| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/10/2006 | US20060176049 Dynamic silicon characterization observability using functional clocks for system or run-time process characterization |
| 08/10/2006 | US20060176048 Generation and use of calibration data for automated test equipment |
| 08/10/2006 | US20060176047 Electric current sensor |
| 08/10/2006 | DE19922907B4 Kalibrierverfahren zum Kalibrieren einer Ausgabezeit eines Prüfsignals, Kalibrierverfahren zum Kalibrieren einer Zeitverschiebung und Halbleiterprüfeinrichtung Calibration method for calibrating an output time of a test signal calibration method for calibrating a time shift and Halbleiterprüfeinrichtung |
| 08/10/2006 | DE19900337B4 Differenzsignalübertragungsschaltung Differential signal transmission circuit |
| 08/10/2006 | DE19744925B4 Verfahren zum Erkennen unerwünschter offener Verbindungen Method to detect unwanted open connections |
| 08/10/2006 | DE10343256B4 Anordnung zur Herstellung einer elektrischen Verbindung zwischen einem BGA-Package und einer Signalquelle, sowie Verfahren zum Herstellen einer solchen Verbindung An arrangement for producing an electrical connection between a BGA package and a signal source, and to processes for producing such a compound |
| 08/10/2006 | DE10332008B4 Elektrische Schaltung sowie Verfahren zum Testen von elektronischen Bauteilen Electrical circuit and method for testing electronic components |
| 08/10/2006 | DE102005037024A1 Sockelanordnung zum Testen einer Halbleitervorrichtung Socket arrangement for testing a semiconductor device |
| 08/10/2006 | DE102005005466A1 Circuit arrangement for switching contact e.g. switch gear, switching state monitoring system, has signal outputs producing combination of digital output signals based on switching state of switching contact |
| 08/10/2006 | DE102005005261A1 Antennenkoppler mit Anschlagwinkel Antenna with stop bracket |
| 08/10/2006 | DE102005004905A1 Connection e.g. plug-in connection, monitoring arrangement for use in e.g. office room, has plug and connector each assigned with transponders, and reader electronics and antenna for selecting transponders |
| 08/10/2006 | DE102005004730A1 Motor vehicle battery testing method, involves detecting and storing exact testing time by real-time clock, associating test result with battery specific test information and time, and transferring result to data acquisition system |
| 08/10/2006 | DE102004057483B3 Verfahren zum Testen von Halbleiter-Chips mittels Bitmasken A method of testing semiconductor chips by means of bitmasks |
| 08/09/2006 | EP1688754A2 Battery management apparatus |
| 08/09/2006 | EP1688753A1 Protection of the test mode of an integrated circuit |
| 08/09/2006 | EP1688752A1 Apparatus and method for using mems filters to test electronic circuits |
| 08/09/2006 | EP1687937A1 Diagnostic system for a modular fieldbus board |
| 08/09/2006 | EP1687881A1 System and method for remotely detecting electric arc events in a power system |
| 08/09/2006 | EP1687649A1 Testing apparatus |
| 08/09/2006 | EP1687648A1 Synchronization of modules for analog and mixed signal testing |
| 08/09/2006 | EP1687647A2 Reliable multicast communication |
| 08/09/2006 | EP1687646A1 Method for determining ohmic insulation resistance |
| 08/09/2006 | EP1642145A4 Apparatus and method for electromechanical testing and validation of probe cards |
| 08/09/2006 | EP1616198B1 Method for identifying electrolyte stratification in a battery |
| 08/09/2006 | EP1604488B1 Non-intrusive cable connection monitoring for use in HFC networks |
| 08/09/2006 | EP1198717B1 Apparatus and method for fault detection on conductors |
| 08/09/2006 | EP1175624B1 Integrated circuit with test interface |
| 08/09/2006 | EP0987634B1 Boundary scanning element and communication equipment using the same |
| 08/09/2006 | CN2805291Y Load testing aircuit of electromagnetic heater |
| 08/09/2006 | CN2805210Y Main circuit for high energy feed back type electronic loading device |
| 08/09/2006 | CN2805179Y Rectification power storage/discharge unit |
| 08/09/2006 | CN2804883Y Investigation type electrostatic ring |
| 08/09/2006 | CN2804882Y Insulation monitoring device |
| 08/09/2006 | CN2804881Y AC, DC voltage parallel measuring circuit |
| 08/09/2006 | CN2804878Y Novel nanometer measuring means |
| 08/09/2006 | CN2804877Y Improvements for measuring means for testing use |
| 08/09/2006 | CN2804875Y Novel measuring means |
| 08/09/2006 | CN2804874Y Conductive measuring means |
| 08/09/2006 | CN2804873Y Simple measuring means |
| 08/09/2006 | CN2803847Y Device for testing track circuit compensating capacity |
| 08/09/2006 | CN1816948A Prefabricated and attached interconnect structure |
| 08/09/2006 | CN1816895A Wafer inspection device |
| 08/09/2006 | CN1816752A Apparatus, methods and computer program products for estimation of battery reserve life using adaptively modified state of health indicator-based reserve life models |
| 08/09/2006 | CN1816751A Apparatus and method for electromechanical testing and validation of probe cards |
| 08/09/2006 | CN1816748A Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 08/09/2006 | CN1815658A Device and method for avoiding pressure responsive resistor failure and earth-fault circuit breaker |
| 08/09/2006 | CN1815305A Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel |
| 08/09/2006 | CN1815304A Inspection probe, inspection device for optical panel and inspection method for the optical panel |
| 08/09/2006 | CN1815252A Earth-fault circuit breaker life termination detecting-protecting method and its circuit |
| 08/09/2006 | CN1815251A Apparatus and method for using mems filters to test electronic circuits |
| 08/09/2006 | CN1815250A Board checking device,Board checking method,Checking condition management system and parts install system |
| 08/09/2006 | CN1815249A Home appliance safety property combined measuring device |
| 08/09/2006 | CN1815241A Loaded board test method |
| 08/09/2006 | CN1815205A Method for detecting surface COP of silicon sheet using Cu inducing |
| 08/09/2006 | CN1269136C Synchronous semiconductor memory apparatus with plurality of memory sets and method for controlling same |
| 08/09/2006 | CN1269135C Semiconductor memory device and its checking method |
| 08/09/2006 | CN1269089C Mark for visual detection and electronic instrument |
| 08/08/2006 | US7089528 Methods and systems for estimating reticle bias states |
| 08/08/2006 | US7089517 Method for design validation of complex IC |
| 08/08/2006 | US7089516 Measurement of integrated circuit interconnect process parameters |
| 08/08/2006 | US7089474 Method and system for providing interactive testing of integrated circuits |
| 08/08/2006 | US7089473 Method and apparatus for testing a circuit using a die frame logic analyzer |
| 08/08/2006 | US7089472 Method and circuit for testing a chip |
| 08/08/2006 | US7089471 Scan testing mode control of gated clock signals for flip-flops |
| 08/08/2006 | US7089470 Programmable test pattern and capture mechanism for boundary scan |
| 08/08/2006 | US7089469 Electrical circuit unit and a method for testing the electrical circuit unit via an electrical test interface |
| 08/08/2006 | US7089468 Program-controlled unit and method for identifying and/or analyzing errors in program-controlled units |
| 08/08/2006 | US7089467 Asynchronous debug interface |
| 08/08/2006 | US7089466 Instrumentation system having a reconfigurable instrumentation card with programmable logic and a modular daughter card |
| 08/08/2006 | US7089465 Multi-port memory device having serial I/O interface |
| 08/08/2006 | US7089463 Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test |
| 08/08/2006 | US7089158 Real-time noise-suppression method and apparatus therefor |
| 08/08/2006 | US7089145 Tap changer condition diagnosing |
| 08/08/2006 | US7089143 Method and system for evaluating timing in an integrated circuit |
| 08/08/2006 | US7089142 Method and device for monitoring the function of an output stage having pulse width modulation |
| 08/08/2006 | US7089137 Universal test platform and test method for latch-up |
| 08/08/2006 | US7089136 Method for reduced electrical fusing time |
| 08/08/2006 | US7089135 Event based IC test system |
| 08/08/2006 | US7089132 Method and system for providing quality control on wafers running on a manufacturing line |
| 08/08/2006 | US7089127 Integrated battery service system |
| 08/08/2006 | US7089096 Apparatus and method for displaying diagnostic values |
| 08/08/2006 | US7088998 Method and product palette for testing electronic products |
| 08/08/2006 | US7088778 Method and apparatus for measurement of channel transmission accuracy |
| 08/08/2006 | US7088682 Reducing overhead when using loopback cells for fault detection in bi-directional virtual circuits |
| 08/08/2006 | US7088677 System and method for delay-based congestion detection and connection admission control |
| 08/08/2006 | US7088676 Methods and systems for fast restoration in a mesh network of optical cross connects |
| 08/08/2006 | US7088675 Wrap path for communication ring access control |
| 08/08/2006 | US7088674 Method and apparatus for checking continuity of leaf-to-root VLAN connections |
| 08/08/2006 | US7088444 Evaluating a multi-layered structure for voids |
| 08/08/2006 | US7088175 Low noise, electric field sensor |
| 08/08/2006 | US7088124 Utilizing clock shield as defect monitor |
| 08/08/2006 | US7088123 System and method for extraction of C-V characteristics of ultra-thin oxides |
| 08/08/2006 | US7088122 Test arrangement for testing semiconductor circuit chips |
| 08/08/2006 | US7088121 Non-contact method and apparatus for on-line interconnect characterization in VLSI circuits |
| 08/08/2006 | US7088120 Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure |
| 08/08/2006 | US7088119 Mechanism for testing printed circuit board |
| 08/08/2006 | US7088118 Modularized probe card for high frequency probing |
| 08/08/2006 | US7088117 Wafer burn-in and test employing detachable cartridge |
| 08/08/2006 | US7088116 Optoelectronic probe |