| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/01/2008 | US7395469 Method for implementing deterministic based broken scan chain diagnostics |
| 07/01/2008 | US7395468 Methods for debugging scan testing failures of integrated circuits |
| 07/01/2008 | US7395467 Remove signal from TAP selection circuitry to multiplexer control circuitry |
| 07/01/2008 | US7395197 Verification method and system for logic circuit |
| 07/01/2008 | US7395170 Methods and apparatus for data analysis |
| 07/01/2008 | US7395169 Memory test engine |
| 07/01/2008 | US7395168 Method for evaluating semiconductor device error and system for supporting the same |
| 07/01/2008 | US7394766 Multi-link extensions and bundle skew management |
| 07/01/2008 | US7394765 Method of measuring traffic volume in mobile communication system |
| 07/01/2008 | US7394764 Technique for improving transmission control protocol performance in lossy networks |
| 07/01/2008 | US7394763 Routing for networks with content filtering |
| 07/01/2008 | US7394762 Congestion control in data networks |
| 07/01/2008 | US7394757 Circuit to provide backup telephone service for a multiple service access system using a twisted pair |
| 07/01/2008 | US7394756 Secure hidden route in a data network |
| 07/01/2008 | US7394554 Selecting a hypothetical profile to use in optical metrology |
| 07/01/2008 | US7394394 Battery monitor with wireless remote communication |
| 07/01/2008 | US7394280 Method of electro migration testing |
| 07/01/2008 | US7394279 Method of measuring a surface voltage of an insulating layer |
| 07/01/2008 | US7394278 Methods and apparatus for integrated circuit loopback testing |
| 07/01/2008 | US7394277 Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method |
| 07/01/2008 | US7394276 Active cancellation matrix for process parameter measurements |
| 07/01/2008 | US7394275 Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing |
| 07/01/2008 | US7394274 On-chip frequency degradation compensation |
| 07/01/2008 | US7394273 On-chip electromigration monitoring system |
| 07/01/2008 | US7394272 Built-in self test for system in package |
| 07/01/2008 | US7394271 Temperature sensing and prediction in IC sockets |
| 07/01/2008 | US7394270 Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device |
| 07/01/2008 | US7394269 Probe for testing a device under test |
| 07/01/2008 | US7394268 Carrier for test, burn-in, and first level packaging |
| 07/01/2008 | US7394267 Compliant contact pin assembly and card system |
| 07/01/2008 | US7394266 Ultra-short low-force vertical probe test head |
| 07/01/2008 | US7394265 Flat portions of a probe card flattened to have same vertical level with one another by compensating the unevenness of a substrate and each identical height needle being mounted on the corresponding flat portion through an adhesive |
| 07/01/2008 | US7394261 Semi-conductor chip package capable of detecting open and short |
| 07/01/2008 | US7394260 Tuning a test trace configured for capacitive coupling to signal traces |
| 07/01/2008 | US7394259 Method and system for detecting and isolating stray voltage |
| 07/01/2008 | US7394241 Method and apparatus for testing power switches using a logic gate tree |
| 07/01/2008 | US7394239 Method and circuit arrangement for the self-testing of a reference voltage in electronic components |
| 07/01/2008 | US7394238 High frequency delay circuit and test apparatus |
| 07/01/2008 | US7394224 Charge control device |
| 07/01/2008 | US7394222 Power supply apparatus with function for correcting for erroneous detection |
| 07/01/2008 | US7393703 Method for reducing within chip device parameter variations |
| 07/01/2008 | US7392582 Socket and/or adapter device, and an apparatus and process for loading a socket and/or adapter device with a corresponding semi-conductor component |
| 06/29/2008 | CA2594606A1 Method and apparatus for locating faults in wired drill pipe |
| 06/28/2008 | CA2615628A1 Measurement of analog coil voltage and coil current |
| 06/28/2008 | CA2614400A1 Relay device and corresponding method |
| 06/27/2008 | CA2614426A1 Methods and systems for detecting series arcs in electrical systems |
| 06/26/2008 | WO2008077100A2 Systems and methods for creating inspection recipes |
| 06/26/2008 | WO2008076593A2 Method and apparatus to evaluate transient characteristics in an electrical power system |
| 06/26/2008 | WO2008076591A1 Reinforced contact elements |
| 06/26/2008 | WO2008076590A2 Electrical guard structures for protecting a signal trace from electrical interference |
| 06/26/2008 | WO2008075702A1 Signal measuring device, and signal measuring method |
| 06/26/2008 | WO2008075439A1 Electronic component testing equipment and method of testing electronic component |
| 06/26/2008 | WO2008075246A2 Battery low indication |
| 06/26/2008 | WO2008074952A1 Method and device for detecting the failure of an excitation circuit of a polyphase alternator |
| 06/26/2008 | WO2008074950A1 System and method for non-destructive electrical testing of an electropyrotechnic initiator by a device |
| 06/26/2008 | WO2008074864A1 Method for simulating the failure rate of an electronic equipment due to neutronic radiation |
| 06/26/2008 | WO2008051922A9 Continuous linear scanning of large flat panel media |
| 06/26/2008 | WO2008049104A3 Interface to full and reduced pin jtag devices |
| 06/26/2008 | WO2008022294A3 Multi-link rlp enhancements |
| 06/26/2008 | US20080155367 System and method for a common testing framework |
| 06/26/2008 | US20080155366 Data access method for serial bus |
| 06/26/2008 | US20080155365 Scan chain architecture for increased diagnostic capability in digital electronic devices |
| 06/26/2008 | US20080155364 Non-volatile memory device and method for operating the memory device |
| 06/26/2008 | US20080153250 Method and structures for indexing dice |
| 06/26/2008 | US20080153187 Chip-probing and bumping solutions for stacked dies having through-silicon vias |
| 06/26/2008 | US20080151988 Multi-pair gigabit ethernet transceiver |
| 06/26/2008 | US20080151762 Packet sniffer node and system including the same to assess wireless communication performance |
| 06/26/2008 | US20080151761 System and method employing wireless communications and predetermined measurement functions of wireless nodes for assessing wireless communication performance |
| 06/26/2008 | US20080151745 Active link cable mesh |
| 06/26/2008 | US20080151744 Communication system, method of providing information therein and communication device |
| 06/26/2008 | US20080150856 Liquid crystal display, connector and method of testing the liquid crystal display |
| 06/26/2008 | US20080150573 Testing Inverter Driven Electric Motor Shut-Off Path |
| 06/26/2008 | US20080150572 Magnetic test apparatus |
| 06/26/2008 | US20080150571 High density planar electrical interface |
| 06/26/2008 | US20080150570 Over clocking detector |
| 06/26/2008 | US20080150568 Contact device for touch contacting an electrical test specimen, and corresponding method |
| 06/26/2008 | US20080150567 Integrated circuit probing apparatus having a temperature-adjusting mechanism |
| 06/26/2008 | US20080150566 Alignment features in a probing device |
| 06/26/2008 | US20080150565 Methods and apparatuses for improved positioning in a probing system |
| 06/26/2008 | US20080150564 Contact device to contact an electrical test specimen to be tested and a corresponding contact process |
| 06/26/2008 | US20080150562 Inspection method, inspection apparatus and computer-readable storage medium storing program |
| 06/26/2008 | US20080150561 Device and method for testing semiconductor element, and manufacturing method thereof |
| 06/26/2008 | US20080150560 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 06/26/2008 | US20080150559 Method for probing impact sensitve and thin layered substrate |
| 06/26/2008 | US20080150557 Charged particle beam device probe operation |
| 06/26/2008 | US20080150549 Insulation deterioration detection device for motor |
| 06/26/2008 | US20080150547 Electronic load |
| 06/26/2008 | US20080150546 Continuity tester adaptors |
| 06/26/2008 | US20080150544 Multi-ended fault location system |
| 06/26/2008 | US20080150542 Battery analyzer in a battery pack and fixture |
| 06/26/2008 | US20080150541 Method and system for monitoring an electrical energy storage device |
| 06/26/2008 | US20080150540 Fuel cell evaluation method and fuel cell evaluation apparatus |
| 06/26/2008 | US20080150539 Method and Circuit Arrangement for Verifying Electrical Contacts Between a First Output Pin of a First Power Switch of a Power Switch Device and an External Node and a Second Ouput Pin of a Second Power Switch of Said Power Switch Device and Said Node |
| 06/26/2008 | US20080150517 Method and apparatus for measuring the force of stiction of a membrane in a mems device |
| 06/26/2008 | US20080150491 Method Of Estimating The State-Of-Charge And Of The Use Time Left Of A Rechageable Battery, And Apparatus For Executing Such A Method |
| 06/26/2008 | US20080149947 Bonding structure of circuit substrate and instant circuit inspection method thereof |
| 06/26/2008 | US20080149382 Method of inspecting printed wiring board and printed wiring board |
| 06/26/2008 | DE112006002404T5 Taktgenerator, Prüfvorrichtung und Takterzeugungsverfahren Clock generator and tester clock generation method |
| 06/26/2008 | DE102007057815A1 Kontaktiervorrichtung für eine Berührungskontaktierung eines elektrischen Prüflings sowie entsprechendes Verfahren Contactor for a touch contacting an electrical device under test and corresponding method |
| 06/26/2008 | DE102007010886B3 Controller for motor vehicle, has counter not reset during malfunctioning of micro-controller, so that signal for resetting micro-controller is produced at counter output, where counter output is coupled with reset input of micro-controller |