Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/26/2006 | US7112953 Method for detecting epitaxial (EPI) induced buried layer shifts in semiconductor devices |
09/26/2006 | US7112952 Inspection system, inspection method, and method for manufacturing semiconductor device |
09/26/2006 | US7112909 Method and system for measuring wedge tightness |
09/26/2006 | US7112889 Semiconductor device having an alignment mark formed by the same material with a metal post |
09/26/2006 | US7112792 Defect inspection and charged particle beam apparatus |
09/26/2006 | US7112791 Method of inspecting pattern and inspecting instrument |
09/26/2006 | US7112288 Methods for inspection sample preparation |
09/26/2006 | US7111983 Temperature detection method and apparatus for inverter-driven machines |
09/26/2006 | US7111490 Method for calibrating semiconductor test instruments |
09/21/2006 | WO2006099582A2 Mini wave soldering system and method for soldering wires and pin configurations |
09/21/2006 | WO2006099455A2 Computer usage management system and method |
09/21/2006 | WO2006099356A1 Rfid application test systems and methods |
09/21/2006 | WO2006099025A2 Qos management in wireless mesh networks |
09/21/2006 | WO2006097982A1 Method for manufacturing semiconductor integrated circuit device |
09/21/2006 | WO2006097377A1 Method and circuit for detecting a line break |
09/21/2006 | WO2006096958A1 Multiplexer and system for supplying current to an electrochemical cell stack |
09/21/2006 | WO2006096956A1 Method, system and apparatus for diagnostic testing of an electrochemical cell stack |
09/21/2006 | WO2005088800A3 Power supply loading indicators and methods |
09/21/2006 | WO2005081728A3 Simultaneous physical and protocol layer analysis |
09/21/2006 | US20060212770 Error detection in compressed data |
09/21/2006 | US20060212769 Apparatus and method for testing codec software by utilizing parallel processes |
09/21/2006 | US20060212768 Verification circuitry for master-slave system |
09/21/2006 | US20060212767 Production plant |
09/21/2006 | US20060212766 Display device and driving method thereof |
09/21/2006 | US20060212765 Integrated circuit with a control input that can be disabled |
09/21/2006 | US20060212460 Methods, systems, and computer program products for implementing data standardization activities |
09/21/2006 | US20060212254 Automatic test equipment operating architecture |
09/21/2006 | US20060212253 Intelligent measurement modular semiconductor parametric test system |
09/21/2006 | US20060212252 Test apparatus and setting method therefor |
09/21/2006 | US20060212236 Device and method for testing an electrical circuit |
09/21/2006 | US20060212235 Arc fault detector with circuit interrupter |
09/21/2006 | US20060210885 In photolithography process on a photoresist coated substrate, determining the effect of flare on line shortening; measure misalignments; measuring the degree of flare distortion; semiconductor processing |
09/21/2006 | US20060209943 Method and apparatus for generating jitter test patterns on a high performance serial bus |
09/21/2006 | US20060209710 Testing method, communication device, and testing system |
09/21/2006 | US20060209706 Intercepting mobile telephone communications |
09/21/2006 | US20060209699 Device and method for network monitoring |
09/21/2006 | US20060209697 Mobile communication control method, mobile communication system, router, and program |
09/21/2006 | US20060209691 Methods, systems, and computer program products for data processing control |
09/21/2006 | US20060209483 Portable circuit interrupter tester and method |
09/21/2006 | US20060208767 Switch control apparatus, semiconductor device test apparatus and sequence pattern generating program |
09/21/2006 | US20060208758 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
09/21/2006 | US20060208757 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays |
09/21/2006 | US20060208756 Connection apparatus and cable assembly for semiconductor - device characteristic measurement apparatus |
09/21/2006 | US20060208755 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays |
09/21/2006 | US20060208754 Method and apparatus for a reliability testing |
09/21/2006 | US20060208753 Apparatus and methods for packaging electronic devices for optical testing |
09/21/2006 | US20060208752 Inspection probe |
09/21/2006 | US20060208751 Elastic micro probe and method of making same |
09/21/2006 | US20060208750 Apparatus and methods for self-heating burn-in processes |
09/21/2006 | US20060208749 Substrate aligning system |
09/21/2006 | US20060208748 Probe holder for testing of a test device |
09/21/2006 | US20060208747 Test system and connection box therefor |
09/21/2006 | US20060208743 Connector device and checker |
09/21/2006 | US20060208742 Power line carrier communication system and its communication device, and method for constructing power line carrier communication system |
09/21/2006 | US20060208739 Method and device for predicting the starting capacity of a vehicle |
09/21/2006 | US20060208721 Semiconductor carrier tray, and burn-in board, burn-in test method, and semiconductor manufacturing method using the semiconductor carrier tray |
09/21/2006 | US20060208720 Testing device and method of testing insulated handles used for servicing high voltage transmission Lines |
09/21/2006 | US20060208704 Charging rate estimating method, charging rate estimating unit and battery system |
09/21/2006 | US20060208696 Method and apparatus for testing and charging a power source |
09/21/2006 | US20060207355 Fault diagnosis apparatus |
09/21/2006 | DE69833320T2 Kommunikationssystem Communication system |
09/21/2006 | DE4243611B4 Testmodusschaltung für eine Speichervorrichtung Test mode circuit for a memory device |
09/21/2006 | DE112004002022T5 Messsonden-Prüfstruktur Measuring probe test structure |
09/21/2006 | DE102006010764A1 Verfahren und System zum Auffinden geöffneter Überstromschutzbauelemente A method and system for finding an open overcurrent protection devices |
09/21/2006 | DE102006000086A1 Akkumulatorsystem und Verfahren zum Verarbeiten einer Anomalie eines Akkumulatorsystems A storage battery system and method for processing an anomaly of an accumulator system |
09/21/2006 | DE102005018790A1 Integrierter Schaltkreis und Verfahren zum Betreiben und parallelen Testen von integrierten Schaltkreisen Integrated circuit and method for operating and parallel testing of integrated circuits |
09/21/2006 | DE102005011152A1 Electronic component e.g. IC, contacting device, has contact springs whose free sections are approximately aligned at their fastening sections above overbalancing part of their length |
09/21/2006 | DE10128365B4 Verbindungsstruktur eines Koaxialkabels an einem elektrischen Schaltungssubstrat Connecting structure of a coaxial cable to an electrical circuit substrate |
09/21/2006 | CA2602123A1 Method, system and apparatus for diagnostic testing of an electrochemical cell stack |
09/21/2006 | CA2600962A1 Qos management in wireless mesh networks |
09/20/2006 | EP1703537A1 Analysing system and charged particle beam device |
09/20/2006 | EP1703294A1 Battery controller |
09/20/2006 | EP1703293A1 Method and device for estimating remaining service life of coil |
09/20/2006 | EP1703292A1 A method for measuring the operating state of a synchronous motor using composite power angle meter |
09/20/2006 | EP1703291A1 Buffer circuit and driver circuit |
09/20/2006 | EP1703290A1 Power supply device |
09/20/2006 | EP1702219A1 Apparatus and method for estimating state of charge of battery using neural network |
09/20/2006 | EP1702218A1 Delay fault test circuitry and related method |
09/20/2006 | EP1702217A1 Measurement connector for test device |
09/20/2006 | EP1649474A4 System, apparatus and method for detection of electrical faults |
09/20/2006 | CN2819708Y Conductive pattern manufacturing device of printing circuit board |
09/20/2006 | CN2819234Y Miner's light charging state display list head |
09/20/2006 | CN2819233Y Digital accumulator checker |
09/20/2006 | CN2819232Y Plumbous acid accumulator capacity sensor for vehicle |
09/20/2006 | CN2819231Y Time domain reflector |
09/20/2006 | CN2819230Y Cable inspector |
09/20/2006 | CN1836330A 半导体集成电路 The semiconductor integrated circuit |
09/20/2006 | CN1836314A Failure analysis methods and systems |
09/20/2006 | CN1836172A Secondary battery voltage correcting method and unit and battery residual capacity estimating method and unit |
09/20/2006 | CN1836171A 半导体测试系统 Semiconductor Test Systems |
09/20/2006 | CN1836170A Calibration of tester and testboard by golden sample |
09/20/2006 | CN1836169A Auto-ip traffic optimization in mobile telecommunications systems |
09/20/2006 | CN1835369A Start and withdrawl method of synthetic all-duty experimental appts. |
09/20/2006 | CN1835360A Battery state monitoring circuitry with low power consumption during a stand-by-state of a battery pack |
09/20/2006 | CN1835330A Accumulating system and method for processing abnormality of accumulating system |
09/20/2006 | CN1835325A Discharger |
09/20/2006 | CN1835316A Intelligent detecting method and appliance for service stop of electricity leakage protector |
09/20/2006 | CN1835273A Power supply with status detector and initial characteristic determination means |
09/20/2006 | CN1835174A Light-spot fast repairing method of color tube |
09/20/2006 | CN1834844A Test set of electronic component connection socket |