Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2006
09/26/2006US7112953 Method for detecting epitaxial (EPI) induced buried layer shifts in semiconductor devices
09/26/2006US7112952 Inspection system, inspection method, and method for manufacturing semiconductor device
09/26/2006US7112909 Method and system for measuring wedge tightness
09/26/2006US7112889 Semiconductor device having an alignment mark formed by the same material with a metal post
09/26/2006US7112792 Defect inspection and charged particle beam apparatus
09/26/2006US7112791 Method of inspecting pattern and inspecting instrument
09/26/2006US7112288 Methods for inspection sample preparation
09/26/2006US7111983 Temperature detection method and apparatus for inverter-driven machines
09/26/2006US7111490 Method for calibrating semiconductor test instruments
09/21/2006WO2006099582A2 Mini wave soldering system and method for soldering wires and pin configurations
09/21/2006WO2006099455A2 Computer usage management system and method
09/21/2006WO2006099356A1 Rfid application test systems and methods
09/21/2006WO2006099025A2 Qos management in wireless mesh networks
09/21/2006WO2006097982A1 Method for manufacturing semiconductor integrated circuit device
09/21/2006WO2006097377A1 Method and circuit for detecting a line break
09/21/2006WO2006096958A1 Multiplexer and system for supplying current to an electrochemical cell stack
09/21/2006WO2006096956A1 Method, system and apparatus for diagnostic testing of an electrochemical cell stack
09/21/2006WO2005088800A3 Power supply loading indicators and methods
09/21/2006WO2005081728A3 Simultaneous physical and protocol layer analysis
09/21/2006US20060212770 Error detection in compressed data
09/21/2006US20060212769 Apparatus and method for testing codec software by utilizing parallel processes
09/21/2006US20060212768 Verification circuitry for master-slave system
09/21/2006US20060212767 Production plant
09/21/2006US20060212766 Display device and driving method thereof
09/21/2006US20060212765 Integrated circuit with a control input that can be disabled
09/21/2006US20060212460 Methods, systems, and computer program products for implementing data standardization activities
09/21/2006US20060212254 Automatic test equipment operating architecture
09/21/2006US20060212253 Intelligent measurement modular semiconductor parametric test system
09/21/2006US20060212252 Test apparatus and setting method therefor
09/21/2006US20060212236 Device and method for testing an electrical circuit
09/21/2006US20060212235 Arc fault detector with circuit interrupter
09/21/2006US20060210885 In photolithography process on a photoresist coated substrate, determining the effect of flare on line shortening; measure misalignments; measuring the degree of flare distortion; semiconductor processing
09/21/2006US20060209943 Method and apparatus for generating jitter test patterns on a high performance serial bus
09/21/2006US20060209710 Testing method, communication device, and testing system
09/21/2006US20060209706 Intercepting mobile telephone communications
09/21/2006US20060209699 Device and method for network monitoring
09/21/2006US20060209697 Mobile communication control method, mobile communication system, router, and program
09/21/2006US20060209691 Methods, systems, and computer program products for data processing control
09/21/2006US20060209483 Portable circuit interrupter tester and method
09/21/2006US20060208767 Switch control apparatus, semiconductor device test apparatus and sequence pattern generating program
09/21/2006US20060208758 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same
09/21/2006US20060208757 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
09/21/2006US20060208756 Connection apparatus and cable assembly for semiconductor - device characteristic measurement apparatus
09/21/2006US20060208755 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
09/21/2006US20060208754 Method and apparatus for a reliability testing
09/21/2006US20060208753 Apparatus and methods for packaging electronic devices for optical testing
09/21/2006US20060208752 Inspection probe
09/21/2006US20060208751 Elastic micro probe and method of making same
09/21/2006US20060208750 Apparatus and methods for self-heating burn-in processes
09/21/2006US20060208749 Substrate aligning system
09/21/2006US20060208748 Probe holder for testing of a test device
09/21/2006US20060208747 Test system and connection box therefor
09/21/2006US20060208743 Connector device and checker
09/21/2006US20060208742 Power line carrier communication system and its communication device, and method for constructing power line carrier communication system
09/21/2006US20060208739 Method and device for predicting the starting capacity of a vehicle
09/21/2006US20060208721 Semiconductor carrier tray, and burn-in board, burn-in test method, and semiconductor manufacturing method using the semiconductor carrier tray
09/21/2006US20060208720 Testing device and method of testing insulated handles used for servicing high voltage transmission Lines
09/21/2006US20060208704 Charging rate estimating method, charging rate estimating unit and battery system
09/21/2006US20060208696 Method and apparatus for testing and charging a power source
09/21/2006US20060207355 Fault diagnosis apparatus
09/21/2006DE69833320T2 Kommunikationssystem Communication system
09/21/2006DE4243611B4 Testmodusschaltung für eine Speichervorrichtung Test mode circuit for a memory device
09/21/2006DE112004002022T5 Messsonden-Prüfstruktur Measuring probe test structure
09/21/2006DE102006010764A1 Verfahren und System zum Auffinden geöffneter Überstromschutzbauelemente A method and system for finding an open overcurrent protection devices
09/21/2006DE102006000086A1 Akkumulatorsystem und Verfahren zum Verarbeiten einer Anomalie eines Akkumulatorsystems A storage battery system and method for processing an anomaly of an accumulator system
09/21/2006DE102005018790A1 Integrierter Schaltkreis und Verfahren zum Betreiben und parallelen Testen von integrierten Schaltkreisen Integrated circuit and method for operating and parallel testing of integrated circuits
09/21/2006DE102005011152A1 Electronic component e.g. IC, contacting device, has contact springs whose free sections are approximately aligned at their fastening sections above overbalancing part of their length
09/21/2006DE10128365B4 Verbindungsstruktur eines Koaxialkabels an einem elektrischen Schaltungssubstrat Connecting structure of a coaxial cable to an electrical circuit substrate
09/21/2006CA2602123A1 Method, system and apparatus for diagnostic testing of an electrochemical cell stack
09/21/2006CA2600962A1 Qos management in wireless mesh networks
09/20/2006EP1703537A1 Analysing system and charged particle beam device
09/20/2006EP1703294A1 Battery controller
09/20/2006EP1703293A1 Method and device for estimating remaining service life of coil
09/20/2006EP1703292A1 A method for measuring the operating state of a synchronous motor using composite power angle meter
09/20/2006EP1703291A1 Buffer circuit and driver circuit
09/20/2006EP1703290A1 Power supply device
09/20/2006EP1702219A1 Apparatus and method for estimating state of charge of battery using neural network
09/20/2006EP1702218A1 Delay fault test circuitry and related method
09/20/2006EP1702217A1 Measurement connector for test device
09/20/2006EP1649474A4 System, apparatus and method for detection of electrical faults
09/20/2006CN2819708Y Conductive pattern manufacturing device of printing circuit board
09/20/2006CN2819234Y Miner's light charging state display list head
09/20/2006CN2819233Y Digital accumulator checker
09/20/2006CN2819232Y Plumbous acid accumulator capacity sensor for vehicle
09/20/2006CN2819231Y Time domain reflector
09/20/2006CN2819230Y Cable inspector
09/20/2006CN1836330A 半导体集成电路 The semiconductor integrated circuit
09/20/2006CN1836314A Failure analysis methods and systems
09/20/2006CN1836172A Secondary battery voltage correcting method and unit and battery residual capacity estimating method and unit
09/20/2006CN1836171A 半导体测试系统 Semiconductor Test Systems
09/20/2006CN1836170A Calibration of tester and testboard by golden sample
09/20/2006CN1836169A Auto-ip traffic optimization in mobile telecommunications systems
09/20/2006CN1835369A Start and withdrawl method of synthetic all-duty experimental appts.
09/20/2006CN1835360A Battery state monitoring circuitry with low power consumption during a stand-by-state of a battery pack
09/20/2006CN1835330A Accumulating system and method for processing abnormality of accumulating system
09/20/2006CN1835325A Discharger
09/20/2006CN1835316A Intelligent detecting method and appliance for service stop of electricity leakage protector
09/20/2006CN1835273A Power supply with status detector and initial characteristic determination means
09/20/2006CN1835174A Light-spot fast repairing method of color tube
09/20/2006CN1834844A Test set of electronic component connection socket