Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2008
05/14/2008EP1218760B1 Measurement of current in a vehicle using battery cable as a shunt
05/14/2008EP0910870B1 Power semiconductor devices with a temperature sensor circuit
05/14/2008CN201061124Y Intelligent terminal system of oil well
05/14/2008CN201060739Y Mutual inductor with self-circuit open circuit and short circuit detection function
05/14/2008CN201060340Y IC loose inspection device
05/14/2008CN201060339Y Electric checking clamp of improved structure
05/14/2008CN201060260Y Fuel battery voltage attenuation rapid measurement device
05/14/2008CN201060259Y Automatic detection battery voltage device and pre-charging cabinet
05/14/2008CN201060258Y Power cell service-life testing apparatus
05/14/2008CN201060257Y Fuel batteries current-voltage characteristic test device
05/14/2008CN201060256Y Device used for electricity generator experiment
05/14/2008CN201060255Y Push pole electric machine synthesis patching table loading simulated mechanism
05/14/2008CN201060254Y Three phase electric motor turning recognition device
05/14/2008CN201060253Y Multifunctional synthesis durability testing stand
05/14/2008CN201060252Y Three phase electronic type over loading relay tester
05/14/2008CN201060251Y Digital type high-pressure signal monitoring apparatus for electric power locomotive engine
05/14/2008CN201060250Y Digital type alternating current-direct current local discharge testing apparatus
05/14/2008CN201060249Y High-performance electric power line fault indicator
05/14/2008CN201060248Y Electrical cable recognizer
05/14/2008CN201060247Y Dynamic electric energy quality detection control device
05/14/2008CN201060246Y High tension power line road online monitoring arrangement
05/14/2008CN201060245Y SVC signal generating device
05/14/2008CN201060244Y Short circuit tester
05/14/2008CN201060243Y Induction type pole tower electrical leakage sensor
05/14/2008CN201060242Y Multi-core co-axial cable assembly opening-breaking circuit detector
05/14/2008CN201060241Y Hall assembly testing apparatus
05/14/2008CN201060240Y General purpose type circuit trouble indicator and housing thereof
05/14/2008CN201060239Y Biology apparatus remote maintenance and failure diagnosis system
05/14/2008CN201060238Y High-pressure electrified displaying interlock apparatus detector
05/14/2008CN201060233Y Breakdown disjunction mechanism used for insulation pretection apparatus pressure test device
05/14/2008CN201060212Y Insulation gloves experiment supporting device
05/14/2008CN201060211Y Automatic controlling insulation laboratory flume
05/14/2008CN201060091Y Sulfur hexafluoride gas leakage laser formatter
05/14/2008CN201060049Y Tester of digital sound-electric transducer
05/14/2008CN201060006Y Bus type debugging diagnostic apparatus
05/14/2008CN201059958Y External shape testing apparatus of electronic element
05/14/2008CN201059278Y Moving cantilever type air volume controlled unit ventilator
05/14/2008CN101180549A Processing device of electronic component
05/14/2008CN101180548A Pick-and-place mechanism of electronic device, electronic device handling apparatus and suction method of electronic device
05/14/2008CN101178838A Lightning arrestor on-line monitoring methods thereof system
05/14/2008CN101178430A Data queue device and data queue testing method
05/14/2008CN101178429A Electric potential displace method based on gate circuit transistor gate control
05/14/2008CN101178428A Relay connector
05/14/2008CN101178427A Relay connector
05/14/2008CN101178426A Short circuit testing apparatus and method
05/14/2008CN101178425A Long time self-adapting integrative approach
05/14/2008CN101178424A Dynamic data compression storage method in electric network wide-area measuring systems (WAMS)
05/14/2008CN101178423A Integrate circuit testing structure and method of use thereof
05/14/2008CN101178422A Character type illuminating device detecting method
05/14/2008CN101178421A Circuit and method for measuring discrepancy between tiny capacitances
05/14/2008CN101178419A Integrate circuit system pressing impedance detection method
05/14/2008CN101178414A Probe card having cantilever probes, producing method and detecting probe needlepoint locating methods
05/14/2008CN101178325A Flow measurement instrument
05/14/2008CN101177199A Resonance type high-speed high-precision multi-station turning table
05/14/2008CN100388454C Testing device and testing method of a semiconductor device
05/14/2008CN100388452C Device and method for detecting the overheating of a semiconductor device
05/14/2008CN100388413C Manufacturing method for semiconductor device
05/14/2008CN100388348C Automatic measurement and correction method and system for LCD GAMMA curve and color temperature
05/14/2008CN100388003C Fast detection device and method of thermal stability sintered neodymium iron boron material for electric machine
05/14/2008CN100388002C Method and apparatus for scanning mode running static time sequence analysis
05/14/2008CN100388001C Detecting chip with multiple detecting units
05/14/2008CN100388000C Lighting apparatus
05/14/2008CN100387999C Circuit fault directional detecting and protecting method for power supply system
05/14/2008CN100387998C Burn-in device
05/14/2008CN100387997C Thin film transistor display array measuring circuit and method
05/14/2008CN100387996C Testing structure for multi-directional leakage current path
05/13/2008US7373625 System and method for product yield prediction
05/13/2008US7373623 Method and apparatus for locating circuit deviations
05/13/2008US7373619 Post-silicon test coverage verification
05/13/2008US7373575 Method and apparatus for generating expect data from a captured bit pattern, and memory device using same
05/13/2008US7373574 Semiconductor testing apparatus and method of testing semiconductor
05/13/2008US7373573 Apparatus and method for using a single bank of eFuses to successively store testing data from multiple stages of testing
05/13/2008US7373572 System pulse latch and shadow pulse latch coupled to output joining circuit
05/13/2008US7373571 Achieving desired synchronization at sequential elements while testing integrated circuits using sequential scan techniques
05/13/2008US7373570 LSI device having scan separators provided in number reduced from signal lines of combinatorial circuits
05/13/2008US7373569 Pulsed flop with scan circuitry
05/13/2008US7373568 Scan insertion
05/13/2008US7373567 System and method of providing error detection and correction capability in an integrated circuit using redundant logic cells of an embedded FPGA
05/13/2008US7373566 Semiconductor device for accurate measurement of time parameters in operation
05/13/2008US7373565 Start/stop circuit for performance counter
05/13/2008US7373563 Root cause correlation in connectionless networks
05/13/2008US7373561 Integrated packet bit error rate tester for 10G SERDES
05/13/2008US7373522 Smart card with enhanced security features and related system, integrated circuit, and methods
05/13/2008US7373360 Methods and apparatus that use contextual test number factors to assign test numbers
05/13/2008US7373282 Fault severity check and source identification
05/13/2008US7373264 Method and apparatus for generalized recursive least-squares process for battery state of charge and state of health
05/13/2008US7373263 Analog-type measurements for a logic analyzer
05/13/2008US7372870 Ethernet transmission apparatus with a quick protective and fair attribute and its method
05/13/2008US7372806 Fault recovery system and method for a communications network
05/13/2008US7372805 Traffic grooming methods for undersea trunk and branch architectures
05/13/2008US7372804 Multiplex communication system and method
05/13/2008US7372803 Apparatus and method for establishment and protection of connections within mesh networks
05/13/2008US7372289 Semiconductor integrated circuit device and power supply voltage monitor system employing it
05/13/2008US7372288 Test apparatus for testing multiple electronic devices
05/13/2008US7372287 Semiconductor device testing apparatus and device interface board
05/13/2008US7372285 Socket-less test board and clamp for electrical testing of integrated circuits
05/13/2008US7372283 Probe navigation method and device and defect inspection device
05/13/2008US7372280 Method and system for transmitting an information signal over a power cable
05/13/2008US7372252 Automated platform for electronic apparatus environmental testing & method of use
05/13/2008US7372251 Semiconductor integrated circuit and memory test method