| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/22/2008 | US7362103 System for driving a plurality of lamps and fault detecting circuit thereof |
| 04/22/2008 | US7362098 Magnetic field sensor |
| 04/22/2008 | US7362093 IC selectively connecting logic and bypass conductors between opposing pads |
| 04/22/2008 | US7362092 Isolation buffers with controlled equal time delays |
| 04/22/2008 | US7362091 Test probe having modular components |
| 04/22/2008 | US7362090 Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same |
| 04/22/2008 | US7362089 Carrier module for adapting non-standard instrument cards to test systems |
| 04/22/2008 | US7362088 Non contact method and apparatus for measurement of sheet resistance of P-N junctions |
| 04/22/2008 | US7362087 Adapter for circuit board examination and device for circuit board examination |
| 04/22/2008 | US7362074 Method for determining deterioration of accumulator battery, method for measuring internal impedance of secondary battery, equipment for measuring internal impedance of secondary battery, equipment for determining deterioration of secondary battery, and power supply system |
| 04/22/2008 | US7361921 Device and method for plane-parallel orientation of a the surface of an object to be examined in relation to a focus plane of a lens |
| 04/22/2008 | US7361920 Substrate processing apparatus and transfer positioning method thereof |
| 04/22/2008 | US7361613 Semiconductor device, manufacture and evaluation methods for semiconductor device, and process condition evaluation method |
| 04/22/2008 | US7361286 Method of detecting etching end-point |
| 04/17/2008 | WO2008045903A2 Method, apparatus, and system for detecting hot socket deterioration in an electrical meter connection |
| 04/17/2008 | WO2008045277A2 Portable vehicle powering and testing system |
| 04/17/2008 | WO2008044670A1 Calibration apparatus, contact judging method and semiconductor testing apparatus |
| 04/17/2008 | WO2008044593A1 Grounding line connection monitor device and electric device |
| 04/17/2008 | WO2008044509A1 Electrical connection device |
| 04/17/2008 | WO2008044467A1 Electrically connecting apparatus |
| 04/17/2008 | WO2008044464A1 Semiconductor test device |
| 04/17/2008 | WO2008044421A1 Tester and control method |
| 04/17/2008 | WO2008044391A1 Testing device, testing method, and manufacturing method |
| 04/17/2008 | WO2008044305A1 Tray transfer apparatus and electronic component testing apparatus provided with the same |
| 04/17/2008 | WO2008043814A1 Solar inverter and plant for converting solar energy into electrical energy |
| 04/17/2008 | WO2008043639A1 Method and device for checking a sensor signal |
| 04/17/2008 | WO2008018941A3 Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system |
| 04/17/2008 | WO2008013606A3 Tuned monolithic microwave ic probe pads |
| 04/17/2008 | WO2007147968A3 Method of analysing an integrated circuit, method of observation and their associated installations |
| 04/17/2008 | WO2007117738A3 Dynamic metrology sampling with wafer uniformity control |
| 04/17/2008 | WO2007106388A3 Long line monitoring and locating system |
| 04/17/2008 | US20080092093 Register Transfer Level (RTL) Test Point Insertion Method to Reduce Delay Test Volume |
| 04/17/2008 | US20080092088 Process monitoring system and method |
| 04/17/2008 | US20080092006 Optimizing a Set of LBIST Patterns to Enhance Delay Fault Coverage |
| 04/17/2008 | US20080092005 Scan Testing Interface |
| 04/17/2008 | US20080092004 Method and system for automated path delay test vector generation from functional tests |
| 04/17/2008 | US20080092003 Diagnostic Information Capture from Logic Devices with Built-in Self Test |
| 04/17/2008 | US20080092001 Method and device for data communication |
| 04/17/2008 | US20080092000 Delay circuit, jitter injection circuit, and test apparatus |
| 04/17/2008 | US20080091999 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain |
| 04/17/2008 | US20080091998 Partial Enhanced Scan Method for Reducing Volume of Delay Test Patterns |
| 04/17/2008 | US20080091997 Systems and Methods for Improved Scan Testing Fault Coverage |
| 04/17/2008 | US20080091996 Single event upset test circuit and methodology |
| 04/17/2008 | US20080091995 Progressive random access scan circuitry |
| 04/17/2008 | US20080091994 Test system for integrated circuits |
| 04/17/2008 | US20080091993 On-board FIFO memory module for high speed digital sourcing and capture to/from DUT (device under test) using a clock from DUT |
| 04/17/2008 | US20080091992 Tri-level test mode terminal in limited terminal environment |
| 04/17/2008 | US20080091991 Method and apparatus for performing logical compare operation |
| 04/17/2008 | US20080091989 System and method for testing memory blocks in an soc design |
| 04/17/2008 | US20080091980 Method and system for validating PCI/PCI-X adapters |
| 04/17/2008 | US20080091979 Semiconductor memory device and test method |
| 04/17/2008 | US20080091364 Battery Management System (BMS) and driving method thereof |
| 04/17/2008 | US20080091363 Battery Management System (BMS) and driving method thereof |
| 04/17/2008 | US20080091362 Battery management system and driving method thereof |
| 04/17/2008 | US20080089378 Method of manufacturing semiconductor laser for communication, semiconductor laser for communication and optical transmission module |
| 04/17/2008 | US20080089226 Transmission device and redundant configuration between transmission device and layer 2 switch |
| 04/17/2008 | US20080088542 Determining leakage in matrix-structured electronic devices |
| 04/17/2008 | US20080088337 Apparatus for Inspecting a Display Device and Method for Inspecting the Display Device |
| 04/17/2008 | US20080088336 System and method for testing the electromagnetic susceptibility of an electronic display unit |
| 04/17/2008 | US20080088335 Packaging reliability superchips |
| 04/17/2008 | US20080088334 Semiconductor device with multipurpose pad |
| 04/17/2008 | US20080088333 Semiconductor device and test method thereof |
| 04/17/2008 | US20080088332 High density cantilevered probe for electronic devices |
| 04/17/2008 | US20080088331 Socket for test |
| 04/17/2008 | US20080088330 Nonconductive substrate with imbedded conductive pin(s) for contacting probe(s) |
| 04/17/2008 | US20080088329 Systems Configured for Utilizing Two or More Multiple Different Semiconductor Components Configurations, Methods of Providing Semicondutor Components within Sockets, and Methods of Retaining Semiconductor Component Configurations within Sockets |
| 04/17/2008 | US20080088328 Grounding scheme for high speed probing with reduced loop area |
| 04/17/2008 | US20080088327 Probe cards employing probes having retaining portions for potting in a potting region |
| 04/17/2008 | US20080088326 Wafer test head architecture and method of use |
| 04/17/2008 | US20080088325 Method and system for performing embedded diagnostic application at subassembly and component level |
| 04/17/2008 | US20080088324 Method and Installation for Analyzing an Integrated Circuit |
| 04/17/2008 | US20080088320 Network measuring and apparatus for magnitude and phase portion independently |
| 04/17/2008 | US20080088318 Method to test transparent-to-test capacitors |
| 04/17/2008 | US20080088317 Detection circuit for measurement of test lead and using the same |
| 04/17/2008 | US20080088301 Testing device handler |
| 04/17/2008 | US20080087113 Junior Ultrasonic Miniature Air Gap Inspection Crawler |
| 04/17/2008 | US20080087112 Senior Ultrasonic Miniature Air Gap Inspection Crawler |
| 04/17/2008 | DE19962702B4 Prüfsockel einer BGA-Vorrichtung A test socket BGA device |
| 04/17/2008 | DE19540103B4 Prüfvorrichtung für mittels Prüfwerkzeugen zu prüfende Halbleiter-Wafer Tester for means testing tools to test semiconductor wafers |
| 04/17/2008 | DE112006000162T5 Prüfvorrichtung und Prüfverfahren Tester and test methods |
| 04/17/2008 | DE10317102B4 Verfahren zum Ermitteln einer Position einer Unterbrechnung in einem Schaltkreis A method for determining a position of an interruption in a circuit |
| 04/17/2008 | DE102006047469A1 Switch arrangement e.g. relay contact, examining method, involves utilizing test signal as indicator for switched path when comparison of test signal with stored signal sample, which results in compatible signal with signal sample |
| 04/17/2008 | DE102005042423B4 Einrichtung und Verfahren zur Überwachung einer ein Heizkabel einer Fußbodenheizung umschließenden Isolierung Apparatus and method for monitoring a heating cable underfloor heating insulation surrounding |
| 04/17/2008 | DE10125345B4 Prüfkontaktsystem mit Planarisierungsmechanismus Prüfkontaktsystem with planarization mechanism |
| 04/16/2008 | EP1912076A2 Method and device for characterising wafers during manufacture of solar cells |
| 04/16/2008 | EP1910857A2 Testable integrated circuit, system in package and test instruction set |
| 04/16/2008 | EP1910856A2 Obtaining test data for a device |
| 04/16/2008 | EP1910855A2 Method of manufacturing a system in package |
| 04/16/2008 | EP1910854A2 Method for checking an inductive load |
| 04/16/2008 | EP1910853A2 Method and circuit for determining the presence of a false connection between an electronic appliance, especially a household appliance, and a network alternating voltage source |
| 04/16/2008 | EP1853931A4 Method and circuit for the detection of solder-joint failures in a digital electronic package |
| 04/16/2008 | EP1849018A4 Pin electronics with high voltage functionality |
| 04/16/2008 | EP1745607A4 Digital subscriber line user capacity estimation |
| 04/16/2008 | EP1629388A4 A network analyzing method and a network analyzing apparatus |
| 04/16/2008 | EP0885380B1 Real time/off line applications testing system |
| 04/16/2008 | CN201048303Y Charging control circuit of charger |
| 04/16/2008 | CN201048277Y Earth fault line breaker with service life expiration period reinforced protection function |
| 04/16/2008 | CN201048276Y Earth fault line breaker with service life expiration period reinforced protection function |
| 04/16/2008 | CN201048031Y Position control device in LCD fixture for testing COG compression joint performance |
| 04/16/2008 | CN201047971Y Electric power overhead wire protection alarm device |