Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2007
11/15/2007US20070266288 Re-configurable architecture for automated test equipment
11/15/2007US20070266287 Spatial frequency response measurement method
11/15/2007US20070266286 Test semiconductor device in full frequency with half frequency tester
11/15/2007US20070266285 Duty cycle measurement method and apparatus that operates in a calibration mode and a test mode
11/15/2007US20070266284 System and method for testing functional boundary logic at asynchronous clock boundaries of an integrated circuit device
11/15/2007US20070266283 Method and Apparatus for Testing an Integrated Circuit
11/15/2007US20070266282 Fault-tolerant architecture of flip-flops for transient pulses and signal delays
11/15/2007US20070266281 Integrated circuit chip packaging
11/15/2007US20070266280 Method and Apparatus to Test the Power-on-Reset Trip Point of an Integrated Circuit
11/15/2007US20070265794 Semiconductor device test apparatus and method
11/15/2007US20070265672 Method for monitoring end of life for battery
11/15/2007US20070265154 Porcelain Enamel Having A Metallic Appearance
11/15/2007US20070264731 Method for Local Hot Spot Fixing
11/15/2007US20070264730 Redundant acknowledgment in loopback entry
11/15/2007US20070264729 Method for reducing within chip device parameter variations
11/15/2007US20070263533 Apparatus and method for transmitting and recovering multi-lane encoded data streams using a reduced number of lanes
11/15/2007US20070262800 Electronic device, circuit and test apparatus
11/15/2007US20070262785 Semiconductor apparatus and test execution method for semiconductor apparatus
11/15/2007US20070262784 Arcuate blade probe
11/15/2007US20070262783 Probing apparatus and probing method
11/15/2007US20070262782 Method for compensation for a position change of a probe card
11/15/2007US20070262780 Arc fault detector
11/15/2007US20070262769 Handler for sorting packaged chips
11/15/2007US20070262767 Probing a device
11/15/2007US20070261232 Method for trimming resistors
11/15/2007DE10325751B4 Vorrichtung und Verfahren zur Berechnung eines Verschlechterungsgrades für eine Batterie Device and method for calculating a degree of deterioration of a battery
11/15/2007DE102007021064A1 Platine mit eingebetteten Bauteilen und Verfahren zur Erkennung einer fehlerhaften Verdrahtung Board with embedded components and method for detecting faulty wiring
11/15/2007DE102006031663B3 Information technology network`s insulation resistance measuring method for vehicle application, involves evaluating average value in temporal sequence, and using transient effect of potential measurements to inspect measuring instrument
11/15/2007DE102006022475A1 Verfahren zum Ausgleichen einer durch eine Temperaturänderung hervorgerufenen Positionsänderung einer Nadelkarte A method of compensating for a temperature change caused by a change in position of a probe card
11/15/2007DE102006022363A1 Verfahren zur Überwachung einer kryogenen Umgebung und Leiteranordnung Method for monitoring a cryogenic environment and conductor arrangement
11/15/2007DE102006021913A1 Circuit arrangement for detecting e.g. series electric arc, in motor vehicle electrical system, has programmable integrated circuit determining electric arcs from decoupled oscillation signal, where interface indicates occurrence of arcs
11/15/2007DE102006019895A1 Power measuring device for use as battery sensor for measuring e.g. battery power, of vehicle, has connecting unit for connecting contact unit with connector of board, where press fit is provided between connecting unit and hole
11/15/2007DE102005044194B4 Messvorrichtung und Verfahren zum Messen von relativen Phasenlagen von digitalen Signalen Measuring apparatus and method for measuring relative phase positions of digital signals
11/14/2007EP1855122A1 Leak current breaker and method
11/14/2007EP1855120A2 Device for evaluating line tests of power lines
11/14/2007EP1854304A2 Method and apparatus for pinpointing common path distortion sources
11/14/2007EP1853934A1 Capacity degradation in a lead acid battery method and apparatus
11/14/2007EP1853933A1 Compact representation of vendor hardware module revisions in an open architecture test system
11/14/2007EP1853932A2 Detecting partial discharge in high voltage cables
11/14/2007EP1853931A2 Method and circuit for the detection of solder-joint failures in a digital electronic package
11/14/2007EP1668376B1 Efficient switching architecture with reduced stub lengths
11/14/2007EP1653239B1 Test apparatus with waveform formatter
11/14/2007EP1637893B1 Method and apparatus for testing electrical characteristics of object under test
11/14/2007EP1588571A4 Method and apparatus for evaluating and optimizing a signaling system
11/14/2007EP1252529B1 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable
11/14/2007EP1250607B1 Method and device for monitoring a telecommunication cable
11/14/2007EP1123639A4 Wafer level burn-in and test thermal chuck and method
11/14/2007EP1083575B1 Non volatile memory with detection of short circuits between word lines
11/14/2007EP0757318B1 A router element for routing messages in a processing system
11/14/2007CN200976498Y Lead accumulator discharging control device
11/14/2007CN200976335Y GFCI having fault indication and forced release function
11/14/2007CN200976040Y Equipment frock for testing safety circulation performance of lithium ionic cell
11/14/2007CN200976039Y Generator startup experiment tester
11/14/2007CN200976038Y Extruding press synthetic measuring instrument
11/14/2007CN200976037Y Assembled switch testing device
11/14/2007CN200976036Y ATCA structure based JTAG testing device
11/14/2007CN200976035Y Device for testing power field-effect transistor static parameter
11/14/2007CN200976034Y Directly-displayed low current grounding detector
11/14/2007CN200976033Y Electric power line anti-theft alarm device
11/14/2007CN200976032Y Malfunction detection device for resistance wire of heating stove
11/14/2007CN200976031Y Power ground network online test device
11/14/2007CN200976030Y Ceramic dual-row package integrated circuit aging test socket
11/14/2007CN200976027Y Insulation push-and-pull tray device for high-voltage aerial extension insulator resistance detection
11/14/2007CN200976023Y CMOS battery voltage detecting circuit
11/14/2007CN200976013Y 电路板测试箱 Circuit board test box
11/14/2007CN200976012Y Touch testing device
11/14/2007CN200976011Y High-voltage vacuum breaker testing device
11/14/2007CN200976009Y Electric performance testing clamp for circuit board
11/14/2007CN200975952Y Mobile telephone keyboard detecting device
11/14/2007CN200975925Y Equipment for testing magnetic levitation dynamic performance of high-temperature superconduction block
11/14/2007CN200974371Y Stator marking device
11/14/2007CN101073016A Method and system for performing installation and configuration management of tester instrument modules
11/14/2007CN101073015A Corrective device protection
11/14/2007CN101073014A Relay connection member, inspection device and method of manufacturing relay connection member
11/14/2007CN101072497A Virtual preventive checking system of mounting device and method for controlling mounting-device using same
11/14/2007CN101072496A 产品处理系统 Product handling systems
11/14/2007CN101072467A Component-embedded board device and faulty wiring detecting method for the same
11/14/2007CN101072025A 半导体集成电路及其测试方法 Semiconductor integrated circuit and test methods
11/14/2007CN101071956A Method and and device for regulating secondary cell array for solar photovalatic system
11/14/2007CN101071890A Battery pack, and residual capacity information feeding device therefor
11/14/2007CN101071163A Current converter test circuit
11/14/2007CN101071162A Current converter test circuit
11/14/2007CN101071161A Secondary discharge battery internal resistance on-line detecting method
11/14/2007CN101071160A Cell health state diagnosis method
11/14/2007CN101071159A Electric automobile energy collecting system and method
11/14/2007CN101071158A Relay test method for on-line testing instrument
11/14/2007CN101071157A Method and equipment for inspecting display substrate
11/14/2007CN101071156A Multi-connecting board bad-product detecting device and method
11/14/2007CN101071155A Device and method for realizing border-scanning multi-link test
11/14/2007CN101071154A Loop oscillator start circuit
11/14/2007CN101071153A Method for designing a probe card
11/14/2007CN101071152A Method for detecting generator stator single-phase earthing fault direction
11/14/2007CN101071151A Amplitude-comparison zero sequence direction relay reactor inter-turn fault measuring method
11/14/2007CN101071150A Flexible circuit board circuit on-off detecting method
11/14/2007CN101071149A Electronic component aligning bias detecting method and its detecting device
11/14/2007CN101071148A Electronic device and method for realizing dynamic environmental stress screening
11/14/2007CN101071147A Electronic device detecting system and electronic device detecting method
11/14/2007CN101071141A Detecting unit and detecting device with same
11/14/2007CN101071140A Probe, testing head having a plurality of probes, and circuit board tester having the testing head
11/14/2007CN100349385C Verifying device special for integrated circuit function
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