| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/20/2008 | CN101126783A Automobile electrical signal test method and device |
| 02/20/2008 | CN101126782A High voltage electric appliance synthetic test loop |
| 02/20/2008 | CN101126781A USB apparatus power consumption test device |
| 02/20/2008 | CN101126780A M-w grade microwave power instrumentation system based on calorimetric method |
| 02/20/2008 | CN101126774A Arc root current density distribution test method and device |
| 02/20/2008 | CN101126773A Electronic type transformer high voltage side redundant backup circuit and failure detection method |
| 02/20/2008 | CN101126769A Transient high-current signal generator |
| 02/20/2008 | CN101126768A Extruded article |
| 02/20/2008 | CN101126745A Method and system for open loop and short circuit failure diagnosis for nitrogen phosphorus detector |
| 02/20/2008 | CN100370676C Transformer substation automatization system information safety protecting method based on neural network |
| 02/20/2008 | CN100370650C Method for providing detecting and displaying of real charging value of charging battery |
| 02/20/2008 | CN100370646C Method for inspecting secondary battery precursor, and method for manufacturing secondary battery using the method |
| 02/20/2008 | CN100370614C Semiconductor integrated circuit device and method for controlling semiconductor integrated circuit device |
| 02/20/2008 | CN100370567C Device and method for avoiding pressure responsive resistor failure and earth-fault circuit breaker |
| 02/20/2008 | CN100370507C Method for testing drive wave-shape of liquid crystal display |
| 02/20/2008 | CN100370430C Boundary Scanning chain self-testing method |
| 02/20/2008 | CN100370357C Digital optical fiber array high speed pick-up device having self-focusing lens |
| 02/20/2008 | CN100370271C Method and apparatus for measuring photoelectric conversion characteristics of solar cell element |
| 02/20/2008 | CN100370270C Voltage detecting method and related circuit |
| 02/20/2008 | CN100370269C Boundary scanning testing controller and boundary scanning testing method |
| 02/20/2008 | CN100370268C Transistor measuring instrument |
| 02/20/2008 | CN100370267C On-line detecting method and its device for multiple path transient wave form over voltage of power system |
| 02/20/2008 | CN100370266C Diagnostic system and method for electric leak detecting device |
| 02/20/2008 | CN100370265C Carrier wave intelligentized detection control apparatus for single power inductance ballasts and detection method thereof |
| 02/20/2008 | CN100370264C Method for automatic identifying circuit board type |
| 02/20/2008 | CN100370260C Multiple crystal grain needle-detection instrument |
| 02/20/2008 | CN100369776C Method and apparatus for detecting control |
| 02/19/2008 | US7334174 Semiconductor integrated circuit device and error detecting method therefor |
| 02/19/2008 | US7334173 Method and system for protecting processors from unauthorized debug access |
| 02/19/2008 | US7334172 Transition fault detection register with extended shift mode |
| 02/19/2008 | US7334171 Test pattern generating apparatus, circuit designing apparatus, test pattern generating method, circuit designing method, test pattern generating program and circuit designing program |
| 02/19/2008 | US7334169 Generation of test mode signals in memory device with minimized wiring |
| 02/19/2008 | US7334168 Semiconductor integrated circuit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit |
| 02/19/2008 | US7334060 System and method for increasing the speed of serially inputting data into a JTAG-compliant device |
| 02/19/2008 | US7333920 Arc fault detector with circuit interrupter |
| 02/19/2008 | US7333916 Performance monitor for a photovoltaic supply |
| 02/19/2008 | US7333908 Techniques for generating test patterns in high speed memory devices |
| 02/19/2008 | US7333436 Network device with traffic shaping functions and bandwidth control method using leaky bucket algorithm |
| 02/19/2008 | US7333435 Apparatus, system and method for the transmission of data with different QoS attributes |
| 02/19/2008 | US7333428 Path pair designing method, path pair designing device and program for causing computer to execute same method |
| 02/19/2008 | US7333377 Test mode control device using nonvolatile ferroelectric memory |
| 02/19/2008 | US7333376 Test mode control device using nonvolatile ferroelectric memory |
| 02/19/2008 | US7333313 Multiplexed temperature sensing circuit for HID lamp ballast |
| 02/19/2008 | US7332929 Wide-scan on-chip logic analyzer with global trigger and interleaved SRAM capture buffers |
| 02/19/2008 | US7332927 Apparatus for temporary thermal coupling of an electronic device to a heat sink during test |
| 02/19/2008 | US7332926 Semiconductor test apparatus |
| 02/19/2008 | US7332925 Engaging device of circuit board |
| 02/19/2008 | US7332924 Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure |
| 02/19/2008 | US7332923 Test probe for high-frequency measurement |
| 02/19/2008 | US7332922 Method for fabricating a structure for making contact with a device |
| 02/19/2008 | US7332921 Probe card and method for constructing same |
| 02/19/2008 | US7332920 Pulsed thermal monitor |
| 02/19/2008 | US7332919 Method and apparatus for distributing signals over jig-plates |
| 02/19/2008 | US7332918 Prober and probe testing method for temperature-controlling object to be tested |
| 02/19/2008 | US7332917 Method for calculating frequency-dependent impedance in an integrated circuit |
| 02/19/2008 | US7332916 On-chip signal waveform measurement apparatus for measuring signal waveforms at detection points on IC chip |
| 02/19/2008 | US7332914 Conductor inspection apparatus and conductor inspection method |
| 02/19/2008 | US7332907 Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals |
| 02/19/2008 | US7332906 Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum |
| 02/19/2008 | US7332905 Fixture for circuit board |
| 02/19/2008 | US7332904 On-chip resistor calibration apparatus and method |
| 02/19/2008 | US7332899 Circuit arrangement for monitoring a voltage supply, and for reliable locking of signal levels when the voltage supply is below normal |
| 02/19/2008 | US7332892 Method for predicting the voltage of a battery |
| 02/19/2008 | US7332891 Abnormality diagnosis device and method for battery pack |
| 02/19/2008 | US7332829 Condition monitor system responsive to different input pulses |
| 02/19/2008 | US7332718 Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor |
| 02/19/2008 | US7332362 Method for inspecting semiconductor device |
| 02/19/2008 | US7332361 Xerographic micro-assembler |
| 02/19/2008 | US7332360 Early detection of metal wiring reliability using a noise spectrum |
| 02/19/2008 | CA2454285C Method and apparatus for testing a motor |
| 02/14/2008 | WO2008019298A2 Microscope enclosure system |
| 02/14/2008 | WO2008019263A2 Adjustment mechanism |
| 02/14/2008 | WO2008019134A2 A probe head assembly for use in testing multiple wafer die |
| 02/14/2008 | WO2008018941A2 Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system |
| 02/14/2008 | WO2008018940A2 Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system |
| 02/14/2008 | WO2008018463A1 Defect inspecting method and defect inspecting apparatus |
| 02/14/2008 | WO2008018286A1 Probe card cassette and probe card |
| 02/14/2008 | WO2008017904A1 Real time clock monitoring method and system |
| 02/14/2008 | WO2008017530A1 Method for determining the battery capacity using capacity-dependent parameters |
| 02/14/2008 | WO2008017305A2 Apparatus and method for investigating the current flow distribution in solar cells and solar modules |
| 02/14/2008 | US20080040641 System and method for performing processing in a testing system |
| 02/14/2008 | US20080040640 Semiconductor integrated circuit and bist circuit design method |
| 02/14/2008 | US20080040639 Apparatus and Method For Generating Test Pattern Data For Testing Semiconductor Device |
| 02/14/2008 | US20080040638 Evaluation Circuit and Method for Detecting and/or Locating Faulty Data Words in a Data Stream Tn |
| 02/14/2008 | US20080040637 Diagnosing mixed scan chain and system logic defects |
| 02/14/2008 | US20080040636 Integrated circuit having a subordinate test interface |
| 02/14/2008 | US20080040457 Heterogeneous, role based enterprise priority manager |
| 02/14/2008 | US20080040056 Battery recharging and replacement system |
| 02/14/2008 | US20080039334 Dielectric Strength Test Method of Superconducting Cable |
| 02/14/2008 | US20080038851 Pattern for evaluating electric characteristics, method for evaluating electric characteristics, method for manufacturing semiconductor device and method for providing reliability assurance |
| 02/14/2008 | US20080037319 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 02/14/2008 | US20080036715 Display device, display device testing system and method for testing a display device using the same |
| 02/14/2008 | US20080036487 Integrated circuit wearout detection |
| 02/14/2008 | US20080036486 Integrated circuit testing methods using well bias modification |
| 02/14/2008 | US20080036485 Semiconductor wafer and method of testing the same |
| 02/14/2008 | US20080036483 Probe card for flip chip testing |
| 02/14/2008 | US20080036482 Carrier tray for use with prober |
| 02/14/2008 | US20080036481 Air trapped circuit board test pad via |
| 02/14/2008 | US20080036480 Adjustment Mechanism |
| 02/14/2008 | US20080036479 Probe and Method of Manufacturing Probe |