| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/24/2008 | US7391218 Method and apparatus for generalized arc fault detection |
| 06/24/2008 | US7391104 Non-stick detection method and mechanism for array molded laminate packages |
| 06/24/2008 | US7390680 Method to selectively identify reliability risk die based on characteristics of local regions on the wafer |
| 06/24/2008 | US7389843 Automotive passenger restraint and protection apparatus |
| 06/24/2008 | US7389581 Method of forming compliant contact structures |
| 06/24/2008 | US7389572 Method of retrofitting a probe station |
| 06/22/2008 | CA2613764A1 Multi-ended fault location system |
| 06/19/2008 | WO2008073513A2 Method and system for measuring properties of microstructures and nanostructures |
| 06/19/2008 | WO2008072639A1 Testing apparatus, testing method and connecting section |
| 06/19/2008 | WO2008072436A1 Secondary battery deterioration judging device and backup power supply |
| 06/19/2008 | WO2008072401A1 Test device and inspection method |
| 06/19/2008 | WO2008072329A1 Analog input device |
| 06/19/2008 | WO2008072287A1 Leakage current determining apparatus and leakage current determining method |
| 06/19/2008 | WO2008072226A2 Fault prediction in electric transmission networks |
| 06/19/2008 | WO2008072202A1 Rf circuit analysis |
| 06/19/2008 | WO2008071560A1 Interface unit and method for managing communication in a computer network |
| 06/19/2008 | WO2008071541A2 Module for a test device for testing circuit boards |
| 06/19/2008 | WO2008034752A3 Method for determining an operating state of an energy accumulator |
| 06/19/2008 | WO2007127332A3 End-system dynamic rate limiting of background traffic |
| 06/19/2008 | WO2007073517A3 Method for cleaning ionizing electrodes |
| 06/19/2008 | WO2007062612A8 Monitoring unit for monitoring the load of an electric motor |
| 06/19/2008 | US20080148118 Method and system for protecting processors from unauthorized debug access |
| 06/19/2008 | US20080148117 Multicore chip test |
| 06/19/2008 | US20080144493 Method of interference management for interference/collision prevention/avoidance and spatial reuse enhancement |
| 06/19/2008 | US20080144489 Network device and communication recovery method thereof |
| 06/19/2008 | US20080144488 Method and System for Providing Prioritized Failure Announcements |
| 06/19/2008 | US20080144243 Method and circuit for low-power detection of solder-joint network failures in digital electronic packages |
| 06/19/2008 | US20080143372 Closed loop feedback control of integrated circuits |
| 06/19/2008 | US20080143371 Semiconductor device including a signal generator activated upon occuring of a timing signal |
| 06/19/2008 | US20080143370 I/o port tester |
| 06/19/2008 | US20080143368 Probe and method for manufacturing the same |
| 06/19/2008 | US20080143366 Contact Pin Probe Card and Electronic Device Test Apparatus Using Same |
| 06/19/2008 | US20080143365 Probe station and method for measurements of semiconductor devices under defined atmosphere |
| 06/19/2008 | US20080143363 Liquid cooled dut card interface for wafer sort probing |
| 06/19/2008 | US20080143361 Automated loader for removing and inserting removable devices to improve load time for automated test equipment |
| 06/19/2008 | US20080143360 Method and apparatus for improving load time for automated test equipment |
| 06/19/2008 | US20080143359 Reinforced contact elements |
| 06/19/2008 | US20080143358 Electrical guard structures for protecting a signal trace from electrical interference |
| 06/19/2008 | US20080143357 High power cobra interposer wtih integrated guard plate |
| 06/19/2008 | US20080143356 Conductive Particle Filled Polymer Electrical Contact |
| 06/19/2008 | US20080143355 Method and System for Testing or Measuring Electrical Elements |
| 06/19/2008 | US20080143354 System and methods of measuring semiconductor sheet resistivity and junction leakage current |
| 06/19/2008 | US20080143342 Screening of electrolytic capacitors |
| 06/19/2008 | US20080143341 System and method for non-destructive testing of rotors |
| 06/19/2008 | US20080143340 Method and Circuit Arrangement for Detecting a Wire Break |
| 06/19/2008 | US20080143339 Electronic apparatus and control method thereof |
| 06/19/2008 | US20080143338 Wire Disconnection Inspecting Device And Method |
| 06/19/2008 | US20080143320 Power Sensor with Switched-In Signal Amplification Path |
| 06/19/2008 | US20080143318 High frequency delay circuit and test apparatus |
| 06/19/2008 | US20080142712 Defect inspection and charged particle beam apparatus |
| 06/19/2008 | DE19938060B4 Integrierte Schaltung mit einer Testeinrichtung und Verfahren zum Testen der Güte elektrischer Verbindungen der ingegrierten Schaltung Integrated circuit with a test device and method for testing the quality of electrical connections of the circuit ingegrierten |
| 06/19/2008 | DE112006002337T5 Verfahren und Vorrichtung zur Detektion verspäteter Timing-Übergänge Method and device for the detection of delayed timing transitions |
| 06/19/2008 | DE112006002109T5 Halbleiterprüfvorrichtung, Funktionsplatte und Schnittstellenplatte Semiconductor testing, performance board and interface board |
| 06/19/2008 | DE112006002098T5 Vorsehen genauer Zeitsteuerung innerhalb eines standardisierten Prüfinstrumentenchassis Providing accurate time control within a standardized test instrumentation |
| 06/19/2008 | DE112006002092T5 Schaltungskartensynchronisation innerhalb eines standardisierten Prüfinstrumentenchassis Circuit card synchronization within a standardized test instrumentation |
| 06/19/2008 | DE112006002066T5 Messung von Strom-Spannung-Charakteristikkurven von Solarzellen und Solarmodulen Measurement of current-voltage characteristic curves of solar cells and solar modules |
| 06/19/2008 | DE102006058784A1 Measurement system for batteries, especially for motor vehicles, has evaluation device arranged outside sensor device and sensors encapsulated in sensor device |
| 06/19/2008 | DE102006058169A1 Integrierter Halbleiterschaltkreis The semiconductor integrated circuit |
| 06/19/2008 | DE102006056543A1 Sondenhalter für eine Sonde zur Prüfung von Halbleiterbauelementen Probe holder for a probe for the testing of semiconductor devices |
| 06/19/2008 | DE102006055125B3 Batteriebetreibbares Feldgerät zur Prozessinstrumentierung Batteriebetreibbares field device for process instrumentation |
| 06/19/2008 | DE102006037633B4 Halbleiterchip mit Beschädigungs-Detektierschaltung und ein Verfahren zum Herstellen eines Halbleiterchips Semiconductor chip having DAMAGE detecting circuit and a method for producing a semiconductor chip |
| 06/19/2008 | DE102004023987B4 Elektrische Prüfeinrichtung Electrical test equipment |
| 06/18/2008 | EP1933443A2 Power cell monitoring |
| 06/18/2008 | EP1933160A2 Battery charge level detecting device |
| 06/18/2008 | EP1933159A2 Method and device for determining state of battery, and battery power supply system therewith |
| 06/18/2008 | EP1933158A1 Secondary cell degradation judgment method, secondary cell degradation judgment device, and power supply system |
| 06/18/2008 | EP1932007A1 Process and device for the error-protected evaluation of a position indicator, in particular a potentiometer |
| 06/18/2008 | EP1932006A1 System and method for monitoring of electrical cables |
| 06/18/2008 | EP1932005A1 Method and system for determining a network structure or layout of at least a part of an electricity transport network |
| 06/18/2008 | EP1733335A4 Radio frequency identification of a connector by a patch panel or other similar structure |
| 06/18/2008 | EP1504382A4 Method and mechanism for improved performance analysis in transaction level models |
| 06/18/2008 | CN201075831Y Alternating current and overpressure resistant resonance step-up apparatus for generator |
| 06/18/2008 | CN201075708Y Constant-current discharging equipment for accumulator |
| 06/18/2008 | CN201075704Y Detection circuit of electrical equipment and mobile phone having the circuit |
| 06/18/2008 | CN201075542Y Universal charging ring |
| 06/18/2008 | CN201075126Y Capacitance detector for endowing energy and overpressure resistance |
| 06/18/2008 | CN201075125Y High-voltage network overvoltage action counter for mining |
| 06/18/2008 | CN201075124Y Transient forward voltage tester for recuperation duration of DC converter valve |
| 06/18/2008 | CN201075123Y Device for measuring high potential current |
| 06/18/2008 | CN201075122Y Off-cycle triggering tester of high voltage DC transmission converter valve |
| 06/18/2008 | CN201075121Y Device for discharging locally and detecting as well as recording voltage of middle-high pressure crosslinking cable |
| 06/18/2008 | CN201075120Y Intelligent navigation simulation load tester |
| 06/18/2008 | CN201075115Y Testing clamp for circuit board |
| 06/18/2008 | CN201075114Y IC testing control tool |
| 06/18/2008 | CN201075057Y Synthetic intelligent detecting instrument for electric vehicle |
| 06/18/2008 | CN201075054Y Electronic control system experimental bench for vehicle electric appliance and engine |
| 06/18/2008 | CN101203800A Liquid crystal display device test circuit, liquid crystal display device incorporating this, and liquid crystal display device test method |
| 06/18/2008 | CN101203767A Method and apparatus for adjusting a multi-substrate probe structure |
| 06/18/2008 | CN101202548A Double runs data coding method |
| 06/18/2008 | CN101202469A Distributing transformator remote monitoring terminal based on embedded system |
| 06/18/2008 | CN101202462A Multifunctional carry-on power supply |
| 06/18/2008 | CN101202440A Protection circuit of relay right acting |
| 06/18/2008 | CN101202433A Reliable load observe and control system |
| 06/18/2008 | CN101202268A Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method |
| 06/18/2008 | CN101202117A System and method for testing NVM chip |
| 06/18/2008 | CN101202001A Inspection plate for vacuum fluorescent display with built-in chip |
| 06/18/2008 | CN101201777A Test system for capacitance type input mechanism |
| 06/18/2008 | CN101201775A Testing clamp for circuit board |
| 06/18/2008 | CN101201393A Method for calibrating closed hull precision of relay synthetic parametric tester |
| 06/18/2008 | CN101201391A Running state display and fault on-line diagnosis circuit for inverter |