| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/06/2008 | CN101120484A Composite conductive sheet, its manufacturing method, anisotropic conductive connector, adapter device, and electric inspection system for circuit apparatus |
| 02/06/2008 | CN101120262A Method and system for scheduling tests in a parallel test system |
| 02/06/2008 | CN101120261A Circuitry and method for an AT-speed scan test |
| 02/06/2008 | CN101120260A Pre-burning device |
| 02/06/2008 | CN101120259A Drain current circuit breaker and method |
| 02/06/2008 | CN101119119A Method and apparatus for detecting open circuit fault of transmitter |
| 02/06/2008 | CN101119095A Large destabilization real-time simulation system based on nonlinear robust power system stabilizer |
| 02/06/2008 | CN101119094A Method for regulating frequency domain based nonlinear power system stabilizer parameter |
| 02/06/2008 | CN101119032A Charging guage device and indicating method for mobile equipment |
| 02/06/2008 | CN101118719A Gantry type four dimensional automatic measurement used for detecting display screen color performance |
| 02/06/2008 | CN101118658A CAN bus instrument vehicle controlling information processing method for mixed power passenger car |
| 02/06/2008 | CN101118534A Event log management system |
| 02/06/2008 | CN101118319A Detecting method for LCD device electro-optical characteristic and average slope angle corresponding relationship |
| 02/06/2008 | CN101118276A Automatic electric checking machine of dry batteries |
| 02/06/2008 | CN101118275A On-line monitoring methods for high-voltage circuit-breaker switching on-off time |
| 02/06/2008 | CN101118274A Multifunctional combined testing moving group chain device |
| 02/06/2008 | CN101118273A Process for measuring PIN diode reverse recovery time |
| 02/06/2008 | CN101118272A Bus parameter correcting method and system |
| 02/06/2008 | CN101118271A Contact type probe used a ball |
| 02/06/2008 | CN101118270A Wire harness tester |
| 02/06/2008 | CN101118269A Wire connection analyse device for electric power protective circuit |
| 02/06/2008 | CN101118268A Test system for external component interconnected extending slot and method |
| 02/06/2008 | CN101118267A Characterization array and method for determining threshold voltage variation |
| 02/06/2008 | CN101118266A Inverter energy current cycle test device |
| 02/06/2008 | CN101118265A Process for real time recognizing voltage stability of electrified wire netting trough recognizing weak links of electric network |
| 02/06/2008 | CN101118264A Wireless high-frequency integration test system and test method thereof |
| 02/06/2008 | CN101118263A Polar direction automatic detection method of polar element |
| 02/06/2008 | CN101118262A Device for taking and putting material carrier of ageing oven |
| 02/06/2008 | CN101118261A Material carrier of ageing oven with brake device |
| 02/06/2008 | CN101118260A Material carrier maintenance stations of ageing oven |
| 02/06/2008 | CN101118259A Material carrier transfer device of ageing oven |
| 02/06/2008 | CN101118258A Material carrier transfer device of ageing oven |
| 02/06/2008 | CN101118257A Device for taking and putting material carrier of ageing oven |
| 02/06/2008 | CN101118255A Device and method for testing clock or signal driving load capacity |
| 02/06/2008 | CN101118251A Perpendicular detecting probe head, detecting probe head manufacturing method and modularized detecting probe card thereof |
| 02/06/2008 | CN100367676C Method and compressing circuits carried by high code rate convolutional codes |
| 02/06/2008 | CN100367627C Method for charging secondary battery |
| 02/06/2008 | CN100367572C Socket device |
| 02/06/2008 | CN100367045C Circuit connecting line conducting test method based on dichotomy |
| 02/06/2008 | CN100367044C Electricity method for measuring thermal resistance front opacification for node type semiconductor luminous tube or laser device |
| 02/06/2008 | CN100367043C Fault selecting method by attenuated DC component |
| 02/06/2008 | CN100367042C High voltage electric transmission line automatic survey inspection robot monobody |
| 02/06/2008 | CN100367041C System level chip detecting method capable of avoiding heat point and uniformly distributing heat |
| 02/06/2008 | CN100367040C Testing method for radio-frequency product |
| 02/05/2008 | US7328393 Forward error correction in packet networks |
| 02/05/2008 | US7328388 Built-in self-test arrangement for integrated circuit memory devices |
| 02/05/2008 | US7328387 Addressable tap domain selection circuit with selectable ⅗ pin interface |
| 02/05/2008 | US7328386 Methods for using checksums in X-tolerant test response compaction in scan-based testing of integrated circuits |
| 02/05/2008 | US7328385 Method and apparatus for measuring digital timing paths by setting a scan mode of sequential storage elements |
| 02/05/2008 | US7328384 Method and apparatus using device defects as an identifier |
| 02/05/2008 | US7328383 Circuit and method for testing embedded phase-locked loop circuit |
| 02/05/2008 | US7328382 Memory BISR controller architecture |
| 02/05/2008 | US7328369 Inherently fail safe processing or control apparatus |
| 02/05/2008 | US7328033 Wireless network system and method |
| 02/05/2008 | US7327871 Defect inspecting method, defect inspecting apparatus and inspection machine |
| 02/05/2008 | US7327816 High resolution synthesizer with improved signal purity |
| 02/05/2008 | US7327693 Method and apparatus for precisely measuring a packet transmission time |
| 02/05/2008 | US7327687 Wireless network virtual station address translation with external data source |
| 02/05/2008 | US7327677 Method for establishment of connections of pre-determined performance for a packet-oriented communication network with a resource manager |
| 02/05/2008 | US7327673 Asymmetric digital subscriber line provision flow control on digital subscriber line access multiplexer switches |
| 02/05/2008 | US7327632 Interface circuit |
| 02/05/2008 | US7327158 Array testing method using electric bias stress for TFT array |
| 02/05/2008 | US7327157 Switch device |
| 02/05/2008 | US7327156 LSI testing apparatus for testing an electronic device |
| 02/05/2008 | US7327155 Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials |
| 02/05/2008 | US7327154 Multichip package test |
| 02/05/2008 | US7327153 Analog built-in self-test module |
| 02/05/2008 | US7327152 Integrated test circuit arrangement and test method |
| 02/05/2008 | US7327151 Memory application tester having vertically-mounted motherboard |
| 02/05/2008 | US7327150 Integrated circuit package resistance measurement |
| 02/05/2008 | US7327149 Bi-directional MOS current sense circuit |
| 02/05/2008 | US7327148 Method for using internal semiconductor junctions to aid in non-contact testing |
| 02/05/2008 | US7327147 Device and method for determining characteristic variables for batteries |
| 02/05/2008 | US7327135 Testing apparatus and testing method using the same |
| 02/05/2008 | US7327133 Current measuring device using hall sensors |
| 02/05/2008 | US7326646 Nitrogen-free ARC layer and a method of manufacturing the same |
| 02/05/2008 | US7326305 System and method for decapsulating an encapsulated object |
| 02/05/2008 | US7326139 Belt with integrated monitoring |
| 02/05/2008 | US7325304 Method of connecting probe pin to circuit board and method of manufacturing probe card |
| 02/05/2008 | US7325292 Method for refinishing a test electrode |
| 02/05/2008 | CA2448866C Fuel cell voltage monitoring system and method thereof |
| 02/05/2008 | CA2346914C Apparatus and method for the visual inspection of concealed soldered joints |
| 02/04/2008 | CA2555480A1 Clearance measurement system and method of operation |
| 01/31/2008 | WO2008014509A2 Rotating joint |
| 01/31/2008 | WO2008014194A2 Methods and apparatus for releasably mounting a semiconductor device to a printed circuit board |
| 01/31/2008 | WO2008013923A1 Probes and methods for semiconductor wafer analysis |
| 01/31/2008 | WO2008013606A2 Tuned monolithic microwave ic probe pads |
| 01/31/2008 | WO2008013273A1 Socket for inspection |
| 01/31/2008 | WO2008012889A1 Electronic component transfer method and electronic component handling device |
| 01/31/2008 | WO2008012124A2 Method and system for determining the equivalent resistance of an energy store |
| 01/31/2008 | WO2008012041A1 Photovoltaic arrangement |
| 01/31/2008 | WO2008012040A1 Photovoltaic arrangement |
| 01/31/2008 | US20080028269 Method and apparatus for characterizing components of a device under test using on-chip trace logic analyzer |
| 01/31/2008 | US20080028268 Image display device and testing method of the same |
| 01/31/2008 | US20080028267 Semiconductor device |
| 01/31/2008 | US20080028266 Method to prevent firmware defects from disturbing logic clocks to improve system reliability |
| 01/31/2008 | US20080028233 LSI design method and verification method |
| 01/31/2008 | US20080027669 Radio Device Testing System |
| 01/31/2008 | US20080027663 System and method for locating and analyzing arcing phenomena |
| 01/31/2008 | US20080026603 Socket for semiconductor device |