| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/26/2007 | CN101093903A Method for maintaining online capacity of accumulator for communication power supply |
| 12/26/2007 | CN101093498A Apparatus for storing variable values to provide context for test results that are to be formatted |
| 12/26/2007 | CN101093470A Technique of integrate circuit, and data analysis method of semiconductor technique |
| 12/26/2007 | CN101093246A Intellectualized online system for testing illuminating quality of headlight of an automobile built from LED |
| 12/26/2007 | CN101093245A Apparatus and method for detecting battery pack voltage |
| 12/26/2007 | CN101093244A Semiconductor device, semiconductor device testing method, and probe card |
| 12/26/2007 | CN101093243A Semiconductor integrated circuit |
| 12/26/2007 | CN101093242A Testing apparatus |
| 12/26/2007 | CN101093241A Test equipment of steady state operation life in use for controlling junction temperature of transistor |
| 12/26/2007 | CN101093240A Method for determining lightning strike point on electric power transmission line |
| 12/26/2007 | CN101093239A Online detection and remote diagnosis system for automated power station |
| 12/26/2007 | CN101093230A Clamp in use for testing LED |
| 12/26/2007 | CN100358180C Method for estimating polarization voltage of secondary cell, method and device for estimating remaining capacity of secondary cell, battery pack system, and vehicle |
| 12/26/2007 | CN100358122C Apparatus and method for testing conductive bumps |
| 12/26/2007 | CN100358078C Method for observing and controlling colour picture tube light-spot, convergence and grating |
| 12/26/2007 | CN100357755C Testing method for effective diffusion length of solar cell |
| 12/26/2007 | CN100357754C Integrated circuit with test circuit |
| 12/26/2007 | CN100357753C Test arrangement and method for selecting a test mode output channel |
| 12/26/2007 | CN100357752C Line defect detection maintenance equipment and method |
| 12/26/2007 | CN100357751C JTAG module and debug method applying the module |
| 12/26/2007 | CN100357750C Device for detecting linear array charge coupling device functionality |
| 12/26/2007 | CN100357749C Zero-line and breakage detector of three-phase and four-line system |
| 12/26/2007 | CN100357748C Group wiring system capable of performing wire pairs identification and method thereof |
| 12/26/2007 | CN100357743C Method and apparatus for taking and putting electronic elements waiting for measurement |
| 12/25/2007 | US7313747 Measuring microprocessor susceptibility to internal noise generation |
| 12/25/2007 | US7313746 Test output compaction for responses with unknown values |
| 12/25/2007 | US7313745 Decoder for pin-based scan test |
| 12/25/2007 | US7313744 Methods and apparatus for testing a scan chain to isolate defects |
| 12/25/2007 | US7313743 Hybrid scan-based delay testing technique for compact and high fault coverage test set |
| 12/25/2007 | US7313742 Logic circuitry having self-test function |
| 12/25/2007 | US7313741 Integrated semiconductor memory |
| 12/25/2007 | US7313740 Internally generating patterns for testing in an integrated circuit device |
| 12/25/2007 | US7313739 Method and apparatus for testing embedded cores |
| 12/25/2007 | US7313738 System and method for system-on-chip interconnect verification |
| 12/25/2007 | US7313129 Arrangement for sharing a single signaling point code between multiple hosts in an IP-based network |
| 12/25/2007 | US7313099 Phase system rotation for power estimation |
| 12/25/2007 | US7313089 Method and apparatus for switching between active and standby switch fabrics with no loss of data |
| 12/25/2007 | US7313088 Common protection architecture for optical network |
| 12/25/2007 | US7313087 Distributed protection switching |
| 12/25/2007 | US7312970 Low cost surge protection |
| 12/25/2007 | US7312625 Test circuit and method of use thereof for the manufacture of integrated circuits |
| 12/25/2007 | US7312623 Wafer-level tester with magnet to test latching micro-magnetic switches |
| 12/25/2007 | US7312622 Wafer level testing for RFID tags |
| 12/25/2007 | US7312621 Semiconductor test unit having low contact resistance with examined electronic products, semiconductor contact board, method for testing semiconductor device, semiconductor device, and method for manufacturing thereof |
| 12/25/2007 | US7312620 Burn-in testing apparatus and method |
| 12/25/2007 | US7312619 Multiple local probe measuring device and method |
| 12/25/2007 | US7312618 Method and system for compensating thermally induced motion of probe cards |
| 12/25/2007 | US7312617 Space transformers employing wire bonds for interconnections with fine pitch contacts |
| 12/25/2007 | US7312614 Commutator for power supply testing |
| 12/25/2007 | US7312613 Method for network diagnostic |
| 12/25/2007 | US7312612 Circuit for detecting electric current |
| 12/25/2007 | US7312608 Systems and methods for inspecting electrical conductivity in composite materials |
| 12/25/2007 | US7312606 Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor |
| 12/25/2007 | US7312605 AC power supply testing module and method for booting a main board |
| 12/25/2007 | US7312604 Portable manipulator for stackable semiconductor test system |
| 12/25/2007 | US7312522 Mounting member of semiconductor device, mounting configuration of semiconductor device, and drive unit of semiconductor device |
| 12/21/2007 | WO2007147099A2 Device testing architecture, and method, and system |
| 12/21/2007 | WO2007147048A2 Protocol manager for massive multi-site test |
| 12/21/2007 | WO2007147000A2 Exhaustive diagnosis of bridging defects in an integrated circuit |
| 12/21/2007 | WO2007146584A2 Contactor having a global spring structure and methods of making and using the contactor |
| 12/21/2007 | WO2007146583A2 Method of designing an application specific probe card test system |
| 12/21/2007 | WO2007146582A2 Ac coupled parametric test probe |
| 12/21/2007 | WO2007146581A2 Method of expanding tester drive and measurement capability |
| 12/21/2007 | WO2007146291A2 Method and apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrate |
| 12/21/2007 | WO2007146285A2 Differential signal probe with integral balun |
| 12/21/2007 | WO2007146186A2 Knee probe having increased scrub motion |
| 12/21/2007 | WO2007145968A2 Methods and apparatus for multi-modal wafer testing |
| 12/21/2007 | WO2007145728A2 A test structure and probe for differential signals |
| 12/21/2007 | WO2007145670A2 Static instrumentation macros for fast declaration free dynamic probes |
| 12/21/2007 | WO2007145156A1 Substrate inspecting device |
| 12/21/2007 | WO2007145053A1 Electromagnetically coupled module, wireless ic device inspecting system, electromagnetically coupled module using the wireless ic device inspecting system, and wireless ic device manufacturing method |
| 12/21/2007 | WO2007144971A1 Semiconductor defect analysis device, defect analysis method, and defect analysis program |
| 12/21/2007 | WO2007144970A1 Semiconductor defect analysis device, defect analysis method, and defect analysis program |
| 12/21/2007 | WO2007144969A1 Semiconductor defect analysis device, defect analysis method, and defect analysis program |
| 12/21/2007 | WO2007144866A1 A personal repeater for cellular networks |
| 12/21/2007 | WO2007144789A2 Instrument and method for measuring partial electrical discharges in an electrical system |
| 12/21/2007 | WO2007144035A1 Apparatus for parallel/serial conversion of a plurality of signal variables which are each detected by a detector |
| 12/21/2007 | WO2007144003A2 A test bench and a method for testing wind turbine equipment |
| 12/21/2007 | WO2007119030A3 Method and device for characterising sensitivity to energy interactions in an electronic component |
| 12/21/2007 | WO2007118770A3 Method and apparatus for determining jitter and pulse width from clock signal comparisons |
| 12/21/2007 | WO2007115196A3 Integrated circuit with improved test capability via reduced pin count |
| 12/21/2007 | WO2007109460A3 Method for distinguishing a first group of wires from other wires of a multi-wire cable, test connector for use in this method and a kit comprising such a multiwire cable and test connector |
| 12/21/2007 | WO2007092901A3 Systems and methods of improving performance of transport protocols |
| 12/21/2007 | WO2007062419A3 Diagnostic tool and method for troubleshooting multicast connectivity flow problem(s) in a layer 2 aggregation network |
| 12/21/2007 | WO2006133269A3 Control message management in physical layer repeater |
| 12/21/2007 | WO2006113884A3 Low power transmission provisioning for wireless network devices |
| 12/21/2007 | WO2006093919B1 Capacity degradation in a lead acid battery method and apparatus |
| 12/21/2007 | WO2006083959A3 Network diagnostic system and methods for aggregated links |
| 12/21/2007 | CA2656645A1 A test bench and a method for testing wind turbine equipment |
| 12/21/2007 | CA2655287A1 Apparatus for capturing multiple data packets in a data signal for analysis |
| 12/20/2007 | US20070294606 Accelerating scan test by re-using response data as stimulus data |
| 12/20/2007 | US20070294605 Circuit configuration with serial test interface or serial test operating-mode procedure |
| 12/20/2007 | US20070294342 Specifying products over a network |
| 12/20/2007 | US20070294341 Pricing products over a network |
| 12/20/2007 | US20070294053 Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program |
| 12/20/2007 | US20070292996 Method and structure to process thick and thin fins and variable fin to fin spacing |
| 12/20/2007 | US20070292976 Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate |
| 12/20/2007 | US20070292018 Semiconductor failure analysis apparatus, failure analysis method, and failure analysis program |
| 12/20/2007 | US20070291819 Arrangement for Monitoring an Installation for Thermal Stresses |
| 12/20/2007 | US20070291660 Mesh Network Evaluation Methods |