Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2006
08/23/2006EP1692754A1 Method for calculating power capability of battery packs using advanced cell model predictive techniques
08/23/2006EP1692634A2 Method and apparatus for use with a portable power source
08/23/2006EP1692532A1 Method for functional testing of a lamp circuit
08/23/2006EP1692531A2 Supporting sdh/sonet aps bridge selector functionality for ethernet
08/23/2006EP1692530A1 Ionization test for electrical verification
08/23/2006EP1692529A2 Die design with integrated assembly aid
08/23/2006EP1692528A1 Device for measuring ambient electromagnetic radiation
08/23/2006EP1692526A1 Apparatus for testing a device with a high frequency signal
08/23/2006EP1692525A1 A ground-signal-ground (gsg) test structure
08/23/2006EP1692056A2 Pulsed current generator circuit with charge booster
08/23/2006EP1402709B1 Detecting a bridge tap or end-of-line of a telephone line using time-domain reflectometry
08/23/2006EP1019740B1 Method and apparatus for testing encapsulated circuits
08/23/2006CN2810099Y Multifunctional test trolley
08/23/2006CN2809908Y Battery for electric bicycle with monitoring apparatus
08/23/2006CN2809658Y Experimental bench for motor with working state simulation
08/23/2006CN2809657Y Test assembly for electrical property test of electrical package
08/23/2006CN1823279A Methods and apparatus for battery monitoring, characterisation and reserve time estimation
08/23/2006CN1823278A Power control and scheduling in an OFDM system
08/23/2006CN1823277A Integrated circuit with test pad structure and method of testing
08/23/2006CN1822737A Organic electroluminescence display and its producing method
08/23/2006CN1822463A Fake battery detecting device of mobile communication terminal
08/23/2006CN1822235A Method and system for measurement
08/23/2006CN1822075A Display circuit
08/23/2006CN1821802A High precision frequency and aplitude measuring module for electric power and method
08/23/2006CN1821801A Internal short detection apparatus for secondary-battery, internal short detection method for secondary-battery, battery-pack, and electronic equipment
08/23/2006CN1821800A Energy status indicator in a portable device
08/23/2006CN1821799A Detecting system of therme generator thermoelectric property
08/23/2006CN1821798A Semiconductor laser near and far field distribution observation device
08/23/2006CN1821797A Method for qualifying joints and contacts of electric circuits
08/23/2006CN1821796A Window type online monitor for detecting gas insulation combined electric appliance (GIS)
08/23/2006CN1821795A Method and its device for detecting discharge fault position of high voltage electric equipment
08/23/2006CN1821792A Method for detecting paper shredder blocking and rotation and paper shredder having blocking and rotation detector
08/23/2006CN1821791A Probe board fixing machanism
08/23/2006CN1821790A Universal probe device for electronic module detecting system
08/23/2006CN1821789A Vertical probe carb
08/23/2006CN1821788A Embedded type micro contact element and its producing method
08/23/2006CN1821766A Electric checking device of flexibility print circuit
08/23/2006CN1821729A Automation device for LED test table
08/23/2006CN1271825C Protective exchanging appts. and method utilizing node group in annular ATM system
08/23/2006CN1271782C Analog amplifier having multiplex function
08/23/2006CN1271748C Self-aligning socket connector
08/23/2006CN1271745C Special cavity resonator and testing method for mediat resonator material at 8mm band test
08/23/2006CN1271699C Probe card for testing wafer having plurality of semiconductor devices and its manufacturing method
08/23/2006CN1271696C Semiconductor device and test method for the same
08/23/2006CN1271694C System, equipment and method for automatic testing IC complete device
08/23/2006CN1271542C Low leakage technique for determining power spectra of non-coherently sampled data
08/22/2006US7096443 Method for determining the critical path of an integrated circuit
08/22/2006US7096442 Optimizing IC clock structures by minimizing clock uncertainty
08/22/2006US7096400 Adaptive hybrid automatic repeat request method and apparatus
08/22/2006US7096398 Distributed test control architecture
08/22/2006US7096397 Dft technique for avoiding contention/conflict in logic built-in self-test
08/22/2006US7096396 Test system for circuits
08/22/2006US7096395 Efficient word recognizer for a logic analyzer
08/22/2006US7096393 Built-in self-test (BIST) of memory interconnect
08/22/2006US7096386 Semiconductor integrated circuit having functional modules each including a built-in self testing circuit
08/22/2006US7096384 Fault simulator for verifying reliability of test pattern
08/22/2006US7096168 Circuit configuration for simulating the input or output load of an analog circuit
08/22/2006US7096140 Test system, test method and test program for an integrated circuit by IDDQ testing
08/22/2006US7096139 Testing apparatus
08/22/2006US7096138 Method for demonstrating the dependence of a signal based on another signal
08/22/2006US7096131 Method for determining specifications of fuel cell power generation system and fuel cell power generation system
08/22/2006US7096130 Charging/discharging apparatus and method, power supplying apparatus and method, program storing medium, and program
08/22/2006US7095835 Time based regulation of use of a telephone line
08/22/2006US7095753 Digital network processor-based multi-protocol flow control
08/22/2006US7095739 Reliable multicast communication
08/22/2006US7095718 Client/server scan software architecture
08/22/2006US7095715 System and method for processing network packet flows
08/22/2006US7095713 Network fabric access device with multiple system side interfaces
08/22/2006US7095712 Method and apparatus for protection path setup
08/22/2006US7095289 Yank detection circuit for self-biased phase locked loops
08/22/2006US7095267 MOSFET drive circuit, programmable power supply and semiconductor test apparatus
08/22/2006US7095264 Programmable jitter signal generator
08/22/2006US7095244 System and method for determining operational states of first and second electrical contacts in a motor
08/22/2006US7095243 AC generator exciter rotor slip-ring test apparatus
08/22/2006US7095242 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
08/22/2006US7095241 Anisotropic conductive connector, probe member, wafer inspecting device, and wafer inspecting method
08/22/2006US7095240 Method of an apparatus for testing wiring
08/22/2006US7095239 Method for detecting defects that exhibit repetitive patterns
08/22/2006US7095238 Diagnostic method for a sensor
08/22/2006US7095237 Method of grouping single cells of power sources to build optimal packs using parameters obtained by analysis of impedance spectrum
08/22/2006US7095236 Synthetic equivalence test circuit for circuit breaker testing
08/22/2006US7095235 Monitoring device, electrical machine tool, current supply device, and associated method of operation
08/22/2006US7095211 Battery gas gauge
08/22/2006US7094615 Method of controlling probe tip sanding in semiconductor device testing equipment
08/22/2006US7094273 melting a low aluminum content alloy, adding calcium prior to the addition of the remaining aluminum then casting; calcium additions deoxidize the melt; by product inhibition
08/22/2006US7094063 High density interconnect
08/22/2006US7093622 Apparatus for deforming resilient contact structures on semiconductor components
08/17/2006WO2006086637A1 Apparatus and method for hard-dock a tester to a tiltable imager
08/17/2006WO2006086512A2 High density interconnect system for ic packages and interconnect assemblies
08/17/2006WO2006086310A2 Arc fault and ground fault circuit interrupter tester apparatus and method
08/17/2006WO2006085608A1 Semiconductor device and semiconductor device design method
08/17/2006WO2006085566A1 Power amplifying circuit and test apparatus
08/17/2006WO2006085364A1 Electronic component test equipment
08/17/2006WO2006085276A1 Testing of an integrated circuit with a plurality of clock domains
08/17/2006WO2006084374A1 Use of location awareness to facilitate clinician- charger interaction in a healthcare environment
08/17/2006WO2006084342A2 Isolated nucleic acid molecules encoding plant transcription factors in the knox family
08/17/2006WO2006066112A3 Using parametric measurement units as a source of power for a device under test
08/17/2006WO2006063809A3 Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate from a single measurement
08/17/2006WO2006041732A3 Optical packet switching
08/17/2006WO2006019625A3 System and method for battery conservation in wireless stations