| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/16/2008 | CN201007733Y Transformer winding deformation detection determining device |
| 01/16/2008 | CN201007732Y Winding deformation test plier |
| 01/16/2008 | CN201007731Y Combined device for detection equipment |
| 01/16/2008 | CN201007730Y Transformer direct loading and temperature rising test device |
| 01/16/2008 | CN201007723Y Signal connecting port positioning device for panel carrier |
| 01/16/2008 | CN201007722Y Semiconductor component testing table with flexible buffering heat conduction foundation |
| 01/16/2008 | CN201007721Y Semiconductor component testing table with ventiduct cooling device |
| 01/16/2008 | CN201007665Y Electromagnetic flowmeter capable of on-line detecting electrode leakage |
| 01/16/2008 | CN201007303Y Lower cramping apparatus of lithium battery detecting locker and liquid injection machine |
| 01/16/2008 | CN101107810A Desktop computer blade fault identification system and method |
| 01/16/2008 | CN101107538A Systems and methods for detecting and indicating fault conditions in electrochemical cells |
| 01/16/2008 | CN101107537A Inspection device, inspection method, and inspection device sensor |
| 01/16/2008 | CN101107536A Circuit pattern inspection device and method thereof |
| 01/16/2008 | CN101107535A Circuit pattern inspection device and method thereof |
| 01/16/2008 | CN101107534A TFT array substrate inspecting apparatus |
| 01/16/2008 | CN101106286A Remote controller for solar charging appliance |
| 01/16/2008 | CN101106282A Portable large capacity power device |
| 01/16/2008 | CN101106270A Remote short circuit failure detection method for low voltage power grid and sensitivity protection module |
| 01/16/2008 | CN101106123A Wafer and semiconductor device testing method |
| 01/16/2008 | CN101105520A Generating set primary frequency regulation test method and emulating instrument for test |
| 01/16/2008 | CN101105519A LED chip/ wafer non-contact type check-up method |
| 01/16/2008 | CN101105518A Semiconductor device creepage detection method |
| 01/16/2008 | CN101105517A Gamma/ transformer triangle winding circumfluence algorithm method and device |
| 01/16/2008 | CN101105516A Device and method for testing semiconductor packages |
| 01/16/2008 | CN101105515A Device for detecting crystal oscillator |
| 01/16/2008 | CN101105514A Portable electronic device test system and method |
| 01/16/2008 | CN101105512A Circular waveguide standing wave measurement device for eight mm waveband dielectric measurement |
| 01/16/2008 | CN101105507A Probe card |
| 01/16/2008 | CN101105506A High frequency probe card |
| 01/16/2008 | CN101105505A Carrier module and test tray installed with the carrier module |
| 01/16/2008 | CN101105504A 探针卡装置 Probe card device |
| 01/16/2008 | CN101104265A Arm hanging type high voltage transmission line detecting robot |
| 01/16/2008 | CN100362739C Method and device for producing electric motor arbitrary mechanical characteristic based on PWM technique |
| 01/16/2008 | CN100362724C Apparatus and method for multi function products effectively utilizing battery electricity quantity |
| 01/16/2008 | CN100362717C Circuit breaker remote service system |
| 01/16/2008 | CN100362707C Socket for semiconductor device |
| 01/16/2008 | CN100362553C Method for inspecting organic el substrate and organic el display device |
| 01/16/2008 | CN100362445C Test set of electronic component connection socket |
| 01/16/2008 | CN100362401C Electrooptical device regulating method, electrooptical device regulating apparatus and electronic apparatus, |
| 01/16/2008 | CN100362360C Verifying apparatus with verifying signal monitoring function and remote controlled verifying system |
| 01/16/2008 | CN100362359C Method for checking the electrical safety of a household appliance, and corresponding household appliance |
| 01/16/2008 | CN100362358C Scatterometry structure with embedded ring oscillator, and methods of using same |
| 01/16/2008 | CN100362357C Probe examination device |
| 01/16/2008 | CN100362356C Device and method for testing fault relay |
| 01/16/2008 | CN100362354C Cell on-position detecting method for terminal device |
| 01/16/2008 | CN100362351C Non-suction head type apparatus for taking and putting measured electronic elements |
| 01/15/2008 | US7320115 Method for identifying a physical failure location on an integrated circuit |
| 01/15/2008 | US7320114 Method and system for verification of soft error handling with application to CMT processors |
| 01/15/2008 | US7320098 Semiconductor integrated circuit device having scan flip-flop circuit |
| 01/15/2008 | US7320097 Serial to parallel conversion circuit having a shift clock frequency lower than a data transfer frequency |
| 01/15/2008 | US7319935 System and method for analyzing electrical failure data |
| 01/15/2008 | US7319700 Communicating constraint information for determining a path subject to such constraints |
| 01/15/2008 | US7319671 Time division polling scheme for network management systems |
| 01/15/2008 | US7319668 Network system capable of selecting optimal route according to type of transmitted data |
| 01/15/2008 | US7319346 Circuit and method for trimming integrated circuits |
| 01/15/2008 | US7319343 Low power scan design and delay fault testing technique using first level supply gating |
| 01/15/2008 | US7319341 Method of maintaining signal integrity across a capacitive coupled solder bump |
| 01/15/2008 | US7319340 Integrated circuit load board and method having on-board test circuit |
| 01/15/2008 | US7319339 Inspection apparatus to break the oxide of an electrode by fritting phenomenon |
| 01/15/2008 | US7319338 Chip tester for testing validity of a chipset |
| 01/15/2008 | US7319337 Method and apparatus for pad aligned multiprobe wafer testing |
| 01/15/2008 | US7319336 Charged particle beam device probe operation |
| 01/15/2008 | US7319335 Configurable prober for TFT LCD array testing |
| 01/15/2008 | US7319334 Apparatus and method of inspecting breakdown of conducting wire |
| 01/15/2008 | US7319317 Probe card and method for producing the same |
| 01/15/2008 | US7319315 Voltage verification unit |
| 01/15/2008 | US7319304 Shunt connection to a PCB of an energy management system employed in an automotive vehicle |
| 01/15/2008 | US7319042 Method and apparatus for manufacture and inspection of semiconductor device |
| 01/15/2008 | US7318729 Sheet-form connector and production method and application therefor |
| 01/15/2008 | CA2423728C Measurement of fuel cell impedance |
| 01/15/2008 | CA2382055C Device, system and method for monitoring a household electric appliance |
| 01/10/2008 | WO2008005790A2 Systems and methods of profiling power cycles in an electronics device |
| 01/10/2008 | WO2008005587A2 Probe tips and method of making same |
| 01/10/2008 | WO2008005362A2 Calibration device |
| 01/10/2008 | WO2008005070A1 System and method for cleaning a contactor device |
| 01/10/2008 | WO2008004414A1 Semiconductor device having defect detecting function |
| 01/10/2008 | WO2008004269A1 Wireless ic tag and wireless ic tag system |
| 01/10/2008 | WO2008004209A2 Methods and systems for semiconductor testing using reference dice |
| 01/10/2008 | WO2008004141A2 Circuit for detecting the duty cycle of clock signals |
| 01/10/2008 | WO2008003917A1 Apparatus for testing wiring |
| 01/10/2008 | WO2008003898A2 Device for measuring parameters of an electrical power supply |
| 01/10/2008 | WO2008003896A2 Hydraulic energy recovery system |
| 01/10/2008 | WO2008003615A1 Method for carrying out a test |
| 01/10/2008 | WO2008003385A1 Arrangement for determining the operational characteristics of a high-frequency power amplifier |
| 01/10/2008 | WO2008003376A1 Arrangement for determining the operational characteristics of a high-frequency power amplifier |
| 01/10/2008 | WO2007115699A3 Method and device for tempering electronic components |
| 01/10/2008 | WO2007102155A3 Pcb design reliability simulation method and system |
| 01/10/2008 | WO2007059315A3 Array test using the shorting bar and high frequency clock signal for the inspection of tft-lcd with integrated driver ic |
| 01/10/2008 | WO2007047862A3 A system, a tool and a method for communicating with a faulted circuit indicator using a remote display |
| 01/10/2008 | WO2007012315A3 Energy store |
| 01/10/2008 | WO2005091916B1 Flexible microcircuit space transformer assembly |
| 01/10/2008 | US20080010576 Method for at speed testing of devices |
| 01/10/2008 | US20080010575 Semiconductor device |
| 01/10/2008 | US20080010574 Integrated circuit arrangement and method for operating an integrated circuit arrangement |
| 01/10/2008 | US20080010573 Test clock control structures to generate configurable test clocks for scan-based testing of electronic circuits using programmable test clock controllers |
| 01/10/2008 | US20080010572 Scan-based testing of devices implementing a test clock control structure ("TCCS") |
| 01/10/2008 | US20080010571 Partial good integrated circuit and method of testing same |
| 01/10/2008 | US20080010570 Semiconductor integrated circuit |
| 01/10/2008 | US20080010569 Device testing architecture, method, and system |
| 01/10/2008 | US20080010568 Fabric-based high speed serial crossbar switch for ate |