Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2008
01/08/2008US7317326 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel
01/08/2008US7317325 Line short localization in LCD pixel arrays
01/08/2008US7317324 Semiconductor integrated circuit testing device and method
01/08/2008US7317323 Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components
01/08/2008US7317322 Interconnect for bumped semiconductor components
01/08/2008US7317321 Methods and systems for automated pipeline testing
01/08/2008US7317319 Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor
01/08/2008US7317318 FEXT cancellation of mated RJ45 interconnect
01/08/2008US7317312 Guide for tip to transmission path contact
01/08/2008US7317311 Wafer handling checker
01/08/2008US7317310 Embedded PCB identification
01/08/2008US7317309 Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus
01/08/2008US7317300 Automotive battery state monitor apparatus
01/08/2008US7316936 Laser decapsulation method
01/08/2008US7316845 Metal or glass medical device or implant with a net anionic surface coated with a block brush copolymer, dendritic copolymer or linear copolymer having a polycationic block that binds to the surface and a non-tissue binding block that prevents attachment of proteins or cells
01/08/2008CA2450849C Diagnostic apparatus and diagnostic method for fuel cell
01/08/2008CA2448756C Automated stator insulation flaw inspection tool and method of operation
01/03/2008WO2008002938A2 Methods and apparatus for sensing unconfinement in a plasma processing chamber
01/03/2008WO2008002779A2 Flexible continuity and circuit tester
01/03/2008WO2008002677A2 Junction device with logic and expansion capability
01/03/2008WO2008002259A1 A method and a device for diagnosing an on-line high voltage component
01/03/2008WO2008002076A1 Battery test apparatus and battery test method
01/03/2008WO2008001818A1 Conversion device, conversion method, program, and recording medium
01/03/2008WO2008001651A1 Board inspecting method and board inspecting device
01/03/2008WO2008001543A1 Semiconductor testing apparatus and semiconductor memory testing method
01/03/2008WO2008001359A2 Detecting sub-system
01/03/2008WO2008000858A1 Leakage power estimation
01/03/2008WO2008000735A1 Method and apparatus for charging batteries
01/03/2008WO2008000661A1 Method and apparatus for constructing a synchronous signal diagram from asynchronously sampled data
01/03/2008WO2008000653A1 Method and apparatus for determining data signal jitter via asynchronous sampling
01/03/2008WO2008000539A1 Method for extending the diagnostic capability of current regulators
01/03/2008WO2008000105A1 Method for determining contact wear in a heavy-duty circuit breaker
01/03/2008WO2007132086A3 Method for managing an assembly of rechargeable batteries using a charging whiplash effect
01/03/2008WO2007131130A3 Interface test circuit
01/03/2008WO2007102834A3 Optically enhanced probe alignment
01/03/2008WO2007091211A3 Circuit arrangement and method for detecting a power down situation of a voltage supply source
01/03/2008WO2007091123A3 System and method of determining the speed of digital application specific integrated circuits
01/03/2008WO2006093852A3 Limiting vpnv4 prefixes in inter-autonomous environment
01/03/2008US20080005635 Integrated circuit and method for identifying propagation time errors in integrated circuits
01/03/2008US20080005634 Scan chain circuitry that enables scan testing at functional clock speed
01/03/2008US20080005633 Jtag bus communication method and apparatus
01/03/2008US20080005632 Test circuit, selector, and semiconductor integrated circuit
01/03/2008US20080005631 Memory module with parallel testing
01/03/2008US20080005629 On-chip receiver eye finder circuit for high-speed serial link
01/03/2008US20080004823 Defect detection system, defect detection method, and defect detection program
01/03/2008US20080004768 Variable-structure diagnostics approach achieving optimized low-frequency data sampling for ema motoring subsystem
01/03/2008US20080002796 Plural circuit selection using role reversing control inputs
01/03/2008US20080002448 Semiconductor integrated circuit
01/03/2008US20080001798 Performing a signal analysis based on digital samples in conjunction with analog samples
01/03/2008US20080001619 Display panel lighting test apparatus, and test line employing the same
01/03/2008US20080001618 In-process system level test before surface mount
01/03/2008US20080001617 Method and apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrate
01/03/2008US20080001616 Testing Components of I/O Paths of an Integrated Circuit
01/03/2008US20080001615 System to calibrate on-die temperature sensor
01/03/2008US20080001614 Image Capture Device with Alignment Indicia
01/03/2008US20080001613 Probe skates for electrical testing of convex pad topologies
01/03/2008US20080001612 Probes with self-cleaning blunt skates for contacting conductive pads
01/03/2008US20080001611 Probe using high pass ground signal path
01/03/2008US20080001606 Load break detection circuit
01/03/2008US20080001605 Voltage detecting regulator with O2 sensor
01/03/2008US20080001575 Circuit for monitoring a battery voltage
01/03/2008US20080000074 Computer automated tag test system
01/03/2008DE102007026147A1 Preferred operating gradient determining method for use during accomplishment of life span presetting for electrical energy storage unit, involves providing of present life span status of electrical energy storage unit
01/03/2008DE102007026144A1 Verfahren und Vorrichtung zur Abschätzung der Lebensdauer in Echtzeit einer Speichereinrichtung für elektrische Energie Method and apparatus for estimating the life span in real time, a storage device for electrical energy
01/03/2008DE102006029992A1 Electrical circuit diagnosing method for operating actuators of internal-combustion engine, involves examining electrical circuit for identifying electrical errors in consideration with information of misfire recognition
01/02/2008EP1873886A1 Method and apparatus for charging batteries
01/02/2008EP1873542A1 Apparatus and method for estimating charge of a battery
01/02/2008EP1873541A1 Enhanced-accuracy battery capacity prediction
01/02/2008EP1873540A1 Test clock control structures to generate configurable test clocks for scan-based testing of electronic circuits using programmable test clock controllers
01/02/2008EP1873539A1 Scan-based testing of devices implementing a test clock control structure ("TCCS")
01/02/2008EP1873538A1 Test apparatus and test method
01/02/2008EP1873537A1 Qualification of a detector of disturbance peaks in the power supply of an integrated circuit
01/02/2008EP1873536A1 Terminal crimped state testing method
01/02/2008EP1873002A1 Electric car control device
01/02/2008EP1872457A2 Device and method for monitoring life history and controlling maintenance of industrial batteries
01/02/2008EP1872349A2 Low power transmission provisioning for wireless network devices
01/02/2008EP1872288A2 Method and system for debugging using replicated logic and trigger logic
01/02/2008EP1872146A1 Simultaneous core testing in multi-core integrated circuits
01/02/2008EP1728085B1 Testing integrated circuits
01/02/2008EP1586912B1 Laser beam inspection equipment
01/02/2008EP1537390B1 Method for detecting oscillations of the shafting of an electric machine
01/02/2008EP1461626B1 Fault location using measurements from two ends of a line
01/02/2008CN201001044Y Intelligent electronic battery
01/02/2008CN201001043Y Quantity meter inversion charging synthetic instrument
01/02/2008CN201000898Y Solar battery testing device
01/02/2008CN201000673Y Rotating member embedded type test device
01/02/2008CN201000657Y Wireless power-off warning equipment
01/02/2008CN201000480Y Accumulator online testing device
01/02/2008CN201000479Y Vehicle circuit detector
01/02/2008CN201000478Y Motor dynamic loading controller
01/02/2008CN201000477Y Railway signal ZPW-2000 equipment receiver automatic detection device
01/02/2008CN201000476Y Generator rotor winding interturn fault online diagnostic device
01/02/2008CN201000475Y Signal generating circuit for detecting earthing condition
01/02/2008CN201000474Y Circuit fault indicator
01/02/2008CN201000473Y current surge instrument
01/02/2008CN201000472Y Turnplate type high speed test device
01/02/2008CN101099292A Latch circuit including a data retention latch
01/02/2008CN101099088A Signal transmission system, signal output circuit board, signal receiving circuit board, signal output method and signal receiving method
01/02/2008CN101099087A Semiconductor device, test apparatus and measurement method therefor
01/02/2008CN101099086A Method and apparatus for constructing a repair path around a non-available component in a data communications network