| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/11/2008 | CN100394395C System and method for controlling a fuel cell testing device |
| 06/11/2008 | CN100394379C Communication terminal device |
| 06/11/2008 | CN100394258C Photoelectric characteristic offset checking and adjusting method and its device |
| 06/11/2008 | CN100394208C Device and method for measuring fuel cell voltage and high frequency resistance |
| 06/11/2008 | CN100394207C Open-loop for waveform acquisition |
| 06/11/2008 | CN100394206C High-precision adjustable gap contactless trielectrode |
| 06/11/2008 | CN100394205C Method for promoting testing reliability of cable obstacle |
| 06/11/2008 | CN100394204C Method for detecting ground wire of power transmission and distribution system |
| 06/11/2008 | CN100394190C Testing device for density variable printed circuit board |
| 06/10/2008 | US7386816 Method for manufacturing an electronic device having an electronically determined physical test member |
| 06/10/2008 | US7386778 Methods for distributing programs for generating test data |
| 06/10/2008 | US7386777 Systems and methods for processing automatically generated test patterns |
| 06/10/2008 | US7386776 System for testing digital components |
| 06/10/2008 | US7386775 Scan verification for a scan-chain device under test |
| 06/10/2008 | US7386774 Memory unit with controller managing memory access through JTAG and CPU interfaces |
| 06/10/2008 | US7386773 Method and system for testing distributed logic circuitry |
| 06/10/2008 | US7386772 Test module for testing of electronic systems |
| 06/10/2008 | US7386650 Memory test circuit with data expander |
| 06/10/2008 | US7386411 Automatic hi-pot test apparatus and method |
| 06/10/2008 | US7386407 Semiconductor device test method using an evaluation LSI |
| 06/10/2008 | US7386404 Method and apparatus for monitoring battery discharge state |
| 06/10/2008 | US7386403 Method and system for charging management |
| 06/10/2008 | US7385946 Service based bearer control and traffic flow template operation with mobile IP |
| 06/10/2008 | US7385942 System for maintaining the integrity of remote data by making it disposable |
| 06/10/2008 | US7385938 Method and apparatus for adjusting a network device configuration change distribution schedule |
| 06/10/2008 | US7385934 Radio communication apparatus and transfer rate decision method |
| 06/10/2008 | US7385932 Wideband frequency domain reflectometry to determine the nature and location of subscriber line faults |
| 06/10/2008 | US7385931 Detection of network misconfigurations |
| 06/10/2008 | US7385927 Methods and structure for improved testing of embedded systems |
| 06/10/2008 | US7385924 Enhanced flow data records including traffic type data |
| 06/10/2008 | US7385920 Flow admission control for wireless systems |
| 06/10/2008 | US7385919 Local network, particularly Ethernet network having redundancy properties, and coupling device for such a network |
| 06/10/2008 | US7385686 Method and apparatus for inspecting semiconductor device |
| 06/10/2008 | US7385413 Electrical inspection method and method of fabricating semiconductor display devices |
| 06/10/2008 | US7385412 Systems and methods for testing microfeature devices |
| 06/10/2008 | US7385411 Method of designing a probe card apparatus with desired compliance characteristics |
| 06/10/2008 | US7385410 Method of and apparatus for testing for integrated circuit contact defects |
| 06/10/2008 | US7385409 System and method of mitigating effects of component deflection in a probe card analyzer |
| 06/10/2008 | US7385408 Apparatus and method for testing integrated circuit devices having contacts on multiple surfaces |
| 06/10/2008 | US7385407 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component |
| 06/10/2008 | US7385406 Automated electrical wiring inspection system |
| 06/10/2008 | US7385404 Arrangement and method for testing a capacitance array in an integrated circuit |
| 06/10/2008 | US7385403 KVM switch configured to estimate a length of a conductor |
| 06/10/2008 | US7385402 Light source current sensing circuit and driving circuit in a display device |
| 06/10/2008 | US7385393 Magnetic field measuring apparatus capable of measuring at high spatial resolution |
| 06/10/2008 | US7385386 Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober |
| 06/10/2008 | US7385385 System for testing DUT and tester for use therewith |
| 06/10/2008 | US7385384 Diagnosis method for an antenna connection |
| 06/10/2008 | US7385382 Quick reference test light probe with digital voltage meter |
| 06/10/2008 | US7385195 Semiconductor device tester |
| 06/10/2008 | US7384806 Method for characterizing defects on semiconductor wafers |
| 06/10/2008 | US7384327 Method for grinding a bar of thin film magnetic elements utilizing a plurality of resistive films |
| 06/10/2008 | US7383985 Household electric user having an electronic control, and control and programming system thereof |
| 06/05/2008 | WO2008067311A2 Compression and decompression of stimulus and response waveforms in automated test systems |
| 06/05/2008 | WO2008067243A1 Method of applying a super-absorbent composition to tissue or towel substrates |
| 06/05/2008 | WO2008067133A2 Self-test, monitoring, and diagnostics in grouped circuitry module |
| 06/05/2008 | WO2008067131A2 Passive station power distribution for cable reduction |
| 06/05/2008 | WO2008067130A2 Multi-point, multi-parameter data acquisition for multi-layer ceramic capacitor testing |
| 06/05/2008 | WO2008067129A2 Zero motion contact actuation |
| 06/05/2008 | WO2008066706A1 Test head testing electrical components |
| 06/05/2008 | WO2008066203A1 Stat-of-charge prediction program, wireless transportation system, and charging method |
| 06/05/2008 | WO2008065910A1 Accumulator failure detecting device, accumulator failure detecting method, accumulator failure detecting program, and computer-readable recording medium containing the accumulator failure detecting program |
| 06/05/2008 | WO2008065863A1 Program, recording medium, testing apparatus and diagnosing method |
| 06/05/2008 | WO2008065848A1 Engine life predication apparatus and refrigerator |
| 06/05/2008 | WO2008065516A2 Device for detecting and signalling malfunctions in the use of electrical appliances |
| 06/05/2008 | WO2008064694A1 Method for detecting the operability of an electric relay and device for performing said method |
| 06/05/2008 | WO2008064476A1 Method and apparatus for detection of resistive fault conditions |
| 06/05/2008 | WO2008044183A3 Integrated circuit with iddq test facilities and ic iddq test method |
| 06/05/2008 | US20080134115 Metastability effects simulation for a circuit description |
| 06/05/2008 | US20080134107 Computer-aided design system to automate scan synthesis at register-transfer level |
| 06/05/2008 | US20080133992 Method, apparatus and computer program product for implementing scan-chain-specific control signals as part of a scan chain |
| 06/05/2008 | US20080133990 Scan Test Data Compression Method And Decoding Apparatus For Multiple-Scan-Chain Designs |
| 06/05/2008 | US20080133989 Method And Apparatus For Scan Chain Circuit AC Test |
| 06/05/2008 | US20080133988 FPGA Programming Structure for ATPG Test Coverage |
| 06/05/2008 | US20080133987 Compressing test responses using a compactor |
| 06/05/2008 | US20080133167 Testable Electronic Circuit |
| 06/05/2008 | US20080133166 Automatic testing method to be used by an IC testing system equipped with multiple testing sites |
| 06/05/2008 | US20080133165 Test apparatus and device interface |
| 06/05/2008 | US20080133164 Using statistical signatures for testing high-speed circuits |
| 06/05/2008 | US20080133159 Instrument check system |
| 06/05/2008 | US20080133157 Nickel-hydride battery life determining method and life determining apparatus |
| 06/05/2008 | US20080133156 Integrated non-destructive method and device for electrochemical energy system diagnostics |
| 06/05/2008 | US20080133154 System and Method for Detecting Non-Cathode Arcing in a Plasma Generation Apparatus |
| 06/05/2008 | US20080133153 Self test, monitoring, and diagnostics in grouped circuitry modules |
| 06/05/2008 | US20080131980 Method of adjusting buried resistor resistance |
| 06/05/2008 | US20080130489 Rerouting for double-link failure recovery in an internet protocol network |
| 06/05/2008 | US20080130454 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method |
| 06/05/2008 | US20080130453 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method |
| 06/05/2008 | US20080130388 Semiconductor device having a system in package structure and method of testing the same |
| 06/05/2008 | US20080130179 Method And Device For Fault Detection In Transformers Or Power Lines |
| 06/05/2008 | US20080129549 System and method for encoder failure detection |
| 06/05/2008 | US20080129529 User interface for electronic devices |
| 06/05/2008 | US20080129327 Liquid crystal display device and testing method thereof |
| 06/05/2008 | US20080129326 Characterization array circuit |
| 06/05/2008 | US20080129325 On-chip detection of power supply vulnerabilities |
| 06/05/2008 | US20080129324 Hot Switchable Voltage Bus for Iddq Current Measurements |
| 06/05/2008 | US20080129322 Soak profiling |
| 06/05/2008 | US20080129321 Relay connector |
| 06/05/2008 | US20080129320 High density integrated circuit apparatus, test probe and methods of use thereof |
| 06/05/2008 | US20080129319 High density integrated circuit apparatus, test probe and methods of use thereof |