Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2007
12/27/2007US20070296455 Disconnection and short detecting circuit that can detect disconnection and short of a signal line transmitting a differential clock signal
12/27/2007US20070296454 Power supply assembly and semiconductor testing system using same
12/27/2007US20070296453 Display element
12/27/2007US20070296452 Flexible display testing and inspection
12/27/2007US20070296451 LCD test device and test process thereof
12/27/2007US20070296450 Testing device
12/27/2007US20070296449 Methods and apparatus for multi-modal wafer testing
12/27/2007US20070296448 Burn-in sorter and sorting method using the same
12/27/2007US20070296447 Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect
12/27/2007US20070296446 Operation monitor system, semiconductor apparatus, and information collection apparatus
12/27/2007US20070296445 Semiconductor Chip Flipping Assembly and Apparatus For Bonding Semiconductor Chip Using The Same
12/27/2007US20070296444 Test structure for measuring electrical and dimensional characteristics
12/27/2007US20070296443 Exhaustive diagnosis of bridging defects in an integrated circuit
12/27/2007US20070296442 Method and Apparatus for Measuring Device Mismatches
12/27/2007US20070296441 Method and Apparatus for Die Testing on Wafer
12/27/2007US20070296440 Semiconductor integrated circuit apparatus, measurement result management system, and management server
12/27/2007US20070296439 Test structure for monitoring leakage currents in a metallization layer
12/27/2007US20070296438 Method for optimizing probe card design
12/27/2007US20070296437 Mini-prober for tft-lcd testing
12/27/2007US20070296436 Electrical test probes with a contact element, methods of making and using the same
12/27/2007US20070296435 AC coupled parameteric test probe
12/27/2007US20070296434 Temperature control method and apparatus and test method and apparatus of semiconductor devices
12/27/2007US20070296433 Contactor having a global spring structure and methods of making and using the contactor
12/27/2007US20070296432 Measurement board for electronic device test apparatus
12/27/2007US20070296431 Membrane probing system with local contact scrub
12/27/2007US20070296430 Control method and control program for prober
12/27/2007US20070296429 Probe contacting electrode and electronic device
12/27/2007US20070296428 Semiconductor device having supply voltage monitoring function
12/27/2007US20070296427 Method for detecting tips of probes, alignment method and storage medium storing the methods, and probe apparatus
12/27/2007US20070296426 Prober for electronic device testing on large area substrates
12/27/2007US20070296425 Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same
12/27/2007US20070296424 Method and apparatus for a paddle board probe card
12/27/2007US20070296423 Double-sided wafer probe
12/27/2007US20070296422 Method of Expanding Tester Drive and Measurement Capability
12/27/2007US20070296420 Device For Testing Connectivity Of A Connector Including Spring Contact Pins
12/27/2007US20070296419 Insert and Pusher of Electronic Device Handling Apparatus, Socket Guide for Test Head, and Electronic Device Handling Apparatus
12/27/2007US20070296418 Flexible Continuity and Circuit Tester
12/27/2007US20070296416 Circuit for detecting end of life of fluorescent lamp
12/27/2007US20070296403 Semiconductor device, unique ID of semiconductor device and method for verifying unique ID
12/27/2007US20070296402 Adapter for positioning of contact tips
12/27/2007US20070296401 Interleaved Differential Multiplexer
12/27/2007DE19940434B4 Vorrichtung und Verfahren zur Anzeige von Signalwerten Apparatus and method for displaying signal values
12/27/2007DE19860560B4 Verwendung einer gebrauchten Wolfram-Prüfmesssonde Use a used tungsten Prüfmesssonde
12/27/2007DE10249599B4 Sicherheitsschaltung für analoge Sensoren Safety circuit for analog sensors
12/27/2007DE102007026132A1 Verfahren und Vorrichtung zum Quantifizieren von Effekten der Temperatur in Untätigkeitsperioden auf eine Speichereinrichtung für elektrische Energie Method and device for quantifying the effects of temperature in periods of inactivity to a storage device for electrical energy
12/27/2007DE102006028923A1 Contact testing device, has spacer unit that is insertable into rear-sided deflection region of locking arm through access opening, where spacer unit and testing unit are arranged at test adapter
12/27/2007DE102006028414A1 Test method for integrated circuit, involves applying floating potential at each signal connection, and applying mass potential at mass connection
12/27/2007DE102006022160B3 Testvorrichtung mit HF-/UHF-Dualbandantenne zum Testen von RFID-Transpondern in einem Fertigungsgerät The test device with HF / UHF dual band antenna for testing of RFID transponders in a single production unit
12/27/2007CA2655500A1 Token based flow control for data communication
12/26/2007EP1870726A1 Test system for smart card and identification devices and the like
12/26/2007EP1870725A1 Test device, test method, electronic device manufacturing method, test simulator, and test simulation method
12/26/2007EP1870724A1 Test emulator, test module emulator and record medium storing program therein
12/26/2007EP1870723A1 Integrated circuit
12/26/2007EP1870722A1 System and method for thermal management and gradient reduction
12/26/2007EP1870721A1 Insulation inspecting apparatus
12/26/2007EP1870720A1 Terminal crimped state testing method
12/26/2007EP1870718A1 System for measuring the radiation diagram of a transmission antenna
12/26/2007EP1870289A1 Vehicle power supply device and its degradation judgment method
12/26/2007EP1869484A1 Apparatus and method for managing battery performance of a wireless device
12/26/2007EP1869483A1 Self-test circuit for high-definition multimedia interface integrated circuits
12/26/2007EP1869482A1 Pyrimidine derivatives
12/26/2007EP1869481A2 Rfid device test thresholds systems and methods
12/26/2007EP1869479A2 Voltage fault detection and protection
12/26/2007EP1869409A1 Sensor system
12/26/2007EP1868552A2 Monitoring system
12/26/2007EP1634088A4 A method and apparatus for measuring and analyzing electrical or electrochemical systems
12/26/2007EP1629562B1 Insulating mount structure, insulation monitoring system, and insulation monitoring method for fuel cells
12/26/2007EP1436636B1 Method and apparatus for sub-micron imaging and probing on probe station
12/26/2007EP0853657B1 Storage device for objects, storage station, and air-conditioned cabinet
12/26/2007CN200997424Y Accumulator voltage collecting module
12/26/2007CN200997262Y Initial high-voltage corrugated driving experimental circuit of grooved plasma display panel
12/26/2007CN200997179Y Thunder and lightning monitor recording network system
12/26/2007CN200997107Y Device for testing CMOS image senser
12/26/2007CN200997008Y Flexible-cable wire jumper containing metal detecting wire
12/26/2007CN200996993Y Frequency-variable serial resonant voltageproof experimental appliance
12/26/2007CN200996992Y Corrugating fast inspecter of micro-radar medical low-voltage power supply
12/26/2007CN200996991Y Switch power-supply tester
12/26/2007CN200996990Y Battery tester
12/26/2007CN200996989Y Workpiece clamp for lithium-ion battery internal-resistance voltage and laser sense code combined test
12/26/2007CN200996988Y Energy interfeedback experimental appliance of generater
12/26/2007CN200996987Y Electric switch state online inspecter of sensitive loading loop
12/26/2007CN200996986Y Digital circuit and system experimental platform
12/26/2007CN200996985Y Warning-light loop fault diagnostic device of automobile
12/26/2007CN200996984Y Wiring tester of electrical appliance socket
12/26/2007CN200996983Y Portable line checker
12/26/2007CN200996982Y Quartz crystal oscillater, its automatic testing loader
12/26/2007CN200996981Y Terminal-module tester
12/26/2007CN200996980Y Equipment for measuring terahertz time-domain spectrum
12/26/2007CN200996979Y Accumulator internal-resistance tester based on 485 bus mode
12/26/2007CN200996976Y Abnormal-voltage alarming indicater in grounding system
12/26/2007CN200996973Y Isolated voltage collecting circuit
12/26/2007CN200995904Y Carrier retainer of conveying track
12/26/2007CN200995700Y Filament-conversion alarming system of scheduling signal indicator
12/26/2007CN101095312A Method and system for providing packet data services
12/26/2007CN101095221A Process for fabricating semiconductor integrated circuit device
12/26/2007CN101095060A Adaptive memory calibration using bins
12/26/2007CN101095059A Method and apparatus for controlling variable delays in electronic circuitry
12/26/2007CN101095058A Efficient protection mechanisms for protecting multicast traffic in a ring topology network utilizing label switching protocols
12/26/2007CN101095057A Probe head arrays
12/26/2007CN101093935A Selfadapting method for determining singlephase earth fault of generator stator