| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/18/2007 | US7309998 Process monitor for monitoring an integrated circuit chip |
| 12/18/2007 | US7309997 Monitor system and method for semiconductor processes |
| 12/18/2007 | US7309996 Contactor for electronic components and test method using the same |
| 12/18/2007 | US7309995 Noncontact conductivity measuring instrument |
| 12/18/2007 | US7309993 Three- or four-pole low-voltage power switch with Rogowski coils operating as current sensors |
| 12/18/2007 | US7309991 Scanning probe inspection apparatus |
| 12/18/2007 | US7309981 Pressing member and electronic device handling apparatus |
| 12/18/2007 | US7309850 Measurement of current-voltage characteristic curves of solar cells and solar modules |
| 12/18/2007 | US7309609 Applying alternating magnetic fields; generating eddy currents |
| 12/18/2007 | US7309079 Method of determining charging capacitance of capacitor |
| 12/18/2007 | CA2422213C State detecting system and device employing the same |
| 12/15/2007 | CA2590948A1 Method and apparatus to determine moisture content in solid insulation |
| 12/13/2007 | WO2007143478A2 Space based network for detection and monitoring of global maritime shipping using automatic identification system |
| 12/13/2007 | WO2007143326A2 Mini-prober for tft-lcd testing |
| 12/13/2007 | WO2007143199A2 Methods and apparatuses for trimming circuits |
| 12/13/2007 | WO2007142732A1 Electrical system |
| 12/13/2007 | WO2007142204A1 Probe card |
| 12/13/2007 | WO2007142195A1 Method for judging abnormality of battery pack, and battery pack |
| 12/13/2007 | WO2007141976A1 Work transporting apparatus and electronic component transporting apparatus |
| 12/13/2007 | WO2007141931A1 Semiconductor device composed of chips and semiconductor examining method |
| 12/13/2007 | WO2007141896A1 Semiconductor integrated circuit |
| 12/13/2007 | WO2007141876A1 Method for judging deterioration state of battery, deterioration judgment device and power supply system |
| 12/13/2007 | WO2007141088A1 Sensor device, in particular sensor mat for a vehicle |
| 12/13/2007 | WO2007140955A1 Circuit for monitoring a battery voltage |
| 12/13/2007 | WO2007140836A1 Device for inspecting an electrical line's protection element and for verifying said electrical line |
| 12/13/2007 | WO2007140795A1 Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection |
| 12/13/2007 | WO2007140753A1 Test probe for a test apparatus for testing plug-type connectors and method for testing plug-type connectors |
| 12/13/2007 | WO2007140732A1 Device and method for detecting an energy quality level in an electrical supply network |
| 12/13/2007 | WO2007140627A1 A method for determining the linear electrical response of a transformer, generator or electrical motor |
| 12/13/2007 | WO2007109428A3 Packaging method of chip or package equipped with bumps |
| 12/13/2007 | WO2007099479A3 Ic circuit with test access control circuit using a jtag interface |
| 12/13/2007 | WO2007094795A3 System and method for resilient wireless packet communications |
| 12/13/2007 | WO2007088552A9 Apparatus and method for imaging integrated circuits and the like |
| 12/13/2007 | WO2007076500A3 A method for reducing traffic loading in an ad-hoc network |
| 12/13/2007 | WO2006116060A3 Direct detect sensor for flat panel displays |
| 12/13/2007 | WO2006101836A3 Fpga emulation system |
| 12/13/2007 | US20070288823 Apparatus including a fluid coupler interfaced to a test head |
| 12/13/2007 | US20070288822 Timing-aware test generation and fault simulation |
| 12/13/2007 | US20070288821 Semiconductor integrated circuit, test data generating device, lsi test device, and computer product |
| 12/13/2007 | US20070288820 Selectable dual mode test access port method and apparatus |
| 12/13/2007 | US20070288819 Semiconductor integrated circuit, test data generating device, lsi test device, and computer product |
| 12/13/2007 | US20070288818 IC functional and delay fault testing |
| 12/13/2007 | US20070288817 Semiconductor integrated circuit and a method of testing the same |
| 12/13/2007 | US20070288816 Semiconductor integrated circuit and test method therefor |
| 12/13/2007 | US20070288815 Dual Mode Test Access Port Method and Apparatus |
| 12/13/2007 | US20070288814 Apparatus and method for discrete test access control of multiple cores |
| 12/13/2007 | US20070288813 Cell board interconnection architecture with serviceable switch board |
| 12/13/2007 | US20070288811 System and method for testing a data storage device without revealing memory content |
| 12/13/2007 | US20070288806 Method and arrangement to estimate transmission channel characteristics |
| 12/13/2007 | US20070288797 Generating scan test vectors for proprietary cores using pseudo pins |
| 12/13/2007 | US20070288190 Increase productivity at wafer test using probe retest data analysis |
| 12/13/2007 | US20070288136 Method For Coupling A Control Unit To A Program For Modeling An Active Chain Diagnosis |
| 12/13/2007 | US20070288115 Methods and apparatus for electronic device manufacturing system monitoring and control |
| 12/13/2007 | US20070287304 Electrical Contactor, Espcecially Wafer Level Contactor, Using Fluid Pressure |
| 12/13/2007 | US20070287206 Method for Manufactuing a Semiconductor Integrated Circuit Device |
| 12/13/2007 | US20070287205 Method of measuring minority carrier diffusion length and method of manufacturing silicon wafer |
| 12/13/2007 | US20070287204 A method for locating a sub-surface feature using a scatterometer |
| 12/13/2007 | US20070286072 Method and system for measuring interest levels of digital messages |
| 12/13/2007 | US20070285267 Ground fault circuit interrupter with end-of-life protection |
| 12/13/2007 | US20070285266 System and method for evaluating ground-fault circuit interrupters |
| 12/13/2007 | US20070285117 Current abnormality detection system and method for shunt motors |
| 12/13/2007 | US20070285116 Apparatus for temporary thermal coupling of an electronic device to a heat sink during test |
| 12/13/2007 | US20070285115 Universal wafer carrier for wafer level die burn-in |
| 12/13/2007 | US20070285114 Socket For Making With Electronic Component, Particularly Semiconductor Device With Spring Packaging, For Fixturing, Testing, Burning-In Or Operating Such A Component |
| 12/13/2007 | US20070285113 Fault tolerant selection of die on wafer |
| 12/13/2007 | US20070285111 Test structure and probe for differential signals |
| 12/13/2007 | US20070285105 Methods and Apparatuses for Trimming Circuits |
| 12/13/2007 | US20070285104 Semiconductor Device Testing |
| 12/13/2007 | US20070285103 Electronic Package and Method for Testing the Same |
| 12/13/2007 | US20070285102 Measuring array |
| 12/13/2007 | US20070285101 Equipment monitoring devices |
| 12/13/2007 | US20070285100 Trailer mate circuit tester |
| 12/13/2007 | US20070285098 Method And System For Ascertaining Operating Parameters Of An Electrochemical Storage Battery |
| 12/13/2007 | US20070284869 Automotive passenger restraint and protection apparatus |
| 12/13/2007 | US20070284669 Method and structure to process thick and thin fins and variable fin to fin spacing |
| 12/13/2007 | US20070284526 Inspection apparatus for circuit pattern |
| 12/13/2007 | DE4403899B4 Vorrichtung zur seriellen Übertragung von Daten zwischen mindestens zwei Stationen Device for serial transmission of data between at least two stations |
| 12/13/2007 | DE202006020060U1 Vorrichtung zur Überwachung der Kontaktierung eines Laststromanschlusselements mit einem Kontaktfeld einer Leiterkarte Device for monitoring the load current contacting of a connection element with a contact pad of a circuit board |
| 12/13/2007 | DE202005021320U1 Schaltung zur Komprimierung und Speicherung von Schaltungsdiagnosedaten Circuitry for compressing and storing diagnostic data circuit |
| 12/13/2007 | DE102006027448A1 Schaltungsanordnung Circuitry |
| 12/13/2007 | DE102006026175A1 Radio frequency identification tag testing device, has base frame provided for flexible attachment of tag-testing units to align each of tag-testing units to one of radio frequency identification tags on carrier sheet |
| 12/13/2007 | DE102005059968B4 Vorrichtung und Verfahren zur Prüfung von Befestigungselementen an einem Kabelstrang Apparatus and method for testing of fastening elements on a cable strand |
| 12/13/2007 | DE102005036808B4 Druckmittelbetätigte Dockingvorrichtung Fluid-actuated docking device |
| 12/13/2007 | DE102005026403B4 Verfahren zum Liefern von Abtastmustern zu einer elektronischen Vorrichtung A method for supplying scanning patterns to an electronic device |
| 12/13/2007 | DE102004036520B4 Bauelementanordnung mit einer Auswerteschaltung zur Detektion eines Verschleißes von Anschlussverbindungen und Verfahren zur Detektion eines Verschleißes von Anschlussverbindungen The component arrangement having an evaluation circuit for the detection of wear of terminal compounds and methods for the detection of wear of connections |
| 12/13/2007 | CA2654404A1 Faulted circuit indicator monitoring device with wireless memory monitor |
| 12/13/2007 | CA2653203A1 Space based network for detection and monitoring of global maritime shipping using automatic identification system |
| 12/12/2007 | EP1865601A1 Asynchronous RS flip-flop having a test mode |
| 12/12/2007 | EP1865333A1 Current measuring device, testing device, current measuring method and testing method |
| 12/12/2007 | EP1865332A1 Tester and testing method |
| 12/12/2007 | EP1864429A2 Combination of high-side and low-side current sensing in system for providing power over communication link |
| 12/12/2007 | EP1864379A1 Method for race prevention and a device having race prevention capabilities |
| 12/12/2007 | EP1864148A1 Method for determining capacity of lead-acid batteries of various specific gravities |
| 12/12/2007 | EP1864147A1 Apparatus and method for measuring the amount of the current in battery cells using a plurality of sensing resistors |
| 12/12/2007 | EP1864146A2 Inspection device |
| 12/12/2007 | EP1864145A1 Active diagnostic interface for wafer probe applications |
| 12/12/2007 | EP1864144A2 A method and system for producing signals to test semiconductor devices |
| 12/12/2007 | EP1864121A2 Semiconductor wafer metrology apparatus and methods |
| 12/12/2007 | EP1637892B1 Electronic component handling device, and method for temperature application in electronic component handling device |
| 12/12/2007 | EP1540659B1 A method and a unit for programming a memory |