| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/01/2008 | US20080104461 ATE architecture and method for DFT oriented testing |
| 05/01/2008 | US20080103709 Battery management system and driving method thereof |
| 05/01/2008 | US20080103707 Malfunction detecting apparatus |
| 05/01/2008 | US20080103706 System and method for testing leds on a motherboard |
| 05/01/2008 | US20080101912 Deposition analysis for robot motion correction |
| 05/01/2008 | US20080101257 Apparatus, and associated method, for selecting quality of service-related information in a radio communication system |
| 05/01/2008 | US20080101237 Communication device |
| 05/01/2008 | US20080101217 Method, system, and computer program product for avoiding data loss during network port recovery processes |
| 05/01/2008 | US20080100332 System and method for detecting a motor shorting relay failure |
| 05/01/2008 | US20080100331 Liquid crystal display having discharging circuit |
| 05/01/2008 | US20080100330 Test apparatus, performance board and interface plate |
| 05/01/2008 | US20080100329 System and method for multi-up inline testing of radio frequency identification (RFID) inlays |
| 05/01/2008 | US20080100328 Method and Apparatus for Testing to Determine Minimum Operating Voltages in Electronic Devices |
| 05/01/2008 | US20080100327 Apparatuses and methods for outputting signals during self-heat burn-in modes of operation |
| 05/01/2008 | US20080100326 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes |
| 05/01/2008 | US20080100324 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/01/2008 | US20080100323 Low cost, high pin count, wafer sort automated test equipment (ate) device under test (dut) interface for testing electronic devices in high parallelism |
| 05/01/2008 | US20080100322 Portable manipulator for stackable semiconductor test system |
| 05/01/2008 | US20080100321 Methods and apparatuses for improved stabilization in a probing system |
| 05/01/2008 | US20080100320 Intelligent probe card architecture |
| 05/01/2008 | US20080100319 Intra-chip power and test signal generation for use with test structures on wafers |
| 05/01/2008 | US20080100318 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/01/2008 | US20080100317 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/01/2008 | US20080100315 Electrochemically fabricated microprobes |
| 05/01/2008 | US20080100314 Electrical test system including coaxial cables |
| 05/01/2008 | US20080100313 Charge eliminating apparatus and method, and program storage medium |
| 05/01/2008 | US20080100312 Method And Apparatus For Providing Active Compliance In A Probe Card Assembly |
| 05/01/2008 | US20080100307 Cable fault detection |
| 05/01/2008 | US20080100306 Connector |
| 05/01/2008 | US20080100305 Automated arc generator and method to repeatably generate electrical arcs for AFCI testing |
| 05/01/2008 | US20080100304 Network device, network connection detector and detection method thereof |
| 05/01/2008 | US20080100303 Circuit and method for determining potentiometer wiper resistance |
| 05/01/2008 | US20080100302 Apparatus and method for measuring and monitoring layer properties in web-based processes |
| 05/01/2008 | US20080100298 Battery management system and driving method thereof |
| 05/01/2008 | US20080100283 Methods for Measuring Capacitance |
| 05/01/2008 | US20080100265 Battery management system and driving method thereof |
| 05/01/2008 | US20080098833 Apparatus and method for evaluating a substrate mounting device |
| 04/30/2008 | EP1916534A1 Verification and generation of timing exceptions |
| 04/30/2008 | EP1916533A1 Characterization of a frequency response for a frequency translation device |
| 04/30/2008 | EP1916462A1 Electrically-operated valve diagnosing method and device therefor |
| 04/30/2008 | EP1916069A2 Cordless power tool battery charging and analyzing system |
| 04/30/2008 | EP1915632A1 Testing of an integrated circuit that contains secret information |
| 04/30/2008 | EP1915631A1 Method and device for monitoring a first voltage value |
| 04/30/2008 | EP1915630A2 Aerospace light-emitting diode (led) - based lights life and operation monitor compensator |
| 04/30/2008 | EP1864147A4 Apparatus and method for measuring the amount of the current in battery cells using a plurality of sensing resistors |
| 04/30/2008 | DE60221836T2 Verfahren und vorrichtung zur optimierten parallelen prüfung und zum zugriff auf elektronische schaltung Method and apparatus for optimizing parallel testing and access to electronic circuit |
| 04/30/2008 | DE202008001256U1 Identifizerbares Kabel Identifizerbares cable |
| 04/30/2008 | DE19959140B4 Fehlerdiagnosesystem für Kraftfahrzeuge Fault diagnosis system for motor vehicles |
| 04/30/2008 | DE112005003600T5 Halbleiter-Prüfvorrichtung Semiconductor test apparatus |
| 04/30/2008 | DE102007041226A1 Interne Zweidraht-Betriebsartenschalteranordnung Internal two-wire mode switch arrangement |
| 04/30/2008 | DE102007039728A1 Tastkopfanordnung Probe assembly |
| 04/30/2008 | DE102006050837A1 Emergency lighting system function testing method for public building, involves detecting operability of emergency lighting system if main current characteristics changes dependent on variation of electrical power of lamps |
| 04/30/2008 | DE102006050529A1 Power supply isolation and contactor monitoring circuit arrangement for electric drive of motor vehicle i.e. passenger car, has points arranged such that contactors are connected, and additional point arranged such that it is separated |
| 04/30/2008 | DE102006050175A1 Delta-Sigma-Datenkonverter-Anordnung und Verfahren zum Überprüfen eines Delta-Sigma-Datenkonverters Delta-sigma data converter arrangement and method for testing a delta-sigma data converter |
| 04/30/2008 | DE102006049791A1 Teststruktur für hochbeschleunigte Elektromigrationstests für dicke Metallisierungssysteme von Festkörperschaltkreisen Test structure for highly accelerated electromigration tests for thick metallization of solid-state circuits |
| 04/30/2008 | DE102006049628A1 Heater testing method for washing machine, involves connecting contact device of adapter with bridging contact for level of regulator before testing, and attaching robot at surface, which is electrically connected with contact device |
| 04/30/2008 | DE102006049324A1 Halbleiterkörper und Verfahren zum Testen eines Halbleiterkörpers Semiconductor body and method for testing a semiconductor body |
| 04/30/2008 | DE102006049148A1 Verfahren zum Betreiben eines elektrischen Zuheizers in einem Kraftfahrzeug Method for operating an electrical auxiliary heater in a motor vehicle |
| 04/30/2008 | DE102006049140A1 Generator current determination device for motor vehicle electrical system, has control device arranged such that generator current is determined based on generator-type-specific curve and generator current-influencing variable |
| 04/30/2008 | DE102005036288B4 Aktiver Tastkopf Active probe |
| 04/30/2008 | CN201054646Y Transreceiver for power grid cable theftproof alarm system |
| 04/30/2008 | CN201054495Y Online monitoring and over-current limit device for power transformer iron core ground current |
| 04/30/2008 | CN201054235Y A conversion interface circuit device for test |
| 04/30/2008 | CN201054177Y Power transmission line theftproof annunciator |
| 04/30/2008 | CN201054018Y Intelligent accumulator capacity test instrument |
| 04/30/2008 | CN201054017Y Transmission line fixed type remote distance computer electricity testing device |
| 04/30/2008 | CN201054016Y Fire-proof leakage current alarm |
| 04/30/2008 | CN201054015Y Surface-mounted type large power device aging test socket |
| 04/30/2008 | CN201053940Y Antistatic wrist band earthing wire bending test machine |
| 04/30/2008 | CN101171524A Memory device and method having a data bypass path to allow rapid testing and calibration |
| 04/30/2008 | CN101171523A Method for determining the condition of a long body |
| 04/30/2008 | CN101170865A Plasm suspending reference probe |
| 04/30/2008 | CN101170791A An industrial installation device for testing automatic power on and off |
| 04/30/2008 | CN101170202A Apparatus for detecting state of charge of battery |
| 04/30/2008 | CN101170073A Method of manufacturing semiconductor integrated circuit device |
| 04/30/2008 | CN101169755A Test pin free contact type CPU card test method |
| 04/30/2008 | CN101169471A Secondary cell capacity estimation method |
| 04/30/2008 | CN101169470A High voltage tandem thyristor valve half cycle wave locking overcurrent test method |
| 04/30/2008 | CN101169469A High voltage tandem thyristor valve unlocking overcurrent test method |
| 04/30/2008 | CN101169468A Board back insertion type circuit breaker characteristic detection and test device |
| 04/30/2008 | CN101169467A Method and apparatus for controlling access to and/or exit from a portion of scan chain |
| 04/30/2008 | CN101169466A On-spot programmable gate array configurable logic block validation method and system |
| 04/30/2008 | CN101169465A Iterative test generation and diagnostic method based on modeled and unmodeled faults |
| 04/30/2008 | CN101169464A Chip repairing auxiliary device |
| 04/30/2008 | CN101169463A Insulated test device for cable connector base |
| 04/30/2008 | CN101169462A Method for blind point detection for display panel composed of multiple LEDs |
| 04/30/2008 | CN101169461A Chip detecting method |
| 04/30/2008 | CN101169460A High voltage elevated transmission line remote electronic line-patrolling method |
| 04/30/2008 | CN101169459A Device for determining phase of two magnetic fields and method for checking stator winding |
| 04/30/2008 | CN101169454A Advanced sandwich sub card test general carrier plate and its production method |
| 04/30/2008 | CN101169340A Main board light-emitting diode detection device and method |
| 04/30/2008 | CN101169337A LED measuring instrument |
| 04/30/2008 | CN100385764C Earth leakage protecting method and apparatus for one line one ground type DC supply circuit |
| 04/30/2008 | CN100385639C System and method for heating semiconductor in standard test environment |
| 04/30/2008 | CN100385638C Test sample for bridging and continuous testing |
| 04/30/2008 | CN100385285C Multi-beam polygon scanning system |
| 04/30/2008 | CN100385248C Method for testing battery electrode material filling properties |
| 04/30/2008 | CN100385247C Testing circuits on substrates |
| 04/30/2008 | CN100385246C Universal open type testing clamp for circuit board |
| 04/30/2008 | CN100385245C Insulating property test machine for insulation bearing |