Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2007
12/11/2007US7307432 Electron beam generating apparatus and optical sampling apparatus using the same
12/11/2007US7307429 Apparatus for testing an arc fault circuit interrupter
12/11/2007US7307428 Method for single ended line testing and single ended line testing device
12/11/2007US7307427 Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards
12/11/2007US7307426 Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices
12/11/2007US7307408 Cable locating device
12/11/2007US7307222 Printed circuit board test access point structures and method for making the same
12/11/2007US7306958 Composite pattern for monitoring various defects of semiconductor device
12/11/2007US7306957 Fabrication method of semiconductor integrated circuit device
12/11/2007US7306746 Critical dimension control in a semiconductor fabrication process
12/11/2007US7306493 Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
12/06/2007WO2007140366A2 Testing components of i/o paths of an integrated circuit
12/06/2007WO2007139102A1 Battery driving device, load control method, integrated circuit and load control program
12/06/2007WO2007138971A1 Antenna cable disconnection detecting device for radio communication device for construction machine, and radio communication device for construction machine
12/06/2007WO2007138831A1 Board examination method and board examination device
12/06/2007WO2007138819A1 Power supply, tester, and stabilizer
12/06/2007WO2007138814A1 Testing apparatus and test module
12/06/2007WO2007138387A1 Device and method for testing integrated circuits
12/06/2007WO2007138059A1 System and method for testing an integrated circuit device having elements with asynchronous clocks or dissimilar design methodologies
12/06/2007WO2007137768A1 Handler comprising an acceleration device for testing electronic components
12/06/2007WO2007137404A1 Dielectric mapping device and method
12/06/2007WO2007111685A3 Ground testing method and apparatus
12/06/2007WO2007107872A3 Universal monitoring and diagnostic control system for a transformer or tap- changer
12/06/2007WO2007101345A9 Method and apparatus for interrogating an electronic component
12/06/2007WO2007095887A3 Apparatus for checking an electrical printed circuit board having a conductor track
12/06/2007WO2007086996A3 System and method for implementing a preemptive retransmit for error recovery in a communications environment
12/06/2007WO2007067943A3 Assessment of electrode coupling for tissue ablation
12/06/2007WO2007047153A3 Method for recovery of a controlled failover of a border gateway protocol speaker
12/06/2007WO2007044939A3 Optical ring networks using circulating optical probe in protection switching with automatic reversion
12/06/2007WO2006120315A8 Integrated circuit comprising a secure test mode using integrated circuit configurable cell chain status detection
12/06/2007WO2006019433A3 Externally-loaded weighted random test pattern compression
12/06/2007US20070283205 System and method for testing an integrated circuit device having elements with asynchronous clocks or dissimilar design methodologies
12/06/2007US20070283204 Method and system for deterministic bist
12/06/2007US20070283203 Semiconductor apparatus and method of disposing observation flip-flop
12/06/2007US20070283202 Compactor independent fault diagnosis
12/06/2007US20070283201 Functional frequency testing of integrated circuits
12/06/2007US20070283200 Scan compression architecture for a design for testability compiler used in system-on-chip software design tools
12/06/2007US20070283199 Method and apparatus for entering special mode in integrated circuit
12/06/2007US20070283198 Parallel bit test circuits for testing semiconductor memory devices and related methods
12/06/2007US20070283197 Mapping logic for controlling loading of the select ram of an error data crossbar multiplexer
12/06/2007US20070283191 Integrated Circuit with Debug Support Interface
12/06/2007US20070282556 Testing of Embedded Systems
12/06/2007US20070282548 Method and Apparatus for Assessing Condition of Motor-Driven Mechanical System
12/06/2007US20070280121 Physical layer loopback
12/06/2007US20070279081 Measurement apparatus for FET characteristics
12/06/2007US20070279080 Method For Evaluating Semiconductor Wafer And Apparatus For Evaluating Semiconductor Wafer
12/06/2007US20070279079 Multiple chip package test program and programming architecture
12/06/2007US20070279078 Kelvin contact measurement device and kelvin contact measurement method
12/06/2007US20070279077 Stacked Contact Bump
12/06/2007US20070279074 Probe Cassette, Semiconductor Inspection Apparatus And Manufacturing Method Of Semiconductor Device
12/06/2007US20070279072 Automatically folding cable
12/06/2007US20070279071 Method and System for Diagnosing Degradation in Vehicle Wiring
12/06/2007US20070279070 Thermal protection of a switch
12/06/2007US20070279069 System and method for reducing current in a device during testing
12/06/2007US20070279068 Power diagnostic system and method
12/06/2007US20070279065 Industrial truck with a battery and method for operating an industrial truck with a battery
12/06/2007US20070279064 Contact resistance test structure and methods of using same
12/06/2007US20070278870 Arrangement in an Electrical Machine
12/06/2007US20070278404 Radiometric Measuring Device
12/06/2007DE19830738B4 Vorrichtung zur richtungsabhängigen Fehlerortung oder Nachrichtenübertragung auf Niederspannungsnetzen Apparatus for directional fault location or messaging in low voltage distribution systems
12/06/2007DE102007024449A1 Measuring plate for connecting e.g. integrated semiconductor component, has cable for connecting measuring plate with test apparatus, and cover unit covering part of front part of middle contact and controlling impedance of front part
12/06/2007DE102007017276A1 Systeme und Verfahren zum Koordinieren von Testergebnissen für Vorrichtungen innerhalb einer Gruppe Systems and methods for coordinating test results for devices within a group
12/06/2007DE102007016890A1 Schaltkreisdiagnose-Schaltersystem Diagnosis circuit switch system
12/06/2007DE102006025341A1 Handler mit Beschleunigungsvorrichtung zum Testen von elektronischen Bauelementen Handler with acceleration device for testing of electronic components
12/06/2007DE102006025117A1 Battery cell destruction-afflicted short-circuit testing method, involves placing measuring tip with sensor in cell, and reading temperature sensor for determining temperature inside cell based on time after placing tip
12/06/2007DE102006024507A1 Integrated circuit`s run-time error detecting method, involves testing whether run-time error is occurred in driven clock domain, and triggering production of clock signals through signal change in scan clock input
12/06/2007DE102006005800B4 Verfahren und Vorrichtung zum Testen von unbestückten Leiterplatten A method and apparatus for testing bare printed circuit boards
12/06/2007DE102006000267A1 Electrical testing device production method, involves flat aligning of front side of printed circuit board, which is directed against aligning aid, where attaching positions are processed for alignment in level parallel to clamped front
12/05/2007EP1863153A2 Tape fed miniature air gap inspection crawler
12/05/2007EP1862808A1 Method for measuring the resonance frequency of a battery
12/05/2007EP1862807A1 Electrostatic discharge device testing system and method
12/05/2007EP1861909A1 Method for controlling a portable electronic device comprising a power storage device
12/05/2007EP1861759A2 Apparatus and method for controlling temperature in a chuck system
12/05/2007EP1861727A1 Rfid application test systems and methods
12/05/2007EP1861726A1 Method and apparatus for generalized arc fault detection
12/05/2007EP1861725A2 Apparatus, system and method for testing electronic elements
12/05/2007EP1776641A4 Method of increasing ddr memory bandwidth in ddr sdram modules
12/05/2007EP1470432B1 Predictive, adaptive power supply for an integrated circuit under test
12/05/2007CN200987168Y Antenna controller capable of warning and wire cutting
12/05/2007CN200986955Y Electric quantity display system for electric bicycle accumulator cell
12/05/2007CN200986650Y Device for testing performance of optical low-pass filter
12/05/2007CN200986585Y Card dedicated for measuring embedded battery of IC card water meter
12/05/2007CN200986584Y Power configuration for dual-electric motor coaxial dragging test system
12/05/2007CN200986583Y Railway signal ZPW-2000 equipment transmitter automatic detection device
12/05/2007CN200986582Y Communication cable integration integrated test device
12/05/2007CN200986581Y Chip welding detection machine
12/05/2007CN200986580Y Intelligent audio digital finder
12/05/2007CN200986579Y Line detecting device with creepage protector and detector produced from the detecting device
12/05/2007CN200986578Y Low noise amplifier monitor alarming device
12/05/2007CN200986577Y LED leakage current detecting device
12/05/2007CN200986568Y Probe card
12/05/2007CN200986566Y Universal device for testing combined circuit board
12/05/2007CN200986565Y PCB test clamp micro-adjusting device
12/05/2007CN200986434Y Intelligent control diagram on-site cruise positioning apparatus
12/05/2007CN101084562A Method and device for the secure operation of a switching device
12/05/2007CN101084561A Method and device for the secure operation of a switching device
12/05/2007CN101084485A Apparatus and method for improving emulation speed of high-level languages in on-chip emulation systems
12/05/2007CN101084448A Battery pack leakage cut-off
12/05/2007CN101084447A System for testing and burning in of integrated circuits
12/05/2007CN101084446A Method and system for generating signal for testing semiconductor device