| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/08/2008 | US7356746 Embedded testing circuit for testing a dual port memory |
| 04/08/2008 | US7356745 IC with parallel scan paths and compare circuitry |
| 04/08/2008 | US7356742 Method and apparatus for testing a memory device in quasi-operating conditions |
| 04/08/2008 | US7356741 Modular test controller with BIST circuit for testing embedded DRAM circuits |
| 04/08/2008 | US7356739 System and program for controlling a distributed processing system |
| 04/08/2008 | US7356435 Semiconductor test apparatus and control method therefor |
| 04/08/2008 | US7356430 Methods and apparatus for data analysis |
| 04/08/2008 | US7356109 Apparatus for and method of measuring clock skew |
| 04/08/2008 | US7356034 Terminal device, method for processing communication data inside the terminal device, and program for implementing the method |
| 04/08/2008 | US7355987 Multi-rate, multi-port, gigabit SERDES transceiver |
| 04/08/2008 | US7355983 Technique for graceful shutdown of a routing protocol in a network |
| 04/08/2008 | US7355981 Signature matching methods and apparatus for performing network diagnostics |
| 04/08/2008 | US7355978 Method for implementing an OAM function by exchanging request-reply packets between stations of a RPR network, and corresponding packet frames |
| 04/08/2008 | US7355967 Transmission device |
| 04/08/2008 | US7355966 Method and system for minimizing disruption in common-access networks |
| 04/08/2008 | US7355965 Apparatus and method for rapid detection of unidirectional breaks in a network ring |
| 04/08/2008 | US7355537 Built-in self-test apparatus and method for digital-to-analog converter |
| 04/08/2008 | US7355467 Physical layers |
| 04/08/2008 | US7355436 Method for error detection in a drive mechanism |
| 04/08/2008 | US7355435 On-chip detection of power supply vulnerabilities |
| 04/08/2008 | US7355434 Lighting inspection device for plasma display panel and display panel producing method |
| 04/08/2008 | US7355433 Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests |
| 04/08/2008 | US7355432 Buffer circuit, driver circuit, and semiconductor testing apparatus |
| 04/08/2008 | US7355431 Test arrangement including anisotropic conductive film for testing power module |
| 04/08/2008 | US7355430 Parallel scan distributors and collectors and process of testing integrated circuits |
| 04/08/2008 | US7355429 On-chip power supply noise detector |
| 04/08/2008 | US7355428 Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing |
| 04/08/2008 | US7355427 Clamping top plate using magnetic force |
| 04/08/2008 | US7355426 Universal measuring adapter system |
| 04/08/2008 | US7355425 Probe card clamp mechanism and probe apparatus |
| 04/08/2008 | US7355424 Test probe for finger tester and corresponding finger tester |
| 04/08/2008 | US7355423 Method for optimizing probe card design |
| 04/08/2008 | US7355422 Optically enhanced probe alignment |
| 04/08/2008 | US7355421 Semiconductor apparatus testing arrangement and semiconductor apparatus testing method |
| 04/08/2008 | US7355420 Membrane probing system |
| 04/08/2008 | US7355419 Enhanced signal observability for circuit analysis |
| 04/08/2008 | US7355418 Configurable prober for TFT LCD array test |
| 04/08/2008 | US7355417 Techniques for obtaining electromagnetic data from a circuit board |
| 04/08/2008 | US7355412 Remote fault monitoring system |
| 04/08/2008 | US7355411 Method and apparatus for estimating state of charge of secondary battery |
| 04/08/2008 | US7355387 System and method for testing integrated circuit timing margins |
| 04/08/2008 | US7355386 Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester |
| 04/08/2008 | US7355385 Voltage injector and detector using pixel array for printed circuit board testing |
| 04/08/2008 | US7355384 Apparatus, method, and computer program product for monitoring and controlling a microcomputer using a single existing pin |
| 04/08/2008 | US7355377 Telescoping electrical tester |
| 04/08/2008 | US7355266 Semiconductor wafer test system |
| 04/08/2008 | US7354779 Topography compensated film application methods |
| 04/08/2008 | US7354668 Operation state determining apparatus and method for fuel cell |
| 04/08/2008 | US7354524 Method and system for processing multi-layer films |
| 04/08/2008 | CA2317583C System for removing spurious signatures in motor current signature analysis |
| 04/03/2008 | WO2008039918A2 Methods and apparatus for hybrid outlier detection |
| 04/03/2008 | WO2008039881A2 Single support structure probe group with staggered mounting pattern |
| 04/03/2008 | WO2008039337A1 Method and system for standing wave detection for radio frequency identification marker readers |
| 04/03/2008 | WO2008039131A1 Method and device for monitoring a system |
| 04/03/2008 | WO2008038594A1 Delay circuit, jigger-apllied circuit, and tester |
| 04/03/2008 | WO2008038546A1 Semiconductor inspecting apparatus and semiconductor integrated circuit |
| 04/03/2008 | WO2008038468A1 Electrical connecting device |
| 04/03/2008 | WO2008037510A1 Method and circuit arrangement for detecting the state of a load device which can be connected to a switching connection |
| 04/03/2008 | WO2008037232A1 Performance and monitoring of a safety test for a device having an integrated overload function |
| 04/03/2008 | WO2008037166A1 A method and system for acquiring an ac voltage |
| 04/03/2008 | WO2007134597A3 Method and device for determining the electrical loadability of overhead lines by means of temperature measurement |
| 04/03/2008 | US20080082889 Semiconductor test system |
| 04/03/2008 | US20080082888 Measurement and calibration method for embedded diagnostic systems |
| 04/03/2008 | US20080082887 System and Method for Modifying a Test Pattern to Control Power Supply Noise |
| 04/03/2008 | US20080082886 Sub-instruction repeats for algorithmic pattern generators |
| 04/03/2008 | US20080082885 Test circuit for testing command signal at package level in semiconductor device |
| 04/03/2008 | US20080082884 Test control circuit |
| 04/03/2008 | US20080082883 System for and method of performing high speed memory diagnostics via built-in-self-test |
| 04/03/2008 | US20080082882 Double-edge triggered scannable pulsed flip-flop for high frequency and/or low power applications |
| 04/03/2008 | US20080082881 In situ processor margin testing |
| 04/03/2008 | US20080082880 Method of testing high-speed ic with low-speed ic tester |
| 04/03/2008 | US20080082879 JTAG boundary scan compliant testing architecture with full and partial disable |
| 04/03/2008 | US20080082878 System and Method to Support Use of Bus Spare Wires in Connection Modules |
| 04/03/2008 | US20080082877 Integrated testing system for wireless and high frequency products and a testing method thereof |
| 04/03/2008 | US20080082876 Power gating in integrated circuits for leakage reduction |
| 04/03/2008 | US20080082875 Secure, Stable On Chip Silicon Identification |
| 04/03/2008 | US20080082274 Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor |
| 04/03/2008 | US20080080369 Relay apparatus, relay method, and relay program |
| 04/03/2008 | US20080080365 Wireless Access Point Failover System and Method |
| 04/03/2008 | US20080080277 Method and system of analyzing failure in semiconductor integrated circuit device |
| 04/03/2008 | US20080079456 Test handler for testing semiconductor device and method of testing semiconductor device using the same |
| 04/03/2008 | US20080079455 IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package |
| 04/03/2008 | US20080079454 Apparatus for testing integrated circuit |
| 04/03/2008 | US20080079453 Manufacture Method Of Vertical-Type Electric Contactor Vertical-Type Electric Contactor Thereof |
| 04/03/2008 | US20080079452 Probe card |
| 04/03/2008 | US20080079451 Apparatus for testing electronic devices |
| 04/03/2008 | US20080079450 Intelligent probe chips/heads |
| 04/03/2008 | US20080079449 Method and apparatus for indirect planarization |
| 04/03/2008 | US20080079448 Enhanced signal observability for circuit analysis |
| 04/03/2008 | US20080079447 Semiconductor device test method and semiconductor device tester |
| 04/03/2008 | US20080079440 Inverter circuit and backlight assembly having the same |
| 04/03/2008 | US20080079439 Development environment and basic tenets for enabling robust embedded diagnostics in RF systems |
| 04/03/2008 | US20080079438 Storage device, and writing unit diagnosing method |
| 04/03/2008 | US20080079437 Current Sensing Module and Assembly Method Thereof |
| 04/03/2008 | US20080079436 System and method for monitoring a motor control center |
| 04/03/2008 | US20080079424 Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor |
| 04/03/2008 | DE202008001113U1 Vorrichtung zur Auf- und/oder Entladung eines elektrischen Energiespeichers Device for lifting and / or discharge of an electric energy storage |
| 04/03/2008 | DE102007044207A1 Schnittstellenvorrichtung für Prüfvorrichtung für elektronische Bauelemente An interface device for electronic device testing apparatus |
| 04/03/2008 | DE102007023689A1 Motorsteuerung Motor control |
| 04/03/2008 | DE102006045319A1 Verfahren und Anordnung zur Detektion einer Spule Method and apparatus for detecting a coil |