Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2006
09/14/2006US20060202708 Low-current probe card
09/14/2006US20060202707 Pin electronic for usage in an automatic test equipment for testing integrated circuits
09/14/2006US20060202706 Test apparatus and method for testing a circuit unit
09/14/2006US20060202705 RFID application test systems and methods
09/14/2006US20060202704 Current measuring apparatus, test apparatus, and coaxial cable and assembled cable for the apparatuses
09/14/2006US20060202703 Apparatus for testing electric cables
09/14/2006US20060202702 Headset charging system with interchargeable charge devices
09/14/2006US20060202675 Method and apparatus for a twisting fixture probe for probing test access point structures
09/14/2006US20060202671 Voltage sensing apparatus for medium-voltage electrical power distribution systems
09/14/2006US20060202119 Semiconductor device tester
09/14/2006US20060200970 Transcutaneous analyte sensor
09/14/2006DE102005047413A1 Magnetoresistives Sensorelement und Konzept zum Herstellen und Testen desselben The magnetoresistive sensor element and concept for making and testing the same
09/14/2006DE102005041881A1 Battery connecting device for motor vehicle`s electrical DC voltage system, has ring-shaped, slotted measuring resistor arranged between pole terminal and pole of battery, where resistor and terminal are formed as single-piece
09/14/2006DE102005012405B3 Verfahren und Schaltungsanordnung zur Detektion eines Leitungsbruches Method and circuit for detecting a wire break
09/14/2006DE102005011387A1 Verfahren und Vorrichtung zum Lokalisieren der Herkunft von die Erreichbarkeit und/oder den Betrieb von Geräten, insbesondere netzfähigen Hausgeräten beeinträchtigenden Störungszuständen Method and apparatus for locating the origin of the accessibility and / or operation of equipment, especially networkable household appliances debilitating disorder states
09/14/2006DE102005010822A1 Processing method for check routine involves generating analyzing and optimizing of check routine by information used automatically on allocation of many contact points
09/14/2006DE102005009164A1 Contact connector surface for semiconductor component, has heater structure electrically isolated from surface and including metallic conducting paths, which surround surface at its edges and arranged meander shaped under surface
09/14/2006CA2499031A1 Voltage applied type current measuring system using computer based data acquisition board
09/13/2006EP1701359A1 Memory tester with test program branch on error indication
09/13/2006EP1701175A2 Power supply with status detector and initial characteristic determination means
09/13/2006EP1701174A1 Pin electronic for usage in an automatic test equipment for testing integrated circuits
09/13/2006EP1701173A1 Error detection in compressed data
09/13/2006EP1701172A1 RF cable testing
09/13/2006EP1701171A1 Solid state absorbing clamp
09/13/2006EP1700132A2 Methods and apparatus for transforming sequential logic designs into equivalent combinational logic
09/13/2006EP1700131A2 Loop resistance tester
09/13/2006EP1606638A4 Method of precisely determining the location of a fault on an electrical transmision system
09/13/2006EP1461584A4 Method and apparatus for measuring stress in semiconductor wafers
09/13/2006EP1435004B1 Test circuit
09/13/2006EP1173811B1 A system for monitoring connection pattern of data ports
09/13/2006CN2816830Y Battery-discharge cure automatic recording instrument
09/13/2006CN2816829Y Small current earthing route selection device
09/13/2006CN2816828Y Electric locomotive main circuit earthing intelligent detecting system
09/13/2006CN2816827Y Short circuit and earth fault indicator voltage type tester
09/13/2006CN2816826Y LCM semi-finished-article power-on decting tool-set having backlight
09/13/2006CN2816825Y Microwave peak-field-density detector
09/13/2006CN2816822Y Metal housing surface-current detecting device
09/13/2006CN2816816Y Measuring instrument and heat-insulation constant temperature duct
09/13/2006CN1833262A Input voltage sense circuit in a line powered network element
09/13/2006CN1833175A Timing comparator, data sampling apparatus, and testing apparatus
09/13/2006CN1833174A High current electron beam inspection
09/13/2006CN1833173A Semiconductor test apparatus
09/13/2006CN1833172A Extended automatic protection switching arrangement
09/13/2006CN1833165A Generation of test patterns for subsequent inspection
09/13/2006CN1832294A Battery state monitoring circuitry with low power consumption during a stand-by-state of a battery pack
09/13/2006CN1832248A Battery pack current monitoring
09/13/2006CN1832123A Semiconductor device, evaluation method, and process condition evaluation method
09/13/2006CN1832122A Detection card interface panel
09/13/2006CN1832050A Method for reliable contact of probe and nano-electrode of phase transformation memory device unit
09/13/2006CN1831551A Method for preventing detection mechanism misjudgement caused by voltage instant changing of battery
09/13/2006CN1831550A Contactless detection device of display panel
09/13/2006CN1831549A Method for low cast detecting interconnected reliability of high frequency cable
09/13/2006CN1831548A Line open-short circuit tester
09/13/2006CN1831547A Detection device capable of automatic aligning detected material
09/13/2006CN1831546A Desuper propagation rate measuring method of high-temp superconductor band
09/13/2006CN1831544A Test method for RF cable testing to avoid long test cables
09/13/2006CN1831525A Inspection device for humidity sensor and method for adjusting sensor characteristics of humidity sensor
09/13/2006CN1831497A Automatic device of LED testing table
09/13/2006CN1275308C Semiconductor detector and detecting method thereof
09/13/2006CN1275074C Detection structure and fabrication method for organic light emitting diode display panel
09/13/2006CN1275046C Method of judging continuous failure occuring position using wave shape
09/13/2006CN1275045C Circuit board detection equipment and circuit board detection method
09/12/2006US7107557 Method for calculation of cell delay time and method for layout optimization of semiconductor integrated circuit
09/12/2006US7107504 Test apparatus for semiconductor device
09/12/2006US7107503 Boundary scan with ground bounce recovery
09/12/2006US7107502 Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD)
09/12/2006US7107484 Fault-tolerant computer system, re-synchronization method thereof and re-synchronization program thereof
09/12/2006US7107394 Apparatus for capturing data on a debug bus
09/12/2006US7107362 Integrated circuit with configuration based on parameter measurement
09/12/2006US7107190 Circuit designing apparatus, circuit designing method, and computer readable recording medium storing a circuit designing program
09/12/2006US7107186 Transformer testing
09/12/2006US7107183 Recyclable electric junction box applicable to automotive vehicles
09/12/2006US7107173 Automatic test equipment operating architecture
09/12/2006US7107172 Test apparatus and setting method therefor
09/12/2006US7107166 Device for testing LSI to be measured, jitter analyzer, and phase difference detector
09/12/2006US7107160 Use-adaptive fuel gauging for battery powered electronic devices
09/12/2006US7107117 Sorting a group of integrated circuit devices for those devices requiring special testing
09/12/2006US7106745 System and method of avoiding cell disposal in buffer
09/12/2006US7106565 Directional ground relay system
09/12/2006US7106450 Determination of a device signal response characteristic using multiple varied signals
09/12/2006US7106402 Method for driving a reflection liquid crystal display wherein the liquid crystal display having particular cholesteric color filters
09/12/2006US7106108 Semiconductor integrated circuit and evaluation method of wiring in the same
09/12/2006US7106097 IC with dual input output memory buffer
09/12/2006US7106091 Circuit configuration and method for detecting an unwanted attack on an integrated circuit
09/12/2006US7106090 Optical semiconductor device with multiple quantum well structure
09/12/2006US7106089 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel
09/12/2006US7106088 Method of predicting high-k semiconductor device lifetime
09/12/2006US7106087 Method and apparatus for evaluating semiconductor device
09/12/2006US7106086 Method of dynamically switching voltage screen test levels based on initial device parameter measurements
09/12/2006US7106085 Electronic circuit unit having small size and good productivity
09/12/2006US7106084 Method of screening semiconductor device
09/12/2006US7106083 Testing system and testing method for DUTs
09/12/2006US7106082 Stage driving apparatus and probe method
09/12/2006US7106081 Parallel calibration system for a test device
09/12/2006US7106080 Probe card and contactor of the same
09/12/2006US7106079 Using an interposer to facilate capacitive communication between face-to-face chips
09/12/2006US7106074 Technique for measurement of programmable termination resistor networks on rapidchip and ASIC devices
09/12/2006US7106071 Cable diagnostics using time domain reflectometry and applications using the same
09/12/2006US7106070 Broad-band low-inductance cables for making Kelvin connections to electrochemical cells and batteries
09/12/2006US7106069 Apparatus for detecting arc fault