| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/03/2008 | US7383477 Interface circuit for using a low voltage logic tester to test a high voltage IC |
| 06/03/2008 | US7383373 Deriving corresponding signals |
| 06/03/2008 | US7383367 Progressive extended compression mask for dynamic trace |
| 06/03/2008 | US7383168 Method and system for design verification and debugging of a complex computing system |
| 06/03/2008 | US7383147 Dynamically adaptable semiconductor parametric testing |
| 06/03/2008 | US7383146 Acquiring test data from an electronic circuit |
| 06/03/2008 | US7383137 Method and apparatus for measuring absolute and net power consumption for computer systems |
| 06/03/2008 | US7382914 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects |
| 06/03/2008 | US7382772 Communication system that shares protect links among multiple services including an internet service |
| 06/03/2008 | US7382272 System, a tool and method for communicating with a faulted circuit indicator using a remote display |
| 06/03/2008 | US7382150 Sensitivity switchable detection circuit and method |
| 06/03/2008 | US7382149 System for acquiring device parameters |
| 06/03/2008 | US7382148 System and method for testing an LED and a connector thereof |
| 06/03/2008 | US7382147 Semiconductor device testing |
| 06/03/2008 | US7382146 Semiconductor testing apparatus |
| 06/03/2008 | US7382145 Docking device actuated by pressure means |
| 06/03/2008 | US7382144 Test fixture for holding signal terminals or pins and related method for assembling the test fixture |
| 06/03/2008 | US7382143 Wafer probe interconnect system |
| 06/03/2008 | US7382142 High density interconnect system having rapid fabrication cycle |
| 06/03/2008 | US7382141 Testing a batch of electrical components |
| 06/03/2008 | US7382138 System and method for non-destructive testing of rotors |
| 06/03/2008 | US7382117 Delay circuit and test apparatus using delay element and buffer |
| 06/03/2008 | US7382110 Method of charging secondary battery, method of calculating remaining capacity rate of secondary battery, and battery pack |
| 06/03/2008 | US7382108 Charging apparatus and charging current detecting circuit thereof |
| 06/03/2008 | US7382046 Semiconductor device protection cover, and semiconductor device unit including the cover |
| 06/03/2008 | US7381986 Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer |
| 06/03/2008 | US7381908 Circuit board stiffener |
| 06/03/2008 | US7381577 Early detection test for identifying defective semiconductor wafers in a front-end manufacturing line |
| 06/03/2008 | US7380631 Automotive passenger restraint and protection apparatus |
| 05/29/2008 | WO2008064182A1 Active voltage management system for energy storage device |
| 05/29/2008 | WO2008063043A1 Flashover analysis tool |
| 05/29/2008 | WO2008062719A1 Test device and test module |
| 05/29/2008 | WO2008062579A1 Semiconductor inspection equipment |
| 05/29/2008 | WO2008062522A1 Electronic component test equipment and method for conveying tray |
| 05/29/2008 | WO2008062341A1 A method of optically inspecting an integrated circuit through a lens |
| 05/29/2008 | WO2008061432A1 A signal generating circuit for detecting ground status |
| 05/29/2008 | WO2008061413A1 A method, device and system for recognizing a cable type and a switching cable |
| 05/29/2008 | WO2008042138A3 Single event upset test circuit and methodology |
| 05/29/2008 | WO2008029348A3 Testable integrated circuit and ic test method |
| 05/29/2008 | WO2008014503A3 Low-noise source |
| 05/29/2008 | US20080126903 Compression and decompression of stimulus and response waveforms in automated test systems |
| 05/29/2008 | US20080126901 Memory with improved bist |
| 05/29/2008 | US20080126899 Pattern controlled, full speed ATE compare capability for deterministic & non-deterministic IC data |
| 05/29/2008 | US20080126896 System and Method for Device Performance Characterization in Physical and Logical Domains with AC SCAN Testing |
| 05/29/2008 | US20080126895 Middlesoft commander |
| 05/29/2008 | US20080126894 Semiconductor integrated circuit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit |
| 05/29/2008 | US20080126892 Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces |
| 05/29/2008 | US20080126863 Testing DRAM Chips with a PC Motherboard Attached to a Chip Handler by a Solder-Side Adaptor Board with an Advanced-Memory Buffer (AMB) |
| 05/29/2008 | US20080126001 Equipment testing system and method having scaleable test line limits |
| 05/29/2008 | US20080125994 Systems and methods of converting rfid labels |
| 05/29/2008 | US20080125987 Nickel-hydride battery life determining method and life determining apparatus |
| 05/29/2008 | US20080125984 Spatially Assisted Fault Reporting Method, System and Apparatus |
| 05/29/2008 | US20080125932 Abnormality detecting device, abnormality detecting method, and computer readable medium storing an abnormality detecting program |
| 05/29/2008 | US20080125903 Semiconductor production system |
| 05/29/2008 | US20080124820 Method and system for detecting existence of an undesirable particle during semiconductor fabrication |
| 05/29/2008 | US20080124819 Molecular containment film modeling tool |
| 05/29/2008 | US20080123533 Relaxed constrained shortest path first (R-CSPF) |
| 05/29/2008 | US20080123532 Dynamic weighted-fair load-balancing |
| 05/29/2008 | US20080123531 Apparatus, System And Method For The Transmission Of Data With Different QoS Attributes |
| 05/29/2008 | US20080123486 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method |
| 05/29/2008 | US20080123310 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/29/2008 | US20080123012 Display device and inspection method for display device |
| 05/29/2008 | US20080122477 Voltage test circuit for computer power supply |
| 05/29/2008 | US20080122476 Test structure with TDDB test pattern |
| 05/29/2008 | US20080122475 A Current Mirror with Circuitry That Allows for Over Voltage Stress Testing |
| 05/29/2008 | US20080122474 Systems and methods for reducing the effects of electrostatic discharge |
| 05/29/2008 | US20080122473 Method for improved single event latch up resistance in an integrated circuit |
| 05/29/2008 | US20080122472 Testing jig of electronic signal |
| 05/29/2008 | US20080122471 Fault detection method, test circuit and semiconductor device |
| 05/29/2008 | US20080122468 Probe holder for a probe for testing semiconductor components |
| 05/29/2008 | US20080122466 Electrical connecting apparatus |
| 05/29/2008 | US20080122463 Testing microelectronic devices using electro-optic modulator probes |
| 05/29/2008 | US20080122462 Method of inspecting pattern and inspecting instrument |
| 05/29/2008 | US20080122447 Method and apparatus for detection of resistive fault conditions |
| 05/29/2008 | US20080122446 Test pattern |
| 05/29/2008 | US20080122445 Fixture for analyzing thin flexible electronic device |
| 05/29/2008 | US20080122433 Pressing member and electronic component handling device |
| 05/29/2008 | US20080122432 Test head positioning system and method |
| 05/29/2008 | US20080121879 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/29/2008 | US20080121625 Detecting arc discharges |
| 05/29/2008 | US20080121020 Sensor element, method of manufacturing a sensor element, and gas sensor |
| 05/29/2008 | DE112005003580T5 Sondenanordnung, Verfahren zu ihrer Herstellung und elektrische Verbindungsvorrichtung Probe assembly, to processes for their preparation and electrical connection device |
| 05/29/2008 | DE10242908B4 Spannungsdetektionsschaltung für Batterien Voltage detection circuit for batteries |
| 05/29/2008 | DE102007056516A1 Evaluation unit for use with start circuit and load circuit, has input signal inputted via input and another input signal inputted via another input for diagnosing operating condition of start circuit and/or load circuit |
| 05/29/2008 | DE102007050628A1 Vorrichtung zum Erfassen des Ladungszustands einer Batterie Means for detecting the charge state of a battery |
| 05/29/2008 | DE102007008202A1 Test system for use in testing arrangement of radar device, has hopper for decoupling radar signals in near field of transmitting antenna of radar device, where signals are radiated by antenna, and conductor transports decoupled signals |
| 05/29/2008 | DE102006054369A1 Sensor arrangement for use in motor vehicle, has circuit arrangement connected with contact areas of supply bus and designed to detect parameter representing electrical current flowing between connections of sensor arrangement |
| 05/29/2008 | DE102005007593B4 Sockel-Vorrichtung zum Testen von Halbleiter-Bauelementen und Verfahren zum Aufnehmen eines Halbleiter-Bauelements in einer Sockel-Vorrichtung Socket apparatus for testing semiconductor devices and methods for receiving a semiconductor device in a base device |
| 05/29/2008 | DE102004027349B4 Prüfanordnuung und Verfahren zum Ermitteln des Verlustfaktors einer Hochspannungsdurchführung Prüfanordnuung and method for determining the loss factor of a high-voltage bushing |
| 05/29/2008 | CA2612842A1 Method and apparatus for detection of resistive fault conditions |
| 05/28/2008 | EP1925945A2 Probe device with heating unit |
| 05/28/2008 | EP1925086A1 High speed transmission system |
| 05/28/2008 | EP1924865A1 High voltage insulation monitoring sensor |
| 05/28/2008 | EP1924863A1 A method for fault location in electric power lines |
| 05/28/2008 | EP1924862A2 Arc fault circuit interrupter system |
| 05/28/2008 | EP1924861A2 Arc fault detection and confirmation using voltage and current analysis |
| 05/28/2008 | EP1756599A4 Qam signal analysis in a network |
| 05/28/2008 | EP1741111A4 Compliant electrical contact assembly |
| 05/28/2008 | EP1649298B1 Method for the diagnosis of driver outputs and diagnosis pulse manager |
| 05/28/2008 | EP1311868B1 Circuit arrangement for monitoring the state of charge of an accumulator |