Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2008
01/31/2008US20080026489 Method and system for modeling statistical leakage-current distribution
01/31/2008US20080025204 Method to utilize physical layer channel state information to improve video quality
01/31/2008US20080025012 Contact signal blocks for transmission of high-speed signals
01/31/2008US20080024759 Sample analyzer and computer program product
01/31/2008US20080024158 RF sensor clamp assembly
01/31/2008US20080024157 Array testing method using electric bias stress for tft array
01/31/2008US20080024156 Inspection System, Inspection Method, and Method for Manufacturing Semiconductor Device
01/31/2008US20080024155 High density cantilevered probe for electronic devices
01/31/2008US20080024154 High density cantilevered probe for electronic devices
01/31/2008US20080024152 System and method for reducing heat dissipation during burn-in
01/31/2008US20080024151 Socket For Connecting Ball-Grid-Array Integrated Circuit Device To Test Circuit
01/31/2008US20080024150 Surface mount package fault detection apparatus
01/31/2008US20080024148 Probe card assembly with a dielectric strip structure
01/31/2008US20080024144 Method and apparatus for dry testing non-conductive containers for carrying people
01/31/2008US20080024139 Device and a Method for Testing At Least One Conductive Joint Forming an Electrical Connection Between an Electrical Component and a Printed Circuit
01/31/2008US20080024138 Identifying apparatus for ac power supply arrangement
01/31/2008US20080024136 Measuring pixel current in display device
01/31/2008US20080024125 Method for positioning a probe
01/31/2008DE19733113B4 Verfahren zum Testen einer elektronischen Baugruppe und elektronische Baugruppe mit Testhilfe A method of testing an electronic assembly and electronic assembly with debugging
01/31/2008DE10342472B4 Schaltungsanordnung und Verfahren zum Testen eines Kapazitätsfeldes in einer integrierten Schaltung Circuit arrangement and method for testing a capacitance array in an integrated circuit
01/31/2008DE10303682B4 Verfahren zum Bewerten lateraler Dotier- und/oder Ladungsträgerprofile A method for evaluating lateral doping and / or carrier profiles
01/31/2008DE102007031866A1 Prüfvorrichtung, Verschiebungsbetrag-Messvorrichtung, Verschiebungsbetrag-Messverfahren und diagnostisches Verfahren Tester, shift amount measuring device, shift amount measuring method and a diagnostic procedure
01/31/2008DE102006035103A1 Otological device i.e. hearing aid, for producing acoustic warning signal, has measuring device for measuring charging condition of electrical energy source depending on electrical charge extracted from energy source
01/31/2008DE102006035095A1 Verfahren und System zum Bestimmen des Ersatzwiderstandes eines Energiespeichers A method and system for determining the equivalent resistance of an energy storage
01/31/2008DE102006034928A1 Switch spring contact pin for use in testing apparatus, has housing, contact lug, retainer and probe head that are provided with inner recess, where recess is guided till head is in use position, and optical fiber is penetrated into recess
01/31/2008DE102006033961A1 Method for detecting damage of plastic pipe, involves moving probe through pipe with wires extending helically around pipe, where probe radiates electromagnetic waves, which is coupled inductively in wires and produces measuring signals
01/31/2008DE102006030607A1 Embedded system testing device, has emulator adjusted for testing different systems, and memory storing instructions and data for operating emulator, where instructions and data are adjusted and extended by user of computer over interface
01/31/2008DE102006027682B3 Integrierte Schaltungsanordnung und Verfahren zum Betreiben einer integrierten Schaltungsanordnung An integrated circuit device and method of operating an integrated circuit arrangement
01/31/2008CA2779575A1 Nuclear magnetic resonance measurement techniques in non-uniform fields
01/30/2008EP1883252A1 Abnormality detecting apparatus
01/30/2008EP1883251A1 Abnormality detecting apparatus
01/30/2008EP1882957A2 Test instrument, program and recording medium
01/30/2008EP1882956A1 Test device, test method, and test control program
01/30/2008EP1882955A1 Fault Detection Apparatus For Surface Mount Package
01/30/2008EP1882190A2 Battery power management in over-discharge situation
01/30/2008EP1640735B1 Pattern generator and test device
01/30/2008CN201015189Y Inductance parallel impedance device
01/30/2008CN201015127Y Electric quantity display box of battery
01/30/2008CN201015016Y Thin film transistor LCD device detecting instrument
01/30/2008CN201015001Y Cable detecting device
01/30/2008CN201015000Y Detector
01/30/2008CN201014999Y Optical detector
01/30/2008CN201014998Y Transmission line insulator flashover fault monitoring and positioning device
01/30/2008CN201014997Y Virtual instrument based excitation system testing device
01/30/2008CN201014996Y Anti-theft device of power apparatus
01/30/2008CN101116003A Secondary cell charge/discharge electricity amount estimation method and device, secondary cell polarization voltage estimation method and device, and secondary cell remaining capacity estimation meth
01/30/2008CN101116002A Method and system for testing or measuring electrical elements, using two offset pulses
01/30/2008CN101116001A Method for testing electrical elements using an indirect photoelectric effect
01/30/2008CN101116000A Method and system for testing or measuring electrical elements
01/30/2008CN101115999A Assembly for regulating the temperature of an integrated circuit
01/30/2008CN101115998A Method and apparatus for remotely buffering test channels
01/30/2008CN101115997A Assembly comprising an electric conductor for transmitting electric energy and method for determining the load of an electric conductor
01/30/2008CN101114724A Nickel-hydrogen battery management system for electric vehicle
01/30/2008CN101114603A Probe card for semiconductor integrated circuit detection and manufacturing method thereof
01/30/2008CN101114602A Device and method for detecting metal etching defect
01/30/2008CN101114414A Driving apparatus for display device and display device including the same
01/30/2008CN101114289A Method and system for selectively processing test data using subscriptions in a multi-formatter architecture
01/30/2008CN101114065A Wireless testing system used for LCD and LCD module
01/30/2008CN101114010A Fuel battery polar plate flow field cavity homogeneity testing method
01/30/2008CN101114009A Battery automatically testing system and method of electronic device
01/30/2008CN101114008A A system for acquiring device parameters
01/30/2008CN101114007A Electrical cable intelligent theft preventing installation
01/30/2008CN101114006A SVC signal generator
01/30/2008CN101114005A Module and method for detecting defect of thin film transistor substrate
01/30/2008CN101114004A Method for looking for breakpoints of optical fiber
01/30/2008CN101114003A Shorting or breaking circuit testing method of polyalcohol flexible packing
01/30/2008CN101114002A Aging and selecting circuit applied to photoelectric collection tube in photoelectric shaft-position encoder
01/30/2008CN101114001A Switching device for detecting electrical cable network switching, insulating and overpressure resistant performance
01/30/2008CN101114000A Electrolyze polar plate status intelligent detecting method and system
01/30/2008CN101113999A Three-wire serial-in type interface method of navigation mark telemetering measurement terminal
01/30/2008CN101113998A Circuit for automatically detecting creepage protecting socket electrifying whether or not end of life
01/30/2008CN101113994A Pulse wave electric voltage frequency testing system
01/30/2008CN101113990A Method for manufacturing probe card
01/30/2008CN101113958A Image checking apparatus
01/30/2008CN100365939C Twelve bits counting compression circuit
01/30/2008CN100365789C Method and apparatus for testing defective portion of semiconductor device
01/30/2008CN100365787C Writing buffer-supporting FLASH internal unit testing metod
01/30/2008CN100365783C Designing method for improving breakdown potential of electronic element with epoxy powder pack
01/30/2008CN100365744C Loading device of large-scale mobile electric generator load experimental-station
01/30/2008CN100365424C Current density distribution measuring shim inside fuel cells
01/30/2008CN100365423C Automatic connecting system for JTAG chain and implementing method thereof
01/30/2008CN100365422C Insertosome and electronic parts processing device with the same
01/30/2008CN100365421C Method for measuring carrier mobility of organic semiconductor in frequency domain
01/29/2008US7325182 Method and circuit arrangement for testing electrical modules
01/29/2008US7325181 Method and device for selecting the operating mode of an integrated circuit
01/29/2008US7325180 System and method to test integrated circuits on a wafer
01/29/2008US7325179 Storage system comprising logical circuit configured in accordance with information in memory on PLD
01/29/2008US7325164 System and method for multiple cycle capture of chip state
01/29/2008US7324982 Method and apparatus for automated debug and optimization of in-circuit tests
01/29/2008US7324932 Virtual test environment
01/29/2008US7324909 Fault diagnosis apparatus
01/29/2008US7324902 Method and apparatus for generalized recursive least-squares process for battery state of charge and state of health
01/29/2008US7324553 Dynamic bandwidth management responsive to access link state in redundant network topologies
01/29/2008US7324531 Gateway enabling data communication between devices having different middlewares
01/29/2008US7324458 Physical layer loopback
01/29/2008US7324457 Method and apparatus for compensating for optical transmission delay in a synchronous mobile communication system using synchronous digital hierarchy
01/29/2008US7324439 Application-transparent IP redundancy
01/29/2008US7324438 Technique for nondisruptively recovering from a processor failure in a multi-processor flow device
01/29/2008US7324392 ROM-based memory testing
01/29/2008US7323906 Simultaneous bi-directional buffer including self-test circuit having function of generating input signal and self testing method of the simultaneous bi-directional buffer