G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2007
11/14/2007	CN100349345C Intelligent detecting method and appliance for service stop of electricity leakage protector
11/14/2007	CN100348995C Passive isolation accumulator voltage monitoring circuit
11/14/2007	CN100348994C Automatic detector and method for mechanical performance of push-pull circuit breaker
11/14/2007	CN100348993C Method of scanning chain and scanning forest for construction of non-fault shielding odd-couple detection
11/14/2007	CN100348992C Testing method of peripheral interconnecting wire
11/14/2007	CN100348991C Automation inspecting method of memory body assembled state
11/14/2007	CN100348990C Adaptive approach for route selection of grounded system connected to arc suppression coil
11/14/2007	CN100348989C Insulation aging test device used for converter high voltage pulse equipment
11/14/2007	CN100348988C On line detecting system with double Y connection wire power capacitor set
11/14/2007	CN100348982C Test method for yielding a known good die
11/14/2007	CN100348981C Test apparatus for electronic device connection interface
11/14/2007	CN100348437C Railway self-closing/cut-through line-to-ground fault range count method
11/13/2007	US7296249 Using constrained scan cells to test integrated circuits
11/13/2007	US7296203 Test apparatus, program and recording medium
11/13/2007	US7296202 Semiconductor module with a configuration for the self-test of a plurality of interface circuits and test method
11/13/2007	US7296201 Method to locate logic errors and defects in digital circuits
11/13/2007	US7296200 Soc-based core scan chain linkage switch
11/13/2007	US7296199 Systems and methods for defining and utilizing attributes of a processor resource
11/13/2007	US7296198 Method for testing semiconductor memory modules
11/13/2007	US7296197 Metadata-facilitated software testing
11/13/2007	US7295900 Load drive apparatus with short circuit determination
11/13/2007	US7295654 Digital kick meter and graphical user interface (GUI)
11/13/2007	US7295514 Method of controlling call admission in a mobile communication system
11/13/2007	US7295513 Scheduling of wireless packet data transmissions
11/13/2007	US7295511 System and method for packet data serving node load balancing and fault tolerance
11/13/2007	US7295510 Method of estimating restoration capacity in a network
11/13/2007	US7295031 Method for non-contact testing of marginal integrated circuit connections
11/13/2007	US7295030 Thin film transistor tester and corresponding test method
11/13/2007	US7295029 Chip-scale package for integrated circuits
11/13/2007	US7295028 Semiconductor integrated circuit and memory test method
11/13/2007	US7295027 Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet
11/13/2007	US7295026 Automated position control of a surface array relative to a liquid microjunction surface sampler
11/13/2007	US7295025 Probe station with low noise characteristics
11/13/2007	US7295024 Contact signal blocks for transmission of high-speed signals
11/13/2007	US7295023 Probe card
11/13/2007	US7295022 Method and system for automatically determining electrical properties of a semiconductor wafer or sample
11/13/2007	US7295021 Process and circuit for protection of test contacts in high current measurement of semiconductor components
11/13/2007	US7295020 Cap at resistors of electrical test probe
11/13/2007	US7295018 Correction of loss and dispersion in cable fault measurements
11/13/2007	US7295017 Method and system for calculating railroad track ballast resistance
11/13/2007	US7295016 Electric leakage detection system
11/13/2007	US7295014 Method for determination of characteristic variable which relates to the state of charge of a storage battery
11/13/2007	US7294999 Apparatus for automatically displaying the grade of liquid crystal display device and operating method thereof
11/13/2007	US7294998 Timing generation circuit and semiconductor test device having the timing generation circuit
11/13/2007	US7294996 Characteristic evaluating system and characteristic evaluating method
11/13/2007	US7294995 Current probing system
11/13/2007	US7294914 Interconnect structure
11/13/2007	US7294853 Substrate for mounting a semiconductor
11/13/2007	US7294530 Method for encapsulating multiple integrated circuits
11/13/2007	US7294516 Test patterns and methods of controlling CMP process using the same
11/13/2007	US7294440 Method to selectively correct critical dimension errors in the semiconductor industry
11/13/2007	US7293354 Apparatus for mounting columns for grid array electronic packages
11/13/2007	CA2450619C Diagnostic apparatus and diagnostic method for fuel cell
11/08/2007	WO2007127895A2 Control signal synchronization of a scannable storage circuit
11/08/2007	WO2007127401A2 Peer-to-peer download and seed policy management
11/08/2007	WO2007127332A2 End-system dynamic rate limiting of background traffic
11/08/2007	WO2007126612A2 Contamination monitoring and control techniques for use with an optical metrology instrument
11/08/2007	WO2007125974A1 Conductive contact holder
11/08/2007	WO2007125906A1 Device and method for determining replacement of storage battery
11/08/2007	WO2007125756A1 Apparatus for inspecting fine structure and method for inspecting fine structure
11/08/2007	WO2007125680A1 Power applying circuit and testing apparatus
11/08/2007	WO2007125641A1 Electronic device, illumination device, and its electric amount calculation method
11/08/2007	WO2007124998A1 Arrangement and method for determining the value of a resistance, and radio module
11/08/2007	WO2007089392A3 Power supply monitoring for an implantable device
11/08/2007	WO2007059025B1 Method and system for testing backplanes utilizing a boundary scan protocol
11/08/2007	WO2006060916A3 Method and apparatus for monitoring and controlling a heater zone
11/08/2007	US20070261009 Programmable devices to route signals on probe cards
11/08/2007	US20070260955 Test auxiliary device in a memory module
11/08/2007	US20070260954 Integrated circuit with low-power built-in self-test logic
11/08/2007	US20070260953 Scan test
11/08/2007	US20070260952 DFT TECHNIQUES TO REDUCE TEST TIME AND POWER FOR SoCs
11/08/2007	US20070260951 Uncompromised standard input set-up time with improved enable input set-up time characteristics in a storage circuit
11/08/2007	US20070260950 Method and apparatus for testing a data processing system
11/08/2007	US20070260949 Trading propensity-based clustering of circuit elements in a circuit design
11/08/2007	US20070260948 Driver IC and inspection method for driver IC and output device
11/08/2007	US20070260408 Fault list and test pattern generating apparatus and method, fault list generating and fault coverage calculating apparatus and method
11/08/2007	US20070259461 Semiconductor wafer examination method and semiconductor chip manufacturing method
11/08/2007	US20070259460 Semiconductor wafer examination method and semiconductor chip manufacturing method
11/08/2007	US20070258799 Turning device for heavy object
11/08/2007	US20070258694 Test apparatus and cable guide unit
11/08/2007	US20070257733 Amplifier system with current-mode servo feedback
11/08/2007	US20070257698 Angle adjusting device and display module testing apparatus using the same
11/08/2007	US20070257697 On-chip frequency degradation compensation
11/08/2007	US20070257696 Predictive, adaptive power supply for an integrated circuit under test
11/08/2007	US20070257695 Defect inspection device
11/08/2007	US20070257694 Parallel scan distributors and collectors and process of testing integrated circuits
11/08/2007	US20070257693 Interface test circuit
11/08/2007	US20070257692 Probe
11/08/2007	US20070257691 Electrical connector assembly
11/08/2007	US20070257690 Low profile electronic assembly test fixtures and methods
11/08/2007	US20070257689 High density thermally matched contacting probe assembly and method for producing same
11/08/2007	US20070257688 Systems configured for utilizing two or more of multiple different semiconductor component configurations, methods of providing semiconductor components within sockets, and methods of retaining semiconductor component configurations within sockets
11/08/2007	US20070257687 Methods Of Using A Blade Probe For Probing A Node Of A Circuit
11/08/2007	US20070257686 Integrated circuit probe card analyzer
11/08/2007	US20070257685 Probe and probe card
11/08/2007	US20070257683 Protection circuit for semiconductor device and semiconductor device including the same
11/08/2007	US20070257680 Relay Testing System and Method
11/08/2007	US20070257657 Current probing system
11/08/2007	US20070257641 Automotive battery state monitor apparatus
11/08/2007	US20070257353 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same

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