current
08/16/2006CN1818669A Semiconductor device, device forming substrate and wiring connection testing method
08/16/2006CN1818668A Method for electric feeding, discharging and super-current time delay protecting on high-frequency tuning device