| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/06/2006 | CN1828322A Method for non-contact testing of fixed and inaccessible connections without using a sensor plate |
| 09/06/2006 | CN1828321A Electronic component detecting system |
| 09/06/2006 | CN1828320A On-line monitoring method and system for converting station high voltage electrical apparatus |
| 09/06/2006 | CN1828319A Phase defect testing method for three phase power supply |
| 09/06/2006 | CN1828314A Substrate integration wave guide measuring method for microwave medium substrate dielectric constant |
| 09/06/2006 | CN1828262A Key-press test method |
| 09/06/2006 | CN1827444A Positioning device for fault of railway automatic blocking and continuous transmission line |
| 09/06/2006 | CN1274014C Voltage metering method for semiconductor device |
| 09/06/2006 | CN1273839C Automated test system |
| 09/06/2006 | CN1273837C Orbit detector |
| 09/06/2006 | CN1273825C Substrate inspecting method and substrate inspecting apparatus using the method |
| 09/06/2006 | CN1273809C Apparatus for providing externally applied in-situ stress in thin film electrical property measurement and measuring method thereof |
| 09/06/2006 | CN1273332C Method and device for stabilizing vehicle distribution network |
| 09/05/2006 | US7103864 Semiconductor device, and design method, inspection method, and design program therefor |
| 09/05/2006 | US7103861 Test structure for automatic dynamic negative-bias temperature instability testing |
| 09/05/2006 | US7103860 Verification of embedded test structures in circuit designs |
| 09/05/2006 | US7103859 System and method for improving testability independent of architecture |
| 09/05/2006 | US7103820 System and method for interleaving forward error correction code words across multiple communication connections |
| 09/05/2006 | US7103816 Method and system for reducing test data volume in the testing of logic products |
| 09/05/2006 | US7103815 Testing of integrated circuit devices |
| 09/05/2006 | US7103814 Testing logic and embedded memory in parallel |
| 09/05/2006 | US7103813 Method and apparatus for testing interconnect bridging faults in an FPGA |
| 09/05/2006 | US7103811 Mechanisms for detecting silent errors in streaming media devices |
| 09/05/2006 | US7103496 Disc interface, disc interface system having the same, and disc interfacing method |
| 09/05/2006 | US7103493 Memory testing apparatus and method |
| 09/05/2006 | US7103484 Non-contact methods for measuring electrical thickness and determining nitrogen content of insulating films |
| 09/05/2006 | US7103052 Device for reassembling cell data device for circuit emulation service and method of ATM synchronization control |
| 09/05/2006 | US7103026 Use of chip repetition to produce a flexible bandwidth DS-CDMA system |
| 09/05/2006 | US7103006 Method, system, and article of manufacture for data transmission |
| 09/05/2006 | US7103005 System and method for resolving wraparound ambiguity in a counter |
| 09/05/2006 | US7103003 Network planning tool |
| 09/05/2006 | US7102995 Supporting SDH/SONET APS bridge selector functionality for ethernet |
| 09/05/2006 | US7102959 Synchronous semiconductor memory device of fast random cycle system and test method thereof |
| 09/05/2006 | US7102555 Boundary-scan circuit used for analog and digital testing of an integrated circuit |
| 09/05/2006 | US7102457 Mechanically balanced microwave load pull tuner |
| 09/05/2006 | US7102413 Semiconductor integrated circuit device |
| 09/05/2006 | US7102395 Power-supply voltage detection circuit and integrated circuit device |
| 09/05/2006 | US7102379 Apparatus and method for monitoring and/or analysis of electrical machines during operation |
| 09/05/2006 | US7102378 Testing apparatus and method for thin film transistor display array |
| 09/05/2006 | US7102377 Packaging reliability superchips |
| 09/05/2006 | US7102376 Power semiconductor module with detector for detecting main circuit current through power semiconductor element |
| 09/05/2006 | US7102375 Pin electronics with high voltage functionality |
| 09/05/2006 | US7102374 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis |
| 09/05/2006 | US7102373 Inspection unit |
| 09/05/2006 | US7102372 Apparatus and method for testing conductive bumps |
| 09/05/2006 | US7102371 Bilevel probe |
| 09/05/2006 | US7102370 Compliant micro-browser for a hand held probe |
| 09/05/2006 | US7102369 Contact pin, connection device and method of testing |
| 09/05/2006 | US7102368 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture |
| 09/05/2006 | US7102367 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof |
| 09/05/2006 | US7102363 Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits |
| 09/05/2006 | US7102362 Integrated circuit for testing circuit components of a semiconductor chip |
| 09/05/2006 | US7102361 Delay lock circuit having self-calibrating loop |
| 09/05/2006 | US7102360 Procedure to measure grounding resistances of electrical installations by measuring the loop impedance |
| 09/05/2006 | US7102359 Integrated fault detector circuit |
| 09/05/2006 | US7102358 Overvoltage detection apparatus, method, and system |
| 09/05/2006 | US7102357 Determination of worst case voltage in a power supply loop |
| 09/05/2006 | US7102356 Electrical leakage detection circuit |
| 09/05/2006 | US7102355 Method, apparatus and computer-readable code for magnifying an incipient ground fault and enable quick detection of such fault |
| 09/05/2006 | US7102345 Portable VI probe |
| 09/05/2006 | US7102344 Circuit tester |
| 09/05/2006 | US7102329 Method of measuring the battery level in a mobile telephone |
| 09/05/2006 | US7101208 Device for detecting malfunctioned power cable in computer without using meter |
| 09/05/2006 | US7100814 Method for preparing integrated circuit modules for attachment to printed circuit substrates |
| 09/05/2006 | US7100389 Apparatus and method having mechanical isolation arrangement for controlling the temperature of an electronic device under test |
| 09/05/2006 | US7100273 Interconnect validation instruments |
| 08/31/2006 | WO2006091051A2 Test handler having size-changeable test site |
| 08/31/2006 | WO2006090891A1 Inspection device, inspection method, and positioning method |
| 08/31/2006 | WO2006090752A1 Current measuring device, testing device, current measuring method and testing method |
| 08/31/2006 | WO2006089548A1 Method for testing an electronic circuit for driving a dc-motor |
| 08/31/2006 | WO2005114232A3 Method and apparatus for the determination of the concentration of impurities in a wafer |
| 08/31/2006 | WO2005069914A3 Probe card configuration for low mechanical flexural strength electrical routing substrates |
| 08/31/2006 | WO2005033906A3 System verification using one or more automata |
| 08/31/2006 | US20060195807 Method and system for evaluating timing in an integated circuit |
| 08/31/2006 | US20060195749 Calibration control for pin electronics |
| 08/31/2006 | US20060195748 Electronic product testing procedure supervising method and system |
| 08/31/2006 | US20060195747 Method and system for scheduling tests in a parallel test system |
| 08/31/2006 | US20060195746 Variable clocked scan test improvements |
| 08/31/2006 | US20060195745 Methods and systems for repairing applications |
| 08/31/2006 | US20060195744 Method and apparatus to simulate automatic test equipment |
| 08/31/2006 | US20060195743 Semiconductor memory device |
| 08/31/2006 | US20060195742 Semiconductor memory device and method of testing the same |
| 08/31/2006 | US20060195741 Shift clock generator, timing generator and test apparatus |
| 08/31/2006 | US20060195740 Clock duty cycle based access timer combined with standard stage clocked output register |
| 08/31/2006 | US20060195739 Multiple device scan chain emulation/debugging |
| 08/31/2006 | US20060195738 Merged MISR and output register without performance impact for circuits under test |
| 08/31/2006 | US20060195737 System and method for characterization of certain operating characteristics of devices |
| 08/31/2006 | US20060195736 Electro-optical device |
| 08/31/2006 | US20060195735 Circuit for distributing a test signal applied to a pad of an electronic device |
| 08/31/2006 | US20060195734 Semiconductor memory device and stress testing method thereof |
| 08/31/2006 | US20060195733 Arc fault and ground fault circuit interrupter tester apparatus and method |
| 08/31/2006 | US20060195732 Method and system for executing test cases for a device under verification |
| 08/31/2006 | US20060195722 Pattern generator and testing apparatus |
| 08/31/2006 | US20060193262 Collecting and managing data at a construction site |
| 08/31/2006 | US20060193256 Method and system for shaping traffic in a parallel queuing hierarchy |
| 08/31/2006 | US20060193254 Data output method, data output apparatus, communication system and computer program product |
| 08/31/2006 | US20060193253 Radio base station |
| 08/31/2006 | US20060193097 Detection of short circuits in a vehicle |
| 08/31/2006 | US20060192752 Inspection method semiconductor device and display device |
| 08/31/2006 | US20060192585 System and method for display test |