| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/29/2008 | US7323899 System and method for resumed probing of a wafer |
| 01/29/2008 | US7323898 Pin electronics driver |
| 01/29/2008 | US7323897 Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment |
| 01/29/2008 | US7323896 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 01/29/2008 | US7323895 Low-current pogo probe card |
| 01/29/2008 | US7323894 Needle alignment verification circuit and method for semiconductor device |
| 01/29/2008 | US7323893 Probe device capable of being used for plural kinds of testers |
| 01/29/2008 | US7323892 Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same |
| 01/29/2008 | US7323891 Method of testing a semiconductor chip and jig used in the method |
| 01/29/2008 | US7323890 Multi-point probe |
| 01/29/2008 | US7323889 Voltage testing and measurement |
| 01/29/2008 | US7323888 System and method for use in functional failure analysis by induced stimulus |
| 01/29/2008 | US7323882 System to place receptacles and distribution blocks |
| 01/29/2008 | US7323880 Ground circuit impedance measurement |
| 01/29/2008 | US7323879 Method and circuit for measuring capacitance and capacitance mismatch |
| 01/29/2008 | US7323878 Ground testing method and apparatus |
| 01/29/2008 | US7323877 Apparatus and methods for making spectroscopic measurements of cathode fall in fluorescent lamps |
| 01/29/2008 | US7323862 Apparatus and method for detecting photon emissions from transistors |
| 01/29/2008 | US7323861 Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate |
| 01/29/2008 | US7323848 Battery charging state arithmetic operation device for calculating charging state of battery, and battery charging state arithmetic operation method |
| 01/29/2008 | US7323768 Voltage contrast monitor for integrated circuit defects |
| 01/29/2008 | US7323712 Anisotropically conductive connector and production process thereof, and probe member |
| 01/29/2008 | US7323116 Methods and apparatus for monitoring a process in a plasma processing system by measuring self-bias voltage |
| 01/29/2008 | CA2305402C Battery capacity measurement circuit |
| 01/24/2008 | WO2008011106A2 Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrate |
| 01/24/2008 | WO2008010919A2 Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrate |
| 01/24/2008 | WO2008009298A1 On-chip test circuit for an embedded comparator |
| 01/24/2008 | WO2008009105A1 Thin film transistor array having test circuitry |
| 01/24/2008 | WO2006137896A3 Metalized elastomeric probe structure |
| 01/24/2008 | WO2006106499A3 Dynamic bandwidth allocation based on partial cycles |
| 01/24/2008 | US20080022176 Semiconductor integrated circuit |
| 01/24/2008 | US20080022175 Program memory having flexible data storage capabilities |
| 01/24/2008 | US20080022174 Electronic circuit comprising a test mode secured by insertion of decoy data in the test chain, associated method |
| 01/24/2008 | US20080022173 Full scan solution for latched-based design |
| 01/24/2008 | US20080022172 Apparatus for testing system-on-chip |
| 01/24/2008 | US20080022171 Mechanism to provide test access to third-party macro circuits embedded in an asic (application-specific integrated circuit) |
| 01/24/2008 | US20080022170 Semiconductor memory device capable of arbitrarily setting the number of memory cells to be tested and related test method |
| 01/24/2008 | US20080022169 Test system and method |
| 01/24/2008 | US20080022168 Systems and Methods for Chip Testing |
| 01/24/2008 | US20080022165 Communications System For Implementation Of Synchronous, Multichannel, Galvanically Isolated Instrumentation Devices |
| 01/24/2008 | US20080021668 Apparatus and method for inspection of electronic devices |
| 01/24/2008 | US20080020676 Run-To-Run Control Of Backside Pressure For CMP Radial Uniformity Optimization Based On Center-To-Edge Model |
| 01/24/2008 | US20080020498 Fabrication method of semiconductor integrated circuit device |
| 01/24/2008 | US20080020495 Semiconductor fabricating apparatus with function of determining etching processing state |
| 01/24/2008 | US20080018371 Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device |
| 01/24/2008 | US20080018356 A system for acquiring device parameters |
| 01/24/2008 | US20080018355 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method |
| 01/24/2008 | US20080018353 Methods and apparatus for releasably mounting a semiconductor device to a printed circuit board |
| 01/24/2008 | US20080018352 Prober and probe contact method |
| 01/24/2008 | US20080018351 Toolless method for alignment, retention, connection, termination and test on printed circuit boards |
| 01/24/2008 | US20080018350 Test probe for integrated circuits with ultra-fine pitch terminals |
| 01/24/2008 | US20080018349 Method for testing electrical elements using an indirect photoelectric effect |
| 01/24/2008 | US20080018341 Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrate |
| 01/24/2008 | US20080018340 Method for Determining Loop Impedance Active and Reactive Components of an Alternative Current Network |
| 01/24/2008 | US20080018339 Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| 01/24/2008 | US20080018338 Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same |
| 01/24/2008 | US20080018324 Voltage-impressed current measuring apparatus and current buffers with switches used therefor |
| 01/24/2008 | US20080018323 Apparatus for Measuring Electric Characteristics of Semiconductor |
| 01/24/2008 | US20080018285 Method and circuit for testing motor |
| 01/24/2008 | US20080018284 Ac Rotary Machine Constant Measuring Apparatus For Measuring Constants Of Stationary Ac Rotary Machine |
| 01/24/2008 | US20080017856 Wafer and semiconductor device testing method |
| 01/24/2008 | US20080017700 Semiconductor device and an information management system therefor |
| 01/24/2008 | US20080017367 Method, Device and System for Controlling Heating Circuits |
| 01/24/2008 | DE19707485B4 Haltevorrichtung und Haltebaugruppe für ein Leiterplatten-Prüfgerät Holding device and support assembly for a printed circuit board testing device |
| 01/24/2008 | DE10349462B4 Schaltungsanordnung zum Überprüfen eines Potentiometers Circuit arrangement for checking a potentiometer |
| 01/24/2008 | DE102007027727A1 Device for detecting fault current in electrical circuits in machines, has electromagnetic filter, which is connected with measuring device for detecting fault current |
| 01/24/2008 | DE102007025993A1 Verfahren zum Erfassen einer Schichtung in einer Batterie A method for detecting a stratification in a battery |
| 01/24/2008 | DE102006033629A1 Battery e.g. lithium-iron battery, condition e.g. internal resistance, determining method for vehicle, involves classifying cells based on condition of battery, and evaluating cells with worse condition in diagnostic procedure |
| 01/24/2008 | CA2658007A1 Combophone with qos on cable access |
| 01/24/2008 | CA2657285A1 Apparatus for testing an arc fault circuit interrupter |
| 01/23/2008 | EP1881333A1 Monitoring battery cell voltage |
| 01/23/2008 | EP1881332A2 Positioning unit for optical and/or electric test systems |
| 01/23/2008 | EP1881331A1 Testing device, diagnostic program, and diagnostic method |
| 01/23/2008 | EP1880555A1 Network connection sensing assembly |
| 01/23/2008 | EP1880457A2 Electronic overload relay for mains-fed induction motors |
| 01/23/2008 | EP1880225A2 Method for determining the condition of a long body |
| 01/23/2008 | EP1879836A2 Porcelain enamel having a metallic appearance |
| 01/23/2008 | EP1607758B1 Test apparatus |
| 01/23/2008 | EP1497666A4 Flexible streaming hardware |
| 01/23/2008 | EP1483596B1 Integrated circuit with test circuit |
| 01/23/2008 | CN201011611Y Electrical measuring clamp for LCD device |
| 01/23/2008 | CN201011522Y Electronic load for energy conversion |
| 01/23/2008 | CN201011521Y Automatic real-time monitor for vehicle mounted electrical apparatus circuit |
| 01/23/2008 | CN201008750Y Lithium cell against overdischarging device of telecontrolling model helicopter |
| 01/23/2008 | CN101111776A Semiconductor integrated circuit and system lsi |
| 01/23/2008 | CN101111775A System and scanout circuits with error resilience circuit |
| 01/23/2008 | CN101111774A Programmable devices to route signals on probe cards |
| 01/23/2008 | CN101110590A Method and device for phase adjustment in the course of detecting time sequence allowance |
| 01/23/2008 | CN101110050A Picture processing chip for self-adapting automatic dead point detection and method thereof |
| 01/23/2008 | CN101109789A Intelligent analyzing test bench for performance of electric car storage battery |
| 01/23/2008 | CN101109788A Intelligent brake switching test fixture of breaker |
| 01/23/2008 | CN101109787A Intelligent detecting device for under-voltage releasing equipment of breaker |
| 01/23/2008 | CN101109786A Method for detecting data loss of field programmable gate array |
| 01/23/2008 | CN101109785A Product multiplexed test board for integrated circuit high temperature dynamic aging |
| 01/23/2008 | CN101109784A Testing method for integrated circuit high temperature dynamic aging and testing device thereof |
| 01/23/2008 | CN101109783A Electrical parameter testing circuit for light emitting diode |
| 01/23/2008 | CN101109782A Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| 01/23/2008 | CN101109781A Method for judging trouble point position of series compensated lines one-phase grounding |
| 01/23/2008 | CN101109780A Method for predicting turbine generator insulating thermal aging life |
| 01/23/2008 | CN101109779A Method for predicting turbine generator insulating thermal aging life |