| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/07/2008 | CN101174710A 电池管理系统及其驱动方法 Battery management system and driving method |
| 05/07/2008 | CN101174376A Method of inspecting defect for electroluminescence display apparatus, repairing method and manufacturing method |
| 05/07/2008 | CN101174362A Automatic remote control test system and test approach thereof |
| 05/07/2008 | CN101173979A Calibration method and special calibration device for dielectric oil dielectrical strength tester |
| 05/07/2008 | CN101173977A Integrated circuit tester |
| 05/07/2008 | CN101173976A Fault detection method of zero-cross triggering circuit |
| 05/07/2008 | CN101173975A Method for implementing distance measurement between two ends of electric transmission line using interphase electrical quantities |
| 05/07/2008 | CN101173974A Apparatus and method of water absorption test for generator stator winding insulator using cross capacitance |
| 05/07/2008 | CN101173973A Method for detecting circuit make-and-break of flexible circuit board |
| 05/07/2008 | CN101173972A Method and apparatus for testing to determine minimum operating voltages in electronic devices |
| 05/07/2008 | CN101173971A Zero sequence parameter live line measurement device of mutual inductance circuit |
| 05/07/2008 | CN101173970A Chip-based prober for high frequency measurements and methods of measuring |
| 05/07/2008 | CN101173969A System, device and method for implementing complete automatic test of MP3 player |
| 05/07/2008 | CN101173967A Testing circuit and method for tiny capacitance |
| 05/07/2008 | CN101173964A Arc detection apparatus and method |
| 05/07/2008 | CN101173960A Universal array type probe card design for semiconductor device testing |
| 05/07/2008 | CN101173959A On-line test attachment |
| 05/07/2008 | CN101173874A Thermocouple type thermometer testing apparatus |
| 05/07/2008 | CN101173474A Method for checking failures of washing machine electric motor loop and clothes amount detection circuit |
| 05/07/2008 | CN100387001C System of virtual cascade time delay alignment characteristic used for testing chip and its method |
| 05/07/2008 | CN100386867C Device package and methods for the fabrication and testing thereof |
| 05/07/2008 | CN100386858C Wafer collective reliability evaluation device and wafer collective reliability evaluation method |
| 05/07/2008 | CN100386643C Secondary cell residual capacity calculation method and battery pack |
| 05/07/2008 | CN100386642C Monitoring device of power generator real time power angle |
| 05/07/2008 | CN100386641C Testing method for gain compression point output power of amplifier |
| 05/07/2008 | CN100386640C Flexible balancing temperature-raising experimental device of crystal brake valve |
| 05/07/2008 | CN100386639C Single-pouring synthetic experimental method of high-voltage parallel crystal brake valve |
| 05/07/2008 | CN100386638C PCB on-line testing system and realization thereof |
| 05/07/2008 | CN100386637C Fault line selection method for single-phase-to-ground fault in small ground current distribution network and its line selection system |
| 05/07/2008 | CN100386636C TPS protection plate detection method |
| 05/07/2008 | CN100386635C Circuit and method for inspecting piezoelectric resonance mode by time-domain transient current |
| 05/07/2008 | CN100386629C Inspection apparatus for display panel |
| 05/06/2008 | US7370257 Test vehicle data analysis |
| 05/06/2008 | US7370256 Integrated circuit testing module including data compression |
| 05/06/2008 | US7370255 Circuit testing with ring-connected test instrument modules |
| 05/06/2008 | US7370254 Compressing test responses using a compactor |
| 05/06/2008 | US7370253 Apparatus and method for high-speed SAS link protocol testing |
| 05/06/2008 | US7370237 Semiconductor memory device capable of accessing all memory cells |
| 05/06/2008 | US7369957 Method and system for generating test pulses to test electronic elements |
| 05/06/2008 | US7369769 Ethernet passive optical network ring and its method of authorization and collision detection |
| 05/06/2008 | US7369608 Dynamic regulation of power consumption of a high-speed communication system |
| 05/06/2008 | US7369604 Time correlation of data acquisition samples from independent systems in a logic analyzer |
| 05/06/2008 | US7369506 Method and apparatus for enabling the detection of transparent defects |
| 05/06/2008 | US7369501 Apparatus and method for controlling reverse-link data transmission rate during handoff |
| 05/06/2008 | US7369498 Congestion control method for a packet-switched network |
| 05/06/2008 | US7369493 Congestion control in an IP network |
| 05/06/2008 | US7369492 Radio area network control system and a wide area radio area network control system |
| 05/06/2008 | US7369489 Unbiased token bucket |
| 05/06/2008 | US7369488 Wireless LAN apparatus for changing packet length according to changing conditions |
| 05/06/2008 | US7369455 Calibration circuit of a semiconductor memory device and method of operating the same |
| 05/06/2008 | US7369375 Magneto-resistance effect element and magneto-resistance effect head |
| 05/06/2008 | US7369030 Fuse state indicator |
| 05/06/2008 | US7368934 Avalanche testing at final test of top and bottom FETs of a buck converter |
| 05/06/2008 | US7368933 Method for testing standby current of semiconductor package |
| 05/06/2008 | US7368932 Testing device for printed circuit board |
| 05/06/2008 | US7368931 On-chip self test circuit and self test method for signal distortion |
| 05/06/2008 | US7368930 Adjustment mechanism |
| 05/06/2008 | US7368929 Methods and apparatuses for improved positioning in a probing system |
| 05/06/2008 | US7368928 Vertical type high frequency probe card |
| 05/06/2008 | US7368927 Probe head having a membrane suspended probe |
| 05/06/2008 | US7368925 Probe station with two platens |
| 05/06/2008 | US7368924 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 05/06/2008 | US7368919 Wireless portable automated harness scanner system and method therefor |
| 05/06/2008 | US7368918 Devices, systems, and methods for adaptive RF sensing in arc fault detection |
| 05/06/2008 | US7368916 Apparatus and methods for making capacitive measurements of cathode fall in fluorescent lamps |
| 05/06/2008 | US7368901 Sequential control circuit |
| 05/06/2008 | US7368886 Method of testing motor torque integrity in a hybrid electric vehicle |
| 05/06/2008 | US7368817 Bump-on-lead flip chip interconnection |
| 05/06/2008 | US7368678 Method for sorting integrated circuit devices |
| 05/06/2008 | US7368303 Method for temperature control in a rapid thermal processing system |
| 05/06/2008 | US7368053 Membrane zeta potential measuring system |
| 05/06/2008 | US7367514 Reprogramming system including reprogramming symbol |
| 05/06/2008 | CA2452781C Alternator testing device and method |
| 05/06/2008 | CA2373434C Abnormality diagnosis method and apparatus for separable transformer |
| 05/02/2008 | WO2008052102A2 Deposition analysis for robot motion correction |
| 05/02/2008 | WO2008051922A2 Continuous linear scanning of large flat panel media |
| 05/02/2008 | WO2008051773A2 Probe card assembly with a mechanically decoupled wiring substrate |
| 05/02/2008 | WO2008051107A1 Testing of a test element |
| 05/02/2008 | WO2008050648A1 Holding member for inspection, inspecting device, and inspecting method |
| 05/02/2008 | WO2008050607A1 Tester, driver comparator chip, response measuring device, calibration method, and calibration device |
| 05/02/2008 | WO2008050527A1 Semiconductor testing apparatus and method of testing semiconductor memory |
| 05/02/2008 | WO2008050518A1 Prober device |
| 05/02/2008 | WO2008050443A1 Customer tray and electronic component testing apparatus |
| 05/02/2008 | WO2008050442A1 Electronic component testing apparatus |
| 05/02/2008 | WO2008050380A1 Display panel testing apparatus and testing method |
| 05/02/2008 | WO2008049793A1 Method and device for analysing electric cable network using pseudorandom sequences |
| 05/02/2008 | WO2008049436A1 Method and device for detection of a loose connection |
| 05/02/2008 | WO2008015462A3 Power supply circuit |
| 05/02/2008 | WO2007145729A3 On-wafer test structures |
| 05/02/2008 | WO2007143378A3 Faulted circuit indicator monitoring device with wireless memory monitor |
| 05/02/2008 | WO2007123741A3 Battery monitoring, warranty, and performance tracking system |
| 05/01/2008 | US20080104471 Method and apparatus for testing an IC device based on relative timing of test signals |
| 05/01/2008 | US20080104470 Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test |
| 05/01/2008 | US20080104469 Apparatus and Method for Using a Single Bank of eFuses to Successively Store Testing Data from Multiple Stages of Testing |
| 05/01/2008 | US20080104468 Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signatures |
| 05/01/2008 | US20080104466 Method and Apparatus for Testing Embedded Cores |
| 05/01/2008 | US20080104465 Failure simulation based on system level boundary scan architecture |
| 05/01/2008 | US20080104464 Method and Apparatus for Controlling Access to and/or Exit From a Portion of Scan Chain |
| 05/01/2008 | US20080104463 Method and system for testing chips |
| 05/01/2008 | US20080104462 Serializer/de-serializer bus controller inferface |