Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2008
04/23/2008EP1913744A2 Integrated packet latency aware qos scheduling using proportional fairness and weighted fair queuing for wireless integrated multimedia packet services
04/23/2008EP1913671A1 Method for regulating charging of nickel cadmium and nickel metal hydride batteries, and power supply unit
04/23/2008EP1913410A2 Method and system for debug and test using replicated logic
04/23/2008EP1913409A2 Method and apparatus for parameter adjustment, testing, and configuration
04/23/2008EP1665285B1 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance
04/23/2008EP1604341B1 In-use determining the near-end-of-life state of a combustion engine battery
04/23/2008EP1135794B1 A method and apparatus for the transport and tracking of an electronic component
04/23/2008CN201051663Y Single phase ground failure location device for neutral point indirect ground power grid
04/23/2008CN201051651Y A failure arc protection breaker
04/23/2008CN201051369Y Display and system displaying input selection
04/23/2008CN201051136Y A magnet polarity recognition device
04/23/2008CN201051135Y Battery ratio instrument
04/23/2008CN201051134Y Acentric switch break rotation speed detector
04/23/2008CN201051133Y A finger touch pressure detection device for insulation switch
04/23/2008CN201051132Y Cable insulation testing device with status self-check of digital output relay
04/23/2008CN201051131Y Self checking module of cable insulation test precision for computer monitoring system
04/23/2008CN201051130Y A whirlpool current change detector probe
04/23/2008CN201051129Y LED polarity self recognition and self switch circuit
04/23/2008CN201051128Y Large generator stator loop detection device
04/23/2008CN201051127Y Automatic failure detection circuit for high-voltage induction sensor
04/23/2008CN201051109Y A clamper for capacitor aging
04/23/2008CN201051042Y High voltage leakage measuring instrument for medical liquid transfusion soft bag
04/23/2008CN201051011Y Analog electronic balance detection and analysis instrument
04/23/2008CN201050358Y Device for monitoring oil well pumping unit start-stop and collecting up and down stroke electric current and punching number
04/23/2008CN101167082A RFID tag sensitivity
04/23/2008CN101166986A IC chip package, test equipment and interface for performing a functional test of a chip contained within said chip package
04/23/2008CN101166985A Site-aware objects
04/23/2008CN101166984A Conduction tester for wire harness
04/23/2008CN101166983A 灵活的微电路空间变压器装配 Flexible microcircuits space transformer assembly
04/23/2008CN101166024A Method and apparatus for overcoming negative bias temperature instability effect in life span
04/23/2008CN101165963A Battery management system (BMS) and driving method thereof
04/23/2008CN101165953A Humidification system for small-sized PEM fuel battery test platform
04/23/2008CN101165952A Humidification technology and humidification system for large power PEM fuel battery test platform
04/23/2008CN101165888A Electrically programmable fuse sense circuit and method for sensing electrically programmable fuse state
04/23/2008CN101165764A Drive circuit of display device and method of testing the same
04/23/2008CN101165751A Panel detector and its detection method
04/23/2008CN101165633A Method, apparatus, and system for power source failure prediction
04/23/2008CN101165508A Electronic component simulated fixture and power supply abnormity detection method
04/23/2008CN101165507A Fuel battery voltage scanning system based on network monitoring
04/23/2008CN101165506A Fuel battery test system based on network study control
04/23/2008CN101165505A Insulation-resistance degradation detecting device for motors
04/23/2008CN101165504A Vehicular combination switch testing jig
04/23/2008CN101165503A Semiconductor ic and testing method thereof
04/23/2008CN101165502A Tester simultaneous test method
04/23/2008CN101165501A Asynchronous chip simultaneous test method
04/23/2008CN101165499A Dynamic burn-in systems and apparatuses
04/23/2008CN101165498A Radio data card radiation stray frequency point test method
04/23/2008CN100383892C Memory device having page buffer with double-register and its using method
04/23/2008CN100383752C Device for testing RS232 ports
04/23/2008CN100383548C Power source characteristic testing insrument
04/23/2008CN100383547C Primary cut-out state monitoring method
04/23/2008CN100383546C Test method for a semiconductor integrated circuit and a semiconductor integrated circuit
04/23/2008CN100383545C Method for generating test mode for integrated circuit design simulating environment
04/23/2008CN100383544C Method and apparatus for real-time monitoring level signal
04/23/2008CN100383543C Module-testing device
04/23/2008CN100383542C Method and device for inspecting circuit board
04/23/2008CN100383541C Device for testing thermal relaxation time of semiconductor laser and testing method thereof
04/23/2008CN100383540C Key detector and method
04/23/2008CN100383534C Test head positioning apparatus
04/22/2008US7363567 System and method for electronic device testing using random parameter looping
04/22/2008US7363565 Method of testing apparatus having master logic unit and slave logic unit
04/22/2008US7363564 Method and apparatus for securing communications ports in an electronic device
04/22/2008US7363563 Systems and methods for a built in test circuit for asynchronous testing of high-speed transceivers
04/22/2008US7363562 Method and apparatus for deferred decision signal quality analysis
04/22/2008US7363561 Method and circuit arrangement for resetting an integrated circuit
04/22/2008US7363560 Circuit for and method of determining the location of a defect in an integrated circuit
04/22/2008US7363559 Detection of tap register characteristics
04/22/2008US7363558 Semiconductor device and method for testing the same
04/22/2008US7363557 System for at-speed automated testing of high serial pin count multiple gigabit per second devices
04/22/2008US7363545 System and method for overcoming download cable bottlenecks during programming of integrated circuit devices
04/22/2008US7363533 High reliability memory module with a fault tolerant address and command bus
04/22/2008US7363176 Operating voltage determination for an integrated circuit
04/22/2008US7363175 Query based electronic battery tester
04/22/2008US7362839 Techniques to adjust vertical offset
04/22/2008US7362801 Method for accurate estimation of noise for data modems
04/22/2008US7362714 Packet network monitoring device
04/22/2008US7362713 System and method for accessing digital subscriber line data
04/22/2008US7362708 Method and device for OMP load distribution
04/22/2008US7362706 Method and apparatus for hierarchial scheduling of virtual paths with underutilized bandwidth
04/22/2008US7362704 Method and apparatus for dynamically allocating upstream bandwidth in passive optical networks
04/22/2008US7362697 Self-healing chip-to-chip interface
04/22/2008US7362652 Semiconductor circuit
04/22/2008US7362632 Test parallelism increase by tester controllable switching of chip select groups
04/22/2008US7362588 Flying capacitor type battery voltage detector
04/22/2008US7362124 Method and apparatus for testing liquid crystal display using electrostatic devices
04/22/2008US7362123 Inspection apparatus for thin film transistor substrate
04/22/2008US7362122 Method and circuit for extracting current-voltage characteristics of device
04/22/2008US7362121 Self-heating mechanism for duplicating microbump failure conditions in FPGAs and for logging failures
04/22/2008US7362120 Method and apparatus for die testing on wafer
04/22/2008US7362118 Probe with contact ring
04/22/2008US7362117 Cooling fin connected to a cooling unit and a pusher of the testing apparatus
04/22/2008US7362116 Method for probing impact sensitive and thin layered substrate
04/22/2008US7362115 Chuck with integrated wafer support
04/22/2008US7362114 Apparatus for interfacing electronic packages and test equipment
04/22/2008US7362113 Universal wafer carrier for wafer level die burn-in
04/22/2008US7362112 Signal acquisition probe having a retractable double cushioned probing tip assembly
04/22/2008US7362111 Device for evaluating at least one electrical conducting structure of an electronic component
04/22/2008US7362108 Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe
04/22/2008US7362106 Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes
04/22/2008US7362104 Current measurement device and test device