| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/02/2008 | CN101099085A A method and apparatus for increasing the operating frequency of a system for testing electronic devices |
| 01/02/2008 | CN101098200A Method for implementing customizable test procedure |
| 01/02/2008 | CN101098029A Method for estimating state of charge of battery, battery management system using same, and driving method thereof |
| 01/02/2008 | CN101098012A Fuel cell control system, control apparatus and control method |
| 01/02/2008 | CN101098011A Method for supporting household electric appliance operation using fuel cell test system |
| 01/02/2008 | CN101097877A Control method for detector and control program |
| 01/02/2008 | CN101097876A Folding optical apparatus for imaging system |
| 01/02/2008 | CN101097653A Electric energy quality and electrical power system malfunction detection wave recording device and method |
| 01/02/2008 | CN101097249A Device used for low voltage electric power detection indicating |
| 01/02/2008 | CN101097248A Enhanced-accuracy battery capacity prediction |
| 01/02/2008 | CN101097247A Method for testing motor and testing circuit |
| 01/02/2008 | CN101097246A Durability testing device of rear-view mirror electric direction varying device |
| 01/02/2008 | CN101097245A Scan chain and method that realizing high speed testing circuitry |
| 01/02/2008 | CN101097244A Scan-based testing of devices implementing a test clock control structure ('tccs') |
| 01/02/2008 | CN101097243A Apparatus and method for customized burn-in of cores on a multicore microprocessor integrated circuit chip |
| 01/02/2008 | CN101097242A Boundary scan testing controller and testing method thereof |
| 01/02/2008 | CN101097241A Semiconductor device and semiconductor testing device |
| 01/02/2008 | CN101097240A Maintaining device and method for transmission line |
| 01/02/2008 | CN101097239A Circuit detecting method and detection device |
| 01/02/2008 | CN101097238A Performance measurement system |
| 01/02/2008 | CN101097237A Electron component pull force tester and method |
| 01/02/2008 | CN101097236A Measuring systems of differential signal and method thereof |
| 01/02/2008 | CN101097235A Test cabinet having positioning apparatus |
| 01/02/2008 | CN101097234A Test cabinet of double testing antenna |
| 01/02/2008 | CN101097229A Detecting device |
| 01/02/2008 | CN101097228A Fixture mechanism used for host board testing operation and testing system having device |
| 01/02/2008 | CN101097221A Dismounting and testing method of zero component |
| 01/02/2008 | CN100359792C Method for detecting broken line fault between rectifier zero line of uninterrupted power source and electrified wire netting zero line |
| 01/02/2008 | CN100359781C Charging apparatus and charging current detecting circuit thereof |
| 01/02/2008 | CN100359761C Mechanism for testing circuit boards |
| 01/02/2008 | CN100359661C Apparatus and method for single die backside probing of semiconductor devices |
| 01/02/2008 | CN100359659C Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
| 01/02/2008 | CN100359608C Storage test circuit |
| 01/02/2008 | CN100359596C Semiconductor memory having enhanced testing power |
| 01/02/2008 | CN100359556C Source driver of built-in detecting circuit and its detecting method |
| 01/02/2008 | CN100359473C Memory rewind and reconstruction for hardware emulator |
| 01/02/2008 | CN100359335C Monitor for small type wind driven generator |
| 01/02/2008 | CN100359334C Electric machine operation state sensor and sensing method |
| 01/02/2008 | CN100359333C Simulation test method applied for chips |
| 01/02/2008 | CN100359332C Device for testing electric pulse strength for insulation |
| 01/02/2008 | CN100359331C Automatic rotary button detecting method and apparatus |
| 01/02/2008 | CN100359328C Connector for measuring electric resistance, apparatus and method for measuring electric resistance of circuit board |
| 01/02/2008 | CN100359310C High and low temperature recycle unit with wide temperature range |
| 01/01/2008 | US7315997 Method and apparatus for supporting designing of LSI, and computer product |
| 01/01/2008 | US7315974 Method for detecting faults in electronic devices, based on quiescent current measurements |
| 01/01/2008 | US7315973 Method and apparatus for choosing tests for simulation and associated algorithms and hierarchical bipartite graph data structure |
| 01/01/2008 | US7315972 Method and apparatus for automated generation of expected value data for circuit designs |
| 01/01/2008 | US7315970 Semiconductor device to improve data retention characteristics of DRAM |
| 01/01/2008 | US7315731 Method of measuring and calibrating frequency down converter |
| 01/01/2008 | US7315593 Hyperfine oversampler method and apparatus |
| 01/01/2008 | US7315574 System and method for generating a jittered test signal |
| 01/01/2008 | US7315515 TCP acceleration system |
| 01/01/2008 | US7315512 Method for redundancy backup of signaling link in IP network |
| 01/01/2008 | US7315511 Transmitter, SONET/SDH transmitter, and transmission system |
| 01/01/2008 | US7315509 Method for recovering from a received data error in a mobile communication system providing a multimedia broadcast/multicast service |
| 01/01/2008 | US7315181 Method for automatically identifying component failure in a communication network |
| 01/01/2008 | US7315180 Device for monitoring quiescent current of an electronic device |
| 01/01/2008 | US7315179 System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 01/01/2008 | US7315178 System and method for measuring negative bias thermal instability with a ring oscillator |
| 01/01/2008 | US7315177 Mixed signal integrated circuits with self-test capability |
| 01/01/2008 | US7315176 Electrical test probes, methods of making, and methods of using |
| 01/01/2008 | US7315175 Probe apparatus and method for examining a sample |
| 01/01/2008 | US7315174 Method of measuring flat-band status capacitance of a gate oxide in a MOS transistor device |
| 01/01/2008 | US7315173 Method of measuring electric field distribution and electric field distribution measuring instrument |
| 01/01/2008 | US7315169 Microprocessor controlled fault indicator having inrush restraint circuit |
| 01/01/2008 | US7315163 Arithmetic unit |
| 01/01/2008 | US7315036 Multifunction multi-spectrum signalling device |
| 01/01/2008 | US7315022 High-speed electron beam inspection |
| 12/27/2007 | WO2007149808A2 Logic device and method supporting scan test |
| 12/27/2007 | WO2007149289A1 Determination of battery predictive power limits |
| 12/27/2007 | WO2007149205A2 High accuracy in-situ resistance measurements methods |
| 12/27/2007 | WO2007148696A1 Substrate inspecting apparatus and substrate inspecting method |
| 12/27/2007 | WO2007148422A1 Calibration method employed in electronic component test system |
| 12/27/2007 | WO2007148375A1 Method for calibrating electronic component testing apparatus |
| 12/27/2007 | WO2007148268A2 Semiconductor device with test structure and semiconductor device test method |
| 12/27/2007 | WO2007148245A2 Method of checking the integrity of an antenna arrangement, transmitter, receiver and transceiver |
| 12/27/2007 | WO2007147941A1 System and method for determining phase-to-earth admittances of a three-phase electric line |
| 12/27/2007 | WO2007147736A1 System for measuring the radiation pattern of a transmission antenna |
| 12/27/2007 | WO2007147324A1 Method for measuring calling time length of mobile phone |
| 12/27/2007 | WO2007131141A3 Method and apparatus for probing |
| 12/27/2007 | WO2007096775A3 Fault detection system |
| 12/27/2007 | WO2007093861B1 Method and apparatus for evaluating the level of superficial pollution of a medium/high voltage outdoor insulator |
| 12/27/2007 | WO2007070272A3 Method and apparatus for packet scheduling in a wireless network |
| 12/27/2007 | US20070300118 Method and system for controlling multiple physical pin electronics channels in a semiconductor test head |
| 12/27/2007 | US20070300117 Mapping logic for loading control of crossbar multiplexer select RAM |
| 12/27/2007 | US20070300116 Asynchronous set-reset circuit device |
| 12/27/2007 | US20070300115 Apparatus and method for accelerating test, debug and failure analysis of a multiprocessor device |
| 12/27/2007 | US20070300114 Test apparatus and test method |
| 12/27/2007 | US20070300112 Semiconductor integrated circuit apparatus, test circuit of semiconductor integrated circuit apparatus and test method of semiconductor integrated circuit apparatus |
| 12/27/2007 | US20070300111 Wide frequency range signal generator and method, and integrated circuit test system using same |
| 12/27/2007 | US20070300110 Phase shifter with reduced linear dependency |
| 12/27/2007 | US20070300109 High speed interconnect circuit test method and apparatus |
| 12/27/2007 | US20070300108 Logic device and method supporting scan test |
| 12/27/2007 | US20070300107 Device test apparatus |
| 12/27/2007 | US20070300106 Integrated memory device and method for its testing and manufacture |
| 12/27/2007 | US20070299620 Method for estimating state of charge of battery, battery management system using same, and driving method thereof |
| 12/27/2007 | US20070298526 Programmable semiconductor device |
| 12/27/2007 | US20070298525 Integrated microelectronic package stress sensor |
| 12/27/2007 | US20070298524 Methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same |
| 12/27/2007 | US20070298279 Organic Electroluminescent Element, Testing Device Thereof, and Testing Method Thereof |