| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/20/2008 | US7376875 Method of improving logical built-in self test (LBIST) AC fault isolations |
| 05/20/2008 | US7376874 Method of controlling a test mode of a circuit |
| 05/20/2008 | US7376873 Method and system for selectively masking test responses |
| 05/20/2008 | US7376872 Testing embedded memory in integrated circuits such as programmable logic devices |
| 05/20/2008 | US7376871 CAM test structures and methods therefor |
| 05/20/2008 | US7376857 Method of timing calibration using slower data rate pattern |
| 05/20/2008 | US7376743 Method and apparatus for load balancing in a virtual private network |
| 05/20/2008 | US7376080 Packet load shedding |
| 05/20/2008 | US7376077 Data monitoring and recovery |
| 05/20/2008 | US7375602 Methods for propagating a non sinusoidal signal without distortion in dispersive lossy media |
| 05/20/2008 | US7375543 Electrostatic discharge testing |
| 05/20/2008 | US7375542 Automated test equipment with DIB mounted three dimensional tester electronics bricks |
| 05/20/2008 | US7375541 Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof |
| 05/20/2008 | US7375540 Process monitor for monitoring and compensating circuit performance |
| 05/20/2008 | US7375539 Testing device |
| 05/20/2008 | US7375538 Method of inspecting pattern and inspecting instrument |
| 05/20/2008 | US7375533 Continuity tester adaptors |
| 05/20/2008 | US7375532 Cable tester |
| 05/20/2008 | US7375531 Method of informing pilot of aircraft of spark detected in gas turbine engine |
| 05/20/2008 | US7375508 Device and a process for the calibration of a semiconductor component test system |
| 05/20/2008 | US7375505 Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
| 05/20/2008 | US7375495 Method for determination of the charge drawn by an energy storage battery |
| 05/20/2008 | US7375371 Structure and method for thermally stressing or testing a semiconductor device |
| 05/20/2008 | US7375332 Laser-based irradiation apparatus and method to measure the functional dose-rate response of semiconductor devices |
| 05/20/2008 | US7374970 Manufacturing method of a tray, a socket for inspection, and a semiconductor device |
| 05/20/2008 | US7374957 Method of calibrating or qualifying a lithographic apparatus or part thereof, and device manufacturing method |
| 05/20/2008 | US7374956 Method for improved metrology by protecting photoresist profiles |
| 05/20/2008 | US7374293 Apparatus, system and method for testing electronic elements |
| 05/20/2008 | CA2488822C High-voltage resistor element |
| 05/20/2008 | CA2397973C Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable |
| 05/15/2008 | WO2008057897A2 Method and apparatus for providing active compliance in a probe card assembly |
| 05/15/2008 | WO2008056666A1 Test circuit, method, and semiconductor device |
| 05/15/2008 | WO2008056627A1 Probe card for inspecting solid state image sensor |
| 05/15/2008 | WO2008056609A1 Parallel test circuit and method and semiconductor device |
| 05/15/2008 | WO2008056541A1 Diagnostic device, diagnostic method, program, and recording medium |
| 05/15/2008 | WO2008056418A1 Tcp handling device, and method for positional alignment of connecting terminals in the device |
| 05/15/2008 | WO2008056385A1 Method for detecting partial discharges in an electric machine and detecting device of partial discharges |
| 05/15/2008 | WO2008056206A1 Method for testing noise immunity of an integrated circuit and a device having noise immunity testing capabilities |
| 05/15/2008 | WO2008055839A2 Electrical contact arrangement |
| 05/15/2008 | WO2008024699A3 Method and apparatus for proactive fault monitoring in interconnects |
| 05/15/2008 | WO2008019298A3 Microscope enclosure system |
| 05/15/2008 | WO2007103626A3 Recording and reproducing trading communications |
| 05/15/2008 | US20080115029 iterative test generation and diagnostic method based on modeled and unmodeled faults |
| 05/15/2008 | US20080115028 Method and system for test verification of integrated circuit designs |
| 05/15/2008 | US20080115027 Memory Model for Functional Verification of Multi-Processor Systems |
| 05/15/2008 | US20080115026 Method and Apparatus for Scheduling BIST Routines |
| 05/15/2008 | US20080115025 Circuit and method operable in functional and diagnostic modes |
| 05/15/2008 | US20080115023 Set hardened register |
| 05/15/2008 | US20080115022 System and related method for chip i/o test |
| 05/15/2008 | US20080115021 Plesiochronous transmit pin with synchronous mode for testing on ATE |
| 05/15/2008 | US20080115020 Plesiochronous receiver pin with synchronous mode for testing on ATE |
| 05/15/2008 | US20080115019 Circuit Timing Monitor Having A Selectable-Path Ring Oscillator |
| 05/15/2008 | US20080112332 Distributed Packet Group Identification For Network Testing |
| 05/15/2008 | US20080112149 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112148 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112147 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112146 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112145 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080112144 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080111578 Device for Measurement and Analysis of Electrical Signals of an Integrated Circuit Component |
| 05/15/2008 | US20080111577 Integrated Substrate Transfer Module |
| 05/15/2008 | US20080111576 Circuit and Method for Trimming Integrated Circuits |
| 05/15/2008 | US20080111575 Semiconductor device |
| 05/15/2008 | US20080111574 Method for Isolating a Short-Circuited Integrated Circuit (IC) From Other ICs on a Semiconductor Wafer |
| 05/15/2008 | US20080111573 Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes |
| 05/15/2008 | US20080111572 Probe cards employing probes having retaining portions for potting in a retention arrangement |
| 05/15/2008 | US20080111571 Membrane probing system |
| 05/15/2008 | US20080111570 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080111569 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/15/2008 | US20080111566 System and Method for Use in Functional Failure Analysis by Induced Stimulus |
| 05/15/2008 | US20080111561 Method for characterizing integrated circuits for identification or security purposes |
| 05/15/2008 | US20080111558 Defect localization based on defective cell diagnosis |
| 05/15/2008 | US20080111557 Method for detecting a discharge condition fault in an electrical system of a vehicle or piece of machinery |
| 05/15/2008 | US20080111556 Car power source apparatus |
| 05/15/2008 | US20080111523 Method and apparatus for displaying charging-state of battery of portable terminal |
| 05/15/2008 | US20080110809 Multifunctional handler system for electrical testing of semiconductor devices |
| 05/15/2008 | US20080110019 Probe card and method for constructing same |
| 05/15/2008 | DE102006053986A1 Lightning arrester for use in electric power transmission network, has casing with optically transparent section, where section has level indicator which is inserted into casing |
| 05/15/2008 | DE102006053446A1 Checking fixture for switch, has mounting plates with mounting units for holding contact units, where mounting units are equispaced with each other and are arranged in standardized arrangement at mounting plates |
| 05/15/2008 | DE102006053398A1 Elektronisches Gerät Electronic Instrument |
| 05/15/2008 | DE102006053021A1 Kraftfahrzeugsensor, insbesondere Batteriesensor mit Messwiderstand Motor vehicle sensor, in particular battery sensor with measuring resistor |
| 05/15/2008 | DE102006053006A1 Circuit testing device, has contact unit for connecting circuit with testing device, and fixation unit for fixing circuit, where contact unit is connected with fixation unit by frame, which is attached detachably to contact unit |
| 05/15/2008 | DE102006052539A1 Verfahren zur großflächigen Erfassung stark schwankender niederfrequenter magnetischer Felder, insbesondere im Rahmen der Ermittlung einer elektromagnetischen Verträglichkeit im Bereich stromführender Einrichtungen Method for large-scale detection of strongly fluctuating low-frequency magnetic fields, in particular in the context of determining the electromagnetic compatibility in the area of current carrying devices |
| 05/15/2008 | DE102006027448B4 Schaltungsanordnung Circuitry |
| 05/15/2008 | DE102006006048B4 Testgerät und Testverfahren Test apparatus and test procedure |
| 05/15/2008 | DE102004027854B4 Testvorrichtung und Verfahren zum Testen von zu testenden Schaltungseinheiten A test device and method for testing the circuit under test units |
| 05/14/2008 | EP1921726A2 Method and apparatus for displaying charging-state of battery of portable terminal |
| 05/14/2008 | EP1921671A1 Wafer level burn-in method and wafer level burn-in system |
| 05/14/2008 | EP1921460A1 Vehicle, power supply and current detector of vehicle |
| 05/14/2008 | EP1921459A1 Calibration board for electronic component testing apparatus |
| 05/14/2008 | EP1921457A1 Insulation resistance degradation detector and failure self-diagnostic method for insulation resistance degradation detector |
| 05/14/2008 | EP1921456A2 Motor vehicle sensor, in particular battery sensor with measuring resistance |
| 05/14/2008 | EP1920518A1 Device and method for balancing charge between the individual cells of a double-layer capacitor |
| 05/14/2008 | EP1920379A2 Controlling embedded memory access |
| 05/14/2008 | EP1920264A1 Battery sensor unit |
| 05/14/2008 | EP1920263A1 Method of testing unloaded, large-area printed circuit boards with a finger tester |
| 05/14/2008 | EP1920262A1 Process and apparatus for estimating circuit delay |
| 05/14/2008 | EP1709453A4 System and method to forecast the electrical conductivity of anodes for aluminum production before baking |
| 05/14/2008 | EP1605271B1 Testing apparatus, program for testing apparatus, and method of controlling testing appratus |
| 05/14/2008 | EP1374364A4 Terminal assembly for battery |