| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/13/2008 | US7372250 Methods and apparatus for determining a position of a substrate relative to a support stage |
| 05/13/2008 | US7372249 Load measurement for a thermal microwave power sensor |
| 05/13/2008 | US7372248 Electronic circuit, system with an electronic circuit and method for testing an electronic circuit |
| 05/13/2008 | US7371689 Backside unlayering of MOSFET devices for electrical and physical characterization |
| 05/13/2008 | US7371078 Insert attachable to an insert magazine of a tray for holding an area array type electronic component to be tested |
| 05/08/2008 | WO2008054186A1 Test handler for semiconductor device |
| 05/08/2008 | WO2008054084A1 Test tray for test handler |
| 05/08/2008 | WO2008054048A1 Circuit for measuring battery voltage and method for battery voltage measurement using the same |
| 05/08/2008 | WO2008053526A1 Apparatus and method for testing connection of printed board |
| 05/08/2008 | WO2008053518A1 Semiconductor inspection equipment and semiconductor inspection method |
| 05/08/2008 | WO2008053512A1 Semiconductor inspecting apparatus |
| 05/08/2008 | WO2008053032A1 Method for measuring the sheet resistance of at least two-layered electronic components via isolation trenches |
| 05/08/2008 | WO2008052783A1 Method for determining the charge acceptance of a storage battery |
| 05/08/2008 | WO2008052648A1 Device and method for detecting electrical properties of a sample composed of an excitable material |
| 05/08/2008 | WO2008052237A1 Methods and systems of producing self-consistently a calibration constant for excess charge carrier lifetime |
| 05/08/2008 | WO2008035004A3 Device for measurting the parameters of an electric power source comprising a clock |
| 05/08/2008 | WO2008034962A3 Method and device for characterising an electric signal propagating through a sample |
| 05/08/2008 | WO2008027969A3 Multi-threshold reset circuit |
| 05/08/2008 | WO2008027710A3 Systems and methods for detecting capacitor process variation |
| 05/08/2008 | WO2008022251A3 Multiple probe acquisition system |
| 05/08/2008 | WO2008014129A3 Test circuit, system, and method for testing one or more circuit components arranged upon a common printed circuit board |
| 05/08/2008 | WO2007133467A3 Air bridge structures and methods of making and using air bridge structures |
| 05/08/2008 | US20080109691 Method and Apparatus for Executing a BIST Routine |
| 05/08/2008 | US20080107149 Method for monitoring stress-induced degradation of conductive interconnects |
| 05/08/2008 | US20080107018 Method and apparatus for computing alternate multicast/broadcast paths in a routed network |
| 05/08/2008 | US20080106959 Semiconductor memory device having advanced test mode |
| 05/08/2008 | US20080106833 Methods and apparatus to facilitate ground fault protection and self test with a single switch |
| 05/08/2008 | US20080106830 AC melt to bushing current detector |
| 05/08/2008 | US20080106296 Test system of multi-chip package with improved signal integrity by restraining reflection wave |
| 05/08/2008 | US20080106295 System and method for measuring negative bias thermal instability with a ring oscillator |
| 05/08/2008 | US20080106294 Apparatus and method for universal connectivity in test applications |
| 05/08/2008 | US20080106293 Drive Method And Drive Circuit Of Peltier Element, Attaching Structure Of Peltier Module And Electronic Device Handling Apparatus |
| 05/08/2008 | US20080106292 Probe card having cantilever probes |
| 05/08/2008 | US20080106291 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106290 Wafer probe station having environment control enclosure |
| 05/08/2008 | US20080106288 Circuit boards including removable test point portions and configurable testing platforms |
| 05/08/2008 | US20080106287 Scan testing system, method and apparatus |
| 05/08/2008 | US20080106286 Routing engine, method of routing a test probe and testing system employing the same |
| 05/08/2008 | US20080106285 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106284 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106283 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106281 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/08/2008 | US20080106279 Probe card layout |
| 05/08/2008 | US20080106278 Method and system for centrally-controlled semiconductor wafer correlation |
| 05/08/2008 | US20080106277 Chip-based prober for high frequency measurements and methods of measuring |
| 05/08/2008 | US20080106269 Methods and apparatus to facilitate ground fault detection with a single coil and an oscillator |
| 05/08/2008 | US20080106268 Methods and apparatus to facilitate ground fault detection with a single coil |
| 05/08/2008 | US20080106267 Battery maintenance tool with probe light |
| 05/08/2008 | US20080106266 Series terminal, test plug and test terminal block |
| 05/08/2008 | US20080105964 Substrate, semiconductor device using the same, method for inspecting semiconductor device, and method for manufacturing semiconductor device |
| 05/08/2008 | US20080105869 Printed circuit board for mounting semiconductor device package, and method of testing and fabricating semiconductor device package using the same |
| 05/08/2008 | DE19882929B4 Temperaturkontrollsystem für eine Werkstückhalterung Temperature control system for a workpiece holder |
| 05/08/2008 | DE112006001477T5 Testsondenkarte Probe card |
| 05/08/2008 | DE10300535B4 Testsystem für integrierte Schaltkreischips Test system for integrated circuit chips |
| 05/08/2008 | DE10255665B4 Schaltung und Verfahren zur Bestimmung wenigstens eines Spannungs-, Strom- und/oder Leistungswerts einer integrierten Schaltung Circuit and method for determining at least one of voltage, current and / or power value of an integrated circuit |
| 05/08/2008 | DE102007049805A1 Markieren asymmetrischer Kabel zum Zweck einer verbesserten Netzwerktaktsynchronisation Mark unbalanced cables for the purpose of improved network clock synchronization |
| 05/08/2008 | DE102007048312A1 Testgerät für Halbleiterbauteile Test device for semiconductor devices |
| 05/08/2008 | DE102006052176A1 Verfahren zum Ermitteln der Ladungsaufnahme einer Speicherbatterie Method for determining the charge acceptance of a storage battery |
| 05/08/2008 | DE102006052112A1 Elektrische Kontaktanordnung The electrical contact assembly |
| 05/08/2008 | DE102006051942A1 Verfahren zur Messung des Schichtwiderstandes von mindestens zweischichtigen elektronischen Bauelementen über Trenngräben A method for measuring the sheet resistance of at least two-layer electronic components by means of isolating trenches |
| 05/08/2008 | DE102006051577A1 Vorrichtung und Verfahren zur Erfassung elektrischer Eigenschaften einer Probe aus einem anregbaren Material Apparatus and method for detecting electrical properties of a sample from a stimulable material |
| 05/08/2008 | DE102006051135A1 Connection quality test method, involves comparing reflected signals, which are produced in reaction to test signal or generated signals, with two threshold values, where one value differs from other value |
| 05/08/2008 | DE102006050573A1 Electrical safety device for e.g. lighting unit of motor vehicle, has terminal clamp with separate parts, which are connected with electrical resistor unit, and electronic unit provided for determining battery state variables |
| 05/08/2008 | CA2666637A1 Automated arc generator and method to repeatably generate electrical arcs for afci testing |
| 05/07/2008 | EP1919060A2 Battery management system and driving method thereof |
| 05/07/2008 | EP1919059A2 Battery management system and driving method thereof |
| 05/07/2008 | EP1919044A2 Method of manufacturing semiconductor lasers for communication, semiconductor lasers for communication and optical transmission modules |
| 05/07/2008 | EP1919034A1 Anisotropic conductive sheet, production method thereof, connection method and inspection method |
| 05/07/2008 | EP1918729A1 Lithium-ion battery prognostic testing and process |
| 05/07/2008 | EP1918727A1 Method for monitoring a photovoltaic generator |
| 05/07/2008 | EP1918726A2 Method of Analyzing Electrical Connection and Test System |
| 05/07/2008 | EP1918725A1 Voltage monitor and electrical storage device using the same |
| 05/07/2008 | EP1917536A1 System and method for estimating a state vector associated with a battery |
| 05/07/2008 | EP1917535A2 Testing of an integrated circuit that contains secret information |
| 05/07/2008 | EP1917534A2 Vertical probe card and air cooled probe head system |
| 05/07/2008 | EP1754075B8 Test method and test device for testing an integrated circuit |
| 05/07/2008 | EP1706752B1 Jtag test architecture for multi-chip pack |
| 05/07/2008 | EP1671142B1 Device and method for measuring individual cell voltages in a cell stack of an energy accumulator |
| 05/07/2008 | EP1670108B1 Arc monitoring system |
| 05/07/2008 | EP1604216A4 Method and system for emulating a fibre channel link over a sonet/sdh path |
| 05/07/2008 | EP1574866B1 Inspection method and inspection equipment |
| 05/07/2008 | EP1466185B1 High speed and high accuracy dut power supply with boost circuitry |
| 05/07/2008 | EP1461722A4 Multi-feature classification memory structure for associative matching |
| 05/07/2008 | EP1455388B1 System and method for reliability evaluation |
| 05/07/2008 | EP1250730B1 An rf antenna detector circuit |
| 05/07/2008 | EP1018027B1 Method for the location of a high-resistance earth fault in a power distribution system on the basis of current measurements |
| 05/07/2008 | CN201057537Y Connection point over-temperature monitor of electric transmission line |
| 05/07/2008 | CN201057536Y X-ray testing apparatus used for electric assembly fault detection |
| 05/07/2008 | CN201057535Y Intelligent electric power experiment load system |
| 05/07/2008 | CN101176071A Microcomputer and method for testing the same |
| 05/07/2008 | CN101176065A Integrated acceptance testing |
| 05/07/2008 | CN101176010A Apparatus and method for managing battery performance of a wireless device |
| 05/07/2008 | CN101176009A Self-test circuitry to determine minimum operating voltage |
| 05/07/2008 | CN101176008A Resilient probes for electrical testing |
| 05/07/2008 | CN101176007A Electronic component test device |
| 05/07/2008 | CN101176006A Tft substrate inspecting apparatus |
| 05/07/2008 | CN101175372A Circuit board with hidden element and method for measuring the same |
| 05/07/2008 | CN101174746A Creepage protecting socket with life end checking function |
| 05/07/2008 | CN101174712A Hybrid battery and full charge capacity calculation method |
| 05/07/2008 | CN101174711A 电池管理系统及其驱动方法 Battery management system and driving method |