| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 02/14/2008 | US20080036468 Apparatus to facilitate functional shock and vibration testing of device connections and related method |
| 02/14/2008 | US20080036467 Appliance Fault Monitor |
| 02/14/2008 | US20080036466 Method for detecting electrical ground faults |
| 02/14/2008 | US20080036423 Method and apparatus for managing charge/discharge current of on-vehicle battery to control on-vehicle generator in consideration of offset of charge/discharge current |
| 02/14/2008 | US20080036402 Method of detecting an arc in a glow-discharge device and apparatus for controlling a high-frequency arc discharge |
| 02/14/2008 | US20080036392 Method of detecting an arc in a glow-discharge device and apparatus for controlling a high-frequency arc discharge |
| 02/14/2008 | US20080035606 Method to Minimize CD Etch Bias |
| 02/14/2008 | US20080035371 Circuit board with embedded components and manufacturing and measuring method thereof |
| 02/14/2008 | DE69737732T2 Nachrichtenübertragungsverfahren für eine Testzugriffsportsteuerungsvorrichtung (TAP) Message transmission method for a test access port controller (TAP) |
| 02/14/2008 | DE60220511T2 Verfahren und system zur optimierung der testkosten und deaktivierungsdefekte für scan- und bist-speicher Method and system for optimizing the test cost and deactivation defective for scan- and are mem |
| 02/14/2008 | DE102007034757A1 Stromsensor Current sensor |
| 02/14/2008 | DE102007034277A1 Vorrichtung und Verfahren zum Erzeugen von Test-Strukturdaten zum Testen eines Halbleiterbauelements Apparatus and method for generating test data structure for testing a semiconductor device |
| 02/14/2008 | DE102006038373A1 Electrical device, especially for determining electrical parameters, e.g. battery sensor, has conductive boundary surface between two conductor sections that is offset relative to the central axis |
| 02/14/2008 | DE102006037592A1 Test system e.g. for automated test of communication interfaces, has power supply unit for provision of supply voltages for circuit under test unit |
| 02/14/2008 | DE102006037480A1 System to measure and display a motor vehicle battery condition, according to parameter conditions, measures its state related to battery and motor intake air temperatures |
| 02/14/2008 | DE102006036784A1 Verfahren zum Bestimmen der Batteriekapazität anhand kapazitätsabhängiger Parameter A method for determining the battery capacity based capacity-based parameters |
| 02/14/2008 | DE102005046814B4 Vorrichtung zum Temperieren und Prüfen elektronischer und/oder elektromechanischer Bauteile A device for tempering and testing electronic and / or electromechanical components |
| 02/14/2008 | CA2659975A1 Microscope enclosure system |
| 02/14/2008 | CA2659796A1 Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system |
| 02/14/2008 | CA2659791A1 Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system |
| 02/13/2008 | EP1887370A1 Charge ratio/remaining capacity estimation method, battery state sensor, and battery power source system |
| 02/13/2008 | EP1887369A1 Device and method for monitoring the triphase current of a triphase electric motor, particularly in plating |
| 02/13/2008 | EP1887368A1 Circuit and method for determining potentionmeter wiper resistance |
| 02/13/2008 | EP1887366A2 Method and system for measurement of current flows in fastener arrays |
| 02/13/2008 | EP1886161A1 An apparatus and method for testing circuit breakers |
| 02/13/2008 | EP1886160A1 Method and apparatus for testing rfid devices |
| 02/13/2008 | EP1886159A2 Method for analyzing an integrated circuit, apparatus and integrated circuit |
| 02/13/2008 | EP1886158A1 Self-test circuitry to determine minimum operating voltage |
| 02/13/2008 | EP1886157A2 Compensating for loss in a transmission path |
| 02/13/2008 | EP1886155A2 Memory device and method having a data bypass path to allow rapid testing and calibration |
| 02/13/2008 | EP1886150A1 Current sensor |
| 02/13/2008 | EP1563390B1 Integrated circuit having multiple modes of operation |
| 02/13/2008 | CN201022051Y A capacitor aging oven |
| 02/13/2008 | CN201022033Y A LCD module detection device |
| 02/13/2008 | CN201021935Y Battery testing device |
| 02/13/2008 | CN201021934Y Online detector for initial failure of asynchronous electromotor |
| 02/13/2008 | CN201021933Y Device for integrated circuit test |
| 02/13/2008 | CN201021930Y Improved structure of probe detector plate |
| 02/13/2008 | CN101124486A Using a parametric measurement unit to sense a voltage at a device under test |
| 02/13/2008 | CN101124485A Detection algorithm for delivering inline power down four pairs of an Ethernet cable to a single powered device |
| 02/13/2008 | CN101124459A Position detector |
| 02/13/2008 | CN101123453A Intelligent determination method for channel exchange test in frequency measurement |
| 02/13/2008 | CN101123316A Manufacturing method for secondary battery and device for detecting secondary battery precursor |
| 02/13/2008 | CN101123245A Testing structure for MOS capacitor and location method for failure point |
| 02/13/2008 | CN101123157A Circuit breaker |
| 02/13/2008 | CN101123156A Circuit breaker |
| 02/13/2008 | CN101123057A Overdue discharging detection for residual image and its detection method |
| 02/13/2008 | CN101122631A Method and device for testing battery charging effect and electronic product power consumption |
| 02/13/2008 | CN101122630A Low cost battery electric quantity checking device and method |
| 02/13/2008 | CN101122629A Method of generating test program of semiconductor testing apparatus |
| 02/13/2008 | CN101122628A System and method for advanced logic built-in self test with selection of scan channels |
| 02/13/2008 | CN101122627A Semi-conducting material thermoelectricity performance test system |
| 02/13/2008 | CN101122626A Failure cable current application method and noise-free hand-held type cable failure positioning instrument |
| 02/13/2008 | CN101122625A Printing circuit, printing circuit board and on-line real-time earthing monitor |
| 02/13/2008 | CN101122624A Method for detecting fixture and capacitor |
| 02/13/2008 | CN101122623A High voltage electricity transmission system thunder-proof property parameter test method |
| 02/13/2008 | CN101122622A Signal branch line length detection system and method |
| 02/13/2008 | CN101122621A Electrostatic discharge detection device and method |
| 02/13/2008 | CN101122618A Electrified information measuring device and circuit breaker with the same |
| 02/13/2008 | CN101122616A Contactor assembly |
| 02/13/2008 | CN101122613A Carrier tray for use with prober |
| 02/13/2008 | CN101122554A SF6 gas density and micro-water integrated on-line monitor |
| 02/13/2008 | CN101122540A Laser imaging SF6 leakage positioning device |
| 02/13/2008 | CN100369329C Anisotropic electrically conductive film and method of producing the same |
| 02/13/2008 | CN100369226C Anisotropic conductivity connector, conductive paste composition, probe member, wafer inspecting device, and wafer inspecting method |
| 02/13/2008 | CN100369225C Testing apparatus, system and method for testing contact between semiconductor and carrier |
| 02/13/2008 | CN100368821C Superconductive conversion magnetic signal detecting system for high-voltage experiment |
| 02/13/2008 | CN100368819C Reliability tester for electric leakage protector |
| 02/13/2008 | CN100368818C Test module and test method in use for electrical erasable memory built in chip |
| 02/13/2008 | CN100368817C On-line method for testing leakage current value of power station zine oxide lightning protector |
| 02/13/2008 | CN100368813C Equivalent period sampling apparatus for intelligent element parameter tester |
| 02/13/2008 | CN100368812C Digital phase-sensitive detector for intelligent element parameter tester |
| 02/13/2008 | CN100368811C Wire-connected circular probe chunck basilar plate |
| 02/13/2008 | CN100368766C Amplifying camera equipment and metering checkout equipment |
| 02/13/2008 | CN100368762C Conductor inspecting device and conductor inspecting method |
| 02/12/2008 | US7331032 Computer-aided design system to automate scan synthesis at register-transfer level |
| 02/12/2008 | US7331006 Multiple sweep point testing of circuit devices |
| 02/12/2008 | US7331005 Semiconductor circuit device and a system for testing a semiconductor apparatus |
| 02/12/2008 | US7331004 Data storage system analyzer having self reset |
| 02/12/2008 | US7331003 Match circuit for performance counter |
| 02/12/2008 | US7331001 Test card for multiple functions testing |
| 02/12/2008 | US7330798 Operating voltage determination for an integrated circuit |
| 02/12/2008 | US7330583 Integrated visual imaging and electronic sensing inspection systems |
| 02/12/2008 | US7330580 System and method for inspecting an LCD panel |
| 02/12/2008 | US7330502 Input/output circuit and semiconductor integrated circuit |
| 02/12/2008 | US7330475 Method for sharing the bandwidth available for unicast and multicast flows in an asynchronous switching node |
| 02/12/2008 | US7330432 Method and apparatus for optimizing channel bandwidth utilization by simultaneous reliable transmission of sets of multiple data transfer units (DTUs) |
| 02/12/2008 | US7330424 Node device in network, and network system |
| 02/12/2008 | US7330279 Model and parameter selection for optical metrology |
| 02/12/2008 | US7330105 System and apparatus for vehicle electrical power analysis |
| 02/12/2008 | US7330046 Circuits and methods for failure prediction of parallel MOSFETs |
| 02/12/2008 | US7330045 Semiconductor test apparatus |
| 02/12/2008 | US7330044 Method and apparatus for semiconductor testing |
| 02/12/2008 | US7330043 Semiconductor device and test method for the same |
| 02/12/2008 | US7330042 Substrate inspection system, substrate inspection method, and substrate inspection apparatus |
| 02/12/2008 | US7330041 Localizing a temperature of a device for testing |
| 02/12/2008 | US7330040 Test circuitry wafer |
| 02/12/2008 | US7330039 Method for making a socket to perform testing on integrated circuits |
| 02/12/2008 | US7330038 Interleaved MEMS-based probes for testing integrated circuits |
| 02/12/2008 | US7330037 Electrical characteristic measuring probe and method of manufacturing the same |