| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/23/2008 | CN101109772A Testing circuit for crossover voltage and testing method thereof |
| 01/23/2008 | CN101109769A Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same |
| 01/23/2008 | CN101109768A Improved structure of modularized elastic probe |
| 01/23/2008 | CN101109767A Improved structure of two sheet type modularized elastic probe |
| 01/23/2008 | CN101109766A Fixing mechanism of probe card, fixing method of probe card and probe card |
| 01/23/2008 | CN101109765A Electromagnetic high-frequency LED conveying device |
| 01/23/2008 | CN101109678A Testing jig |
| 01/23/2008 | CN100364205C Remaining capacity calculation method for secondary battery, and battery pack |
| 01/23/2008 | CN100364203C Portable composite battery managing system |
| 01/23/2008 | CN100364168C Method for sorting batteries according to battery volt-ampere curve |
| 01/23/2008 | CN100364072C Motor drive device with power semiconductor module life testing function |
| 01/23/2008 | CN100364043C Semiconductor device, electrical inspection method thereof, and electronic apparatus including the semiconductor device |
| 01/23/2008 | CN100364041C Wafer inspection device |
| 01/23/2008 | CN100364014C Method and device for testing semiconductor memory devices |
| 01/23/2008 | CN100363751C Measuring system of fluorescent lamp high frequency standard and its method |
| 01/23/2008 | CN100363750C Method for judging generator PT line failure |
| 01/23/2008 | CN100363749C Scanning device of boundary |
| 01/23/2008 | CN100363748C On-line detecting and positioning device for local discharging of electrical insulated combined electrical appliance, and positioning method thereof |
| 01/23/2008 | CN100363747C Gas insulation combined electric device local discharge superhigh frequency detection apparatus and method |
| 01/23/2008 | CN100363746C Method for measuring multimedia recording and playing device |
| 01/23/2008 | CN100363744C Probe connecting terminal cladded with conducting wire on testing tool of printed circuit distributing board |
| 01/22/2008 | US7322032 Methods and apparatus for scheduling operation of a data source |
| 01/22/2008 | US7322001 Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance |
| 01/22/2008 | US7322000 Methods and apparatus for extending semiconductor chip testing with boundary scan registers |
| 01/22/2008 | US7321999 Methods and apparatus for programming and operating automated test equipment |
| 01/22/2008 | US7321998 Semiconductor integrated circuit having a number of data output pins capable of selectively providing output signals and test method thereof |
| 01/22/2008 | US7321997 Memory channel self test |
| 01/22/2008 | US7321991 Semiconductor memory device having advanced test mode |
| 01/22/2008 | US7321559 System and method of noise reduction in receiving wireless transmission of packetized audio signals |
| 01/22/2008 | US7321554 Method and apparatus for preventing blocking in a quality of service switch |
| 01/22/2008 | US7321482 Sub-circuit voltage manipulation |
| 01/22/2008 | US7321249 Oscillator, frequency multiplier, and test apparatus |
| 01/22/2008 | US7321235 Input circuit for an integrated circuit |
| 01/22/2008 | US7321234 Resistive test probe tips and applications therefor |
| 01/22/2008 | US7321233 System for evaluating probing networks |
| 01/22/2008 | US7321232 Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam |
| 01/22/2008 | US7321220 Method for calculating power capability of battery packs using advanced cell model predictive techniques |
| 01/17/2008 | WO2008008773A1 System and method for performing processing in a testing system |
| 01/17/2008 | WO2008008769A1 Apparatus for and method of generating a time reference |
| 01/17/2008 | WO2008008736A2 Dynamic redundancy checker against fault injection |
| 01/17/2008 | WO2008008570A2 Sawing tile corners on probe card substrates |
| 01/17/2008 | WO2008008367A2 System-on-a-chip (soc) test interface security |
| 01/17/2008 | WO2008008227A1 Digital waveform generation and measurement in automated test equipment |
| 01/17/2008 | WO2008008156A2 Electron induced chemical etching for device diagnosis |
| 01/17/2008 | WO2008008065A1 Probe card with balanced lateral force |
| 01/17/2008 | WO2008007636A1 Tester, adjustment method, and adjustment program |
| 01/17/2008 | WO2008006655A1 Method and device for detecting interlaminar short circuits |
| 01/17/2008 | WO2007146479A3 Data communication flow control device and methods thereof |
| 01/17/2008 | WO2007102847A3 Excess overdrive detector for probe cards |
| 01/17/2008 | US20080016486 System and method of assessing reliability of a semiconductor |
| 01/17/2008 | US20080016423 Segmented algorithmic pattern generator |
| 01/17/2008 | US20080016421 Method and apparatus for providing programmable control of built-in self test |
| 01/17/2008 | US20080016420 Memory controller with a self-test function, and method of testing a memory controller |
| 01/17/2008 | US20080016419 Data compression read mode for memory testing |
| 01/17/2008 | US20080016417 Cell Supporting Scan-based Tests and With Reduced Time Delay in Functional Mode |
| 01/17/2008 | US20080016396 Test emulator, test module emulator and record medium storing program therein |
| 01/17/2008 | US20080015798 Test Protocol Manager for Massive Multi-Site Test |
| 01/17/2008 | US20080013458 Method and apparatus for transmitting/receiving link status |
| 01/17/2008 | US20080013454 Content Aware Transport Layer Multicast |
| 01/17/2008 | US20080012596 Method and system for trimming voltage or current references |
| 01/17/2008 | US20080012594 Probe Card with Balanced Lateral Force |
| 01/17/2008 | US20080012593 Circuit board checker and circuit board checking method |
| 01/17/2008 | US20080012592 Device and method for testing semiconductor packages |
| 01/17/2008 | US20080012591 Differential signal probe with integral balun |
| 01/17/2008 | US20080012587 Method for measuring work function |
| 01/17/2008 | US20080012583 Power grid structure to optimize performance of a multiple core processor |
| 01/17/2008 | US20080012574 Qualifying of a detector of noise peaks in the supply of an integrated circuit |
| 01/17/2008 | US20080012573 Digital cable toning apparatus and method |
| 01/17/2008 | US20080012572 Semiconductor device having a function of detection breakages on a periphery thereof |
| 01/17/2008 | US20080012571 Measuring Device And Measuring Procedure For Determining Battery Cell Voltages |
| 01/17/2008 | US20080012547 Detection circuit for sensing the input voltage of transformer |
| 01/17/2008 | US20080012516 Electromotive Furniture Drive |
| 01/17/2008 | US20080010814 Tester channel to multiple ic terminals |
| 01/17/2008 | DE10344021B4 Nichtflüchtiger Speicherbaustein, Programmiervorrichtung und Programmierverfahren Non-volatile memory device programmer and programming methods |
| 01/17/2008 | CA2656025A1 Detection and monitoring of partial discharge of a power line |
| 01/16/2008 | EP1879091A1 Voltage sag generator device |
| 01/16/2008 | EP1879038A1 Conductive contact holder and conductive contact unit |
| 01/16/2008 | EP1879035A1 Probe Card |
| 01/16/2008 | EP1877812A1 Lithium sulfur rechargeable battery fuel gauge systems and methods |
| 01/16/2008 | EP1877811A1 Integrated circuit comprising a secure test mode using integrated circuit configurable cell chain status detection |
| 01/16/2008 | EP1877810A1 Probe card assembly with a dielectric structure |
| 01/16/2008 | EP1877809A2 Assembly for regulating the temperature of an integrated circuit |
| 01/16/2008 | EP1877807A2 Apparatus and method for managing thermally induced motion of a probe card assembly |
| 01/16/2008 | EP1877806A1 Supply voltage monitoring |
| 01/16/2008 | EP1685417A4 Hot switchable voltage bus for iddq current measurements |
| 01/16/2008 | EP1642471A4 Method and apparatus for control channel scheduling in a packet data communication system |
| 01/16/2008 | EP1592976B1 Method and structure to develop a test program for semiconductor integrated circuits |
| 01/16/2008 | EP1459323B1 Multi-mode synchronous memory device and method of operating and testing same |
| 01/16/2008 | EP1307755B1 Capturing and evaluating high speed data streams |
| 01/16/2008 | CN201008137Y Dual-digital power amplifier thermal backup device for digital train broadcasting machine |
| 01/16/2008 | CN201008136Y Power amplifier and loading output detecting apparatus |
| 01/16/2008 | CN201008095Y Small current grounding wire-selecting device of microcomputer |
| 01/16/2008 | CN201007855Y Motor vehicle circuit detecting instrument |
| 01/16/2008 | CN201007846Y On-line monitoring system for lightning arrester |
| 01/16/2008 | CN201007763Y LCD glass substrates crash detection circuit |
| 01/16/2008 | CN201007738Y Battery electric quantity metering display circuit device of LED lamp |
| 01/16/2008 | CN201007737Y Circuit test device |
| 01/16/2008 | CN201007736Y Cable plastic-aluminum strip breakpoint positioning device |
| 01/16/2008 | CN201007735Y DC integrated monitor device |
| 01/16/2008 | CN201007734Y Ground fault display apparatus |