Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2007
12/12/2007EP1322971A4 Re-locatable partial discharge transducer head
12/12/2007CN200990516Y Energy standby device
12/12/2007CN200990499Y DSP relay protection controller based on ripple theory
12/12/2007CN200990261Y Electric source line with electricity leakage detecting conductor
12/12/2007CN200989936Y Logical analyzer
12/12/2007CN200989935Y Testing system
12/12/2007CN200989934Y CPU socket open-circuit detector
12/12/2007CN200989933Y Electric line antitheft alarming device
12/12/2007CN200989932Y Test system for reducing index time
12/12/2007CN200989931Y Domestic air conditioner outdoor machine voltage circulating compact testing device
12/12/2007CN200989930Y Electric tracting coal cutting machine electric fitting quality detecting table
12/12/2007CN200989929Y Magnetron tester
12/12/2007CN200989928Y Organic electroluminescent device brightness testing device
12/12/2007CN200989925Y Strong magnetic field prealarming device
12/12/2007CN200989924Y Wireless hidden earphone detector for examination cheating
12/12/2007CN200989921Y Electric line antitheft alarming device
12/12/2007CN200989918Y Inputting voltage detection circuit for sensing transformer
12/12/2007CN200989911Y Multipurpose device testing holder
12/12/2007CN200989910Y Automatic connecting and disconnecting device
12/12/2007CN200989909Y Vernier adjustable PCB test device
12/12/2007CN200989844Y Apparatus for battery impact test
12/12/2007CN200989820Y Road illumination detecting vehicle
12/12/2007CN200989773Y Chip box chip fixing mechanism detector
12/12/2007CN200988037Y Battery sorter
12/12/2007CN101088133A Method and device for the secure operation of a switching device
12/12/2007CN101088018A Test apparatus
12/12/2007CN101088017A Plug-in, pusher for electronic component conveying device, socket guide piece for test and electronic component conveying device
12/12/2007CN101088015A On silicon interconnect capacitance extraction
12/12/2007CN101087148A Simulation and analysis system and method of high-speed differential signal
12/12/2007CN101087125A An electromotor drive system of electromotive motorcar with life prediction function
12/12/2007CN101087067A A self-check device and method of relay circuit
12/12/2007CN101086974A Built-in testing device and method and testing device built in wafer cutting line section
12/12/2007CN101086765A System and method for testing RFID devices
12/12/2007CN101086563A LCD test device and test process thereof
12/12/2007CN101086523A Sensor node energy management system
12/12/2007CN101086522A Method and apparatus for determining the effect of temperature upon life expectancy of an electric energy storage device
12/12/2007CN101086521A Method and apparatus for real-time life estimation of an electric energy storage device
12/12/2007CN101086520A Method and apparatus for real-time life estimation of an electric energy storage device in a hybrid electric vehicle
12/12/2007CN101086519A Method and apparatus for implementing target life span of an electric energy storage device
12/12/2007CN101086518A Method and apparatus for predicting change in an operating state of an electric energy storage device
12/12/2007CN101086517A Method and apparatus for quantifying quiescent period temperature effects upon an electric energy storage device
12/12/2007CN101086516A Battery in-position detection system when charging of electronic apparatus
12/12/2007CN101086515A Dynamotor local discharge on-line monitoring method based on double sensor directional coupling
12/12/2007CN101086514A 半导体器件 Semiconductor devices
12/12/2007CN101086513A Transmission line real-time on-line monitoring method based on acoustic emission principle and the device
12/12/2007CN101086508A Checking apparatus and its connector and checking method
12/12/2007CN101086482A Object image coordinate error regulation device and method when spicing surface flaw detecting image
12/12/2007CN101086481A Automatic optical inspection system teaching method and inspection method using same
12/12/2007CN100355179C Output voltage adjustable combined battery
12/12/2007CN100355071C Mixed analog and digital inegrated circits
12/12/2007CN100355054C Reliability screening method of infrared focus planardetector
12/12/2007CN100355052C Testing mode control device using nonvolatile ferroeletric storage
12/12/2007CN100354918C Flat display apparatus and flat display apparatus testing method
12/12/2007CN100354838C Method and device for analyzing damage
12/12/2007CN100354734C Automatic controller of liquid-crystal panel for panel crade of automatic detector and method thereof
12/12/2007CN100354642C No coupling property detecting system and its method for single phase AC series excitation commutator motor
12/12/2007CN100354641C Reliability test installation for overload relay
12/12/2007CN100354640C Apparatus and method for handling and testing of wafers
12/12/2007CN100354639C Method for detecting gallium nitride base LED quality good or not
12/12/2007CN100354638C Measuring device of deep energy level transient state spectrum having external magnetic field and measuring method
12/12/2007CN100354637C Test circuit and test method thereof
12/12/2007CN100354514C Control apparatus and method for vehicle equipped power supply having battery deterioration diagnostic feature
12/11/2007US7308660 Calculation system of fault coverage and calculation method of the same
12/11/2007US7308656 Method and apparatus for generating a boundary scan description and model
12/11/2007US7308635 Integrated circuit comprising a test mode secured by initialization of the test mode
12/11/2007US7308634 Systems and methods for LBIST testing using multiple functional subphases
12/11/2007US7308633 Master controller architecture
12/11/2007US7308632 Method and apparatus for measuring duty cycle distortion on an integrated circuit
12/11/2007US7308631 Wrapper serial scan chain functional segmentation
12/11/2007US7308630 Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit)
12/11/2007US7308629 Addressable tap domain selection circuit with TDI/TDO external terminal
12/11/2007US7308628 Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits
12/11/2007US7308627 Self-timed reliability and yield vehicle with gated data and clock
12/11/2007US7308626 Method and structure for picosecond-imaging-circuit-analysis based built-in-self-test diagnostic
12/11/2007US7308625 Delay-fault testing method, related system and circuit
12/11/2007US7308622 Integrated memory and method for testing the memory
12/11/2007US7308621 Testing of ECC memories
12/11/2007US7308619 IP packet error handling apparatus and method using the same, and computer readable medium having computer program for executing the method recorded thereon
12/11/2007US7308595 Method and device for generating an internal time base for a diagnostic function for an output module
12/11/2007US7308395 Simulation circuit pattern evaluation method, manufacturing method of semiconductor integrated circuit, test substrate, and test substrate group
12/11/2007US7308370 Using a fixed network wireless data collection system to improve utility responsiveness to power outages
12/11/2007US7308282 Communication control system, communication control method, base station and mobile station
12/11/2007US7308129 Characteristic amount calculating device for soldering inspection
12/11/2007US7307960 Method and device for data communication with a data processing device controlling an electronic device
12/11/2007US7307948 System with multiple path fail over, fail back and load balancing
12/11/2007US7307947 Protection system, layer 2 function block, node and ring network enabling wideband transmission of working traffic and protection of protection channel traffic
12/11/2007US7307820 Systems, methods, and device for arc fault detection
12/11/2007US7307528 RFID tag design with circuitry for wafer level testing
12/11/2007US7307444 Testing method and testing apparatus for liquid crystal panel
12/11/2007US7307443 Test socket for an integrated circuit
12/11/2007US7307442 Integrated circuit test array including test module
12/11/2007US7307441 Integrated circuit chips and wafers including on-chip test element group circuits, and methods of fabricating and testing same
12/11/2007US7307440 Semiconductor integrated circuit tester with interchangeable tester module
12/11/2007US7307439 Semiconductor integrated circuit apparatus, measurement result management system, and management server
12/11/2007US7307438 Thermal transferring member, test board and test apparatus
12/11/2007US7307437 Arrangement with conductive pad embedment
12/11/2007US7307436 Electrical feedback detection system for multi-point probes
12/11/2007US7307435 Probe card
12/11/2007US7307434 Operation voltage supply apparatus and operation voltage supply method for semiconductor device
12/11/2007US7307433 Intelligent probe card architecture