Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2008
04/16/2008CN201047869Y Electric vehicle creepage testing apparatus
04/16/2008CN201047868Y Air purifier filter screen obstruction and fan fault detection circuit
04/16/2008CN201047867Y IC test carrier non-soldering package assembly
04/16/2008CN201047866Y Automatically emergent oil supply system for oil-filled cable in power system
04/16/2008CN201047865Y Transformer station grounding network online monitoring device
04/16/2008CN201047864Y Duplex horizontal insulator string live-wire detecting automatically walking device
04/16/2008CN201047863Y GPS clock signal based high voltage capacity equipment insulation online monitoring system
04/16/2008CN201047862Y Electrical pulse derivational tester for resistor reversible change performance
04/16/2008CN101163980A Lithium sulfur rechargeable battery fuel gauge systems and methods
04/16/2008CN101163979A Test prepared integrated circuit with an internal power supply domain
04/16/2008CN101163978A Testable electronic circuit
04/16/2008CN101163977A Integrated circuit testing module
04/16/2008CN101163976A Brown out detection circuit and method
04/16/2008CN101163975A Data rate shifting methods and techniques
04/16/2008CN101163364A Monitoring system and method for monitoring operation of electric element using the system
04/16/2008CN101162838A Low current neutral grounding system fault route selecting method by wavelet package decompose and correlation analysis
04/16/2008CN101162794A Battery electric quantity colour development machine
04/16/2008CN101162792A Battery management system and driving method thereof
04/16/2008CN101162694A Chemical passivation method for measuring minority carrier lifetime of crystalline silicon
04/16/2008CN101162543A Perimeter defencealarm
04/16/2008CN101162261A Numerical control system electric power anti-jamming status on-line testing apparatus and method
04/16/2008CN101162260A Function testing device and method for small electric quantity extra battery
04/16/2008CN101162259A Function testing device and method for small electric quantity extra battery
04/16/2008CN101162258A Semiconductor integrated circuit and control method thereof
04/16/2008CN101162257A Electric wire and cable electric voltage test methods and experiment machine
04/16/2008CN101162256A Method to determine the polarity of bushing TA without disintegration for main transformer
04/16/2008CN101162255A Method for testing CT yarn cutting through estimating out-of-balance current variation
04/16/2008CN101162254A CPU slot testing device
04/16/2008CN101162253A PDP substrates medium layer characteristic test device
04/16/2008CN101162252A High voltage DC transmission converter valve three injection test methods
04/16/2008CN101162251A High voltage DC transmission converter valve double injection test methods
04/16/2008CN101162250A High voltage DC transmission converter valve maximum transient test methods
04/16/2008CN101162249A Digital quantity input module having multi state checking function
04/16/2008CN101162248A Press keys and touch screen testing device
04/16/2008CN101162247A Sub-health running status recognition method of electrical device
04/16/2008CN101162246A Crosslinking polyethylene-insulated cable insulation diagnostic apparatus
04/16/2008CN101162240A Detecting probe card testing system
04/16/2008CN101162239A Detecting probe card
04/16/2008CN101162169A Simulated electronic scale detecting analyzer
04/16/2008CN100382532C Circuit for detecting ground offset of parts of a network
04/16/2008CN100382270C Short detection circuit and short detection method
04/16/2008CN100381972C Power management method for an electronic apparatus
04/16/2008CN100381834C Method and apparatus for secure scan testing
04/16/2008CN100381833C Method and device for testing bridge circuit
04/16/2008CN100381832C Time resolved non-invasive diagnostics system
04/16/2008CN100381831C Thyristor core parameter testing mould
04/16/2008CN100381830C Method for checking out phase handling unit (PHU) in site
04/16/2008CN100381829C Electromagnetic detector for electromagnetic compatible diagnostic test in vehicle
04/16/2008CN100381828C Electric arc detecting equipment and method
04/16/2008CN100381826C Method for measuring power cable equipment live or not
04/16/2008CN100381319C Positioning device for fault of railway automatic blocking and continuous transmission line
04/15/2008US7360184 Method and apparatus for scenario search based random generation of functional test suites
04/15/2008US7360139 Semiconductor component, arrangement and method for characterizing a tester for semiconductor components
04/15/2008US7360137 Flash programmer for programming NAND flash and NOR/NAND combined flash
04/15/2008US7360136 Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data
04/15/2008US7360135 Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance
04/15/2008US7360134 Centralized BIST engine for testing on-chip memory structures
04/15/2008US7360133 Method for creating a JTAG tap controller in a slice for use during custom instance creation to avoid the need of a boundary scan synthesis tool
04/15/2008US7360129 Simultaneous switch test mode
04/15/2008US7360128 Method of testing memory device
04/15/2008US7360127 Method and apparatus for evaluating and optimizing a signaling system
04/15/2008US7360116 Built-in self test circuit
04/15/2008US7360111 Lossless recovery for computer systems with remotely dependent data recovery
04/15/2008US7359822 Testing device
04/15/2008US7359808 Fuel cell evaluation method and fuel cell evaluation apparatus
04/15/2008US7359546 Defect inspection apparatus and defect inspection method
04/15/2008US7359410 Apparatus and method for increasing optical density of SONET multiplexer using integral components
04/15/2008US7359330 Fault location on a telecommunications network
04/15/2008US7359329 Device for detecting failure of communication network
04/15/2008US7359323 Bi-directional ring network having minimum spare bandwidth allocation and corresponding connection admission controls
04/15/2008US7359321 Systems and methods for selectively performing explicit congestion notification
04/15/2008US7359320 Method for supporting quality of service features in heterogeneous communications networks
04/15/2008US7359315 Method, system, and computer program product for avoiding data loss during network port recovery processes
04/15/2008US7359177 Dual bias frequency plasma reactor with feedback control of E.S.C. voltage using wafer voltage measurement at the bias supply output
04/15/2008US7358953 Semiconductor device and testing method of semiconductor device
04/15/2008US7358786 Control signal generator, latch circuit, flip flop and method for controlling operations of the flip-flop
04/15/2008US7358757 Display apparatus and inspection method
04/15/2008US7358756 Method and apparatus for testing liquid crystal display device
04/15/2008US7358755 Ring oscillator system
04/15/2008US7358754 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment
04/15/2008US7358753 Probing apparatus, probing circuit board and probing system for high-voltage matrix probing
04/15/2008US7358752 Signal launch for high speed differential signals
04/15/2008US7358751 Contact pin assembly and contactor card
04/15/2008US7358750 Inspection apparatus for printed board
04/15/2008US7358749 Method, apparatus, and program for measuring an electromagnetic field and medium storing the program
04/15/2008US7358748 Methods and systems for determining a property of an insulating film
04/15/2008US7358745 Cable tester
04/15/2008US7358744 Method for testing the serviceability of transducers
04/15/2008US7358743 Accumulated current counter and method thereof
04/15/2008US7358740 Thermal switch with self-test feature
04/15/2008US7358718 Semiconductor device and electronics device
04/15/2008US7358715 Semiconductor integrated circuit
04/15/2008US7358714 Testing method and testing apparatus
04/15/2008US7358704 Critical state estimation system and method for secondary cells
04/15/2008US7358701 Method and system for modeling energy transfer
04/10/2008WO2008042676A2 Method and apparatus for indirect planarization
04/10/2008WO2008042520A2 Probe array wafer
04/10/2008WO2008042138A2 Single event upset test circuit and methodology
04/10/2008WO2008042113A2 Networked test system
04/10/2008WO2008041803A1 Side-docking type test handler and apparatus for transferring test tray for same