| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/30/2007 | US20070200555 Contact pusher, contact arm, and electronic device test apparatus |
| 08/30/2007 | US20070200554 Solid or three-dimensional circuit board |
| 08/30/2007 | US20070200434 Battery communication system |
| 08/30/2007 | US20070199370 Drying balance |
| 08/30/2007 | DE4313532B4 Verfahren zur Überprüfung einer Endstufe Process for review of a final stage |
| 08/30/2007 | DE202006012552U1 Prüfadapter für Amalgamabscheider und Wasserentkeimungsanlage Test adapter for amalgam and water disinfection |
| 08/30/2007 | DE112005002545T5 Taktgenerator und Prüfvorrichtung Clock generator and tester |
| 08/30/2007 | DE102007010686A1 Prüfsystem, hinzugefügte Vorrichtung und Prüfverfahren Test system, added device and test methods |
| 08/30/2007 | DE102007007528A1 Contacting station for testing specimens under temperature, has contacting and measuring unit, which comprises needle area with multiple contact-needles or measuring-needles, which are adjustable in axial direction |
| 08/30/2007 | DE102006057166A1 Electrical test specimen e.g. structural component, testing device, has transfer device with two guiding rails for partially guiding test specimens vertically one upon other, where guiding rails are arranged partially one upon other |
| 08/30/2007 | DE102006008539A1 Error condition simulating method for use in control device, involves connecting circuit points of device to be tested with points of fault generation circuit across multiplexer, and multiplexer is implemented using relay technology |
| 08/30/2007 | DE102006008486A1 Circuit arrangement for use on printed circuit board, has capacitor picking measuring voltage potential on secondary side, and determination device determining whether measuring voltage potential lies in permissible range or not |
| 08/30/2007 | DE102006007847A1 Vorrichtung und Verfahren zur Anzeige wenigstens eines elektrischen Signals Apparatus and method for displaying at least an electrical signal |
| 08/30/2007 | DE102006007846A1 Signalanzeigevorrichtung zur Anzeige der Signale auf Signalwegen Signal display device for displaying the signals on signal paths |
| 08/30/2007 | DE102006007435A1 Verfahren zum Bestimmen einer Induktivität eines Motors A method for determining an inductance of a motor |
| 08/30/2007 | DE10116886B4 Verfahren zum Optimieren des Frequenzaufbereitungszuges eines Hochfrequenz-Überlagerungsempfängers A method for optimizing the frequency processing train of high-frequency heterodyne receiver |
| 08/30/2007 | CA2770476A1 Flow meter and method for detecting a cable fault in a cabling of the flow meter |
| 08/30/2007 | CA2768991A1 Flow meter and method for detecting a cable fault in a cabling of the flow meter |
| 08/30/2007 | CA2647385A1 Energy collection system using a collection device suspended from a support structure |
| 08/29/2007 | EP1826580A2 Testing circuit and testing method for semiconductor device and semiconductor chip |
| 08/29/2007 | EP1826579A1 Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan test |
| 08/29/2007 | EP1826578A2 Device for checking an electrical circuit board with a track |
| 08/29/2007 | EP1825284A1 System and method for measuring fuel cell voltage |
| 08/29/2007 | EP1825283A1 Using a parametric measurement unit to sense a voltage at a device under test |
| 08/29/2007 | EP1825282A1 Signal module with reduced reflections |
| 08/29/2007 | EP1825281A1 A system for testing and burning in of integrated circuits |
| 08/29/2007 | EP1825280A2 Using parametric measurement units as a source of power for a device under test |
| 08/29/2007 | EP1613374B1 System and method for monitoring power source longevity of an implantable medical device |
| 08/29/2007 | EP1171247B1 Four electrical contact testing machine for miniature electrical components and process of using |
| 08/29/2007 | EP1032912B1 Electronic assembly video inspection system |
| 08/29/2007 | EP1000498B1 Fault location in the access network |
| 08/29/2007 | CN200941560Y Vehicle digital displaying charger |
| 08/29/2007 | CN200941291Y OLED module tester |
| 08/29/2007 | CN200941114Y Three-phase three-line power source faults detecting circuit |
| 08/29/2007 | CN200941113Y Multipurpose pulse voltage tester |
| 08/29/2007 | CN200941112Y Combined electrician meter for automobile maintenance |
| 08/29/2007 | CN200941111Y Neutral point resistance information detection recorder |
| 08/29/2007 | CN200941110Y Multifunction cable detector |
| 08/29/2007 | CN101027766A Semiconductor integrated circuit device and method for inspecting the same, semiconductor wafer and burn-in inspection apparatus |
| 08/29/2007 | CN101027568A Dynamic line rating system with real-time tracking of conductor creep to establish the maximum allowable conductor loading as limited by clearance |
| 08/29/2007 | CN101027567A Integrated circuit with input and/or output Bolton welding pads |
| 08/29/2007 | CN101027566A Test simulator, test simulation program and recording medium |
| 08/29/2007 | CN101027565A Method and device for detecting electric arc phenomenon on at least one electric cable |
| 08/29/2007 | CN101026254A Battery device and electronic equipment |
| 08/29/2007 | CN101026156A 半导体器件 Semiconductor devices |
| 08/29/2007 | CN101026021A Multi-layer test platform and production line test conveying method |
| 08/29/2007 | CN101025880A Display device and method of testing sensing unit thereof |
| 08/29/2007 | CN101025746A Method and machine-readable media for inferring relationships between test results |
| 08/29/2007 | CN101025745A Systems and methods for accumulation of summaries of test data |
| 08/29/2007 | CN101025437A Circuit for detecting remaining battery capacity |
| 08/29/2007 | CN101025436A High-voltage safety monitoring device for electric automobile |
| 08/29/2007 | CN101025435A Linear motor performance detecting device for track traffic |
| 08/29/2007 | CN101025434A Asynchronous motor stator winding inter-turn short circuit failure on-line detecting method and device |
| 08/29/2007 | CN101025433A Synthesis test synchronous control system |
| 08/29/2007 | CN101025432A System on a chip pipeline tester and method |
| 08/29/2007 | CN101025431A High power semiconduction tube test method and device |
| 08/29/2007 | CN101025430A Cage type asynchronous motor rotor strip-broken failure detecting method |
| 08/29/2007 | CN101025429A Method and device for on-line monitoring power cable metal sheath layer insulating state |
| 08/29/2007 | CN101025428A Radio frequency coaxial microband connector test sample and its test method |
| 08/29/2007 | CN101025427A Method for judging leakage current in integrated circuit and MOS element |
| 08/29/2007 | CN101025426A 探针组合体 Probe assembly |
| 08/29/2007 | CN101025425A Test fixture for clamping signal terminal and its assembling method |
| 08/29/2007 | CN100334916C Method and device for displaying cell voltage margin of cell phone |
| 08/29/2007 | CN100334906C Mobile telephone |
| 08/29/2007 | CN100334702C Method for testing state settings of chip set |
| 08/29/2007 | CN100334460C Method for precise estimated secondary battery significant fully discharge capacity |
| 08/29/2007 | CN100334459C Organic luminescent display pixel testing method and apparatus |
| 08/29/2007 | CN100334458C Malfunction route selection method for resonant grounded system based on current decomposition and wattles detection |
| 08/29/2007 | CN100334457C Method and system for measuring coercive field strength of ferroelectrics |
| 08/29/2007 | CN100334456C Method and apparatus for distinguishing cable by simultaneous supplying of tone and intermittent link |
| 08/29/2007 | CN100334455C Pulse width measuring apparatus with auto-range setting function |
| 08/29/2007 | CN100334441C Method and device for inspecting an array of electronic components |
| 08/28/2007 | US7263679 Semiconductor integrated circuit device with boundary scan test and design automation apparatus, boundary scan test method and program |
| 08/28/2007 | US7263643 Test apparatus and testing method |
| 08/28/2007 | US7263642 Testing replicated sub-systems in a yield-enhancing chip-test environment using on-chip compare to expected results for parallel scan chains testing critical and repairable sections of each sub-system |
| 08/28/2007 | US7263641 Phase shifter with reduced linear dependency |
| 08/28/2007 | US7263640 LSI, test pattern generating method for scan path test, LSI inspecting method, and multichip module |
| 08/28/2007 | US7263639 Combinatorial at-speed scan testing |
| 08/28/2007 | US7263478 System and method for design verification |
| 08/28/2007 | US7263449 Method for determining poor performing cells |
| 08/28/2007 | US7263277 Control signal transmitting and receiving techniques for video/audio processing IC and apparatus therefor |
| 08/28/2007 | US7263216 Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof |
| 08/28/2007 | US7263150 Probability estimating apparatus and method for peak-to-peak clock skews |
| 08/28/2007 | US7263134 Ethernet transceiver with single-state decision feedback equalizer |
| 08/28/2007 | US7263062 Transmission apparatus with a function to switch a line in the event of a transmission failure |
| 08/28/2007 | US7263060 Multiple switch protected architecture |
| 08/28/2007 | US7262864 Method and apparatus for determining grid dimensions using scatterometry |
| 08/28/2007 | US7262852 Wafer-level testing of optical and optoelectronic chips |
| 08/28/2007 | US7262628 Digital calibration with lossless current sensing in a multiphase switched power converter |
| 08/28/2007 | US7262627 Measuring apparatus, measuring method, and test apparatus |
| 08/28/2007 | US7262626 Connection apparatus and cable assembly for semiconductor-device characteristic measurement apparatus |
| 08/28/2007 | US7262625 Increased yield manufacturing for integrated circuits |
| 08/28/2007 | US7262624 Bi-directional buffer for interfacing test system channel |
| 08/28/2007 | US7262623 Method for gross I/O functional test at wafer sort |
| 08/28/2007 | US7262622 Wafer-level package for integrated circuits |
| 08/28/2007 | US7262621 Method and apparatus for integrated mixed-signal or analog testing |
| 08/28/2007 | US7262620 Resource matrix, system, and method for operating same |
| 08/28/2007 | US7262619 Semiconductor device test system |
| 08/28/2007 | US7262618 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
| 08/28/2007 | US7262616 Apparatus, method and system for testing electronic components |