| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/30/2008 | CN100385244C PWM current measuring method |
| 04/30/2008 | CN100385212C Optical signal collecting and on-line monitoring method for electric power equipment internal failure |
| 04/30/2008 | CN100384551C Optical coupling screening device |
| 04/29/2008 | US7366967 Methods of testing semiconductor memory devices in a variable CAS latency environment and related semiconductor test devices |
| 04/29/2008 | US7366965 Semiconductor integrated circuit |
| 04/29/2008 | US7366964 Method, system, and apparatus for loopback entry and exit |
| 04/29/2008 | US7366954 Data transfer device and abnormal transfer state detecting method |
| 04/29/2008 | US7366947 High reliability memory module with a fault tolerant address and command bus |
| 04/29/2008 | US7366937 Fast synchronization of a number of digital clocks |
| 04/29/2008 | US7366651 Co-simulation interface |
| 04/29/2008 | US7366106 Radio communication terminal and communication method |
| 04/29/2008 | US7366104 Network monitoring and disaster detection |
| 04/29/2008 | US7366102 Fault isolation system and method |
| 04/29/2008 | US7366100 Method and apparatus for multipath processing |
| 04/29/2008 | US7366099 Method and apparatus for synchronizing a data communications network |
| 04/29/2008 | US7366091 Method and apparatus for changing parallel clock signals in a digital data transmission |
| 04/29/2008 | US7365837 Vision inspection apparatus using a full reflection mirror |
| 04/29/2008 | US7365611 Element substrate, test method for element substrate, and manufacturing method for semiconductor device |
| 04/29/2008 | US7365574 General purpose delay logic |
| 04/29/2008 | US7365562 Display device and method of testing sensing unit thereof |
| 04/29/2008 | US7365561 Test probe and tester, method for manufacturing the test probe |
| 04/29/2008 | US7365560 Apparatus and method for testing liquid crystal display panel |
| 04/29/2008 | US7365559 Current sensing for power MOSFETs |
| 04/29/2008 | US7365558 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays |
| 04/29/2008 | US7365557 Integrated circuit testing module including data generator |
| 04/29/2008 | US7365556 Semiconductor device testing |
| 04/29/2008 | US7365555 Semiconductor device, method for testing the same and IC card |
| 04/29/2008 | US7365554 Integrated circuit for determining a voltage |
| 04/29/2008 | US7365553 Probe card assembly |
| 04/29/2008 | US7365552 Surface mount package fault detection apparatus |
| 04/29/2008 | US7365551 Excess overdrive detector for probe cards |
| 04/29/2008 | US7365550 Low impedance test fixture for impedance measurements |
| 04/29/2008 | US7365547 Circuit arrangement for a corrosion protection current feed and for a line test for two-wire lines |
| 04/29/2008 | US7365546 Apparatus and method for non-destructive testing of primers, in particular for airbags in motor vehicles |
| 04/29/2008 | US7365529 Test structure design for reliability test |
| 04/29/2008 | US7365517 Calculating remaining battery capacity based on battery-side end voltage and device-side end voltage |
| 04/29/2008 | US7365368 Surface-emitting type wafer and method for manufacturing the same, and burn-in method for surface-emitting type wafers |
| 04/29/2008 | US7364095 Apparatus for judging target to be temperature-regulated |
| 04/29/2008 | US7364078 Bar code reading method and apparatus for a battery tester charger |
| 04/29/2008 | US7363694 Method of testing using compliant contact structures, contactor cards and test system |
| 04/27/2008 | CA2608229A1 Cordless power tool battery charging and analyzing system |
| 04/24/2008 | WO2008048706A2 Dynamic burn-in systems and apparatuses |
| 04/24/2008 | WO2008048663A2 Novel process for devitalized/acellular tissue for transplantation |
| 04/24/2008 | WO2008048326A1 A self-contained apparatus for inspection of electric conductors |
| 04/24/2008 | WO2008047837A1 Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage |
| 04/24/2008 | WO2008047685A1 Jitter applying device, jitter applying method, test equipment, and communication chip |
| 04/24/2008 | WO2008046904A1 Semi-conductor body and method for testing a semi-conductor body |
| 04/24/2008 | WO2008046869A1 Power supply device for charging a removable equipment, in particular for charging the battery of an automotive vehicle |
| 04/24/2008 | WO2007148268A3 Semiconductor device with test structure and semiconductor device test method |
| 04/24/2008 | WO2007145730A3 Calibration structures for differential signal probing |
| 04/24/2008 | WO2007098332A8 Electrical interconnect interface and wire harness test and test development system and method |
| 04/24/2008 | WO2007098167A3 Multi-stage test response compactors |
| 04/24/2008 | WO2007065111A3 Battery powered intelligent variable power supply/battery charger |
| 04/24/2008 | US20080098272 Networked test system |
| 04/24/2008 | US20080098270 Method For Determining Time to Failure of Submicron Metal Interconnects |
| 04/24/2008 | US20080098269 Mechanism for concurrent testing of multiple embedded arrays |
| 04/24/2008 | US20080098268 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection |
| 04/24/2008 | US20080098267 Semiconductor IC and testing method thereof |
| 04/24/2008 | US20080098253 Method of timing calibration using slower data rate pattern |
| 04/24/2008 | US20080097717 Data generating method, connection checking system, and computer product |
| 04/24/2008 | US20080097706 Method of Monitoring Line Faults in a Medium Voltage Network |
| 04/24/2008 | US20080096292 Method for measuring interface traps in thin gate oxide MOSFETs |
| 04/24/2008 | US20080095067 APPLICATION MANAGEMENT OBJECTS AND WiMax MANAGEMENT OBJECTS FOR MOBILE DEVICE MANAGEMENT |
| 04/24/2008 | US20080095046 Apparatus and method for detecting a communication abnormality in a multi-type air conditioner |
| 04/24/2008 | US20080095045 Method and Apparatus for Detecting MPLS Network Failures |
| 04/24/2008 | US20080094098 Device under test power supply |
| 04/24/2008 | US20080094097 Method of Testing a Power Supply Controller and Structure Therefor |
| 04/24/2008 | US20080094096 Semiconductor testing equipment and semiconductor testing method |
| 04/24/2008 | US20080094094 Apparatus for testing a semiconductor device |
| 04/24/2008 | US20080094093 Universal array type probe card design for semiconductor device testing |
| 04/24/2008 | US20080094092 Mechanism For Detection And Compensation Of NBTI Induced Threshold Degradation |
| 04/24/2008 | US20080094091 Dynamic Burn-in Systems and Apparatuses |
| 04/24/2008 | US20080094088 Method and System for Compensating Thermally Induced Motion of Probe Cards |
| 04/24/2008 | US20080094087 Device for detecting chip location and method of detecting chip location using the device |
| 04/24/2008 | US20080094086 Stack-type semiconductor package sockets and stack-type semiconductor package test systems |
| 04/24/2008 | US20080094085 Metalized Elastomeric Probe Structure |
| 04/24/2008 | US20080094084 Multi-layer electric probe and fabricating method thereof |
| 04/24/2008 | US20080094083 Versatile materials probe |
| 04/24/2008 | US20080094082 Die Infrared Transceiver Bus |
| 04/24/2008 | US20080094081 Continuous linear scanning of large flat panel media |
| 04/24/2008 | US20080094071 Semiconductor device and test system which output fuse cut information sequentially |
| 04/24/2008 | US20080094069 Method and apparatus for monitoring the condition of a battery by measuring its internal resistance |
| 04/24/2008 | US20080094068 Kelvin Connector Including Temperature Sensor |
| 04/24/2008 | US20080094035 Method for calculating power capability of battery packs using advanced cell model predictive techniques |
| 04/24/2008 | US20080094030 Light-weight package for lithium battery |
| 04/24/2008 | US20080094022 Insulation-resistance degradation detecting device for motors |
| 04/24/2008 | US20080093851 Method and apparatus for controlling charging operations for battery |
| 04/24/2008 | US20080093597 Semiconductor device |
| 04/24/2008 | DE102007048620A1 System und Verfahren zur Überwachung einer Hochspannungsenergiespeicherverbindung System and method for monitoring a high-voltage energy storage compound |
| 04/24/2008 | DE102006061601A1 Transition contacts burn up determining method for electrical on-load tap changer of step transformer, involves computing actual burn-up of transition contacts depending on current flowing over transition contacts |
| 04/24/2008 | DE102006049471A1 Noise field estimating method for material coil of e.g. behind-the-Ear hearing aid, involves measuring field parameter, and computing individual weights based on comparison between measured field parameter and entire noise field parameter |
| 04/24/2008 | DE102006044530A1 Vorrichtung und Verfahren zur Strommessung bzw. Stromverstärkung Apparatus and method for power measurement or current gain |
| 04/24/2008 | DE102006026825B4 Gehäuse für aktiven Tastkopf im T-Profil Housing for active probe in the T-profile |
| 04/24/2008 | DE102004037718B4 Verfahren zur Detektion von Fehlstellen auf elektrisch leitenden oder dielektrischen Ebenen und Testeinrichtung hierzu A method for detecting defects on electrically conductive or dielectric layers and testing device for this purpose |
| 04/23/2008 | EP1914861A2 Battery management system and driving method thereof |
| 04/23/2008 | EP1914858A2 Non-contact electricity feeding facility |
| 04/23/2008 | EP1914787A1 Detection device and inspection device |
| 04/23/2008 | EP1914559A2 Battery management system (BMS) and driving method thereof |
| 04/23/2008 | EP1914558A2 Method to test transparent - to - test capacitors |
| 04/23/2008 | EP1914557A2 Insulation-resistance degradation detecting device for motors |