Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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04/23/2008 | EP1913744A2 Integrated packet latency aware qos scheduling using proportional fairness and weighted fair queuing for wireless integrated multimedia packet services |
04/23/2008 | EP1913671A1 Method for regulating charging of nickel cadmium and nickel metal hydride batteries, and power supply unit |
04/23/2008 | EP1913410A2 Method and system for debug and test using replicated logic |
04/23/2008 | EP1913409A2 Method and apparatus for parameter adjustment, testing, and configuration |
04/23/2008 | EP1665285B1 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
04/23/2008 | EP1604341B1 In-use determining the near-end-of-life state of a combustion engine battery |
04/23/2008 | EP1135794B1 A method and apparatus for the transport and tracking of an electronic component |
04/23/2008 | CN201051663Y Single phase ground failure location device for neutral point indirect ground power grid |
04/23/2008 | CN201051651Y A failure arc protection breaker |
04/23/2008 | CN201051369Y Display and system displaying input selection |
04/23/2008 | CN201051136Y A magnet polarity recognition device |
04/23/2008 | CN201051135Y Battery ratio instrument |
04/23/2008 | CN201051134Y Acentric switch break rotation speed detector |
04/23/2008 | CN201051133Y A finger touch pressure detection device for insulation switch |
04/23/2008 | CN201051132Y Cable insulation testing device with status self-check of digital output relay |
04/23/2008 | CN201051131Y Self checking module of cable insulation test precision for computer monitoring system |
04/23/2008 | CN201051130Y A whirlpool current change detector probe |
04/23/2008 | CN201051129Y LED polarity self recognition and self switch circuit |
04/23/2008 | CN201051128Y Large generator stator loop detection device |
04/23/2008 | CN201051127Y Automatic failure detection circuit for high-voltage induction sensor |
04/23/2008 | CN201051109Y A clamper for capacitor aging |
04/23/2008 | CN201051042Y High voltage leakage measuring instrument for medical liquid transfusion soft bag |
04/23/2008 | CN201051011Y Analog electronic balance detection and analysis instrument |
04/23/2008 | CN201050358Y Device for monitoring oil well pumping unit start-stop and collecting up and down stroke electric current and punching number |
04/23/2008 | CN101167082A RFID tag sensitivity |
04/23/2008 | CN101166986A IC chip package, test equipment and interface for performing a functional test of a chip contained within said chip package |
04/23/2008 | CN101166985A Site-aware objects |
04/23/2008 | CN101166984A Conduction tester for wire harness |
04/23/2008 | CN101166983A 灵活的微电路空间变压器装配 Flexible microcircuits space transformer assembly |
04/23/2008 | CN101166024A Method and apparatus for overcoming negative bias temperature instability effect in life span |
04/23/2008 | CN101165963A Battery management system (BMS) and driving method thereof |
04/23/2008 | CN101165953A Humidification system for small-sized PEM fuel battery test platform |
04/23/2008 | CN101165952A Humidification technology and humidification system for large power PEM fuel battery test platform |
04/23/2008 | CN101165888A Electrically programmable fuse sense circuit and method for sensing electrically programmable fuse state |
04/23/2008 | CN101165764A Drive circuit of display device and method of testing the same |
04/23/2008 | CN101165751A Panel detector and its detection method |
04/23/2008 | CN101165633A Method, apparatus, and system for power source failure prediction |
04/23/2008 | CN101165508A Electronic component simulated fixture and power supply abnormity detection method |
04/23/2008 | CN101165507A Fuel battery voltage scanning system based on network monitoring |
04/23/2008 | CN101165506A Fuel battery test system based on network study control |
04/23/2008 | CN101165505A Insulation-resistance degradation detecting device for motors |
04/23/2008 | CN101165504A Vehicular combination switch testing jig |
04/23/2008 | CN101165503A Semiconductor ic and testing method thereof |
04/23/2008 | CN101165502A Tester simultaneous test method |
04/23/2008 | CN101165501A Asynchronous chip simultaneous test method |
04/23/2008 | CN101165499A Dynamic burn-in systems and apparatuses |
04/23/2008 | CN101165498A Radio data card radiation stray frequency point test method |
04/23/2008 | CN100383892C Memory device having page buffer with double-register and its using method |
04/23/2008 | CN100383752C Device for testing RS232 ports |
04/23/2008 | CN100383548C Power source characteristic testing insrument |
04/23/2008 | CN100383547C Primary cut-out state monitoring method |
04/23/2008 | CN100383546C Test method for a semiconductor integrated circuit and a semiconductor integrated circuit |
04/23/2008 | CN100383545C Method for generating test mode for integrated circuit design simulating environment |
04/23/2008 | CN100383544C Method and apparatus for real-time monitoring level signal |
04/23/2008 | CN100383543C Module-testing device |
04/23/2008 | CN100383542C Method and device for inspecting circuit board |
04/23/2008 | CN100383541C Device for testing thermal relaxation time of semiconductor laser and testing method thereof |
04/23/2008 | CN100383540C Key detector and method |
04/23/2008 | CN100383534C Test head positioning apparatus |
04/22/2008 | US7363567 System and method for electronic device testing using random parameter looping |
04/22/2008 | US7363565 Method of testing apparatus having master logic unit and slave logic unit |
04/22/2008 | US7363564 Method and apparatus for securing communications ports in an electronic device |
04/22/2008 | US7363563 Systems and methods for a built in test circuit for asynchronous testing of high-speed transceivers |
04/22/2008 | US7363562 Method and apparatus for deferred decision signal quality analysis |
04/22/2008 | US7363561 Method and circuit arrangement for resetting an integrated circuit |
04/22/2008 | US7363560 Circuit for and method of determining the location of a defect in an integrated circuit |
04/22/2008 | US7363559 Detection of tap register characteristics |
04/22/2008 | US7363558 Semiconductor device and method for testing the same |
04/22/2008 | US7363557 System for at-speed automated testing of high serial pin count multiple gigabit per second devices |
04/22/2008 | US7363545 System and method for overcoming download cable bottlenecks during programming of integrated circuit devices |
04/22/2008 | US7363533 High reliability memory module with a fault tolerant address and command bus |
04/22/2008 | US7363176 Operating voltage determination for an integrated circuit |
04/22/2008 | US7363175 Query based electronic battery tester |
04/22/2008 | US7362839 Techniques to adjust vertical offset |
04/22/2008 | US7362801 Method for accurate estimation of noise for data modems |
04/22/2008 | US7362714 Packet network monitoring device |
04/22/2008 | US7362713 System and method for accessing digital subscriber line data |
04/22/2008 | US7362708 Method and device for OMP load distribution |
04/22/2008 | US7362706 Method and apparatus for hierarchial scheduling of virtual paths with underutilized bandwidth |
04/22/2008 | US7362704 Method and apparatus for dynamically allocating upstream bandwidth in passive optical networks |
04/22/2008 | US7362697 Self-healing chip-to-chip interface |
04/22/2008 | US7362652 Semiconductor circuit |
04/22/2008 | US7362632 Test parallelism increase by tester controllable switching of chip select groups |
04/22/2008 | US7362588 Flying capacitor type battery voltage detector |
04/22/2008 | US7362124 Method and apparatus for testing liquid crystal display using electrostatic devices |
04/22/2008 | US7362123 Inspection apparatus for thin film transistor substrate |
04/22/2008 | US7362122 Method and circuit for extracting current-voltage characteristics of device |
04/22/2008 | US7362121 Self-heating mechanism for duplicating microbump failure conditions in FPGAs and for logging failures |
04/22/2008 | US7362120 Method and apparatus for die testing on wafer |
04/22/2008 | US7362118 Probe with contact ring |
04/22/2008 | US7362117 Cooling fin connected to a cooling unit and a pusher of the testing apparatus |
04/22/2008 | US7362116 Method for probing impact sensitive and thin layered substrate |
04/22/2008 | US7362115 Chuck with integrated wafer support |
04/22/2008 | US7362114 Apparatus for interfacing electronic packages and test equipment |
04/22/2008 | US7362113 Universal wafer carrier for wafer level die burn-in |
04/22/2008 | US7362112 Signal acquisition probe having a retractable double cushioned probing tip assembly |
04/22/2008 | US7362111 Device for evaluating at least one electrical conducting structure of an electronic component |
04/22/2008 | US7362108 Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe |
04/22/2008 | US7362106 Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes |
04/22/2008 | US7362104 Current measurement device and test device |