Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2007
12/05/2007CN101084445A Method and system for testing semiconductor device
12/05/2007CN101084444A Pin electronics with high voltage functionality
12/05/2007CN101084443A Vacuum ring designs for electrical contacting improvement
12/05/2007CN101083862A Deuterium lamp lighting detection recognizing device
12/05/2007CN101083507A IEEE1149.1 protocol based universal test IP method
12/05/2007CN101083255A Device package and methods for the fabrication and testing thereof
12/05/2007CN101083218A Chip for measuring Ohm contact deterioration failure of semicondutor device and its measuring method
12/05/2007CN101083189A Device to recognise components mounted in the fuse cartridge or similar devices
12/05/2007CN101082656A Circuit for detecting end of life of fluorescent lamp
12/05/2007CN101082655A Switch power source EMI noise origin internal impedance test system and measuring method thereof
12/05/2007CN101082654A Micro miniature air gap inspection crawler
12/05/2007CN101082653A Flying vehicle power functional failure simulation equipment and method thereof
12/05/2007CN101082652A Tester used for testing operating reliability of capsule cabin oxygen distribute loop
12/05/2007CN101082651A ICDetecting machine
12/05/2007CN101082650A 记忆卡检测机 Memory Card Inspection Machine
12/05/2007CN101082649A Method for testing three phases power supply of flying vehicle and tool set
12/05/2007CN101082648A Method and apparatus for testing flying vehicle electric systemic
12/05/2007CN101082647A Telephone set detector
12/05/2007CN101082646A Two terminal electron component characteristic integrated tester
12/05/2007CN101082641A Signal line tester of flight control system for testing airplane THS motor
12/05/2007CN101082638A Transmission line used for internal circuit test point
12/05/2007CN101082636A Method for detecting tips of probes, alignment method and storage medium storing the methods, and probe apparatus
12/05/2007CN101082635A Memory bank testing device
12/05/2007CN101082634A Checking tool for printed circuit-board
12/05/2007CN101082633A IC detecting machine capable of simultaneously multiple parallel built-in testing
12/05/2007CN101082632A Testing tool for circuit board
12/05/2007CN101082631A IC detecting machine capable of simultaneously multiple parallel built-in testing
12/05/2007CN100353678C Application-specific integrated circuits checking apparatus and method based on peripherial element expansion interface card
12/05/2007CN100353639C Photoelectricity triggering and detecting system for static reactive-load compensation equipment based on multi-mode optical fibre
12/05/2007CN100353630C Circuit longitudinal differential protection braking curve and closed locking angle testing method
12/05/2007CN100353462C Method for characterizing active track and latch sense-amp (comparator) in one time programmable (OTP) salicided poly fuse array
12/05/2007CN100353461C Test method for testing data memory
12/05/2007CN100353364C Test mode control circuit for reconfiguring a device pin of an integrated circuit chip
12/05/2007CN100353175C Test device for small breaker reliability
12/05/2007CN100353174C Positioning method for detecting flip-chip substrate
12/05/2007CN100353173C Device and method for accessing hidden data in boundary scan test interface
12/05/2007CN100353172C Group delay test method and device thereof
12/05/2007CN100353171C Sample holder in use for measuring spectrum of photoluminescence of electrical modulation
12/05/2007CN100353170C Controller of auto detector for dielectric strength between sheets of commutator
12/04/2007US7305604 Determining edge relationship between clock signals
12/04/2007US7305603 Boundary scan cell and methods for integrating and operating the same
12/04/2007US7305602 Merged MISR and output register without performance impact for circuits under test
12/04/2007US7305601 Method and test apparatus for testing integrated circuits using both valid and invalid test data
12/04/2007US7305600 Partial good integrated circuit and method of testing same
12/04/2007US7305599 Testing propagation delay of a shift register using a ring oscillator
12/04/2007US7305598 Test clock generation for higher-speed testing of a semiconductor device
12/04/2007US7305320 Metrology tool recipe validator using best known methods
12/04/2007US7305029 Multi-pair gigabit ethernet transceiver
12/04/2007US7305025 Measurement instrument and measurement method
12/04/2007US7304972 Method and device for establishing communication links and handling unbalanced traffic loads in a communication system
12/04/2007US7304958 Method and apparatus for analyzing events in a telecommunications system
12/04/2007US7304950 Two-wire interface having dynamically adjustable data fields depending on operation code
12/04/2007US7304949 Scalable link-level flow-control for a switching device
12/04/2007US7304947 Connection creation/termination using parallel cross-connection download/undownload processes
12/04/2007US7304943 Apparatus and method for bandwidth control
12/04/2007US7304492 Inspecting circuit layout for LCD panel and fabricating method for LCD panel
12/04/2007US7304491 Interconnect for testing semiconductor components
12/04/2007US7304490 In-situ wafer and probe desorption using closed loop heating
12/04/2007US7304489 Inspection method and inspection apparatus
12/04/2007US7304488 Shielded probe for high-frequency testing of a device under test
12/04/2007US7304487 Test method of semiconductor devices
12/04/2007US7304486 Nano-drive for high resolution positioning and for positioning of a multi-point probe
12/04/2007US7304485 Analysis of the quality of contacts and vias in multi-metal fabrication processes of semiconductor devices, method and test chip architecture
12/04/2007US7304482 Characterization of the nonlinearities of a display device by adaptive bisection with continuous user refinement
12/04/2007US7304481 Apparatus for testing electric cables
12/04/2007US7304467 Circuit for simultaneous testing of electricity meters with interconnected current and voltage circuits
12/04/2007US7304264 Micro thermal chamber having proximity control temperature management for devices under test
12/04/2007US7303929 Reloading of die carriers without removal of die carriers from sockets on test boards
12/04/2007US7303928 Process monitor and system for producing semiconductor
12/04/2007US7303845 Generating mask pattern data from design data under first condition, generating first corrected pattern data by applying optical proximity correction tofirst mask pattern data, generating second mask pattern data from design data under second condition, generating second corrected pattern, comparing
11/2007
11/29/2007WO2007137202A2 User interface for monitoring a plurality of faulted circuit indicators
11/29/2007WO2007137183A2 Magnetic probe apparatus and method for providing a wireless connection to a detection device
11/29/2007WO2007137065A2 Probe card and temperature stabilizer for testing semiconductor devices
11/29/2007WO2007136126A1 Accumulator charge/discharge control device and charge/discharge control method
11/29/2007WO2007135848A1 Work transfer apparatus and electronic component transfer apparatus
11/29/2007WO2007135847A1 Work transfer apparatus and electronic component transfer apparatus
11/29/2007WO2007135710A1 Electronic component testing apparatus
11/29/2007WO2007135709A1 Electronic component testing apparatus
11/29/2007WO2007135162A1 A method of detecting faults on an electrical power line
11/29/2007WO2007134427A1 System and method for monitoring temperature inside electric machines
11/29/2007WO2007134425A1 Fault monitoring of electric machines
11/29/2007WO2007113582A3 Fault detection
11/29/2007WO2007089937A3 High-speed capacitor leakage measurement systems and methods
11/29/2007WO2007079006B1 Connection verification technique
11/29/2007WO2006124916A3 Solid-state ethernet by-pass switch circuitry
11/29/2007WO2006113012A8 Determining quality of lubricating oils in use
11/29/2007WO2004073041A3 Testing embedded memories in an integrated circuit
11/29/2007US20070277130 System and method for architecture verification
11/29/2007US20070277071 Write-Side Calibration for Data Interface
11/29/2007US20070277070 Apparatus and method for checking an error detection functionality of a data processor
11/29/2007US20070277069 Serializer/deserializer circuit for jitter sensitivity characterization
11/29/2007US20070277068 System and Method of State Point Correspondence with Constrained Function Determination
11/29/2007US20070277067 Fault detection method and apparatus
11/29/2007US20070277066 System and method for more efficiently using error correction codes to facilitate memory device testing
11/29/2007US20070276648 Sequential tester for longest prefix search engines
11/29/2007US20070276623 Semiconductor Component Test Process and a System for Testing Semiconductor Components
11/29/2007US20070274345 Method and System for Out-of -Band Messaging Between Customer Premises Equipment and a Cabel Modem Termination System
11/29/2007US20070274206 Distributed beaconing periods for ad-hoc networks
11/29/2007US20070273419 Synchronizing measurement devices using trigger signals
11/29/2007US20070273400 Apparatus and Method for Electrical Characterization of Semiconductors
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