Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2007
11/27/2007US7301895 Virtual path restoration scheme using fast dynamic mesh restoration in an optical network
11/27/2007US7301894 Method for providing fault tolerance in an XDSL system
11/27/2007US7301737 Motor power line break detection method in AC servo driver
11/27/2007US7301619 Evaluating a multi-layered structure for voids
11/27/2007US7301372 Domino logic compatible scannable flip-flop
11/27/2007US7301361 Logic circuit for board power-supply evaluation and board power-supply evaluating method
11/27/2007US7301360 Method and apparatus for inspecting flat panel display
11/27/2007US7301359 Testing apparatus, and testing method
11/27/2007US7301358 Contactor assembly for testing electrical circuits
11/27/2007US7301357 Inspection method and inspection equipment
11/27/2007US7301356 Support for a receptacle block of a unit under test
11/27/2007US7301355 MEMS probe card with elastic multi-layer structure
11/27/2007US7301354 Contact probe for a testing head having vertical probes for semiconductor integrated devices
11/27/2007US7301347 Current sensing circuit
11/27/2007US7301346 Hand lamp, especially for magnetic crack detection
11/27/2007US7301327 Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces
11/27/2007US7301326 Modular interface
11/27/2007US7301325 Method and apparatus for creating performance limits from parametric measurements
11/27/2007US7301305 System and method for determining available capacity of a rechargeable battery
11/27/2007US7301304 Energy storage system state of charge diagnostic
11/27/2007US7301246 Switch for switching off at least one airbag
11/27/2007US7301146 Probe driving method, and probe apparatus
11/27/2007US7299973 Semiconductor device and an information management system therefor
11/27/2007CA2343261C Measurements using tunnelling current between elongate conductors
11/22/2007WO2007132880A1 Image binarizing method, image processing device, and computer program
11/22/2007WO2007132739A1 Substrate inspecting jig, and electrode structure of connecting electrode unit in the jig
11/22/2007WO2007132729A1 Battery device, vehicle having the same, and battery device failure judging method
11/22/2007WO2007132086A2 Method for managing an assembly of rechargeable batteries using a charging whiplash effect
11/22/2007WO2007132015A1 Method and apparatus for measuring the duty cycle or relative duty cycle of a digital signal
11/22/2007WO2007131947A1 Method and pulse-width-modulated current control circuit for driving inductive loads in motor vehicles
11/22/2007WO2007131667A1 Drive system for an electronic domestic appliance
11/22/2007WO2007131323A1 Microwave circuit performance optimization by on-chip digital distribution of operating set-point
11/22/2007WO2007115218A3 Integrated circuit with improved test capability via reduced pin count
11/22/2007WO2007109196A3 Method, system and program for tracking pharmaceutical samples
11/22/2007WO2007093861A3 Method and apparatus for evaluating the level of superficial pollution of a medium/high voltage outdoor insulator
11/22/2007WO2007038236A3 Electric circuit tracer
11/22/2007WO2007021436A8 Directional power detection by quadrature sampling
11/22/2007WO2007016038A3 Temperature control in ic sockets
11/22/2007WO2007002249A3 Method and apparatus for adjusting a multi-substrate probe structure
11/22/2007WO2005091916A3 Flexible microcircuit space transformer assembly
11/22/2007WO2005026860A3 Preventive maintenance tapping and duty cycle monitor for voltage regulator
11/22/2007US20070271489 Apparatus and method for verifying custom ic
11/22/2007US20070271488 Semiconductor integrated circuit and test method therefor
11/22/2007US20070271061 System and method for reducing temperature variation during burn in
11/22/2007US20070271057 Inspection method of semiconductor integrated circuit and semiconductor
11/22/2007US20070271045 Test apparatus and test method
11/22/2007US20070269997 Electronic components with plurality of contoured microelectronic spring contacts
11/22/2007US20070269911 Memory-Module Manufacturing Method with Memory-Chip Burn-In and Full Functional Testing Delayed Until Module Burn-In
11/22/2007US20070269909 Method for processing an integrated circuit
11/22/2007US20070269726 Phase-shift mask, manufacturing method thereof and manufacturing method of semiconductor element
11/22/2007US20070269101 Pattern inspection method and apparatus
11/22/2007US20070268820 Failover of multicast traffic flows using NIC teaming
11/22/2007US20070268063 Signal Detector
11/22/2007US20070268038 Method for analyzing the reliability of optoelectronic elements rapidly
11/22/2007US20070268037 Circuit testing apparatus
11/22/2007US20070268036 Integrated systems testing
11/22/2007US20070268035 Probe card
11/22/2007US20070268034 Method and apparatus for setting of appliance-specific evaluation parameters
11/22/2007US20070268033 Prober and probe contact method
11/22/2007US20070268032 Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection Apparatus
11/22/2007US20070268031 Wafer Probe Interconnect System
11/22/2007US20070268030 Spatial transformer for RF and low current interconnect
11/22/2007US20070268029 Probe card and temperature stabilizer for testing semiconductor devices
11/22/2007US20070268023 System and method for monitoring temperature inside electric machines
11/22/2007US20070268022 Measurement circuit and test apparatus
11/22/2007US20070267632 Apparatus and Method for Test Structure Inspection
11/22/2007US20070267463 Apparatus for mounting columns for grid array electronic packages
11/22/2007DE102006058101A1 Antriebssystem für ein elektronisches Haushaltsgerät A drive system for an electronic domestic appliance
11/22/2007DE102006023628A1 Embedded system testing method, involves generating and storing instruction or data till receiving command for transmission of buffer contents to emulator, and transmitting contents to emulator for testing embedded system using interface
11/22/2007DE102006022985A1 Schaltungsanordnung mit einer seriellen Testschnittstelle bzw. serielles Testbetriebsverfahren Circuitry with a serial test interface or serial test operating procedures
11/21/2007EP1858028A1 Memory test engine
11/21/2007EP1857828A1 Method of displaying remaining battery power, and electronic apparatus
11/21/2007EP1857827A2 Circuit device with serial test interface and serial test mode procedure
11/21/2007EP1857822A1 Spatial transformer for RF and low current interconnect
11/21/2007EP1856840A1 Measuring device and method for monitoring a network
11/21/2007EP1856793A1 Method for testing an electronic circuit for driving a dc-motor
11/21/2007EP1856547A2 Detection algorithm for delivering inline power down four pairs of an ethernet cable to a single powered device
11/21/2007EP1682911B1 Method for monitoring contact consumption in multiple contact switches
11/21/2007EP1666898B1 Testing apparatus
11/21/2007EP1603773B1 Method and system for early detecting the defects of an electrically controlled brake system
11/21/2007EP1482313B1 Capacity load type probe, and test jig using the same
11/21/2007EP1476761B1 Contact actuator with contact force control
11/21/2007EP1373914B1 Anionic polymers composed of dicarboxylic acids and uses thereof
11/21/2007CN200980200Y 一种挠性印制电路板 A flexible printed circuit board
11/21/2007CN200979731Y A theft-proof automatic alarm circuit used for an air conditioner
11/21/2007CN200979590Y A constant-current discharging circuit for a feedback battery
11/21/2007CN200979589Y A middle-high power motor test platform system
11/21/2007CN200979588Y A novel detection circuit for air breaker
11/21/2007CN200979587Y A short distance audio-signal test device for locating cable fault
11/21/2007CN200979586Y An on-line monitoring device of transformer fault
11/21/2007CN200979585Y A synchronous ratio and polarity testing device in multi-channels
11/21/2007CN200979584Y A signal microcomputer interlocking based dynamic transformer testing device
11/21/2007CN200979583Y An intelligent positioning device for the breakpoint and of the cable and the mix line
11/21/2007CN200979582Y A portable power-cable detection device
11/21/2007CN200979581Y A thyristor valves equivalent load testing circuit for a high voltage inverter
11/21/2007CN200979580Y A magnetron testing device
11/21/2007CN200979579Y A release wire board aging detection circuit
11/21/2007CN200979578Y A weight gravity finger
11/21/2007CN200979577Y A novel three-phase voltage open-phase detection circuit
11/21/2007CN200979576Y An electromagnetic radiation detector