| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/27/2007 | US20070296455 Disconnection and short detecting circuit that can detect disconnection and short of a signal line transmitting a differential clock signal |
| 12/27/2007 | US20070296454 Power supply assembly and semiconductor testing system using same |
| 12/27/2007 | US20070296453 Display element |
| 12/27/2007 | US20070296452 Flexible display testing and inspection |
| 12/27/2007 | US20070296451 LCD test device and test process thereof |
| 12/27/2007 | US20070296450 Testing device |
| 12/27/2007 | US20070296449 Methods and apparatus for multi-modal wafer testing |
| 12/27/2007 | US20070296448 Burn-in sorter and sorting method using the same |
| 12/27/2007 | US20070296447 Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect |
| 12/27/2007 | US20070296446 Operation monitor system, semiconductor apparatus, and information collection apparatus |
| 12/27/2007 | US20070296445 Semiconductor Chip Flipping Assembly and Apparatus For Bonding Semiconductor Chip Using The Same |
| 12/27/2007 | US20070296444 Test structure for measuring electrical and dimensional characteristics |
| 12/27/2007 | US20070296443 Exhaustive diagnosis of bridging defects in an integrated circuit |
| 12/27/2007 | US20070296442 Method and Apparatus for Measuring Device Mismatches |
| 12/27/2007 | US20070296441 Method and Apparatus for Die Testing on Wafer |
| 12/27/2007 | US20070296440 Semiconductor integrated circuit apparatus, measurement result management system, and management server |
| 12/27/2007 | US20070296439 Test structure for monitoring leakage currents in a metallization layer |
| 12/27/2007 | US20070296438 Method for optimizing probe card design |
| 12/27/2007 | US20070296437 Mini-prober for tft-lcd testing |
| 12/27/2007 | US20070296436 Electrical test probes with a contact element, methods of making and using the same |
| 12/27/2007 | US20070296435 AC coupled parameteric test probe |
| 12/27/2007 | US20070296434 Temperature control method and apparatus and test method and apparatus of semiconductor devices |
| 12/27/2007 | US20070296433 Contactor having a global spring structure and methods of making and using the contactor |
| 12/27/2007 | US20070296432 Measurement board for electronic device test apparatus |
| 12/27/2007 | US20070296431 Membrane probing system with local contact scrub |
| 12/27/2007 | US20070296430 Control method and control program for prober |
| 12/27/2007 | US20070296429 Probe contacting electrode and electronic device |
| 12/27/2007 | US20070296428 Semiconductor device having supply voltage monitoring function |
| 12/27/2007 | US20070296427 Method for detecting tips of probes, alignment method and storage medium storing the methods, and probe apparatus |
| 12/27/2007 | US20070296426 Prober for electronic device testing on large area substrates |
| 12/27/2007 | US20070296425 Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same |
| 12/27/2007 | US20070296424 Method and apparatus for a paddle board probe card |
| 12/27/2007 | US20070296423 Double-sided wafer probe |
| 12/27/2007 | US20070296422 Method of Expanding Tester Drive and Measurement Capability |
| 12/27/2007 | US20070296420 Device For Testing Connectivity Of A Connector Including Spring Contact Pins |
| 12/27/2007 | US20070296419 Insert and Pusher of Electronic Device Handling Apparatus, Socket Guide for Test Head, and Electronic Device Handling Apparatus |
| 12/27/2007 | US20070296418 Flexible Continuity and Circuit Tester |
| 12/27/2007 | US20070296416 Circuit for detecting end of life of fluorescent lamp |
| 12/27/2007 | US20070296403 Semiconductor device, unique ID of semiconductor device and method for verifying unique ID |
| 12/27/2007 | US20070296402 Adapter for positioning of contact tips |
| 12/27/2007 | US20070296401 Interleaved Differential Multiplexer |
| 12/27/2007 | DE19940434B4 Vorrichtung und Verfahren zur Anzeige von Signalwerten Apparatus and method for displaying signal values |
| 12/27/2007 | DE19860560B4 Verwendung einer gebrauchten Wolfram-Prüfmesssonde Use a used tungsten Prüfmesssonde |
| 12/27/2007 | DE10249599B4 Sicherheitsschaltung für analoge Sensoren Safety circuit for analog sensors |
| 12/27/2007 | DE102007026132A1 Verfahren und Vorrichtung zum Quantifizieren von Effekten der Temperatur in Untätigkeitsperioden auf eine Speichereinrichtung für elektrische Energie Method and device for quantifying the effects of temperature in periods of inactivity to a storage device for electrical energy |
| 12/27/2007 | DE102006028923A1 Contact testing device, has spacer unit that is insertable into rear-sided deflection region of locking arm through access opening, where spacer unit and testing unit are arranged at test adapter |
| 12/27/2007 | DE102006028414A1 Test method for integrated circuit, involves applying floating potential at each signal connection, and applying mass potential at mass connection |
| 12/27/2007 | DE102006022160B3 Testvorrichtung mit HF-/UHF-Dualbandantenne zum Testen von RFID-Transpondern in einem Fertigungsgerät The test device with HF / UHF dual band antenna for testing of RFID transponders in a single production unit |
| 12/27/2007 | CA2655500A1 Token based flow control for data communication |
| 12/26/2007 | EP1870726A1 Test system for smart card and identification devices and the like |
| 12/26/2007 | EP1870725A1 Test device, test method, electronic device manufacturing method, test simulator, and test simulation method |
| 12/26/2007 | EP1870724A1 Test emulator, test module emulator and record medium storing program therein |
| 12/26/2007 | EP1870723A1 Integrated circuit |
| 12/26/2007 | EP1870722A1 System and method for thermal management and gradient reduction |
| 12/26/2007 | EP1870721A1 Insulation inspecting apparatus |
| 12/26/2007 | EP1870720A1 Terminal crimped state testing method |
| 12/26/2007 | EP1870718A1 System for measuring the radiation diagram of a transmission antenna |
| 12/26/2007 | EP1870289A1 Vehicle power supply device and its degradation judgment method |
| 12/26/2007 | EP1869484A1 Apparatus and method for managing battery performance of a wireless device |
| 12/26/2007 | EP1869483A1 Self-test circuit for high-definition multimedia interface integrated circuits |
| 12/26/2007 | EP1869482A1 Pyrimidine derivatives |
| 12/26/2007 | EP1869481A2 Rfid device test thresholds systems and methods |
| 12/26/2007 | EP1869479A2 Voltage fault detection and protection |
| 12/26/2007 | EP1869409A1 Sensor system |
| 12/26/2007 | EP1868552A2 Monitoring system |
| 12/26/2007 | EP1634088A4 A method and apparatus for measuring and analyzing electrical or electrochemical systems |
| 12/26/2007 | EP1629562B1 Insulating mount structure, insulation monitoring system, and insulation monitoring method for fuel cells |
| 12/26/2007 | EP1436636B1 Method and apparatus for sub-micron imaging and probing on probe station |
| 12/26/2007 | EP0853657B1 Storage device for objects, storage station, and air-conditioned cabinet |
| 12/26/2007 | CN200997424Y Accumulator voltage collecting module |
| 12/26/2007 | CN200997262Y Initial high-voltage corrugated driving experimental circuit of grooved plasma display panel |
| 12/26/2007 | CN200997179Y Thunder and lightning monitor recording network system |
| 12/26/2007 | CN200997107Y Device for testing CMOS image senser |
| 12/26/2007 | CN200997008Y Flexible-cable wire jumper containing metal detecting wire |
| 12/26/2007 | CN200996993Y Frequency-variable serial resonant voltageproof experimental appliance |
| 12/26/2007 | CN200996992Y Corrugating fast inspecter of micro-radar medical low-voltage power supply |
| 12/26/2007 | CN200996991Y Switch power-supply tester |
| 12/26/2007 | CN200996990Y Battery tester |
| 12/26/2007 | CN200996989Y Workpiece clamp for lithium-ion battery internal-resistance voltage and laser sense code combined test |
| 12/26/2007 | CN200996988Y Energy interfeedback experimental appliance of generater |
| 12/26/2007 | CN200996987Y Electric switch state online inspecter of sensitive loading loop |
| 12/26/2007 | CN200996986Y Digital circuit and system experimental platform |
| 12/26/2007 | CN200996985Y Warning-light loop fault diagnostic device of automobile |
| 12/26/2007 | CN200996984Y Wiring tester of electrical appliance socket |
| 12/26/2007 | CN200996983Y Portable line checker |
| 12/26/2007 | CN200996982Y Quartz crystal oscillater, its automatic testing loader |
| 12/26/2007 | CN200996981Y Terminal-module tester |
| 12/26/2007 | CN200996980Y Equipment for measuring terahertz time-domain spectrum |
| 12/26/2007 | CN200996979Y Accumulator internal-resistance tester based on 485 bus mode |
| 12/26/2007 | CN200996976Y Abnormal-voltage alarming indicater in grounding system |
| 12/26/2007 | CN200996973Y Isolated voltage collecting circuit |
| 12/26/2007 | CN200995904Y Carrier retainer of conveying track |
| 12/26/2007 | CN200995700Y Filament-conversion alarming system of scheduling signal indicator |
| 12/26/2007 | CN101095312A Method and system for providing packet data services |
| 12/26/2007 | CN101095221A Process for fabricating semiconductor integrated circuit device |
| 12/26/2007 | CN101095060A Adaptive memory calibration using bins |
| 12/26/2007 | CN101095059A Method and apparatus for controlling variable delays in electronic circuitry |
| 12/26/2007 | CN101095058A Efficient protection mechanisms for protecting multicast traffic in a ring topology network utilizing label switching protocols |
| 12/26/2007 | CN101095057A Probe head arrays |
| 12/26/2007 | CN101093935A Selfadapting method for determining singlephase earth fault of generator stator |