| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/12/2008 | US7330036 Engagement Probes |
| 02/12/2008 | US7330033 Noncontact sensor |
| 02/12/2008 | US7330025 Touchdown counter for integrated circuit testers |
| 02/12/2008 | US7330024 Power supply device, test apparatus, and power supply voltage stabilizing device |
| 02/12/2008 | US7330023 Wafer probe station having a skirting component |
| 02/12/2008 | US7330021 Integrated substrate transfer module |
| 02/12/2008 | US7329899 Wafer-level redistribution circuit |
| 02/12/2008 | US7329056 Device package and methods for the fabrication and testing thereof |
| 02/07/2008 | WO2008017072A2 Automated test and characterization data analysis methods and arrangement |
| 02/07/2008 | WO2008016767A2 Array testing method using electric bias stress for tft array |
| 02/07/2008 | WO2008016577A2 System and method for locating and analyzing arcing phenomena |
| 02/07/2008 | WO2008016274A1 Measuring instrument for an electric current leakage |
| 02/07/2008 | WO2008016179A1 Insulation resistance determining system, insulation resistance determining apparatus and insulation resistance determining method |
| 02/07/2008 | WO2008016129A1 Secondary battery charge/discharge control device and hybrid vehicle using the same |
| 02/07/2008 | WO2008016050A1 Power supply device and sequencer system |
| 02/07/2008 | WO2008015962A1 Parallelism adjusting mechanism of probe card |
| 02/07/2008 | WO2008015808A1 Active matrix substrate, display, and active matrix substrate inspecting method |
| 02/07/2008 | WO2008015462A2 Power supply circuit |
| 02/07/2008 | WO2008014923A1 Contacting device for testing electronic components under specific temperature conditions |
| 02/07/2008 | WO2008014827A1 Test module with blocks of universal and specific resources |
| 02/07/2008 | WO2008014738A1 Method for evaluating a semiconductor circuit |
| 02/07/2008 | WO2007149808A3 Logic device and method supporting scan test |
| 02/07/2008 | WO2007144003A3 A test bench and a method for testing wind turbine equipment |
| 02/07/2008 | WO2007098332A3 Electrical interconnect interface and wire harness test and test development system and method |
| 02/07/2008 | WO2007084884A3 System and method for multihop packet forwarding |
| 02/07/2008 | WO2007084280A3 Dynamic protection against failure of a head-end node of one or more te-lsps |
| 02/07/2008 | WO2006138476A3 Multiplexed temperature sensing circuit for hid lamp ballast |
| 02/07/2008 | US20080034334 Integrated Circuit Chip with Communication Means Enabling Remote Control of Testing Means of Ip Cores of the Integrated Circuit |
| 02/07/2008 | US20080034266 Tester For Testing Semiconductor Device |
| 02/07/2008 | US20080034264 Dynamic redundancy checker against fault injection |
| 02/07/2008 | US20080034263 Semiconductor integrated circuit device and internal power control system including the same |
| 02/07/2008 | US20080034261 System and Method for Reducing Test Time for Loading and Executing an Architecture Verification Program for a Soc |
| 02/07/2008 | US20080034260 Method for structured storage of error entries |
| 02/07/2008 | US20080034105 System and method for delivering contents by exploiting unused capacities in a communication network |
| 02/07/2008 | US20080033602 Method and Device for Detecting Electric Arc Phenomenon on at Least One Electric Cable |
| 02/07/2008 | US20080030354 Sensor Device for Monitoring the Operation of a PV System, and PV System with Such a Sensor Device |
| 02/07/2008 | US20080030225 Optically Reconfigurable Gate Array Write State Inspection Method, Write State Inspection Device, and Optically Reconfigurable Gate Array |
| 02/07/2008 | US20080030220 Characterization Array and Method for Determining Threshold Voltage Variation |
| 02/07/2008 | US20080030219 Diagnostic circuit and method therefor |
| 02/07/2008 | US20080030218 Tester For Testing Semiconductor Device |
| 02/07/2008 | US20080030217 Systems and Methods for Continuity Testing Using a Functional Pattern |
| 02/07/2008 | US20080030216 Contactor assembly |
| 02/07/2008 | US20080030215 High density cantilevered probe for electronic devices |
| 02/07/2008 | US20080030214 Probe head assembly for use in testing multiple wafer die |
| 02/07/2008 | US20080030212 Active probe contact array management |
| 02/07/2008 | US20080030211 Active probe contact array management |
| 02/07/2008 | US20080030210 Test socket |
| 02/07/2008 | US20080030209 Interposer structures and methods of manufacturing the same |
| 02/07/2008 | US20080030203 System and Method for Utilizing an Automatic Circuit Tester System having Multiple Automatic Circuit Tester Platforms |
| 02/07/2008 | US20080030202 Method and apparatus for measuring data rates |
| 02/07/2008 | US20080030201 Method Of Operating A Shielded Connection, And Communication Network |
| 02/07/2008 | US20080030200 Image defect inspection apparatus |
| 02/07/2008 | US20080030199 Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system |
| 02/07/2008 | US20080030169 Battery remaining capacity detecting apparatus and battery remaining capacity detecting method |
| 02/07/2008 | US20080030143 Discharge Lamp Lighting Device, and Lighting Equipment and Lighting System Using the Device |
| 02/07/2008 | US20080029763 Transmission Circuit, Connecting Sheet, Probe Sheet, Probe Card, Semiconductor Inspection System and Method of Manufacturing Semiconductor Device |
| 02/07/2008 | DE60035318T2 Integrierte Halbleiterschaltung, Flüssigkristallvorrichtung, elektronisches Gerät und Verfahren zur integrierten Halbleiterschaltungsregelung A semiconductor integrated circuit, the liquid crystal device, electronic device and method for semiconductor integrated circuit control |
| 02/07/2008 | DE102006039592A1 Verfahren zur Beurteilung einer Halbleiterschaltung A method for evaluating a semiconductor circuit |
| 02/07/2008 | DE102006036419A1 Electrical and/or electronic device`s i.e. ignition lock, operability checking method for motor vehicle, involves switching-on light barriers and evaluating output signal before starting and/or during operation of device |
| 02/07/2008 | DE102006036291A1 Verfahren und Kontaktiervorrichtung zum elektrischen Testen von elektronischen Bauelementen unter bestimmten Temperaturbedingungen Procedures and contactor for electrically testing of electronic components under certain temperature conditions |
| 02/07/2008 | CA2596213A1 Leakage location methods |
| 02/06/2008 | EP1884790A1 Battery monitoring device and batteries |
| 02/06/2008 | EP1884789A2 Test apparatus and test method |
| 02/06/2008 | EP1884788A1 Trimming of operative parameters in electronic devices based on corrections mappings |
| 02/06/2008 | EP1883974A2 System and method for testing a photovoltaic module |
| 02/06/2008 | EP1883829A1 Detection, localization and interpretation of partial discharge |
| 02/06/2008 | EP1883828A1 Circuit protection device and test facility to simulate a fault condition |
| 02/06/2008 | EP1774654B1 Method and device for the connection of inputs for microcontrollers and corresponding microcontroller |
| 02/06/2008 | CN201018614Y Portable radio data channel instrument |
| 02/06/2008 | CN201018275Y Duplicate power supply loop network single phase earthing time sequence identification route selection device |
| 02/06/2008 | CN201018263Y Low-voltage circuitry three-phase unsymmetrical fault synthetic protection module |
| 02/06/2008 | CN201018262Y Low-voltage electric network remote distance short-circuit fault sensitive protection module |
| 02/06/2008 | CN201018194Y Protection detecting device capable of panel installation |
| 02/06/2008 | CN201018047Y Memory card testing device |
| 02/06/2008 | CN201017757Y Decomposing prevention circuit of transformer device |
| 02/06/2008 | CN201017606Y Display screen capable of self detecting trouble point |
| 02/06/2008 | CN201017321Y Anti-stealing lock damage detecting structure |
| 02/06/2008 | CN201017308Y Communication debugging device of I2C bus signal |
| 02/06/2008 | CN201017134Y Testing circuit of LCD electric power |
| 02/06/2008 | CN201017081Y Distributing line soft optic cable containing metallic detecting lines |
| 02/06/2008 | CN201017027Y Vehicle hydraulic hoisting tail plate underpressure alarm |
| 02/06/2008 | CN201017026Y Portable accumulator cell tester |
| 02/06/2008 | CN201017025Y Stepping motor characteristic test experimental device |
| 02/06/2008 | CN201017024Y Large current arc starting device |
| 02/06/2008 | CN201017023Y Inductor for detecting controlled silicon conducting |
| 02/06/2008 | CN201017022Y Semiconductor lighting device service life accelerate tester |
| 02/06/2008 | CN201017021Y Test mechanism |
| 02/06/2008 | CN201017020Y Electric thin plastic film electric foible tester for |
| 02/06/2008 | CN201017019Y Test blind removing instrument used for removing electrical cable fault testing and test system |
| 02/06/2008 | CN201017018Y Isolator leakage current photoelectric stroboscopic instrument |
| 02/06/2008 | CN201017017Y baking test box |
| 02/06/2008 | CN201017016Y Electric power apparatus integrated automation testing apparatus |
| 02/06/2008 | CN201017015Y multi-functional exploder parameter measuring apparatus |
| 02/06/2008 | CN201017010Y Vehicle malfunction detection pens |
| 02/06/2008 | CN201016994Y PCB testing jig |
| 02/06/2008 | CN201016960Y Insulating medium life tester |
| 02/06/2008 | CN201016859Y Electric vehicle mounted testing device |
| 02/06/2008 | CN201016843Y LED light flux testing device employing narrow beam standard light source |
| 02/06/2008 | CN201016842Y Photoelectric detection principle test instrument |
| 02/06/2008 | CN201016000Y Railway signal ZPW-2000 equipment attenuation implement automatic detection device |