| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/04/2007 | US7266740 Methods of testing a digital frequency synthesizer in a programmable logic device using a reduced set of multiplier and divider values |
| 09/04/2007 | US7266739 Systems and methods associated with test equipment |
| 09/04/2007 | US7266735 Semiconductor device having ECC circuit |
| 09/04/2007 | US7266464 Dynamic cut-off frequency varying filter |
| 09/04/2007 | US7266432 Method of diagnosing an electronic control unit |
| 09/04/2007 | US7266235 Pattern inspection method and apparatus |
| 09/04/2007 | US7266083 Method and apparatus for implementing queue pair connection protection over infiniband |
| 09/04/2007 | US7266081 Method and system for arranging data flow control in a data transfer system |
| 09/04/2007 | US7266080 Access based on a rate in a wireless communication system |
| 09/04/2007 | US7265953 Power supply boost control device and method for identifying and judging fault location in power supply boost control device |
| 09/04/2007 | US7265949 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 09/04/2007 | US7265639 Methods and apparatus for ring oscillator based MOSFET gate capacitance measurements |
| 09/04/2007 | US7265637 Startup/yank circuit for self-biased phase-locked loops |
| 09/04/2007 | US7265579 Field programmable gate array incorporating dedicated memory stacks |
| 09/04/2007 | US7265578 In-system programming of non-JTAG device using SPI and JTAG interfaces of FPGA device |
| 09/04/2007 | US7265572 Image display device and method of testing the same |
| 09/04/2007 | US7265571 Method and device for determining a characteristic of a semiconductor sample |
| 09/04/2007 | US7265570 Integrated circuit testing module |
| 09/04/2007 | US7265569 Test apparatus |
| 09/04/2007 | US7265568 Semi-conductor component test process and a system for testing semi-conductor components |
| 09/04/2007 | US7265567 First die indicator for integrated circuit wafer |
| 09/04/2007 | US7265566 Semiconductor component arrangement having a temperature-based defect identification |
| 09/04/2007 | US7265565 Cantilever microprobes for contacting electronic components and methods for making such probes |
| 09/04/2007 | US7265564 Method for testing a contact region of a semiconductor module |
| 09/04/2007 | US7265563 Test method for semiconductor components using anisotropic conductive polymer contact system |
| 09/04/2007 | US7265562 Cantilever microprobes for contacting electronic components and methods for making such probes |
| 09/04/2007 | US7265561 Device burn in utilizing voltage control |
| 09/04/2007 | US7265556 System and method for adaptable testing of backplane interconnections and a test tool incorporating the same |
| 09/04/2007 | US7265555 Loop impedance meter |
| 09/04/2007 | US7265536 Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station |
| 09/04/2007 | US7265535 Circuit configuration for providing of a diagnostic signal for a power switching device |
| 09/04/2007 | US7265534 Test system for device characterization |
| 09/04/2007 | US7265533 Non-intrusive power monitor |
| 09/04/2007 | US7265518 Method of automatically cutting off power in case of low battery voltage in mobile electronic unit |
| 09/04/2007 | US7264535 Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge model |
| 09/04/2007 | US7263759 Methods of manufacturing and testing bonding wires |
| 09/04/2007 | CA2425609C Method for locating defects and measuring resistance in a test structure |
| 09/03/2007 | CA2580998A1 Adaptive analysis methods |
| 08/30/2007 | WO2007098426A2 Methods and apparatus for data analysis |
| 08/30/2007 | WO2007098341A2 Energy collection |
| 08/30/2007 | WO2007098332A2 Electrical interconnect interface and wire harness test and test development system and method |
| 08/30/2007 | WO2007098313A2 Short range booster |
| 08/30/2007 | WO2007098167A2 Multi-stage test response compactors |
| 08/30/2007 | WO2007098153A2 Method and apparatus for strain monitoring of printed circuit board assemblies |
| 08/30/2007 | WO2007097579A1 Test tray for test handler |
| 08/30/2007 | WO2007097234A1 Method for fabricating connecting jig, and connecting jig |
| 08/30/2007 | WO2007097207A1 Inspecting method, inspecting apparatus and control program |
| 08/30/2007 | WO2007097190A1 Abnormality judgment device and abnormality judgment method of power supply unit |
| 08/30/2007 | WO2007097087A1 Electronic device testing apparatus and electronic device testing method |
| 08/30/2007 | WO2007097053A1 Semiconductor integrated circuit and method for inspecting same |
| 08/30/2007 | WO2007096210A1 Method and circuit arrangement for simulating fault states in a control device |
| 08/30/2007 | WO2007096021A1 Method for determining a motor's inductance |
| 08/30/2007 | WO2007095893A1 Method for controlling solar power plants |
| 08/30/2007 | WO2007095890A1 Device for monitoring a series resonant circuit of an antenna |
| 08/30/2007 | WO2007095758A1 Apparatus and method for detecting output power from an amplifier |
| 08/30/2007 | WO2007080163A3 Method and electronic regulator with a current measuring circuit for measuring the current by sense-fet and sigma-delta modulation |
| 08/30/2007 | WO2007079477A3 Apparatus and method for test structure inspection |
| 08/30/2007 | WO2007078721A3 Test equipment positional control manipulator |
| 08/30/2007 | WO2007044286A3 Memory scan testing |
| 08/30/2007 | WO2007022431A3 Test device for applying and measuring contact pressure on wires |
| 08/30/2007 | WO2006130830A3 System and method for measuring traffic and flow matrices |
| 08/30/2007 | WO2004111768A3 Correcting test system calibration and transforming device measurements when using multiple test fixtures |
| 08/30/2007 | US20070204246 Method and system for logic verification using mirror interface |
| 08/30/2007 | US20070204201 High reliability memory module with a fault tolerant address and command bus |
| 08/30/2007 | US20070204200 High reliability memory module with a fault tolerant address and command bus |
| 08/30/2007 | US20070204194 Testing of multiple asynchronous logic domains |
| 08/30/2007 | US20070204193 Microcontroller for logic built-in self test (lbist) |
| 08/30/2007 | US20070204192 Method for detecting defects of a chip |
| 08/30/2007 | US20070204191 Method for detecting a malfunction in a state machine |
| 08/30/2007 | US20070203662 Testing circuit and testing method for semiconductor device and semiconductor chip |
| 08/30/2007 | US20070202617 Method for fabricating stacked semiconductor components with through wire interconnects |
| 08/30/2007 | US20070202616 Structure and method for reliability evaluation of fcpbga substrates for high power semiconductor packaging applications |
| 08/30/2007 | US20070202615 Method of measuring critical dimension |
| 08/30/2007 | US20070202371 Cell voltage detection device and cell system using the same |
| 08/30/2007 | US20070202370 Power System And Management Method Thereof |
| 08/30/2007 | US20070201373 Portable interactive apparatus and method for providing service information |
| 08/30/2007 | US20070200590 Saturation detection circuits |
| 08/30/2007 | US20070200589 Test apparatus and test method for liquid crystal display device |
| 08/30/2007 | US20070200588 Fiducial markings for quality verification of high density circuit board connectors |
| 08/30/2007 | US20070200587 Versatile semiconductor test structure array |
| 08/30/2007 | US20070200586 Method of testing for power and ground continuity of a semiconductor device |
| 08/30/2007 | US20070200585 Semiconductor wafer, semiconductor chip, semiconductor device, and wafer testing method |
| 08/30/2007 | US20070200584 High frequency cantilever-type probe card |
| 08/30/2007 | US20070200583 Plunger and chip-testing module applying the same |
| 08/30/2007 | US20070200582 Probe and method of manufacturing a probe |
| 08/30/2007 | US20070200581 Automated characterization system for laser chip on a submount |
| 08/30/2007 | US20070200580 Wafer probe |
| 08/30/2007 | US20070200579 Integrated circuit load board and method having on-board test circuit |
| 08/30/2007 | US20070200578 Probe assembly |
| 08/30/2007 | US20070200577 Probe repair methods |
| 08/30/2007 | US20070200576 Multi-layered probes |
| 08/30/2007 | US20070200575 Circuit and method for error test, recordation, and repair |
| 08/30/2007 | US20070200574 Sheet-like probe, method of producing the probe, and application of the probe |
| 08/30/2007 | US20070200573 Auto-measuring universal meter |
| 08/30/2007 | US20070200572 Structure for coupling probes of probe device to corresponding electrical contacts on product substrate |
| 08/30/2007 | US20070200571 Verifying individual probe contact using shared tester channels |
| 08/30/2007 | US20070200570 Test fixture for holding signal terminals and related method for assembling the test fixture |
| 08/30/2007 | US20070200569 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus |
| 08/30/2007 | US20070200557 Grid system selection supporting device, grid system selection supporting method and storage medium |
| 08/30/2007 | US20070200556 Dynamic line rating system with real-time tracking of conductor creep to establish the maximum allowable conductor loading as limited by clearance |