| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/12/2008 | US20080141191 Test method for unit re-modification |
| 06/12/2008 | US20080141088 Method and apparatus for test of asynchronous pipelines |
| 06/12/2008 | US20080141087 core circuit test architecture |
| 06/12/2008 | US20080141086 Chip level scan chain planning for hierarchical design flows |
| 06/12/2008 | US20080141085 Process for identifying the location of a break in a scan chain in real time |
| 06/12/2008 | US20080141084 System for estimating and improving test case generation |
| 06/12/2008 | US20080141083 Integrated circuit with jtag port, tap linking module, and off-chip tap interface port |
| 06/12/2008 | US20080140354 Arc fault detector with circuit interrupter |
| 06/12/2008 | US20080140335 Systems and Methods for a Distributed Execution Environment with Per-Command Environment Management |
| 06/12/2008 | US20080140334 Semiconductor package capable of performing various tests and method of testing the same |
| 06/12/2008 | US20080139120 Method and system for monitoring module power information in a communication device |
| 06/12/2008 | US20080139024 Burn-in board connection device and method |
| 06/12/2008 | US20080139020 Separable Electrical Interconnect With Anisotropic Conductive Elastomer and Adaptor With Channel For Engaging A Frame |
| 06/12/2008 | US20080139017 Electric connector and electrical connecting apparatus using the same |
| 06/12/2008 | US20080138099 Power supply apparatus and image forming apparatus |
| 06/12/2008 | US20080137542 Method for detecting abnormal network packets |
| 06/12/2008 | US20080137538 Performance Measuring in a Packet Transmission Network |
| 06/12/2008 | US20080137498 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method |
| 06/12/2008 | US20080137456 Method of testing memory device |
| 06/12/2008 | US20080136440 Method and apparatus for testing liquid crystal display device |
| 06/12/2008 | US20080136439 Method and apparatus for cooling non-native instrument in automatic test equipment |
| 06/12/2008 | US20080136438 Parallel scan distributors and collectors and process of testing integrated circuits |
| 06/12/2008 | US20080136437 Method and system for device characterization with array and decoder |
| 06/12/2008 | US20080136436 Wafer chuck, apparatus including the same and method for testing electrical characteristics of wafer |
| 06/12/2008 | US20080136435 Clamping top plate using magnetic force |
| 06/12/2008 | US20080136434 Wafer-level test module for testing image sensor chips, the related test method and fabrication |
| 06/12/2008 | US20080136433 Contactor for electronic components and test method using the same |
| 06/12/2008 | US20080136432 Sharing resources in a system for testing semiconductor devices |
| 06/12/2008 | US20080136431 Apparatus, system and method for testing electronic elements |
| 06/12/2008 | US20080136430 Broken die detect sensor |
| 06/12/2008 | US20080136428 Contacting component, method of producing the same, and test tool having the contacting component |
| 06/12/2008 | US20080136427 On-chip probing apparatus |
| 06/12/2008 | US20080136426 Method and Apparatus For Characterising a Three Phase Transformer Using a Single Phase Power supply |
| 06/12/2008 | US20080136422 Amperage/voltage loop calibrator with loop diagnostics |
| 06/12/2008 | US20080136421 Remotely reconfigurable system for mapping subsurface geological anomalies |
| 06/12/2008 | US20080136360 Apparatus, System, and Method for Detecting an Electrical Short Condition In A Dynamoelectric Machine |
| 06/12/2008 | US20080135315 Fast search algorithm for finding initial diffusion voltage in electro-chemical systems |
| 06/12/2008 | DE102007053862A1 Probe station for e.g. testing semiconductor substrates, has positioning system positioning substrate with respect to sensors, housing enclosing chuck and sensors to form electromagnetic shielding |
| 06/12/2008 | DE102006055315A1 Monitoring device for power line, has line section and another line section, where line sections are switched into series and have measuring instrument which generates two measuring signals |
| 06/12/2008 | DE102006052295B3 Verfahren und Schaltungsanordnung zur Überwachung eines Photovoltaikgenerators Method and circuit arrangement for monitoring a photovoltaic generator |
| 06/12/2008 | DE102005015311B4 Testvorrichtung und Testverfahren für Mixed-Signal Halbleiterbauteile sowie elektrische Schaltung zur Erzeugung von Zahlenwerten zur Nachbildung eines sinusförmigen Signals Test apparatus and test procedure for mixed-signal semiconductor components as well as electric circuit for the generation of numerical values for the replica of the sinusoidal signal |
| 06/12/2008 | DE10110576B4 Einbetten dynamischer Schaltkreise in eine statische Umgebung Embed dynamic circuits in a static environment |
| 06/12/2008 | DE10028835B4 Halbleitertestgerät und Verfahren zum Testen einer Halbleitervorrichtung The semiconductor test apparatus and method for testing a semiconductor device |
| 06/11/2008 | EP1930738A2 Method for detecting an electrical short condition in a dynamoelectric machine |
| 06/11/2008 | EP1930737A1 Insulating resistance detection apparatus |
| 06/11/2008 | EP1930734A1 Probe card |
| 06/11/2008 | EP1930649A1 Flashlight with LCD display |
| 06/11/2008 | EP1929318A1 Pin electronics driver |
| 06/11/2008 | EP1929317A2 Test sequence optimization method and design tool |
| 06/11/2008 | EP1929315A2 Wafer inspection system and a method for translating wafers |
| 06/11/2008 | EP1662263B1 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device |
| 06/11/2008 | EP1440323B1 Method and device for phase calculation from attenuation values using a hilbert transform for reflectometric measurements in the frequency domain |
| 06/11/2008 | EP1129343B1 Method and apparatus for determining battery properties from complex impedance/admittance |
| 06/11/2008 | CN201072651Y Testing device for hard disk connection socket |
| 06/11/2008 | CN201072644Y Multifunctional driving circuit for metal net plate type plasma display panel test |
| 06/11/2008 | CN201072642Y Electric detection circuit of LCD driving mainboard |
| 06/11/2008 | CN201072438Y Multi-input channel modularized high-frequency isolation single phase electric energy feedback type electronic load |
| 06/11/2008 | CN201072437Y DC/DC module aging test circuit |
| 06/11/2008 | CN201072436Y Form testing bench for generator |
| 06/11/2008 | CN201072435Y Logic analyzer |
| 06/11/2008 | CN201072434Y Direct plugging type LED push-and-pull tester |
| 06/11/2008 | CN201072433Y CAN bus open circuit detection circuit |
| 06/11/2008 | CN201072432Y Distant range short circuit multi-phase detection device |
| 06/11/2008 | CN201072431Y Broadband aviation electronic bus testing device |
| 06/11/2008 | CN201072430Y Novel industrial frequency high voltage test device |
| 06/11/2008 | CN201072425Y Electric voltage supplying module used for electrical power system of partial discharge test |
| 06/11/2008 | CN201072423Y Special jig device of lithium battery checking equipment |
| 06/11/2008 | CN201072373Y Simple air permeability tester |
| 06/11/2008 | CN101199059A Monolithically integrated semiconductor assembly comprising a power component and method for producing a monolithically integrated semiconductor assembly |
| 06/11/2008 | CN101198879A Method of testing unloaded, large-area printed circuit boards with a finger tester |
| 06/11/2008 | CN101198878A Probe card assembly with a dielectric structure |
| 06/11/2008 | CN101198877A Bi-directional MOS current sense circuit |
| 06/11/2008 | CN101197569A Circuit built in chip for initializing its operation mode and method thereof |
| 06/11/2008 | CN101197204A Lighting arrester |
| 06/11/2008 | CN101196842A Electric power loop test method |
| 06/11/2008 | CN101196662A Liquid crystal display device and driving method of the same |
| 06/11/2008 | CN101196623A Device and method for detecting screen chromatic characteristics |
| 06/11/2008 | CN101196566A Ice slush geoelectricity testing technique |
| 06/11/2008 | CN101196559A Magneto-optic circular polarization dichroism measuring system capable of adjusting measuring geometry |
| 06/11/2008 | CN101196557A Method, device and system for field programmable gate array test |
| 06/11/2008 | CN101196556A SOC for parallel test judgement and its implementing method |
| 06/11/2008 | CN101196555A Variegated BIST test approach |
| 06/11/2008 | CN101196554A Wafer multi-test object parallel test system |
| 06/11/2008 | CN101196553A Method for improving SOC chip testing efficiency |
| 06/11/2008 | CN101196552A Method for judging existence of high-efficiency quantum structure in multi-quantum well LED materials |
| 06/11/2008 | CN101196551A Ground wire patrol checking robot of high voltage power line |
| 06/11/2008 | CN101196550A Power cable monitoring device and method for monitoring power cable state using the same |
| 06/11/2008 | CN101196549A Method, device and system for detecting an electrical short condition in a dynamoelectric machine |
| 06/11/2008 | CN101196548A Receiving card recognizing method and correlated communication equipment |
| 06/11/2008 | CN101196547A Live testing apparatus for local discharge based on ultrasound assistance |
| 06/11/2008 | CN101196546A Method for different IP products executing burn-in test and test board used for it |
| 06/11/2008 | CN101196545A Device for measuring dielectric characteristics of dielectric material |
| 06/11/2008 | CN101196544A Method for measuring capacitance mismatch and circuit structure thereof |
| 06/11/2008 | CN101196540A Voltage detecting circuit |
| 06/11/2008 | CN101196414A Detecting instrument |
| 06/11/2008 | CN100394686C Precision margining circuitry |
| 06/11/2008 | CN100394572C System for processing electronic devices |
| 06/11/2008 | CN100394571C LSI package, LSI element testing method, and semiconductor device manufacturing method |
| 06/11/2008 | CN100394537C Manufacturing method for semiconductor device |
| 06/11/2008 | CN100394408C Electric voltage lower-frequency interference detection apparatus and method |