Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2007
11/21/2007CN200979574Y A piezoelectric quartz detector based on a complex programmable logic device technology
11/21/2007CN200979572Y A high voltage signal detection system for AC-AC frequency conversion system
11/21/2007CN200979561Y A circuit board fixing mechanism
11/21/2007CN200979560Y An inner discharge circuit of a testing circuit board fixture
11/21/2007CN200979559Y A magnetic fixed substructure of a probe-bed
11/21/2007CN200979539Y A portable crack monitoring device
11/21/2007CN200979489Y An automatic tracking and testing device of a distribution photometer
11/21/2007CN101076736A Configuring redundancy in a supervisory process control system
11/21/2007CN101075613A Semiconductor device with pad switch
11/21/2007CN101075549A Marking pen design for optical microscope
11/21/2007CN101075257A System, method and equipment for integrated testing state event of data stream
11/21/2007CN101074981A Method and apparatus for metering fuel battery power
11/21/2007CN101074980A Method for inspecting LED chip
11/21/2007CN101074979A Method for measuring power-transmission circuit double-ended distance by distributing parameter
11/21/2007CN101074978A Method for measuring power-supply grounded resistance triple-bridged arm of electric system
11/21/2007CN101074977A Electrode inspector
11/21/2007CN101074976A Method and apparatus for inspecting connection status between display device and peripheral equipment
11/21/2007CN101074973A Sensor and its scramble current monitoring system
11/21/2007CN101074969A Carrier for measuring display device panel
11/21/2007CN101074890A Method for measuring dye sensitive solar battery conversion efficiency and mono-wavelength quantum efficiency
11/21/2007CN101074762A 图象传感器测试光源系统 Light image sensor test system
11/21/2007CN100350585C Wafer measuring system
11/21/2007CN100350582C Method and system for observing all signals inside programmable digital IC chip
11/21/2007CN100350508C Method for testing semiconductor memory device and test circuit for semiconductor memory device
11/21/2007CN100350349C Battery capacity predicting method, Battery unit and apparatus using battery unit
11/21/2007CN100350262C On-line testing system for capacity of vehicle lead-acid battery
11/21/2007CN100350261C Fuel cell votage monitoring system and its method
11/21/2007CN100350260C Device and method for transmitting hidden signal in boundary scan test interface
11/21/2007CN100350259C 电子部件试验装置 Electronic component testing device
11/21/2007CN100350258C Insert and electronic component handling apparatus having the same
11/21/2007CN100350256C Voltage measuring apparatus
11/21/2007CN100350254C Contact structure having silicon finger contactor
11/21/2007CN100350253C Programmable test socket
11/20/2007US7299437 Method and apparatus for detecting timing exception path and computer product
11/20/2007US7299430 Reducing design execution run time bit stream size for device testing
11/20/2007US7299395 Test apparatus
11/20/2007US7299394 Method and apparatus for determining optimum initial value for test pattern generator
11/20/2007US7299393 Microprocessor with trace module
11/20/2007US7299392 Semiconductor integrated circuit device and method of design of semiconductor integrated circuit device
11/20/2007US7299391 Circuit for control and observation of a scan chain
11/20/2007US7299390 Apparatus and method for encrypting security sensitive data
11/20/2007US7299389 Test circuit, integrated circuit, and test method
11/20/2007US7299381 Discrete tests for weak bits
11/20/2007US7299267 Radio terminal with browser
11/20/2007US7299236 Test data compression and decompression method using zero-detected run-length code in system-on-chip
11/20/2007US7299155 Method and apparatus for decomposing and verifying configurable hardware
11/20/2007US7299153 Biometric quality control process
11/20/2007US7299142 System and method for prevention of accidental activation of portable audio device
11/20/2007US7298707 System and method for controlling the flooding of information in a network environment
11/20/2007US7298706 Method and apparatus for power line communication
11/20/2007US7298704 Dynamic path routing with service level guarantees in optical networks
11/20/2007US7298656 Process monitoring by comparing delays proportional to test voltages and reference voltages
11/20/2007US7298598 Wiring device with multi-shot miswire
11/20/2007US7298596 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system
11/20/2007US7298536 Fiber optic wafer probe
11/20/2007US7298396 Apparatus and method for monitoring transmission systems using embedded test signals
11/20/2007US7298282 Health monitoring method and system for a permanent magnet device
11/20/2007US7298196 Level shifter circuit with stress test function
11/20/2007US7298167 Power supply system
11/20/2007US7298166 Loading device
11/20/2007US7298165 Active device array substrate, liquid crystal display panel and examining methods thereof
11/20/2007US7298164 System and method for display test
11/20/2007US7298163 TFT array inspection device
11/20/2007US7298162 Test apparatus and test method
11/20/2007US7298161 Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability
11/20/2007US7298160 Method of measuring gate capacitance by correcting dissipation factor error
11/20/2007US7298159 Method of measuring the leakage current of a deep trench isolation structure
11/20/2007US7298158 Network analyzing apparatus and test method
11/20/2007US7298157 Device for generating internal voltages in burn-in test mode
11/20/2007US7298156 Electronic part test apparatus
11/20/2007US7298155 Probing apparatus
11/20/2007US7298154 Probe apparatus
11/20/2007US7298153 Eccentric offset Kelvin probe
11/20/2007US7298150 Test apparatus and test method
11/20/2007US7298149 Fault location using measurements of current and voltage from one end of a line
11/20/2007US7298148 Relay controller
11/20/2007US7298136 Magnetically coupled electrical test lead
11/20/2007US7298131 Current sensors
11/20/2007US7298113 Battery pack
11/20/2007US7297562 Circuit-on-foil process for manufacturing a laminated semiconductor package substrate having embedded conductive patterns
11/20/2007US7296430 Cooling air flow control valve for burn-in system
11/20/2007CA2360817C Dry load test apparatus
11/20/2007CA2273603C Method and apparatus for adaptive clocking for boundary scan testing and device programming
11/15/2007WO2007131194A2 Apparatus and methods for processing, testing, and packaging of semiconductor ics and image sensors
11/15/2007WO2007131141A2 Method and apparatus for probing
11/15/2007WO2007131130A2 Interface test circuit
11/15/2007WO2007130764A1 Integrated circuit with improved test capability via reduced pin count
11/15/2007WO2007129931A1 Method, system and a connecting sensor for for identifying the port of a plug board
11/15/2007WO2007129585A1 Method and device for evaluating solar cell and use of the solar cell
11/15/2007WO2007129583A1 Switch circuit, filter circuit and testing apparatus
11/15/2007WO2007129566A1 Server device, and program
11/15/2007WO2007129565A1 Server device, and program
11/15/2007WO2007129491A1 Tester, circuit, and electronic device
11/15/2007WO2007129386A1 Test device and test method
11/15/2007WO2007128535A1 Plug-in connector
11/15/2007WO2007103748A9 Dual-path, multimode sequential storage element
11/15/2007WO2007090791A3 Method and device for detecting ground faults in a supply cable
11/15/2007US20070266349 Directed random verification
11/15/2007US20070266290 Test apparatus, test method, and program
11/15/2007US20070266289 Testing mobile wireless devices during device production
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