Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2007
11/29/2007US20070273399 Probe for testing a device under test
11/29/2007US20070273398 Mounting apparatus
11/29/2007US20070273397 Apparatus for Evaluating Semiconductor Wafer
11/29/2007US20070273391 Loop Resistance Tester
11/29/2007US20070273387 Optical testing device
11/29/2007US20070273386 Tuning a test trace configured for capacitive coupling to signal traces
11/29/2007US20070273361 Input by-pass circuit for a current probe
11/29/2007US20070273360 Cap at resistors of electrical test probe
11/29/2007US20070271781 High density integrated circuit apparatus, test probe and methods of use thereof
11/29/2007DE202005021386U1 Prüfkopf mit einem Messfühler mit Membranaufhängung Probe with a sensor with membrane suspension
11/29/2007DE102007013580A1 Grafische Präsentation von Halbleitertestergebnissen Graphical presentation of semiconductor test results
11/29/2007DE102006025066A1 Integrated circuit`s e.g. remote sensor, part e.g. processor, testing method for radio frequency identification system, involves contactless selecting result of functional test by testing device
11/29/2007DE102006025031A1 Prüfschaltungsanordnung und Prüfverfahren zum Prüfen einer Schaltungsstrecke einer Schaltung Test circuit and test methods for testing a circuit path of a circuit
11/29/2007DE102006025028A1 Switching arrangement for monitoring a current comprises a diode switch connected to a diode or a transistor switch with diode configuration between a reference chain and a switch connection so that the reference current is not switched off
11/29/2007DE102006024460A1 Motor vehicle radar system`s circuit structure, has coupling/decoupling device for coupling test resonator structure with circuit section having negative resistance during testing and for decoupling structure from section after testing
11/29/2007DE102004042562B4 xDSL-Leitungstester xDSL line tester
11/29/2007DE102004041901B4 Spannungsdetektor für eine Batterieanordnung Voltage detector for battery assembly
11/29/2007CA2654411A1 User interface for monitoring a plurality of faulted circuit indicators
11/29/2007CA2651141A1 Apparatus and method for controlling charging and discharging power storage device
11/29/2007CA2644038A1 System and method for monitoring temperature inside electric machines
11/28/2007EP1860760A1 Power conversion device
11/28/2007EP1860565A1 Method for performing a functional check of the control unit for a motor vehicle
11/28/2007EP1860449A2 Power storage device and method of measuring voltage of storage battery
11/28/2007EP1860448A2 Handler for sorting packaged chips
11/28/2007EP1860447A2 Circuit test arrangement and test method for testing a path in a circuit
11/28/2007EP1860446A1 Method and device for measuring the temperature of a junction in an electronic component.
11/28/2007EP1860445A1 Ground detector and DC-AC inverter for vehicles
11/28/2007EP1859528A1 Power supply apparatus with function of detecting abnormality of current sensor
11/28/2007EP1859523A1 Apparatus and method for estimating battery state of charge
11/28/2007EP1859290A1 Method, system and apparatus for diagnostic testing of an electrochemical cell stack
11/28/2007EP1859289A2 Fpga emulation system
11/28/2007EP1859288A1 Method and circuit for detecting a line break
11/28/2007EP1774352B1 Vehicle battery arrangement comprising electronic components
11/28/2007EP1771741B1 Device and method for testing at least one conducting joint forming an electrical connection between an electric component and a printed circuit
11/28/2007EP1601985B1 Laminated core testing device
11/28/2007CN200983513Y 智能不间断电源 Intelligent uninterruptible power supply
11/28/2007CN200983002Y Power supply status display device
11/28/2007CN200983001Y Electromotor load simulation machine
11/28/2007CN200983000Y Online monitoring instrument for SF6 breaker gas
11/28/2007CN200982999Y Electric resistance part of line for dynamic simulation test
11/28/2007CN200982998Y A surge current generator
11/28/2007CN200982997Y An electric performance testing clamp for flexible circuit board
11/28/2007CN200982996Y Improvement of detection circuit for transformation from current to voltage
11/28/2007CN200982995Y A current leakage searcher for mine well cable
11/28/2007CN200982994Y Controllable silicon triggered current detection alarming circuit
11/28/2007CN200982993Y Discharge/remote feedback integration detection system
11/28/2007CN200982992Y Remote distance wave guide arc light detector
11/28/2007CN200982991Y A detection device for motorcar electronic product
11/28/2007CN200982990Y USB testing device
11/28/2007CN200982988Y Monitoring alarming system for electric pole pull rope
11/28/2007CN200982987Y An electricity testing pen for motorcar
11/28/2007CN200982983Y Electric probe device
11/28/2007CN200982982Y Freezing environment IC testing table
11/28/2007CN200982924Y A flux switch detection device
11/28/2007CN200981644Y Polling unit electricity supplying device for airfield navigation lamp polling monitoring system
11/28/2007CN200981061Y Luminous diode photoelectric parameter online testing screening circuit
11/28/2007CN101080643A Signal module with reduced reflections
11/28/2007CN101080642A Remote test facility with wireless interface to local test facilities
11/28/2007CN101080641A Bi-directional buffer for interfacing test system channel
11/28/2007CN101080640A Using parametric measurement units as a source of power for a device under test
11/28/2007CN101079552A Charging device with cell capacity analysis function
11/28/2007CN101079549A Apparatus and method for producing signal conveying circuit status information
11/28/2007CN101079389A Handler for testing of packed chip
11/28/2007CN101079387A Device package and methods for the fabrication and testing thereof
11/28/2007CN101078997A Semiconductor integrated circuit system, semiconductor integrated circuit, operating system, and control method for semiconductor integrated circuit
11/28/2007CN101078752A Multiple platform automobile lamp detecting platform
11/28/2007CN101078751A Method and device for monitoring accumulator property using transient DC small current electric quantity comparison method
11/28/2007CN101078750A Vehicle mounted battery monitor system
11/28/2007CN101078749A Power cell source test system
11/28/2007CN101078748A Brushless motor Hall detector
11/28/2007CN101078747A Double salient-pole motor drive power tube fault diagnosis method
11/28/2007CN101078746A Border scanning test structure of multiple chip package internal connection and test method
11/28/2007CN101078745A Method and system for checking needle break in gold finger
11/28/2007CN101078739A Needle bed processing equipment
11/28/2007CN101078737A Testing fixture and machine station combination device
11/28/2007CN101078692A Liquid or solid powder substance dielectric coefficient test device, and the test and calculation method
11/28/2007CN101078666A Reflective type display apparatus detection device and method
11/28/2007CN100352209C Initialization of a bidirectional, self-timed parallel interface with automatic testing of AC differential wire pairs
11/28/2007CN100352185C Method and system for monitoring broadband quality of services
11/28/2007CN100352029C Control method for automatic testing IC complete device
11/28/2007CN100351803C Reference circuit and signal alignment circuit
11/28/2007CN100351678C Combined detecting circuit for display panel
11/28/2007CN100351641C Device capable of displaying its cell capacity when handset is not opened
11/28/2007CN100351640C Loading device
11/28/2007CN100351639C Semiconductor integrated circuit verification method and test pattern preparation method
11/28/2007CN100351638C Boundary scan testing device for integrated circuit
11/28/2007CN100351637C Photoelectricity characteristic measuring device and method for organic light emitting diode
11/28/2007CN100351636C Module power supply tester
11/27/2007US7302668 Layout designing/characteristic analyzing apparatus for a wiring board
11/27/2007US7302658 Methods for evaluating quality of test sequences for delay faults and related technology
11/27/2007US7302651 Technology migration for integrated circuits with radical design restrictions
11/27/2007US7302626 Test pattern compression with pattern-independent design-independent seed compression
11/27/2007US7302625 Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration
11/27/2007US7302624 Adaptive fault diagnosis of compressed test responses
11/27/2007US7302623 Algorithm pattern generator for testing a memory device and memory tester using the same
11/27/2007US7302365 Apparatus and method for performing eye scan
11/27/2007US7302358 Automatic test equipment operating architecture
11/27/2007US7302352 Method and system for providing dying gasp support for a network component
11/27/2007US7302041 Method for estimating the remaining life span of an X-ray radiator
11/27/2007US7301931 Hexanary-feedback contention access method with pdf-based multi-user estimation for wireless communication networks
1 ... 841 842 843 844 845 846 847 848 849 850 851 852 853 854 855 856 857 858 859 860 861 ... 1523