Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/20/2006 | CN1834680A Integrated circuit with a control input that can be disabled |
09/20/2006 | CN1834679A Method and apparatus for a twisting fixture probe for probing test access point structures |
09/20/2006 | CN1834678A Multi-channel analyzer of non-contact applied chip |
09/20/2006 | CN1834677A Main circuit of general smart synthetic all-duty testing device |
09/20/2006 | CN1834676A Auxilary valve triggering and detecting code of all-duty testing device |
09/20/2006 | CN1834675A Inspection method and device of using scan laser SQUID microscope |
09/20/2006 | CN1834674A Method and apparatus for a reliability testing |
09/20/2006 | CN1834673A Insulating state on-line monitoring method of cross-linked PE cable |
09/20/2006 | CN1834672A Highly reliable vehicle system start controller |
09/20/2006 | CN1834671A Double injection synthetic test method of high voltage series TCR |
09/20/2006 | CN1834670A Overcurrent tester of TCR |
09/20/2006 | CN1834669A On-line detecting and positioning device for local discharging of electrical insulated combined electrical appliance, and positioning method thereof |
09/20/2006 | CN1834668A System class testing method |
09/20/2006 | CN1834664A Test system and connection box therefor |
09/20/2006 | CN1834663A Printed circuit holding device |
09/20/2006 | CN1834630A Base inspection device,method and device for setting inspection logic |
09/20/2006 | CN1834600A Testing clamp and method of producing super-short optical palse based on cascade electrical sucking modulator |
09/20/2006 | CN1276509C Semiconductor integrated circuit |
09/20/2006 | CN1276493C Device and method for nondestructive inspection of semiconductor device |
09/20/2006 | CN1276264C Method for determining stable cell terminal voltage |
09/20/2006 | CN1276260C Coaxial probe interface for automatic test equipment |
09/19/2006 | US7111257 Using a partial metal level mask for early test results |
09/19/2006 | US7111224 FPGA configuration memory with built-in error correction mechanism |
09/19/2006 | US7111218 Apparatus with self-test circuit |
09/19/2006 | US7111217 Method and system for flexibly nesting JTAG TAP controllers for FPGA-based system-on-chip (SoC) |
09/19/2006 | US7111216 Scan controller and integrated circuit including such a controller |
09/19/2006 | US7111215 Methods of reducing the susceptibility of PLD designs to single event upsets |
09/19/2006 | US7111214 Circuits and methods for testing programmable logic devices using lookup tables and carry chains |
09/19/2006 | US7111213 Failure isolation and repair techniques for integrated circuits |
09/19/2006 | US7111212 Debugging system for semiconductor integrated circuit |
09/19/2006 | US7111211 Efficient air-flow loop through dual burn-in chambers with removable pattern-generator boards for memory-module environmental testing |
09/19/2006 | US7111210 Accelerated test method for ferroelectric memory device |
09/19/2006 | US7111209 Test pattern compression for an integrated circuit test environment |
09/19/2006 | US7111208 On-chip standalone self-test system and method |
09/19/2006 | US7111199 Built-in debug feature for complex VLSI chip |
09/19/2006 | US7111087 Storage control system and operating method for storage control system |
09/19/2006 | US7111073 Apparatus for estimating delay and jitter between network routers |
09/19/2006 | US7111049 System and method for providing internet based phone conferences using multiple codecs |
09/19/2006 | US7110905 Universal automated circuit board tester |
09/19/2006 | US7110896 System and method for displaying battery status and other parameters of a portable electronic device in a power-off state |
09/19/2006 | US7110895 Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same |
09/19/2006 | US7110864 Systems, devices, and methods for detecting arcs |
09/19/2006 | US7110354 Method of controlling 1+1bi-directional switching operation of asynchronous transfer mode switch |
09/19/2006 | US7110307 Semiconductor memory with a data holding circuit having two output terminals |
09/19/2006 | US7109779 Semiconductor integrated circuit and a burn-in method thereof |
09/19/2006 | US7109742 Current sensing in a two-phase motor |
09/19/2006 | US7109741 Image data display on an information carrier |
09/19/2006 | US7109740 Method for retesting semiconductor device |
09/19/2006 | US7109739 Wafer-level opto-electronic testing apparatus and method |
09/19/2006 | US7109738 Method for modeling inductive effects on circuit performance |
09/19/2006 | US7109737 Arrangements having IC voltage and thermal resistance designated on a per IC basis |
09/19/2006 | US7109736 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
09/19/2006 | US7109735 Method for measuring gate dielectric properties for three dimensional transistors |
09/19/2006 | US7109734 Characterizing circuit performance by separating device and interconnect impact on signal delay |
09/19/2006 | US7109733 Test head docking system and method |
09/19/2006 | US7109732 Electronic component test apparatus |
09/19/2006 | US7109731 Membrane probing system with local contact scrub |
09/19/2006 | US7109730 Non-contact tester for electronic circuits |
09/19/2006 | US7109721 Method and electronic circuit for regenerating an electrical contact |
09/19/2006 | US7109720 Method for determining wear of a switchgear contacts |
09/19/2006 | US7109700 Multimeter having off-device display device and selection device |
09/19/2006 | US7109685 Method for estimating states and parameters of an electrochemical cell |
09/19/2006 | US7109684 Secondary cell charger and charging method |
09/19/2006 | US7109582 Semiconductor device for testing semiconductors |
09/19/2006 | US7109050 Solid state image pickup device and method of fabricating the same |
09/19/2006 | US7109047 Method and device for analyzing circuits |
09/19/2006 | US7108546 High density planar electrical interface |
09/19/2006 | US7107817 Method for calibrating semiconductor test instruments |
09/19/2006 | US7107816 Method for calibrating semiconductor test instruments |
09/19/2006 | US7107815 Method for calibrating semiconductor test instruments |
09/19/2006 | CA2354248C Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits |
09/15/2006 | CA2536444A1 Dynamic vehicle electrical system test |
09/14/2006 | WO2006096644A2 Circuit board diagnostic operating center |
09/14/2006 | WO2006096543A2 Temperature sensing and prediction in ic sockets |
09/14/2006 | WO2006096361A2 Apparatus and method for controlling temperature in a chuck system |
09/14/2006 | WO2006096327A2 Boundary scan testing system |
09/14/2006 | WO2006095791A1 Element substrate, inspecting method, and manufacturing method of semiconductor device |
09/14/2006 | WO2006095715A1 Test device, test method, electronic device manufacturing method, test simulator, and test simulation method |
09/14/2006 | WO2006095563A1 Method of displaying remaining battery power, and electronic apparatus |
09/14/2006 | WO2006094908A1 Measuring device and method for monitoring a network |
09/14/2006 | WO2006094522A1 Test method and production method for a semiconductor circuit composed of partial circuits |
09/14/2006 | WO2006055862A3 Programmable memory built-in-self-test (mbist) method and apparatus |
09/14/2006 | WO2005101113A3 Polymer dispersed liquid crystal formulations for modulator fabrication |
09/14/2006 | WO2005076132A3 A test system |
09/14/2006 | WO2004042795A3 Method of preparing whole semiconductor wafer for analysis |
09/14/2006 | US20060206773 Tester simulation system and tester simulation method using same |
09/14/2006 | US20060206772 Method and apparatus for supporting test pattern generation, and computer product |
09/14/2006 | US20060206771 Read-only memory and operational control method thereof |
09/14/2006 | US20060206762 Circuit arrangement, in addition to method for identifying interruptions and short-circuits in coupled systems |
09/14/2006 | US20060206280 Jtag testing arrangement |
09/14/2006 | US20060206277 Wireless functional testing of RFID tag |
09/14/2006 | US20060206276 Method of estimating maximum output of battery for hybrid electric vehicle |
09/14/2006 | US20060206241 Control unit for vehicle and control system |
09/14/2006 | US20060203735 Bridge apparatus and control packet processing apparatus in a spanning tree protocol network |
09/14/2006 | US20060203734 Method and system of evaluating survivability of ATM switches over SONET networks |
09/14/2006 | US20060203729 Dynamic adaptation of MAC-layer retransmission value |
09/14/2006 | US20060203722 System and method for managing performance of mobile terminals via remote diagnostics |
09/14/2006 | US20060202857 Status detector for power supply, power supply, and initial characteristic extracting device for use with power supply |
09/14/2006 | US20060202733 High performance signal generation |
09/14/2006 | US20060202709 Apparatus and methods for self-heating burn-in processes |